JPS62151744U - - Google Patents

Info

Publication number
JPS62151744U
JPS62151744U JP3895786U JP3895786U JPS62151744U JP S62151744 U JPS62151744 U JP S62151744U JP 3895786 U JP3895786 U JP 3895786U JP 3895786 U JP3895786 U JP 3895786U JP S62151744 U JPS62151744 U JP S62151744U
Authority
JP
Japan
Prior art keywords
positioning
stopper
head
passage
open
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP3895786U
Other languages
Japanese (ja)
Other versions
JPH0644100Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1986038957U priority Critical patent/JPH0644100Y2/en
Publication of JPS62151744U publication Critical patent/JPS62151744U/ja
Application granted granted Critical
Publication of JPH0644100Y2 publication Critical patent/JPH0644100Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Branching, Merging, And Special Transfer Between Conveyors (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Special Conveying (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は本考案の一実施例に係る装置の部分側
面図、第２図は一部を断面とした第１図の―
方向図、第３図は半導体素子の一例を示す図、第
４図は測定ブロツクを除いた状態の第１図の部分
拡大図、第５図は一部を断面としよ第１図の―
方向からの全体図、第６図は位置決めピン取付
部分の拡大断面図、第７図は本考案に係る装置を
備えた測定仕分け装置の一例を示す説明図である
。 １：半導体素子、２：傾斜シユート、３：素子
頭部、４ａ，４ｂ：位置決め面、５：位置決め通
路、６：ストツパー、７：位置決めピン、８：架
台、９：リード、１０：案内ブロツク、１１：ス
タンド、１２：磁界発生部、１３：ストツパー取
付アーム、１４：スペーサー、１５：ストツパー
用エヤアクチユエーター、１６：吸引孔、１７：
フレキシブルホース、１８：測定ブロツク取付ア
ーム、１９：測定ブロツク、２０：支持フレーム
、２１ａ〜２１ｃ：測定ブロツク用エヤアクチユ
エーター、２２：接触子、２３：スプリング、２
４：切欠部、２５：フイダー、２６：搬送ゲート
装置、２７：測定装置、２８：待機装置、２９：
振り分け装置、３０：ロータリーシユート、３１
ａ，３１ｂ：集積部、３２ａ，３２ｂ：通過セン
サー。 Fig. 1 is a partial side view of a device according to an embodiment of the present invention, and Fig. 2 is a partially sectional view of the device shown in Fig. 1.
3 is a diagram showing an example of a semiconductor element, FIG. 4 is a partially enlarged view of FIG. 1 with the measurement block removed, and FIG. 5 is a partially cross-sectional view.
6 is an enlarged sectional view of the positioning pin attachment portion, and FIG. 7 is an explanatory diagram showing an example of a measuring and sorting device equipped with the device according to the present invention. 1: semiconductor element, 2: inclined chute, 3: element head, 4a, 4b: positioning surface, 5: positioning passage, 6: stopper, 7: positioning pin, 8: pedestal, 9: lead, 10: guide block, 11: Stand, 12: Magnetic field generator, 13: Stopper mounting arm, 14: Spacer, 15: Air actuator for stopper, 16: Suction hole, 17:
Flexible hose, 18: Measuring block mounting arm, 19: Measuring block, 20: Support frame, 21a to 21c: Air actuator for measuring block, 22: Contact, 23: Spring, 2
4: Notch, 25: Feeder, 26: Transfer gate device, 27: Measuring device, 28: Standby device, 29:
Sorting device, 30: Rotary chute, 31
a, 31b: accumulation section, 32a, 32b: passage sensor.

Claims (1)

【実用新案登録請求の範囲】 半導体素子を搬送する傾斜シユート上に沿つて
、搬送される半導体素子の素子頭部の一側方と上
方の位置決め面を有し、かつ他側方が開放された
位置決め通路を形成し、 この位置決め通路の出口に近接して、素子頭部
の進路を開閉するストツパーを設け、 更に、位置決め通路の開放された側方側に、側
方の位置決め面に向つて進退し、前進時に、スト
ツパーで停止されている半導体素子の素子頭部を
押圧する位置決めピンを設けたことを特徴とする
半導体素子の位置決め装置。[Claims for Utility Model Registration] Along an inclined chute for transporting semiconductor chips, the device has positioning surfaces on one side and above the head of the semiconductor chip to be transported, and the other side is open. A positioning passage is formed, a stopper for opening and closing the path of the element head is provided near the exit of this positioning passage, and a stopper is provided on the open side of the positioning passage to advance and retreat toward the side positioning surface. A positioning device for a semiconductor device, characterized in that a positioning pin is provided for pressing the head of a semiconductor device stopped by a stopper when moving forward.
JP1986038957U 1986-03-19 1986-03-19 Positioning device for semiconductor elements Expired - Lifetime JPH0644100Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1986038957U JPH0644100Y2 (en) 1986-03-19 1986-03-19 Positioning device for semiconductor elements

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1986038957U JPH0644100Y2 (en) 1986-03-19 1986-03-19 Positioning device for semiconductor elements

Publications (2)

Publication Number Publication Date
JPS62151744U true JPS62151744U (en) 1987-09-26
JPH0644100Y2 JPH0644100Y2 (en) 1994-11-14

Family

ID=30851680

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1986038957U Expired - Lifetime JPH0644100Y2 (en) 1986-03-19 1986-03-19 Positioning device for semiconductor elements

Country Status (1)

Country Link
JP (1) JPH0644100Y2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012086653A1 (en) * 2010-12-22 2012-06-28 日本発條株式会社 Testing system and package retainer

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58168251A (en) * 1982-03-30 1983-10-04 Toshiba Corp Supply shoot device
JPS60177115U (en) * 1984-05-04 1985-11-25 株式会社　東京精密 distribution device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58168251A (en) * 1982-03-30 1983-10-04 Toshiba Corp Supply shoot device
JPS60177115U (en) * 1984-05-04 1985-11-25 株式会社　東京精密 distribution device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012086653A1 (en) * 2010-12-22 2012-06-28 日本発條株式会社 Testing system and package retainer
JP6039425B2 (en) * 2010-12-22 2016-12-07 日本発條株式会社 Inspection system

Also Published As

Publication number Publication date
JPH0644100Y2 (en) 1994-11-14

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