JPS6215822B2 - - Google Patents
Info
- Publication number
- JPS6215822B2 JPS6215822B2 JP52152691A JP15269177A JPS6215822B2 JP S6215822 B2 JPS6215822 B2 JP S6215822B2 JP 52152691 A JP52152691 A JP 52152691A JP 15269177 A JP15269177 A JP 15269177A JP S6215822 B2 JPS6215822 B2 JP S6215822B2
- Authority
- JP
- Japan
- Prior art keywords
- slit
- spectroscopic crystal
- rays
- ray source
- crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Dispersion Chemistry (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15269177A JPS5484794A (en) | 1977-12-19 | 1977-12-19 | Xxray spectroscope |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15269177A JPS5484794A (en) | 1977-12-19 | 1977-12-19 | Xxray spectroscope |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5484794A JPS5484794A (en) | 1979-07-05 |
| JPS6215822B2 true JPS6215822B2 (enrdf_load_stackoverflow) | 1987-04-09 |
Family
ID=15546016
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15269177A Granted JPS5484794A (en) | 1977-12-19 | 1977-12-19 | Xxray spectroscope |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5484794A (enrdf_load_stackoverflow) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6175244A (ja) * | 1984-09-20 | 1986-04-17 | Jeol Ltd | Ｘ線分光装置 |
| JPH0752611Y2 (ja) * | 1988-10-24 | 1995-11-29 | 横河電機株式会社 | シート状物質の特性測定装置 |
| JP2007093581A (ja) * | 2005-09-01 | 2007-04-12 | Jeol Ltd | 波長分散型ｘ線分光器 |
| EP4006531B1 (en) | 2020-11-27 | 2023-04-26 | JEOL Ltd. | X-ray detection apparatus and method |
| JP7245885B2 (ja) * | 2020-11-27 | 2023-03-24 | 日本電子株式会社 | Ｘ線検出装置及び方法 |
-
1977
- 1977-12-19 JP JP15269177A patent/JPS5484794A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5484794A (en) | 1979-07-05 |
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