JPS62157549A - シート状透光性試料の異方性測定方法 - Google Patents

シート状透光性試料の異方性測定方法

Info

Publication number
JPS62157549A
JPS62157549A JP60297490A JP29749085A JPS62157549A JP S62157549 A JPS62157549 A JP S62157549A JP 60297490 A JP60297490 A JP 60297490A JP 29749085 A JP29749085 A JP 29749085A JP S62157549 A JPS62157549 A JP S62157549A
Authority
JP
Japan
Prior art keywords
sample
analyzer
light
anisotropy
polarizer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60297490A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0478137B2 (enExample
Inventor
Shigeyoshi Osaki
大崎　茂芳
Kiyokazu Sakai
清和 酒井
Yoshihiko Fujii
藤井　良彦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kanzaki Paper Manufacturing Co Ltd
Original Assignee
Kanzaki Paper Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kanzaki Paper Manufacturing Co Ltd filed Critical Kanzaki Paper Manufacturing Co Ltd
Priority to JP60297490A priority Critical patent/JPS62157549A/ja
Priority to US06/945,776 priority patent/US4849623A/en
Priority to DE3644705A priority patent/DE3644705C2/de
Publication of JPS62157549A publication Critical patent/JPS62157549A/ja
Publication of JPH0478137B2 publication Critical patent/JPH0478137B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties
    • G01N21/23—Bi-refringence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/86—Investigating moving sheets
    • G01N2021/869—Plastics or polymeric material, e.g. polymers orientation in plastic, adhesive imprinted band

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP60297490A 1985-12-30 1985-12-30 シート状透光性試料の異方性測定方法 Granted JPS62157549A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP60297490A JPS62157549A (ja) 1985-12-30 1985-12-30 シート状透光性試料の異方性測定方法
US06/945,776 US4849623A (en) 1985-12-30 1986-12-23 System and method for determining anisotropy of light-transmitting sheet specimen
DE3644705A DE3644705C2 (de) 1985-12-30 1986-12-30 Verfahren und Vorrichtung zum Bestimmen der Anisotropie eines lichtdurchlässigen Flächengebildes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60297490A JPS62157549A (ja) 1985-12-30 1985-12-30 シート状透光性試料の異方性測定方法

Publications (2)

Publication Number Publication Date
JPS62157549A true JPS62157549A (ja) 1987-07-13
JPH0478137B2 JPH0478137B2 (enExample) 1992-12-10

Family

ID=17847177

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60297490A Granted JPS62157549A (ja) 1985-12-30 1985-12-30 シート状透光性試料の異方性測定方法

Country Status (3)

Country Link
US (1) US4849623A (enExample)
JP (1) JPS62157549A (enExample)
DE (1) DE3644705C2 (enExample)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6475939A (en) * 1987-09-18 1989-03-22 Pioneer Electronic Corp Apparatus for measuring double refraction
JPH02102437A (ja) * 1988-10-08 1990-04-16 Kanzaki Paper Mfg Co Ltd レターデーション等の測定方法
JPH02102436A (ja) * 1988-10-08 1990-04-16 Kanzaki Paper Mfg Co Ltd レターデーション測定方法
JPH0329816U (enExample) * 1989-07-27 1991-03-25
JPH03110358U (enExample) * 1990-02-28 1991-11-12
JPH04335145A (ja) * 1991-05-13 1992-11-24 Idec Izumi Corp 織物欠陥穴検出器
JPH05209823A (ja) * 1991-12-02 1993-08-20 Kanzaki Paper Mfg Co Ltd 複屈折測定装置

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3830398C2 (de) * 1988-09-07 1997-11-27 Bodenseewerk Perkin Elmer Co Antriebsvorrichtung zum Antreiben eines Schwingpolarisators
US4973163A (en) * 1988-10-08 1990-11-27 Kanzaki Paper Manufacturing Co., Ltd. Method for measuring birefringence
US5235177A (en) * 1991-10-29 1993-08-10 Maximum, Inc. Angular position sensor using a polarized disc with coded tracks
DE4219271A1 (de) * 1992-06-12 1993-12-16 Zeiss Carl Jena Gmbh Optischer Meßkopf
DE4219691A1 (de) * 1992-06-16 1993-12-23 Siemens Ag Meßvorrichtung zur Bestimmung der Richtung der Polarisationsebene von linear polarisiertem Licht
US5519493A (en) * 1994-03-30 1996-05-21 Reiley; Daniel J. Remote sample polarimeter
US6236439B1 (en) * 1998-04-20 2001-05-22 Nitto Denko Corporation Wide viewing angle polarizing plate and liquid crystal display
US20030076487A1 (en) * 2001-08-03 2003-04-24 Cannon Bret D. System and method for glass processing and stress measurement
DE10154008C1 (de) * 2001-10-28 2003-04-30 Hans-Dieter Geiler Verfahren und Anordnung zur spannungsoptischen Analyse von Festkörpern
US6997343B2 (en) 2001-11-14 2006-02-14 Hypoguard Limited Sensor dispensing device
US20030111357A1 (en) * 2001-12-13 2003-06-19 Black Murdo M. Test meter calibration
US20030169426A1 (en) * 2002-03-08 2003-09-11 Peterson Timothy A. Test member orientation
US7250095B2 (en) * 2002-07-11 2007-07-31 Hypoguard Limited Enzyme electrodes and method of manufacture
US7264139B2 (en) * 2003-01-14 2007-09-04 Hypoguard Limited Sensor dispensing device
US20050150762A1 (en) * 2004-01-09 2005-07-14 Butters Colin W. Biosensor and method of manufacture
DE102005005757B4 (de) * 2005-02-07 2007-03-15 Octax Microscience Gmbh Anordnung zur mikroskop-optischen Erfassung von Anisotropien
GB0807668D0 (en) * 2008-04-28 2008-06-04 Innovia Films Ltd Method of authenticating a polymer film
EP2267422A1 (de) * 2009-06-26 2010-12-29 Evgeny Pavlovich Germanov Verfahren und Einrichtung zur Bestimmung der Malignität von biologischen Objekten
JP5150904B2 (ja) * 2010-05-10 2013-02-27 康博 小池 粘着剤の複屈折値定量的測定方法、粘着剤の設計方法及び製造方法、並びに、偏光板及び液晶表示装置の製造方法。
CN110651177B (zh) * 2017-05-23 2022-07-29 浜松光子学株式会社 取向特性测定方法、取向特性测定程序及取向特性测定装置
KR102366788B1 (ko) 2017-05-23 2022-02-23 하마마츠 포토닉스 가부시키가이샤 배향 특성 측정 방법, 배향 특성 측정 프로그램, 및 배향 특성 측정 장치

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6013245A (ja) * 1983-07-04 1985-01-23 Mitsubishi Chem Ind Ltd 光学異方性測定装置
JPS60143745A (ja) * 1983-12-30 1985-07-30 Nitto Electric Ind Co Ltd 光軸方向連続測定装置

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR936125A (fr) * 1946-12-17 1948-07-09 Photoélasticimètre
US3293908A (en) * 1964-08-21 1966-12-27 Chapman Everett Photoelastic machine
US3679309A (en) * 1970-05-04 1972-07-25 Japan Spectroacopic Co Ltd Instruments for measuring molecular orientations with the aid of fluorescence
US3724952A (en) * 1971-06-14 1973-04-03 C Vossberg Method for polarimetric analysis
DE2338305C3 (de) * 1973-07-27 1979-06-13 Vereinigung Zur Foerderung Des Instituts Fuer Kunststoffverarbeitung In Industrie Und Handwerk An Der Rhein.- Westf. Technischen Hochschule Aachen E.V., 5100 Aachen Verfahren und Vorrichtung zur Ermittlung der linearen Doppelbrechung eines Materials
US3902805A (en) * 1973-09-17 1975-09-02 Vishay Intertechnology Inc Automatic birefringence measuring apparatus
GB1570067A (en) * 1975-12-11 1980-06-25 Optical Activity Ltd Polarimeter
FR2347666A1 (fr) * 1976-04-09 1977-11-04 France Etat Photoelasticimetre automatique a deux longueurs d'ondes
US4140902A (en) * 1977-08-25 1979-02-20 Xonics, Inc. Device for measurement of hair-like particulate material
SU1023230A1 (ru) * 1978-01-11 1983-06-15 Предприятие П/Я В-2262 Устройство дл измерени степени ориентации одноосно ориентированных полимерных пленок
NL7920100A (nl) * 1978-11-01 1981-02-27 Hitachi Ltd Inrichting voor het detecteren van magneto-optische anisotropie.
JPS59224547A (ja) * 1983-06-03 1984-12-17 Kanzaki Paper Mfg Co Ltd 繊維シ−トの繊維配向測定方法
US4684256A (en) * 1983-12-30 1987-08-04 Nitto Electric Industrial Co., Ltd. Apparatus and method for continuously measuring polarizing property
FR2563337B1 (fr) * 1984-04-19 1986-06-27 Saint Gobain Rech Mesure des contraintes dans le verre flotte

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6013245A (ja) * 1983-07-04 1985-01-23 Mitsubishi Chem Ind Ltd 光学異方性測定装置
JPS60143745A (ja) * 1983-12-30 1985-07-30 Nitto Electric Ind Co Ltd 光軸方向連続測定装置

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6475939A (en) * 1987-09-18 1989-03-22 Pioneer Electronic Corp Apparatus for measuring double refraction
JPH02102437A (ja) * 1988-10-08 1990-04-16 Kanzaki Paper Mfg Co Ltd レターデーション等の測定方法
JPH02102436A (ja) * 1988-10-08 1990-04-16 Kanzaki Paper Mfg Co Ltd レターデーション測定方法
JPH0329816U (enExample) * 1989-07-27 1991-03-25
JPH03110358U (enExample) * 1990-02-28 1991-11-12
JPH04335145A (ja) * 1991-05-13 1992-11-24 Idec Izumi Corp 織物欠陥穴検出器
JPH05209823A (ja) * 1991-12-02 1993-08-20 Kanzaki Paper Mfg Co Ltd 複屈折測定装置

Also Published As

Publication number Publication date
DE3644705C2 (de) 1996-01-11
JPH0478137B2 (enExample) 1992-12-10
DE3644705A1 (de) 1987-07-02
US4849623A (en) 1989-07-18

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