JPS6218853B2 - - Google Patents

Info

Publication number
JPS6218853B2
JPS6218853B2 JP18967682A JP18967682A JPS6218853B2 JP S6218853 B2 JPS6218853 B2 JP S6218853B2 JP 18967682 A JP18967682 A JP 18967682A JP 18967682 A JP18967682 A JP 18967682A JP S6218853 B2 JPS6218853 B2 JP S6218853B2
Authority
JP
Japan
Prior art keywords
test pieces
test
order
supplied
predetermined order
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP18967682A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5979141A (ja
Inventor
Ikuo Watanabe
Masanori Kameda
Toshiaki Shiraishi
Chikahide Koizumi
Hideo Masuse
Akio Ueda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
JFE Steel Corp
Shimazu Seisakusho KK
Original Assignee
Shimazu Seisakusho KK
Kawasaki Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimazu Seisakusho KK, Kawasaki Steel Corp filed Critical Shimazu Seisakusho KK
Priority to JP18967682A priority Critical patent/JPS5979141A/ja
Publication of JPS5979141A publication Critical patent/JPS5979141A/ja
Publication of JPS6218853B2 publication Critical patent/JPS6218853B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02—Details

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
JP18967682A 1982-10-27 1982-10-27 自動引張試験機における試験片供給順序確認装置 Granted JPS5979141A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18967682A JPS5979141A (ja) 1982-10-27 1982-10-27 自動引張試験機における試験片供給順序確認装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18967682A JPS5979141A (ja) 1982-10-27 1982-10-27 自動引張試験機における試験片供給順序確認装置

Publications (2)

Publication Number Publication Date
JPS5979141A JPS5979141A (ja) 1984-05-08
JPS6218853B2 true JPS6218853B2 (enrdf_load_stackoverflow) 1987-04-24

Family

ID=16245310

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18967682A Granted JPS5979141A (ja) 1982-10-27 1982-10-27 自動引張試験機における試験片供給順序確認装置

Country Status (1)

Country Link
JP (1) JPS5979141A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS5979141A (ja) 1984-05-08

Similar Documents

Publication Publication Date Title
DE602004003182T3 (de) Vorrichtung und Verfahren zum Bearbeiten von geschlachteten Tieren und/oder Teilen davon mit einer Transportanlage
US6070731A (en) IC receiving tray storage device and mounting apparatus for the same
US5249131A (en) Apparatus for controlling the loading of workpieces onto a pallet
DE4331881A1 (de) Blutgerinnungsanalysator
JPS6481010A (en) Expert system for machine tool containing nc device
DE2262476C2 (de) Schaltungsanordnung zur automatischen Vorweg-Fehlersuche in einer an einer zentralen Verarbeitungseinheit angeschlossenen peripheren Einrichtung
DE19723434A1 (de) Halbleiterbauelement-Testgerät
CA2024671A1 (en) Synthetic apparatus for inspection of blood
KR940002441B1 (ko) 고속 집적회로 취급기
DE3607588A1 (de) Verfahren und vorrichtung zum automatischen handhaben von halbleiterplaettchen
DE20122143U1 (de) Vorrichtung zum Überwachen und Verwalten von Produkten
DE102020211723A1 (de) Verfahren zum bearbeiten eines wafers und eine chipmessvorrichtung
DE3713155A1 (de) Einrichtung zum automatischen programmierten pruefen von prueflingen aller art
CN103712991A (zh) 重绕产品检查方法、重绕产品检查装置和重绕产品检查系统
DE19927419A1 (de) Überwachungseinrichtung für ein Ende eines auf einer Vorratsspule aufgewickelten fadenförmigen Gutes sowie Verfahren hierfür
GB2317499A (en) Control system for use with semiconductor device transporting and handling apparatus
JP2001114407A (ja) 物品の集品装置
JPS6218853B2 (enrdf_load_stackoverflow)
US4021336A (en) Grading apparatus
DE19610125C1 (de) Einrichtung in einer Halbleiterfertigungsanlage, insbesondere für integrierte Schaltungen
JPS61207046A (ja) テ−プキヤリア半導体装置選別用オ−トハンドラ−
DE102014015945B3 (de) Magazinvorrichtung, Messsystem und Verfahren zur Messung einer Konzentration von gas- und/oder aerosolförmigen Komponenten eines Gasgemisches
KR200145603Y1 (ko) 자동 도금두께 측정 일렉트로 플레이팅 장치
JPH03222639A (ja) 巡視点検方式
DE2649496C3 (de) Vorrichtung zur Prüfung der richtigen Lage und Zahl von in Magazinen in Reihen hintereinander gelagerten Bauelementen