JPS62188669A - Polishing device - Google Patents
Polishing deviceInfo
- Publication number
- JPS62188669A JPS62188669A JP61030505A JP3050586A JPS62188669A JP S62188669 A JPS62188669 A JP S62188669A JP 61030505 A JP61030505 A JP 61030505A JP 3050586 A JP3050586 A JP 3050586A JP S62188669 A JPS62188669 A JP S62188669A
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- board
- liquid
- polishing liquid
- slurry
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005498 polishing Methods 0.000 title claims abstract description 111
- 239000007788 liquid Substances 0.000 claims abstract description 40
- 239000002002 slurry Substances 0.000 claims abstract description 17
- 239000006061 abrasive grain Substances 0.000 claims description 2
- 239000004065 semiconductor Substances 0.000 abstract description 3
- 238000010586 diagram Methods 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 239000012670 alkaline solution Substances 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 239000000463 material Substances 0.000 description 1
Landscapes
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は、半導体ウェーハ等を研摩する研摩装置に関
するものである。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a polishing apparatus for polishing semiconductor wafers and the like.
一般に1表面が若干凹凸形状や、屈曲した形状になって
いる半導体ウェー71等の板体の平面研摩を行う場合に
は、保持盤で保持された板体な研摩盤に当接させ、上記
保持盤と研摩盤とを回転させつつ、上記研摩盤の回転中
心K、砥粒とアルカリ液とを混合したスラリー状研摩液
を供給することにより板体の平面研摩を行う。In general, when performing surface polishing of a plate such as the semiconductor wafer 71 whose surface is slightly uneven or bent, the plate is brought into contact with a plate-like polishing plate held by a holding plate, and the holding plate is held in place. While rotating the disk and the polishing disk, a slurry-like polishing liquid containing abrasive grains and an alkaline solution is supplied to the center of rotation K of the polishing disk, thereby polishing the surface of the plate.
第5図、第6図は、従来のこの種の研摩装置の一例を示
す図である。図中符号1は、図示しない駆動源により回
転駆動させる円柱状の支持軸である。この支持軸lの上
部には、上面が平坦な円板状の研摩盤2が固定されてい
る。研摩盤2の上方には、研摩盤2の上面3に垂直に図
示しない駆動源により回転駆動させる4本の円柱状の支
持軸4゜4・・・が設けられている。これら支持軸4,
4・・・の下部には、下面5が平坦な円板状の保持盤6
,6・・・が固定されている。上記研摩盤2の上面3と
、保持盤6,6・・・の下面5,5・・・とは互いに平
行な面となっている。研摩盤2の上面3の中心部上方に
は、スラリー状研摩液を、研摩盤2の上面3の中心部に
供給する研摩スラリー液供給部7が設けられている。こ
の研摩スラリー液供給部7は、円筒状の筒部8と、その
下端より下方に向けて半径方向内方に漸次傾斜している
切頭円錐筒状の供給口部9とで形成されている。FIGS. 5 and 6 are diagrams showing an example of a conventional polishing apparatus of this type. Reference numeral 1 in the figure is a cylindrical support shaft that is rotationally driven by a drive source (not shown). A disk-shaped polishing disk 2 with a flat upper surface is fixed to the upper part of the support shaft l. Above the polishing machine 2, there are provided four cylindrical support shafts 4.degree. 4 that are perpendicular to the top surface 3 of the polishing machine 2 and rotated by a drive source (not shown). These support shafts 4,
At the bottom of 4... is a disc-shaped holding plate 6 with a flat lower surface 5.
, 6... are fixed. The upper surface 3 of the polishing plate 2 and the lower surfaces 5, 5, . . . of the holding plates 6, 6, . . . are parallel to each other. A polishing slurry liquid supply section 7 is provided above the center of the top surface 3 of the polishing machine 2 to supply a slurry-like polishing liquid to the center of the top surface 3 of the polishing machine 2 . This polishing slurry liquid supply section 7 is formed of a cylindrical tube section 8 and a truncated conical tube-shaped supply port section 9 that is gradually inclined radially inward downward from its lower end. .
上記の研摩装置を用いて板体の平面研摩を行うには、ま
ず、第6図に示す保持盤6,6・・・の下面5 、 5
@5・fC1被加工物の板体10,10・・・を保持
する。そして、板体10,10・・・を第6図に示す研
摩盤2の上面3に当接させ、上記支持軸1と支持軸4,
4・・・とを回転させることにより、研摩盤2と保持盤
6,6・・・とを回転させつつ、研摩盤2の上面3の中
心部上方に設けられた研摩ステ1フー液供給部7の供給
口9より、研摩盤2の回転中心に、スラリー状研摩液を
供給する。この供給されたスラリー状研摩液は、研摩盤
2の上面3のつれ回り力により、研摩盤2の上1fi3
と共に回転しつつ、研摩盤2の上面3上を半径方向外方
に流れる。In order to perform flat surface polishing of a plate using the above-mentioned polishing device, first, the lower surfaces 5, 5 of the holding plates 6, 6, etc. shown in FIG.
@5.fC1 Holds the plates 10, 10, . . . of the workpiece. Then, the plates 10, 10, . . . are brought into contact with the upper surface 3 of the polishing machine 2 shown in FIG.
4..., while rotating the polishing plate 2 and the holding plates 6, 6..., the polishing station 1, which is provided above the center of the upper surface 3 of the polishing plate 2, is rotated. A slurry-like polishing liquid is supplied from the supply port 9 of 7 to the center of rotation of the polishing plate 2. This supplied slurry-like polishing liquid is caused by the twisting force of the upper surface 3 of the polishing disc 2, and the slurry-like polishing liquid is
It flows radially outwardly over the top surface 3 of the polishing disk 2 while rotating with the polishing disk 2 .
このことにより、スラリー状研摩液が、板体10゜10
・・・と研摩盤2の上面3との間に入り込み、上記スラ
リー状研摩液により板体10,10・・・が研摩される
。As a result, the slurry-like polishing liquid spreads between the plates 10° and 10°.
... and the upper surface 3 of the polishing machine 2, and the plates 10, 10, ... are polished by the slurry-like polishing liquid.
ところで、上記の研摩装置において、研摩盤2の上面3
のつれ回り力のみKより、スラリー状研摩液に運動エネ
ルギーが与えられるのでスラリー状研摩液の流速が遅(
、そのため、研摩時間とスラリー状研摩液の使用量とが
必要以上にかかるという欠点があった。By the way, in the above polishing apparatus, the upper surface 3 of the polishing machine 2
Since kinetic energy is given to the slurry polishing liquid by the twisting force only, the flow velocity of the slurry polishing liquid is slow (
Therefore, there was a drawback that the polishing time and the amount of slurry-like polishing liquid used were longer than necessary.
この発明では、研摩時間とスラリー状研摩液の使用量と
を縮減する研摩装置の実現を問題としている。The problem of this invention is to realize a polishing apparatus that reduces polishing time and the amount of slurry polishing liquid used.
この発明は、研摩装置を構成している研摩盤の中心部K
、スラリー状研摩液を、研摩盤の回転中心から外方に案
内するガイド部材を設けてなるものである。This invention focuses on the central part K of the polishing machine constituting the polishing device.
, a guide member is provided to guide the slurry-like polishing liquid outward from the center of rotation of the polishing plate.
第1図ないし第4図は、この発明の一実施例を示す図で
ある。これらの図において、第5図、第6図に示す構成
要素と同一の要素については、同一符号を付しである。1 to 4 are diagrams showing one embodiment of the present invention. In these figures, the same elements as those shown in FIGS. 5 and 6 are designated by the same reference numerals.
賞、第5図、第6図と構成が同一である部分については
、その説明を省略する。The explanation of the parts having the same structure as the prize, FIG. 5, and FIG. 6 will be omitted.
第1図、第2図に示す研摩装置が第5図、第6図に示す
研摩装置と異なる点は、研摩盤2の上面3の中心部にス
ラリー状研摩液を研摩盤2の回°転中心から外方に案内
するガイド部材20を設けた点である。The difference between the polishing apparatus shown in FIGS. 1 and 2 and the polishing apparatus shown in FIGS. 5 and 6 is that the slurry-like polishing liquid is applied to the center of the upper surface 3 of the polishing plate 2 by the rotation of the polishing plate 2. The point is that a guide member 20 is provided to guide outward from the center.
第3図、第4図に示すように、ガイド部材20は、母線
が弓形の円錐状の本体21と、その側面に形成された5
枚のガイド板22,22・・・とで形成されている。ガ
イド板22.22・・・は、湾曲した薄板状のものであ
り、これらガイド板22.22・・・が円錐状の本体2
1の頂点より下方斜め方向に放射状に同ピツチで、湾曲
した面が円錐状の本体21の円周方向同一方向を向いて
、本体21の側面に形成されている。ガイド部材20の
材質には、耐蝕、耐摩耗材が使用されている。As shown in FIGS. 3 and 4, the guide member 20 includes a conical main body 21 whose generatrix is arcuate, and a conical main body 21 with a conical shape formed on the side surface of the conical main body 21.
It is formed of two guide plates 22, 22.... The guide plates 22, 22, . . . are curved thin plates, and these guide plates 22, 22, . . .
The curved surfaces are formed on the side surface of the conical main body 21 with the same pitch radially diagonally downward from the apex of the conical main body 21 and facing in the same direction in the circumferential direction of the conical main body 21. The guide member 20 is made of a corrosion-resistant and wear-resistant material.
上記のよ’l trガイド部#2oh玉x冴暦盤2のト
面3の中心部に設けられた研摩装置を用いて板体10゜
10・・・の平面研摩を行うには、まず、第2図に示す
保持盤6,6・・・の下11ii5. 5・・・に板体
10,10・・・を保持する。そして、板体10,10
・・・を第2図に示す研摩盤2の上面3に当接させ、上
記支持軸1と支持軸4,4・・・とを矢印方向に回転さ
せることKより、研摩42と保持盤6,6・・・とを矢
印方向に回転させつつ、研摩盤2の上面3の中心部上方
に設けられた研摩スラリー液供給部7の供給口部9より
、研摩盤2の上面3の中心部に設けられたガイド部材2
0にスラリー状研摩液を供給する。ガイド部材20は、
研摩盤2と共に矢印方向に回転しており、この回転して
いるガイド部材20/)、11転エネルギーが、ガイド
部材20を構成しているガイド板22,22・・・を介
して、スラリー状研摩液に運動エネルギーとして与えら
れる。To perform flat surface polishing of the plate 10° 10... using the polishing device installed at the center of the top surface 3 of the calendar board 2 as described above, first, Lower 11ii5 of the holding plates 6, 6... shown in FIG. 5... holds the plates 10, 10.... And the plates 10, 10
... is brought into contact with the upper surface 3 of the polishing plate 2 shown in FIG. , 6 . Guide member 2 provided in
A slurry-like polishing liquid is supplied to 0. The guide member 20 is
The rotating guide member 20/) rotates in the direction of the arrow together with the polishing machine 2, and the 11 rotation energy is applied to the slurry form through the guide plates 22, 22, . . . that constitute the guide member 20. It is given to the polishing fluid as kinetic energy.
この運動エネルギーを与えられたスラリー状研摩液は、
研摩盤2の上面3上を、研摩盤20回転中心から半径方
向外方へ、第6図で示したスラリー状研摩液の流速より
速い流速で流れる。このことによりスラリー状研摩液が
、板体10,10・・・と研摩盤2の上面3との間に入
り込み、スラリー状研摩液により板体10,10・・・
が研摩される。尚研摩盤2の回転数はスラリー状研摩液
が層流域内であるような回転数で使用する。The slurry-like polishing liquid given this kinetic energy is
It flows over the upper surface 3 of the polishing disk 2 radially outward from the center of rotation of the polishing disk 20 at a flow rate faster than the flow rate of the slurry-like polishing liquid shown in FIG. As a result, the slurry-like polishing liquid enters between the plate bodies 10, 10... and the upper surface 3 of the polishing machine 2, and the slurry-like polishing liquid causes the plate bodies 10, 10...
is polished. The rotation speed of the polishing plate 2 is such that the slurry-like polishing liquid is within the laminar region.
この発明によれば、研摩装置を構成している研摩盤の回
転中心に研摩スラリー液供給部から供給されるスラリー
状研摩液を、研摩盤の回転中心から外方へ案内するガイ
ド部材を研摩盤の回転中心に設げ、これによりスラリー
状研摩液の流速を速めたので、研摩時間を短縮すること
ができ、かつスラリー状研摩液の使用量を減少させるこ
とができるという効果が得られる。According to this invention, the guide member that guides the slurry-like polishing liquid supplied from the polishing slurry liquid supply section to the rotation center of the polishing machine constituting the polishing device outward from the rotation center of the polishing machine is attached to the polishing machine. Since the flow rate of the slurry polishing liquid is increased, the polishing time can be shortened and the amount of slurry polishing liquid used can be reduced.
第1図ないし第4図は、この発明の一実施例を示す図で
あり、第1図は、研摩装置の平面図、第2図は、研摩装
置の正面図、第6図は、ガイド部材の平面図、第4図は
、ガイド部材の正面図、第5図は従来の研摩装置の平面
図、第6図は従来の研摩装置の正面図である。
2・・・・・・研摩盤、6・・・・・・保持盤、7・・
・・・・研摩スラリー液供給部、20・・・・・・ガイ
ド部材。1 to 4 are views showing one embodiment of the present invention, in which FIG. 1 is a plan view of the polishing device, FIG. 2 is a front view of the polishing device, and FIG. 6 is a guide member. 4 is a front view of a guide member, FIG. 5 is a plan view of a conventional polishing device, and FIG. 6 is a front view of a conventional polishing device. 2... Polishing plate, 6... Holding plate, 7...
... Polishing slurry liquid supply section, 20 ... Guide member.
Claims (1)
接させ、上記保持盤と研摩盤とを回転させつつ、砥粒と
アルカリ液とを混合したスラリー状研摩液を、研摩スラ
リー液供給部から上記研摩盤の回転中心に供給すること
により被加工物を研摩する研摩装置において、上記研摩
盤の回転中心に、上記研摩スラリー液供給部から供給さ
れるスラリー状研摩液を上記研摩盤の回転中心から外方
に案内するガイド部材を設けてなることを特徴とする研
摩装置。A workpiece is held by a holding plate, the workpiece is brought into contact with a polishing plate, and while the holding plate and the polishing plate are rotated, a slurry-like polishing liquid containing abrasive grains and alkaline liquid is applied to the polishing plate. In a polishing apparatus that polishes a workpiece by supplying a slurry liquid from a slurry supply unit to a rotation center of the polishing machine, the slurry polishing liquid supplied from the polishing slurry supply unit is supplied to the rotation center of the polishing machine. A polishing device characterized by being provided with a guide member that guides the polishing machine outward from the center of rotation.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61030505A JPS62188669A (en) | 1986-02-14 | 1986-02-14 | Polishing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61030505A JPS62188669A (en) | 1986-02-14 | 1986-02-14 | Polishing device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62188669A true JPS62188669A (en) | 1987-08-18 |
Family
ID=12305671
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP61030505A Pending JPS62188669A (en) | 1986-02-14 | 1986-02-14 | Polishing device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62188669A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7717768B2 (en) * | 2005-05-18 | 2010-05-18 | Sumco Corporation | Wafer polishing apparatus and method for polishing wafers |
-
1986
- 1986-02-14 JP JP61030505A patent/JPS62188669A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7717768B2 (en) * | 2005-05-18 | 2010-05-18 | Sumco Corporation | Wafer polishing apparatus and method for polishing wafers |
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