JPS62176767U - - Google Patents
Info
- Publication number
- JPS62176767U JPS62176767U JP6432386U JP6432386U JPS62176767U JP S62176767 U JPS62176767 U JP S62176767U JP 6432386 U JP6432386 U JP 6432386U JP 6432386 U JP6432386 U JP 6432386U JP S62176767 U JPS62176767 U JP S62176767U
- Authority
- JP
- Japan
- Prior art keywords
- contact
- points
- contact means
- circuit board
- printed circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000006243 chemical reaction Methods 0.000 claims description 5
- 239000011148 porous material Substances 0.000 claims description 5
- 229920001971 elastomer Polymers 0.000 claims description 4
- 239000000806 elastomer Substances 0.000 claims description 4
- 238000007689 inspection Methods 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000009413 insulation Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
第1図はプリント回路基板検査装置の説明図、
第2図は他の形式のプリント回路基板検査装置の
説明図、第3図はテストヘツド及び被検査用プリ
ント回路基板と対応して示す変換治具の断面図、
第4図は他の実施例の変換治具の断面図、第5図
は従来の変換治具の断面図である。
1,1′……プリント回路基板検査装置、2…
…テストヘツド、3……電極部、10……被検査
用プリント回路基板、11……試験点、20……
変換治具、21……第1の接触手段、22……第
1の絶縁プレート、23……細孔、24……導電
性エラストマー、25……第1の接触ポイント、
31……第2の接触手段、32……第2の絶縁プ
レート、33……細孔、34……導電性エラスト
マー、35……第2の接触ポイント、41……接
続手段、42……絶縁薄材、43……導電部。
Figure 1 is an explanatory diagram of a printed circuit board inspection device.
FIG. 2 is an explanatory diagram of another type of printed circuit board inspection device, and FIG. 3 is a sectional view of a conversion jig shown in correspondence with a test head and a printed circuit board to be inspected.
FIG. 4 is a sectional view of a conversion jig according to another embodiment, and FIG. 5 is a sectional view of a conventional conversion jig. 1, 1'...Printed circuit board inspection equipment, 2...
...Test head, 3... Electrode part, 10... Printed circuit board to be tested, 11... Test point, 20...
Conversion jig, 21... first contact means, 22... first insulating plate, 23... pore, 24... conductive elastomer, 25... first contact point,
31... Second contact means, 32... Second insulating plate, 33... Pore, 34... Conductive elastomer, 35... Second contact point, 41... Connection means, 42... Insulation Thin material, 43... conductive part.
Claims (1)
リツド状に配置されない被検査用プリント回路基
板上の試験点の位置に対応して細孔を設け、これ
ら細孔に導電性エラストマーを配設して一端部が
上記試験点と接触する多数の第1の接触ポイント
を備える第1の接触手段と、第2の絶縁プレート
に、プリント回路基板検査装置のテストヘツドの
オングリツド状に配置された多数の電極部の位置
に対応し、かつ、上記第1の接触手段の第1の接
触ポイントと個々に対応して細孔を設け、これら
細孔に導電性エラストマーを配設して一端部が上
記電極部と接触する多数の第2の接触ポイントを
備える第2の接触手段と、上記第1の接触手段及
び第2の接触手段との間に絶縁薄材を配設し、該
絶縁薄材に、個々に対応関係にある第1の接触手
段の第1の接触ポイントと第2の接触手段の第2
の接触ポイントとの夫々の他端部に接触して両者
を導通させる導電部を、互いに絶縁して上記第1
の接触ポイントと第2の接触ポイントとの対応す
る数だけ備える接続手段とからなることを特徴と
するプリント回路基板検査装置の変換治具。 The first insulating plate is provided with pores corresponding to the positions of the test points on the printed circuit board to be inspected, which are not necessarily arranged in an on-grid manner, and a conductive elastomer is placed in these pores to form one end. a first contact means comprising a plurality of first contact points in contact with said test points, and a second insulating plate with the location of a plurality of electrode parts arranged in an on-grid configuration of a test head of a printed circuit board testing device; and corresponding to the first contact points of the first contact means, and a conductive elastomer is disposed in these pores so that one end thereof contacts the electrode part. A second contact means comprising a plurality of second contact points, and an insulating thin material arranged between the first contact means and the second contact means, each of which has a corresponding relationship. a first contact point of the first contact means and a second contact point of the second contact means located at
The conductive parts that contact the other ends of the contact points of the first part and the second end of the first part of the first part of the first part of the first part of
1. A conversion jig for a printed circuit board inspection apparatus, comprising a connecting means having a corresponding number of contact points and second contact points.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6432386U JPS62176767U (en) | 1986-04-30 | 1986-04-30 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6432386U JPS62176767U (en) | 1986-04-30 | 1986-04-30 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS62176767U true JPS62176767U (en) | 1987-11-10 |
Family
ID=30900378
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6432386U Pending JPS62176767U (en) | 1986-04-30 | 1986-04-30 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62176767U (en) |
-
1986
- 1986-04-30 JP JP6432386U patent/JPS62176767U/ja active Pending
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS62176767U (en) | ||
JPS63181969U (en) | ||
JPS62176766U (en) | ||
JPS6367978U (en) | ||
JPS62108874U (en) | ||
JPH0181583U (en) | ||
JPS62187871U (en) | ||
JPH0191261U (en) | ||
JPH0262671U (en) | ||
JPS6360971U (en) | ||
JPS6011081U (en) | Printed wiring board terminal inspection device | |
JPH0444200U (en) | ||
JPH0174570U (en) | ||
JPS63276U (en) | ||
JPS6039974U (en) | Probe for in-circuit tester | |
JPS635479U (en) | ||
JPS5960572U (en) | Connection device for liquid crystal display element testing | |
JPS6234385U (en) | ||
JPS59149069U (en) | Printed wiring board terminal inspection device | |
JPS6415174U (en) | ||
JPH0178963U (en) | ||
JPS6262271U (en) | ||
JPS59176977U (en) | Semiconductor device testing equipment | |
JPS6310469U (en) | ||
JPS62140445U (en) |