JPS5484794A - Xxray spectroscope - Google Patents
Xxray spectroscopeInfo
- Publication number
- JPS5484794A JPS5484794A JP15269177A JP15269177A JPS5484794A JP S5484794 A JPS5484794 A JP S5484794A JP 15269177 A JP15269177 A JP 15269177A JP 15269177 A JP15269177 A JP 15269177A JP S5484794 A JPS5484794 A JP S5484794A
- Authority
- JP
- Japan
- Prior art keywords
- crystal
- plates
- gear
- phi
- rays
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000013078 crystal Substances 0.000 abstract 4
- 230000003595 spectral effect Effects 0.000 abstract 2
- 230000003247 decreasing effect Effects 0.000 abstract 1
- 238000005259 measurement Methods 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
- G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
Landscapes
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Health & Medical Sciences (AREA)
- Dispersion Chemistry (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15269177A JPS5484794A (en) | 1977-12-19 | 1977-12-19 | Xxray spectroscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP15269177A JPS5484794A (en) | 1977-12-19 | 1977-12-19 | Xxray spectroscope |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5484794A true JPS5484794A (en) | 1979-07-05 |
JPS6215822B2 JPS6215822B2 (enrdf_load_stackoverflow) | 1987-04-09 |
Family
ID=15546016
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP15269177A Granted JPS5484794A (en) | 1977-12-19 | 1977-12-19 | Xxray spectroscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5484794A (enrdf_load_stackoverflow) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6175244A (ja) * | 1984-09-20 | 1986-04-17 | Jeol Ltd | X線分光装置 |
JPH0259459U (enrdf_load_stackoverflow) * | 1988-10-24 | 1990-05-01 | ||
JP2007093581A (ja) * | 2005-09-01 | 2007-04-12 | Jeol Ltd | 波長分散型x線分光器 |
JP2022085853A (ja) * | 2020-11-27 | 2022-06-08 | 日本電子株式会社 | X線検出装置及び方法 |
US11699567B2 (en) | 2020-11-27 | 2023-07-11 | Jeol Ltd. | X-ray detection apparatus and method |
-
1977
- 1977-12-19 JP JP15269177A patent/JPS5484794A/ja active Granted
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6175244A (ja) * | 1984-09-20 | 1986-04-17 | Jeol Ltd | X線分光装置 |
JPH0259459U (enrdf_load_stackoverflow) * | 1988-10-24 | 1990-05-01 | ||
JP2007093581A (ja) * | 2005-09-01 | 2007-04-12 | Jeol Ltd | 波長分散型x線分光器 |
JP2022085853A (ja) * | 2020-11-27 | 2022-06-08 | 日本電子株式会社 | X線検出装置及び方法 |
US11699567B2 (en) | 2020-11-27 | 2023-07-11 | Jeol Ltd. | X-ray detection apparatus and method |
Also Published As
Publication number | Publication date |
---|---|
JPS6215822B2 (enrdf_load_stackoverflow) | 1987-04-09 |
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