JP3326442B2 - Polishing method and apparatus - Google Patents

Polishing method and apparatus

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Publication number
JP3326442B2
JP3326442B2 JP17599793A JP17599793A JP3326442B2 JP 3326442 B2 JP3326442 B2 JP 3326442B2 JP 17599793 A JP17599793 A JP 17599793A JP 17599793 A JP17599793 A JP 17599793A JP 3326442 B2 JP3326442 B2 JP 3326442B2
Authority
JP
Japan
Prior art keywords
polishing
workpiece
polishing cloth
cloth
pressure
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP17599793A
Other languages
Japanese (ja)
Other versions
JPH079328A (en
Inventor
厚 山田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nikon Corp
Original Assignee
Nikon Corp
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Filing date
Publication date
Application filed by Nikon Corp filed Critical Nikon Corp
Priority to JP17599793A priority Critical patent/JP3326442B2/en
Publication of JPH079328A publication Critical patent/JPH079328A/en
Application granted granted Critical
Publication of JP3326442B2 publication Critical patent/JP3326442B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【産業上の利用分野】本発明は主として半導体基板であ
るSOI(Silicon-on-Insulator)基板やSi基板等を
均一な厚さに研磨する方法及び装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method and apparatus for polishing a semiconductor substrate such as an SOI (Silicon-on-Insulator) substrate or a Si substrate to a uniform thickness.

【0002】[0002]

【従来の技術】従来は、図3に示すように、基板等の被
加工物1の表面にコロイダルシリカの液を流しながら、
被加工物1の上方に配置した研磨棒29の下端に取り付
けたポリウレタンパッドを被加工物1に接触させ、研磨
棒29を中心線の回りに自転させつつ被加工物1の上を
相対的に往復させながら順次に横方向に移動して研磨し
ている。研磨量は、あらかじめ被加工物1の各部分にお
ける厚さを測定して置き、研磨棒29の自転速度、被加
工物1への圧接力、停滞時間を各部分の研磨量に対応す
るよう調節することにより行われている。一度に1個の
研磨棒29が研磨する面積が小さいことによる加工能率
の低さは、研磨棒29を複数配置することで補われる。
2. Description of the Related Art Conventionally, as shown in FIG. 3, while flowing a colloidal silica liquid over the surface of a workpiece 1 such as a substrate,
A polyurethane pad attached to the lower end of a polishing rod 29 disposed above the workpiece 1 is brought into contact with the workpiece 1 and the polishing rod 29 is rotated around a center line while relatively rotating on the workpiece 1. Polishing is performed by sequentially moving in the lateral direction while reciprocating. The amount of polishing is measured in advance by measuring the thickness of each part of the workpiece 1, and the rotation speed of the polishing rod 29, the pressing force on the workpiece 1, and the stagnation time are adjusted to correspond to the amount of polishing of each part. It is done by doing. The low processing efficiency due to the small polishing area of one polishing rod 29 at a time is compensated for by arranging a plurality of polishing rods 29.

【0003】この研磨方法では、研磨棒29が、被加工
物1の研磨面に垂直となるように配置され、研磨棒29
の下端が研磨面に平行な平面に形成されており、被加工
物1が回転せず、研磨棒29の方が自転するので、研磨
棒29の被加工物1に対する相対速度は最外周部で最大
となり中心部でゼロとなる。このため、ある研磨位置で
は研磨棒29の周囲の方だけ研磨され、研磨棒29の中
心部直下の領域は山となって残る。被加工物1の表面
は、極端に言えば、丘陵地帯の山や谷のような凹凸をな
しているが、山の部分を研磨するときは、この傾向が顕
著となり所望に研磨できない。
In this polishing method, the polishing rod 29 is disposed so as to be perpendicular to the polishing surface of the workpiece 1, and the polishing rod 29
Is formed in a plane parallel to the polishing surface, and the workpiece 1 does not rotate, and the polishing rod 29 rotates. Therefore, the relative speed of the polishing rod 29 to the workpiece 1 is at the outermost peripheral portion. It becomes maximum and becomes zero at the center. Therefore, at a certain polishing position, only the periphery of the polishing rod 29 is polished, and a region immediately below the center of the polishing rod 29 remains as a mountain. Extremely speaking, the surface of the workpiece 1 has irregularities such as hills and valleys in a hill, but when polishing the hills, this tendency becomes remarkable and polishing cannot be performed as desired.

【0004】又、研磨棒29が被加工物1の研磨面に対
して傾いているときは、研磨面が非対称に加工される。
研磨棒29を自転させながら研磨棒29を公転させるい
わゆる遊星運動型装置では、前述の研磨棒29の最外周
部のみで極端に加工が進行する問題を解決することがで
きる。しかし、この装置では研磨棒29の駆動機構が複
雑となり大型化するため、複数の研磨棒29を被加工物
1の上方に密に配置することができなくなり、加工能率
の良いものが得られない。研磨棒29が被加工物1の研
磨面に対して傾いているときの非対称な加工が生ずる問
題も解決出来ない。
When the polishing rod 29 is inclined with respect to the polished surface of the workpiece 1, the polished surface is processed asymmetrically.
In a so-called planetary motion type apparatus in which the polishing rod 29 revolves while rotating the polishing rod 29, it is possible to solve the problem that the processing is extremely advanced only in the outermost peripheral portion of the polishing rod 29 described above. However, in this apparatus, the driving mechanism of the polishing rod 29 is complicated and large, so that the plurality of polishing rods 29 cannot be densely arranged above the workpiece 1, and a product with high processing efficiency cannot be obtained. . The problem that asymmetric processing occurs when the polishing rod 29 is inclined with respect to the polishing surface of the workpiece 1 cannot be solved.

【0005】又、このような研磨棒自転型研磨装置で
は、研磨棒29の最外周部の線速度で加工速度が決まる
が、最外周部の接触圧力が低下すると、加工能率が低く
なるので最外周部まで必要充分な荷重を印加することが
必要となる。このため、研磨棒29が被加工物1に圧接
する周縁とその外周との間の被加工物1の表面層に強い
剪断応力が働き、場合によっては、単結晶シリコンのよ
うな結晶組織に欠陥を生ずる問題もあった。
In such a polishing rod rotating type polishing apparatus, the processing speed is determined by the linear velocity at the outermost peripheral portion of the polishing rod 29. However, when the contact pressure at the outermost peripheral portion is reduced, the processing efficiency is reduced. It is necessary to apply a necessary and sufficient load to the outer peripheral portion. For this reason, a strong shear stress acts on the surface layer of the workpiece 1 between the periphery of the polishing rod 29 pressed against the workpiece 1 and the outer periphery thereof, and in some cases, the crystal structure such as single crystal silicon has a defect. There was also a problem that caused.

【0006】本発明者は、上記の従来装置が有する問題
を解決し、被加工物を従来よりも均一な厚さに効率よく
研磨でき、結晶組織に欠陥を生ずることのない下記この
種の研磨装置を特願平4−350977号出願により提
案した。
The inventor of the present invention has solved the above-mentioned problems of the conventional apparatus, and has been able to polish a workpiece to a uniform thickness more efficiently than in the prior art, without causing defects in the crystal structure. The device was proposed in Japanese Patent Application No. 4-350977.

【0007】(1) 被加工物の研磨面に接して研磨布を
配置し、被加工物の研磨面の面積よりも小さい面積の領
域に、加圧棒で、被加工物の研磨面に研磨布を接触圧力
を調節しつつ圧接せしめ、研磨布に対して被加工物を、
研磨面に沿い自転を伴なわず前記の領域の差し渡し長さ
よりも小さい半径の周回運動をさせつつ研磨を行うこと
を特徴とする研磨方法。 (2) 加圧棒の研磨布に対向する面が凸球面に形成され
ている上記(1)に記載の研磨方法。 (3) 研磨布の加圧棒側に板状の弾性体を配置して行う
上記(1)(2)の何れか1つに記載の研磨方法。 (4) 被加工物の研磨面の上方に複数の加圧棒を配置
し、被加工物の研磨面を複数箇所で同時に研磨する上記
(1)(2)(3)の何れか1つに記載の研磨方法。 (5) 被加工物を支持して被加工物の研磨面に沿い周回
運動しつつ研磨面に沿い移動し更に一方向と逆方向に移
動するジグザク移動をする被加工物支持装置と、被加工
物の研磨面と相対して研磨面と平行に研磨布を周縁で支
持し研磨布を被加工物の研磨面に接離可能に移動する研
磨布支持装置と、研磨布の被加工物と反対側に配置され
複数の加圧棒を研磨布側に移動可能に保持する加圧棒支
持装置とを備え、加圧棒の研磨布に面する先端が凸球面
をなしている研磨装置。 (6) 研磨布の加圧棒側に、板状の弾性体が研磨布に接
して配置されているか、加圧棒先端の凸球面が、凸球面
に沿う形状の弾性体で覆われている上記(5)に記載の研
磨装置。にある。
(1) A polishing cloth is placed in contact with the polished surface of the workpiece, and a polishing rod is used to polish the polished surface of the workpiece with a pressure bar in an area smaller than the area of the polished surface of the workpiece. The cloth is pressed against the polishing cloth while adjusting the contact pressure.
A polishing method characterized in that polishing is performed while making a revolving motion of a radius smaller than the crossing length of the above-mentioned area without rotating along the polishing surface. (2) The polishing method according to the above (1), wherein the surface of the pressure bar facing the polishing cloth is formed as a convex spherical surface. (3) The polishing method according to any one of the above (1) and (2), wherein a plate-shaped elastic body is disposed on the pressing rod side of the polishing cloth. (4) A plurality of pressure rods are arranged above the polishing surface of the workpiece, and the polishing surface of the workpiece is simultaneously polished at a plurality of locations.
(1) The polishing method according to any one of (2) and (3). (5) A workpiece support device that supports the workpiece and makes a zigzag movement that moves along the polishing surface while moving around the polishing surface of the workpiece and further moves in a direction opposite to one direction, and A polishing cloth support device that supports the polishing cloth at the periphery thereof in parallel with the polishing surface relative to the polishing surface of the workpiece and moves the polishing cloth so as to be able to move toward and away from the polishing surface of the workpiece, and is opposite to the workpiece of the polishing cloth. A pressure rod supporting device disposed on the side of the polishing pad so as to movably hold the plurality of pressure rods toward the polishing cloth, wherein the tip of the pressure rod facing the polishing cloth has a convex spherical surface. (6) On the pressing rod side of the polishing cloth, a plate-like elastic body is disposed in contact with the polishing cloth, or the convex spherical surface at the tip of the pressing rod is covered with an elastic body along the convex spherical surface. The polishing apparatus according to the above (5). It is in.

【0008】この発明によれば、被加工物の研磨面の面
積よりも小さい面積の領域に、加圧棒で、被加工物の研
磨面に研磨布を接触圧力を調節しつつ圧接せしめるよう
にしたので、一つの加圧棒で被加工物の表面の局部を研
磨量を微細に調整して研磨できる。こうすることによ
り、局部の加工精度を高くできる。
According to the present invention, the polishing cloth is brought into pressure contact with the polishing surface of the workpiece by adjusting the contact pressure with the pressing rod to the area having an area smaller than the area of the polishing surface of the workpiece. Therefore, the polishing amount can be finely adjusted at a local portion of the surface of the workpiece by one pressure rod to polish the portion. By doing so, the local processing accuracy can be increased.

【0009】又、研磨布に対して被加工物を、研磨面に
沿い自転を伴なわず周回運動をさせつつ研磨を行うよう
にすると、研磨面のどの部分でも一様に周回しているの
で、研磨布に対する研磨面の相対移動速度がどの部分で
も一様になる。
If the workpiece is polished while rotating around the polishing cloth without rotating along the polishing surface, any portion of the polishing surface is uniformly circulated. In addition, the relative movement speed of the polishing surface with respect to the polishing cloth becomes uniform in any portion.

【0010】図2に示すように、周回運動Eの半径Rを
研磨布が圧接されている研磨面上の領域Fの差し渡し長
さよりも小さくすることにより、周回運動により加工さ
れる領域Gの周辺部は、断続的にしか研磨布により圧接
されないのに対して、その中心部は持続的に研磨布によ
り圧接され、加工研磨を受け続ける。従って、延べ加工
時間は中心部で最大であり、周辺部で次第に短くなる。
その結果、加工される領域Gは、中空円環状とはならず
内周部において重畳加工されて中心部で加工量が最大と
なり、周辺部へ次第に小さくなる。
As shown in FIG. 2, the radius R of the orbital motion E is made smaller than the length of the region F on the polishing surface to which the polishing cloth is pressed, so that the periphery of the region G processed by the orbital motion is reduced. The portion is only intermittently pressed by the polishing cloth, while its central portion is continuously pressed by the polishing cloth and continues to be polished. Therefore, the total processing time is maximum at the central portion and gradually shortens at the peripheral portion.
As a result, the region G to be processed does not have a hollow annular shape but is superimposed on the inner peripheral portion, and the processing amount becomes maximum at the central portion, and gradually decreases toward the peripheral portion.

【0011】前記の領域の差し渡し長さよりも周回運動
の半径を小さくするのは、前記の領域の差し渡し長さよ
りも周回運動の半径が大きいと、周回運動により加工さ
れる領域が中空円環状となり、凸部を効果的に平坦化出
来なくなるという不都合を生ずるからである。
The reason why the radius of the orbital motion is smaller than the crossover length of the above-mentioned region is that if the radius of the orbital motion is larger than the crossover length of the above-mentioned region, the region processed by the orbital motion becomes a hollow annular shape, This is because there is a disadvantage that the projection cannot be effectively flattened.

【0012】加圧棒の先端を凸球面とすることにより、
研磨布を介して被加工物と接するとき、頂面で最も接触
圧が高く頂面から遠ざかる周囲に行くに従い接触圧が次
第に低下する。研磨圧力が周辺に次第に小さくなるの
で、基板に対して従来のように剪断応力を与えることが
なく、基板の結晶組織に欠陥が生ずるような恐れもなく
なる。加圧棒が研磨面に対して傾くことから生ずる非対
称加工の問題も解決できる。
By making the tip of the pressure rod a convex spherical surface,
When the workpiece comes into contact with the workpiece through the polishing cloth, the contact pressure is highest at the top surface, and gradually decreases as the distance from the top surface increases. Since the polishing pressure gradually decreases in the vicinity, no shear stress is applied to the substrate as in the related art, and there is no possibility that a defect occurs in the crystal structure of the substrate. The problem of asymmetric processing caused by the inclination of the pressure rod with respect to the polishing surface can also be solved.

【0013】その上弾性体を介して加圧棒の先端が研磨
布を圧するようになっているので、加圧棒の加圧力は、
加圧棒と弾性体との接触領域の外周まで弾性体を変形さ
せ、被加工物に対して研磨布を、加圧棒の外周に加圧力
がなだらかに低下した状態に圧接せしめる。山の部分を
研磨するとき、山の頂部で接触圧が大きく山裾側に行く
に従い接触圧が次第に低下するので、前記の接触圧の分
布は更に、中心部から周囲になだらかに低下しつつ広が
ったものとなる。この作用により、従来よりも均一な厚
さに効率よく研磨できる。
In addition, since the tip of the pressure rod presses the polishing cloth via the elastic body, the pressing force of the pressure rod is:
The elastic body is deformed to the outer periphery of the contact area between the pressing rod and the elastic body, and the polishing cloth is pressed against the workpiece in a state where the pressing force is gradually reduced on the outer periphery of the pressing rod. When polishing a mountain portion, the contact pressure at the top of the mountain is large and the contact pressure gradually decreases as it goes to the foot of the mountain, so the distribution of the contact pressure further spreads while gradually decreasing from the center to the periphery. It will be. By this operation, the polishing can be efficiently performed to a uniform thickness as compared with the related art.

【0014】加圧棒は一つでも、被加工物の研磨面を周
回運動させつつ、被加工物の研磨面に平行に研磨面を、
加圧棒に対して一方向に一端から他端に移動させ、次い
で一方向に直角に移動し次いで一方向と逆に若干の重な
りを有して移動させるジグザグ移動させつつ片側から他
側に掃引して研磨することにより、被加工物の表面全面
を研磨できる。
[0014] Even with one pressing rod, the polishing surface of the workpiece is circulated while moving the polishing surface parallel to the polishing surface of the workpiece.
Move in one direction from one end to the other with respect to the pressure rod, then move at a right angle in one direction, then move with a slight overlap in the opposite direction from one direction Sweep from one side to the other while moving in zigzag By polishing the workpiece, the entire surface of the workpiece can be polished.

【0015】加工能率を上げるためには、例えば加圧棒
を1列に6個で6列配置する等して複数個で同時に研磨
面を研磨することで解決できる。この場合、1個の加圧
棒が研磨を担当する領域は小さくなるから、ジクザグ移
動させる範囲は狭い一定の範囲となる。従って、四角な
領域を四角な外形に沿って、外側から、又は内側から渦
状に移動させて研磨してもよい。
In order to improve the processing efficiency, it is possible to solve the problem by simultaneously polishing the polishing surface with a plurality of pressing rods, for example, by arranging six pressing rods in one row and six rows. In this case, the area in which one pressing rod is in charge of polishing becomes small, and the range in which the zigzag movement is performed is narrow and constant. Therefore, the rectangular area may be polished by moving it from the outside or from the inside in a spiral shape along the square outline.

【0016】上記の装置において研磨布支持装置は、被
加工物に対して接離可能に設けられているが、被加工物
に対して平行移動したり、回転したりするように設けら
れていなかった。
In the above-mentioned apparatus, the polishing cloth support device is provided so as to be able to contact and separate from the workpiece, but is not provided so as to translate or rotate with respect to the workpiece. Was.

【0017】一般に用いられている研磨布は、ポリウレ
タン製の不織布、又は、それに更にポリウレタン樹脂を
含浸させることにより硬化処理を施したものである。そ
の表面は凹凸を有し、又、粗い組織の密度むらに起因す
る硬度むらが存在し、研磨のための荷重印加時には、乱
雑な圧力分布を与えていることが分かった。
A generally used polishing cloth is a non-woven fabric made of polyurethane, or a hardened cloth impregnated with a polyurethane resin. It was found that the surface had irregularities, and that there was uneven hardness due to uneven density of the coarse structure, and that a random pressure distribution was given when a load for polishing was applied.

【0018】上記の研磨装置では、加圧棒により狭い領
域を研磨するため、研磨布は被加工物に対して回転した
り移動したりせず、常に同一位置状態で接するため、研
磨布表面の硬度むらや凹凸が被加工物の表面に転写され
る傾向があり、加工量の分布に不規則性が生ずる。この
結果、生じる起伏は研磨布の組織の粗さの程度(0.1
〜0.5mm)の短い周期を持っており、被加工物表面
の面粗度を悪化させていることが分かった。
In the above-mentioned polishing apparatus, since the narrow area is polished by the pressure bar, the polishing cloth does not rotate or move with respect to the workpiece, but always comes into contact with the workpiece at the same position. Uneven hardness and irregularities tend to be transferred to the surface of the workpiece, and irregularities occur in the distribution of the processing amount. As a result, the undulation that occurs is the degree of the roughness of the structure of the polishing pad (0.1).
(Approximately 0.5 mm), which indicates that the surface roughness of the workpiece surface is deteriorated.

【0019】[0019]

【発明が解決しようとする課題】本発明は上記の装置に
おいて、研磨布による面粗度の悪化を防止しうる研磨装
置を提供することを課題とする。
SUMMARY OF THE INVENTION An object of the present invention is to provide a polishing apparatus which can prevent the surface roughness from being deteriorated by a polishing cloth in the above-mentioned apparatus.

【0020】[0020]

【課題を解決するための手段】本発明は、上記の装置に
おいて、研磨棒支持装置により研磨布支持装置を同一位
置で回転可能に保持させ、研磨布と被加工物との間に生
ずる摩擦力と被加工物の周回運動により研磨布を同一位
置で回転させつつ研磨を行うようにすることにより、上
記の課題を解決するものである。
According to the present invention, there is provided the above-mentioned apparatus, wherein the polishing pad supporting device rotatably holds the polishing pad supporting device at the same position, and the frictional force generated between the polishing pad and the workpiece. The above problem is solved by performing polishing while rotating the polishing cloth at the same position by the orbital movement of the workpiece.

【0021】[0021]

【作用】本発明では、研磨布が被加工物に対して、被加
工物の加工面に平行な面に沿って回転運動を行うので、
加工量分布の不規則の原因である研磨布表面の凹凸が広
い領域で平均化され、加工量の不規則分布の問題を生ず
る事がなくなり、時事刻々意図した加工量を与えること
が出来る。
According to the present invention, since the polishing cloth makes a rotational movement with respect to the workpiece along a plane parallel to the processing surface of the workpiece,
The unevenness of the polishing cloth surface, which is the cause of the irregular distribution of the processing amount, is averaged over a wide area, so that the problem of the irregular distribution of the processing amount does not occur, and the intended processing amount can be given every moment.

【0022】[0022]

【実施例】研磨布の加圧棒側に板状の弾性体を研磨布に
接して配置した場合の実施例を図1について説明する。
本発明装置は被加工物支持装置3と、研磨布支持装置4
と、加圧棒支持装置5とを備え、被加工物支持装置3
は、円環状の固定枠6と、固定枠6の内側にゴムベロー
ズ8で周縁を固定枠6と結合した加工台7と、支持枠9
と、支持枠9に支持され図示しないモータにより回転さ
れる軸10とを有し、加工台7は軸10の一端に形成し
た偏心部11により、ゴムベローズ8に拘束され同一位
置で、偏心部11の偏心量に対応する周回運動をするよ
うになっている。この偏心運動から生ずる振動をなくす
るために、偏心部11の偏心側と反対側において、軸1
0の外側に位置して錘24が軸10に取り付けてある。
FIG. 1 shows an embodiment in which a plate-like elastic body is arranged in contact with a polishing cloth on the pressing rod side of the polishing cloth.
The apparatus of the present invention includes a workpiece support device 3 and a polishing cloth support device 4.
And a pressure rod support device 5, and the workpiece support device 3
Is a ring-shaped fixed frame 6, a processing table 7 having a peripheral edge joined to the fixed frame 6 by a rubber bellows 8 inside the fixed frame 6, and a support frame 9.
And a shaft 10 supported by a support frame 9 and rotated by a motor (not shown). The processing table 7 is constrained by a rubber bellows 8 by an eccentric portion 11 formed at one end of the shaft 10, and has an eccentric portion at the same position. A revolving motion corresponding to the eccentric amount of 11 is performed. In order to eliminate the vibration caused by this eccentric movement, the shaft 1
A weight 24 is attached to the shaft 10 outside the zero.

【0023】固定枠6内の加工台7の上には、基板等の
被加工物1が吸着により固定できるようになっている。
固定枠6、支持枠9等からなる被加工物支持装置3は、
図示しない装置により、被加工物1の研磨面12に平行
な面上で一方向に移動し、次いで一方向と直角な横方向
に僅かに移動し、前と反対に移動し、前と同方向の横方
向に僅かに移動するというジグザグ移動を一定の領域で
行うように構成されている。
The workpiece 1 such as a substrate can be fixed on the processing table 7 in the fixed frame 6 by suction.
The workpiece support device 3 including the fixed frame 6, the support frame 9, and the like,
By means of a device (not shown), the workpiece 1 moves in one direction on a plane parallel to the polishing surface 12, then slightly moves in a lateral direction perpendicular to one direction, moves in the opposite direction, and moves in the same direction as before. The zigzag movement of slight movement in the horizontal direction is performed in a certain area.

【0024】この送り装置は直角2方向へのボールネジ
による送り機構を備えた、通常のXYテーブルである。
各方向への送り量はボールネジを回転駆動するモーター
の回転量によって調節される。1方向への送り量を周期
的に増減しながら、直角方向への一定速度の送りを行う
ことによって、ジグザク運動を行うようになっている。
又、固定枠6は、被加工物1が浸かるようにコロイダル
シリカの溶液が一方から他方に通過するようにコロイダ
ルシリカ溶液の供給及び排出口が設けられている。
This feeder is a normal XY table provided with a feed mechanism using ball screws in two perpendicular directions.
The amount of feed in each direction is adjusted by the amount of rotation of a motor that rotationally drives the ball screw. The zigzag motion is performed by performing the feed at a constant speed in the right angle direction while periodically increasing and decreasing the feed amount in one direction.
The fixed frame 6 is provided with a supply and discharge port for the colloidal silica solution so that the colloidal silica solution passes from one side to the other so that the workpiece 1 is immersed.

【0025】研磨布支持装置4は、中央が開口した円筒
部27の一端にフランジが形成された形状をした研磨布
取付枠13と、研磨布取付枠13の円筒部27の他端を
閉じるように周縁で円筒部27の他端に固着された研磨
布14とがあり、研磨布14が加工台7上の被加工物1
の研磨面12と平行に研磨面12に接したり、研磨面1
2から離れたりしうるように図示しない上下装置により
支持されている。研磨布14の被加工物1と反対側に
は、シリコンゴムからなる板状の弾性体15が研磨布1
4に接着されている。
The polishing cloth support device 4 closes the other end of the cylindrical part 27 of the polishing cloth mounting frame 13 with the polishing cloth mounting frame 13 having a shape in which a flange is formed at one end of the cylindrical part 27 having an open center. There is a polishing cloth 14 fixed to the other end of the cylindrical portion 27 at the peripheral edge, and the polishing cloth 14 is
Contacting the polishing surface 12 in parallel with the polishing surface 12
2 is supported by an up-down device (not shown) so as to be able to be separated from the device 2. On the opposite side of the workpiece 1 of the polishing cloth 14, a plate-like elastic body 15 made of silicon rubber is provided.
4 is adhered.

【0026】加圧棒支持装置5は、研磨布14に平行な
支持板16と、支持板16に直角に支持板16を貫通し
て軸方向に移動可能に支持板16に保持された多数の加
圧棒2と、支持板16の上方に配置されたシリンダブロ
ック17と、シリンダブロック17の上面に加圧棒2と
相対して取り付けられた加圧棒2と同数のリニアアクチ
ュエータ18と、リニアアクチュエータ18の押圧力を
加圧棒2側に伝達するシリンダブロック17内に設けた
ばね19と、各加圧棒2の上端に接続された接続筒21
と、接続筒21内に配置された圧力センサ22と、ばね
19の圧力を圧力センサ22を介して加圧棒2に伝える
中間軸20とを備えている。
The pressure rod support device 5 includes a support plate 16 parallel to the polishing pad 14, and a plurality of support members 16 which are movably moved in the axial direction through the support plate 16 at right angles to the support plate 16. A pressure rod 2, a cylinder block 17 disposed above a support plate 16, a linear actuator 18 of the same number as the pressure rods 2 mounted on the upper surface of the cylinder block 17 in opposition to the pressure rod 2, A spring 19 provided in the cylinder block 17 for transmitting the pressing force of the actuator 18 to the pressure rod 2 side, and a connection cylinder 21 connected to the upper end of each pressure rod 2
, A pressure sensor 22 disposed in the connection cylinder 21, and an intermediate shaft 20 that transmits the pressure of the spring 19 to the pressure rod 2 via the pressure sensor 22.

【0027】又、加圧棒2の弾性体15側に突出した先
端23は凸球面に形成してある。支持板16にはリニア
アクチュエータ26が取り付けられており、支持板16
の下側に配置した研磨布ガイド25をリニアアクチュエ
ータ26で上下できるようになっている。研磨布ガイド
25の中央は円筒部28に形成されていて、研磨加工の
前後にはリニアアクチュエータ26により研磨布ガイド
25より上方に保持され、研磨布14が被加工物1と接
する加工状態のときには、研磨布ガイド25はリニアア
クチュエータ26により下降され、円筒部28の外周
は、研磨布取付枠13の円筒部27の内周に嵌合して研
磨布取付枠13を同一位置で回転出来るように保持す
る。
The tip 23 of the pressure rod 2 protruding toward the elastic body 15 is formed as a convex spherical surface. A linear actuator 26 is attached to the support plate 16 and the support plate 16
The polishing cloth guide 25 disposed below the lower side can be moved up and down by a linear actuator 26. The center of the polishing cloth guide 25 is formed in a cylindrical portion 28, and is held above the polishing cloth guide 25 by a linear actuator 26 before and after polishing, and when the polishing cloth 14 is in a processing state in which the polishing cloth 14 contacts the workpiece 1. The polishing cloth guide 25 is lowered by the linear actuator 26 so that the outer periphery of the cylindrical portion 28 is fitted to the inner periphery of the cylindrical portion 27 of the polishing cloth mounting frame 13 so that the polishing cloth mounting frame 13 can be rotated at the same position. Hold.

【0028】上記の実施例においては、研磨布ガイド2
5は支持板16に支持されているが、研磨布取付枠の周
囲に配置してもよい。
In the above embodiment, the polishing cloth guide 2
5 is supported by the support plate 16, but may be arranged around the polishing cloth mounting frame.

【0029】被加工物1の研磨面12の研磨は次のよう
にして行う。まず、各部分の厚みを測定した被加工物1
を加工台7に取り付け、固定枠6内にコロイダルシリカ
液を研磨面12が浸かるように流す。研磨布取付枠13
を下降して研磨布14を研磨面12に接せしめる。リニ
アアクチュエータ26により研磨布ガイド25を下降さ
せ、円筒部28を研磨布取付枠13の円筒部27の内部
に挿入する。リニアアクチュエータ18を動作させ、加
圧棒2を下降して先端23を弾性体15に圧接させる。
軸10を回転させ被加工物1をその位置で周回させつつ
研磨面の一端側から他端側に一方向に移動を開始させ
る。
The polishing of the polishing surface 12 of the workpiece 1 is performed as follows. First, the workpiece 1 whose thickness of each part was measured
Is mounted on the processing table 7, and the colloidal silica liquid is flowed into the fixed frame 6 so that the polishing surface 12 is immersed. Polishing cloth mounting frame 13
To bring the polishing pad 14 into contact with the polishing surface 12. The polishing cloth guide 25 is lowered by the linear actuator 26, and the cylindrical section 28 is inserted into the cylindrical section 27 of the polishing cloth mounting frame 13. By operating the linear actuator 18, the pressure rod 2 is lowered to bring the tip 23 into pressure contact with the elastic body 15.
The rotation of the shaft 10 causes the workpiece 1 to orbit at that position, and starts moving in one direction from one end of the polishing surface to the other end.

【0030】このとき、加圧棒2によって圧接される研
磨面12の各部分の測定結果により決定された研磨量に
相当する研磨が得られるようにリニアアクチュエータ1
8を動作させ、この動作を圧力センサ22でリニアアク
チュエータ18に帰還して各部分の研磨量に相当する研
磨が行なわれるようにする。他端側に移動した研磨面は
一方向と直角に若干移動させ、次いで一方向と逆に移動
させて順次に横に移動して複数個の加圧棒で研磨面全面
が掃引されるように研磨する。被加工物1に周回運動が
与えられると、研磨布14は、被加工物1と研磨布14
との摩擦により、周回方向にその位置で周回速度に比較
して非常にゆっくりとした自転を行う。
At this time, the linear actuator 1 is polished so that polishing corresponding to the polishing amount determined by the measurement result of each portion of the polishing surface 12 pressed by the pressure rod 2 is obtained.
8 is operated, and this operation is returned to the linear actuator 18 by the pressure sensor 22 so that polishing corresponding to the polishing amount of each portion is performed. The polishing surface moved to the other end side is slightly moved at a right angle to one direction, then moved in the opposite direction to one direction and sequentially moved sideways so that the entire polishing surface is swept by a plurality of pressure rods. Grind. When the work piece 1 is given a revolving motion, the polishing cloth 14 is brought into contact with the work piece 1 and the polishing cloth 14.
Due to the friction with the circumferential direction, the self-rotation is performed very slowly in the circulating direction at that position as compared with the circulating speed.

【0031】この装置で、研磨布14としてポリウレタ
ン樹脂を含浸したポリウレタン繊維不織布を用いた。加
圧棒2の先端23の直径を20mm、下面の曲率半径を
25mmとした。板状のシリコンゴムからなる弾性体1
5の厚さを5mm、先端23の弾性体15の接触部の直
径15mmとした。被加工物1の周回直径2mm、周回
回転数1000回/分で、被加工物1の往復移動の際の
振幅を25mm、往復の重なり幅を0.2mmとして研
磨を行った結果、仕上げ表面の平均面粗度はRa値にし
て20Åであった。これに対して従来の研磨布固定型の
研磨装置での仕上げ表面の平均面粗度は、Ra値にして
100Åであった。
In this apparatus, a polyurethane fiber non-woven fabric impregnated with a polyurethane resin was used as the polishing cloth 14. The diameter of the tip 23 of the pressure rod 2 was 20 mm, and the radius of curvature of the lower surface was 25 mm. Elastic body 1 made of plate-like silicon rubber
The thickness of 5 was 5 mm, and the diameter of the contact portion of the elastic body 15 at the tip 23 was 15 mm. Polishing was performed with the workpiece 1 having a circumference diameter of 2 mm, a rotation speed of 1000 times / minute, an amplitude of 25 mm during reciprocating movement of the workpiece 1 and a reciprocating overlap width of 0.2 mm. The average surface roughness was 20 ° in terms of Ra value. On the other hand, the average surface roughness of the finished surface in the conventional polishing cloth fixed type polishing apparatus was 100 ° in terms of Ra value.

【0032】[0032]

【発明の効果】本発明によれば、被加工物を均一な厚さ
に研磨できると共に、従来よりも良好な面粗度に研磨で
き、又、シリコン基板の単結晶に欠陥を生ずる恐れのな
い研磨方法及び装置を提供することができる。
According to the present invention, the workpiece can be polished to a uniform thickness, the surface can be polished to a better surface roughness than in the past, and there is no risk of defects occurring in the single crystal of the silicon substrate. A polishing method and apparatus can be provided.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明装置の実施例の断面図である。FIG. 1 is a sectional view of an embodiment of the device of the present invention.

【図2】本発明方法における被加工物の周回運動と、一
つの加圧棒による加工領域との関係の説明図である。
FIG. 2 is an explanatory diagram of a relationship between a revolving motion of a workpiece and a processing area by one pressure rod in the method of the present invention.

【図3】従来の研磨装置の説明図である。FIG. 3 is an explanatory view of a conventional polishing apparatus.

【符号の説明】[Explanation of symbols]

1 被加工物 2 加圧棒 3 被加工物支持装置 4 研磨布支持装置 5 加圧棒支持装置 6 固定枠 7 加工台 8 ゴムベローズ 9 支持枠 10 軸 11 偏心部 12 研磨面 13 研磨布取付枠 14 研磨布 15 弾性体 16 支持板 17 シリンダブロック 18 リニアアクチュエータ 19 ばね 20 中間軸 21 接続筒 22 圧力センサ 23 先端 24 錘 25 研磨布ガイド 26 リニアアクチュエータ 27 円筒部 28 円筒部 DESCRIPTION OF SYMBOLS 1 Workpiece 2 Pressing rod 3 Workpiece support device 4 Polishing cloth support device 5 Pressing rod support device 6 Fixed frame 7 Processing table 8 Rubber bellows 9 Supporting frame 10 Axis 11 Eccentric part 12 Polishing surface 13 Polishing cloth mounting frame 14 Polishing cloth 15 Elastic body 16 Support plate 17 Cylinder block 18 Linear actuator 19 Spring 20 Intermediate shaft 21 Connecting cylinder 22 Pressure sensor 23 Tip 24 Weight 25 Polishing cloth guide 26 Linear actuator 27 Cylindrical part 28 Cylindrical part

Claims (6)

(57)【特許請求の範囲】(57) [Claims] 【請求項1】 被加工物の研磨面に接して研磨布を配置
し、被加工物の研磨面の面積よりも小さい面積の領域
に、加圧棒で、被加工物の研磨面に研磨布を接触圧力を
調節しつつ圧接せしめ、研磨布に対して被加工物を、研
磨面に沿い自転を伴なわず前記の領域の差し渡し長さよ
りも小さい半径の周回運動をさせると同時に、研磨面に
沿い移動をさせ、研磨布と被加工物との間に生ずる摩擦
力と被加工物の周回運動により研磨布を同一位置で回転
させつつ研磨を行うことを特徴とする研磨方法。
1. A polishing cloth is arranged in contact with a polishing surface of a workpiece, and a polishing cloth is applied to a polishing surface of the processing object with a pressure rod in a region having an area smaller than an area of the polishing surface of the workpiece. Is pressed while adjusting the contact pressure, and the workpiece is made to circulate along the polishing surface with a radius smaller than the crossing length of the region without rotating along the polishing surface, and A polishing method wherein the polishing is performed while rotating the polishing cloth at the same position by a frictional force generated between the polishing cloth and the workpiece and the orbital movement of the workpiece.
【請求項2】 加圧棒の研磨布に対向する面が凸球面に
形成されている請求項1に記載の研磨方法。
2. The polishing method according to claim 1, wherein a surface of the pressure bar facing the polishing cloth is formed as a convex spherical surface.
【請求項3】 研磨布の加圧棒側に板状の弾性体を配置
して行う請求項1、2の何れか1つに記載の研磨方法。
3. The polishing method according to claim 1, wherein a plate-shaped elastic body is arranged on the pressing rod side of the polishing cloth.
【請求項4】 被加工物の研磨面の上方に複数の加圧棒
を配置し、被加工物の研磨面を複数箇所で同時に研磨す
る請求項1、2、3の何れか1つに記載の研磨方法。
4. The polishing method according to claim 1, wherein a plurality of pressure rods are arranged above the polishing surface of the workpiece, and the polishing surface of the workpiece is simultaneously polished at a plurality of locations. Polishing method.
【請求項5】 被加工物を支持して被加工物の研磨面に
沿い周回運動しつつ研磨面に沿い移動をする被加工物支
持装置と、被加工物の研磨面と相対して研磨面と平行に
研磨布を周縁で支持し研磨布を被加工物の研磨面に接離
可能に移動し、かつ同一位置で回転可能に保持される研
磨布支持装置と、研磨布の被加工物と反対側に配置され
複数の加圧棒を研磨布側に移動可能に保持する加圧棒支
持装置とを備え、加圧棒の研磨布に面する先端が凸球面
をなしている研磨装置。
5. A workpiece support device for supporting a workpiece and moving along the polishing surface while moving around the polishing surface of the workpiece, and a polishing surface opposed to the polishing surface of the workpiece. A polishing cloth supporting device that supports the polishing cloth at the peripheral edge thereof in parallel with and moves the polishing cloth so as to be able to approach and separate from the polishing surface of the workpiece, and is rotatably held at the same position, and a workpiece of the polishing cloth. A polishing rod supporting device which is disposed on the opposite side and movably holds the plurality of pressure rods toward the polishing cloth, wherein a tip of the pressure rod facing the polishing cloth has a convex spherical surface.
【請求項6】研磨布の加圧棒側に、板状の弾性体が研磨
布に接して配置されているか、加圧棒先端の凸球面が、
凸球面に沿う形状の弾性体で覆われている請求項5に記
載の研磨装置。
6. A plate-shaped elastic body is arranged on the pressing rod side of the polishing cloth in contact with the polishing cloth, or the convex spherical surface at the tip of the pressing rod is
The polishing apparatus according to claim 5, wherein the polishing apparatus is covered with an elastic body having a shape along the convex spherical surface.
JP17599793A 1993-06-23 1993-06-23 Polishing method and apparatus Expired - Fee Related JP3326442B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17599793A JP3326442B2 (en) 1993-06-23 1993-06-23 Polishing method and apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17599793A JP3326442B2 (en) 1993-06-23 1993-06-23 Polishing method and apparatus

Publications (2)

Publication Number Publication Date
JPH079328A JPH079328A (en) 1995-01-13
JP3326442B2 true JP3326442B2 (en) 2002-09-24

Family

ID=16005907

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17599793A Expired - Fee Related JP3326442B2 (en) 1993-06-23 1993-06-23 Polishing method and apparatus

Country Status (1)

Country Link
JP (1) JP3326442B2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4048396B2 (en) * 1998-04-21 2008-02-20 旭硝子株式会社 Pressing method and pressing device for plate-like material
WO2000056502A1 (en) * 1999-03-19 2000-09-28 Fujitsu Limited Lapping machine, lapping method, and method of fabricating magnetic head
US7014532B2 (en) 2001-09-10 2006-03-21 Fujitsu Limited Lapping machine, lapping method, and method of manufacturing magnetic head

Also Published As

Publication number Publication date
JPH079328A (en) 1995-01-13

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