JPS62192266U - - Google Patents
Info
- Publication number
- JPS62192266U JPS62192266U JP7908686U JP7908686U JPS62192266U JP S62192266 U JPS62192266 U JP S62192266U JP 7908686 U JP7908686 U JP 7908686U JP 7908686 U JP7908686 U JP 7908686U JP S62192266 U JPS62192266 U JP S62192266U
- Authority
- JP
- Japan
- Prior art keywords
- test pin
- pin device
- view
- perspective
- showing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 229910000679 solder Inorganic materials 0.000 description 2
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Description
第1図は本考案の第一実施例を示すテストピン
装置の斜視図、第2図は同プリント基板取付状態
を示す正面図、第3図はプリント基板の裏面側で
検査する場合のテストピン装置の取付状態を示す
正面図、第4図は本考案の第二実施例を示すテス
トピン装置の斜視図、第5図は本考案の第三実施
例を示すテストピン装置の斜視図、第6図は本考
案の第四実施例を示すテストピン装置の斜視図、
第7図は同正面図、第8,9,10図は夫々従来
のテストピン装置の基板取付状態を示す正面図で
ある。
1:テストピン装置、2:プリント基板、3:
孔、4:Dip半田、5:ピン本体、6:空胴部
、7,8:両外側面、9:上板、10:接触部、
11:半田、12:チエツカーランド、13:ス
ルーホール、14:切欠凹部、15:開放面、1
6:底面、17:位置決め用突起、A:横寸法、
B:縦寸法。
Fig. 1 is a perspective view of a test pin device showing the first embodiment of the present invention, Fig. 2 is a front view showing the same printed circuit board installed state, and Fig. 3 is a test pin device when inspecting the back side of a printed circuit board. 4 is a perspective view of a test pin device showing a second embodiment of the present invention; FIG. 5 is a perspective view of a test pin device showing a third embodiment of the present invention; FIG. Figure 6 is a perspective view of a test pin device showing a fourth embodiment of the present invention;
FIG. 7 is a front view of the same, and FIGS. 8, 9, and 10 are front views showing the state in which the conventional test pin device is attached to the board. 1: Test pin device, 2: Printed circuit board, 3:
Hole, 4: Dip solder, 5: Pin body, 6: Cavity, 7, 8: Both outer surfaces, 9: Upper plate, 10: Contact part,
11: Solder, 12: Checker land, 13: Through hole, 14: Notch recess, 15: Open surface, 1
6: Bottom surface, 17: Positioning protrusion, A: Horizontal dimension,
B: Vertical dimension.
Claims (1)
されたことを特徴とするテストピン装置。 A test pin device characterized in that the external shape of the pin body is a standard chip shape.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7908686U JPH0540453Y2 (en) | 1986-05-26 | 1986-05-26 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7908686U JPH0540453Y2 (en) | 1986-05-26 | 1986-05-26 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62192266U true JPS62192266U (en) | 1987-12-07 |
JPH0540453Y2 JPH0540453Y2 (en) | 1993-10-14 |
Family
ID=30928624
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7908686U Expired - Lifetime JPH0540453Y2 (en) | 1986-05-26 | 1986-05-26 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0540453Y2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01121864U (en) * | 1988-02-12 | 1989-08-18 | ||
JPH01135371U (en) * | 1988-03-03 | 1989-09-18 |
-
1986
- 1986-05-26 JP JP7908686U patent/JPH0540453Y2/ja not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01121864U (en) * | 1988-02-12 | 1989-08-18 | ||
JPH01135371U (en) * | 1988-03-03 | 1989-09-18 |
Also Published As
Publication number | Publication date |
---|---|
JPH0540453Y2 (en) | 1993-10-14 |
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