JPS62167485A - Can型ic用自動検査装置 - Google Patents

Can型ic用自動検査装置

Info

Publication number
JPS62167485A
JPS62167485A JP61005515A JP551586A JPS62167485A JP S62167485 A JPS62167485 A JP S62167485A JP 61005515 A JP61005515 A JP 61005515A JP 551586 A JP551586 A JP 551586A JP S62167485 A JPS62167485 A JP S62167485A
Authority
JP
Japan
Prior art keywords
type
header
stick
section
inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61005515A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0460552B2 (enExample
Inventor
Tomio Kobayashi
富夫 小林
Shigeshi Kishimoto
岸本 繁志
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP61005515A priority Critical patent/JPS62167485A/ja
Publication of JPS62167485A publication Critical patent/JPS62167485A/ja
Publication of JPH0460552B2 publication Critical patent/JPH0460552B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP61005515A 1986-01-13 1986-01-13 Can型ic用自動検査装置 Granted JPS62167485A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61005515A JPS62167485A (ja) 1986-01-13 1986-01-13 Can型ic用自動検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61005515A JPS62167485A (ja) 1986-01-13 1986-01-13 Can型ic用自動検査装置

Publications (2)

Publication Number Publication Date
JPS62167485A true JPS62167485A (ja) 1987-07-23
JPH0460552B2 JPH0460552B2 (enExample) 1992-09-28

Family

ID=11613324

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61005515A Granted JPS62167485A (ja) 1986-01-13 1986-01-13 Can型ic用自動検査装置

Country Status (1)

Country Link
JP (1) JPS62167485A (enExample)

Also Published As

Publication number Publication date
JPH0460552B2 (enExample) 1992-09-28

Similar Documents

Publication Publication Date Title
US4940935A (en) Automatic SMD tester
US6137303A (en) Integrated testing method and apparatus for semiconductor test operations processing
KR100221949B1 (ko) 반도체 디바이스 반송처리장치
US6573739B1 (en) IC testing apparatus
US5894217A (en) Test handler having turn table
US8890018B2 (en) Method and apparatus for improved sorting of diced substrates
JPH09229999A (ja) 半導体装置のテストハンドラ
TWI646339B (zh) 具備有三個以上電極的晶片電子零件之檢查分類裝置
US5399983A (en) Probe apparatus
JPH0498167A (ja) Ic検査装置
US7190446B2 (en) System for processing electronic devices
CN214953947U (zh) 一种集成电路测试多工位定位装置
US20050005702A1 (en) Transporting tool for object to be tested, and object-to-be-tested transporting system
JPH0567060B2 (enExample)
US5789685A (en) Structure of rotary arm and device chuck part of a device handler
JPS62167485A (ja) Can型ic用自動検査装置
US4790438A (en) Electrical component sequential testing apparatus
CN215575184U (zh) 一种全自动生化分析仪
CN115372672A (zh) 探针设备的工作台、探针设备、控制方法及探针测试方法
JPH09175647A (ja) 半導体デバイス搬送処理装置
JPH0758175A (ja) ウエハ搬送方法とその装置並びにウエハ検査装置
CN120246570A (zh) 电容测试装置
TWI387761B (zh) 用於檢測微型sd裝置的方法
KR100714754B1 (ko) 전자부품 시험장치
JPS62167486A (ja) Can型ic用自動検査装置