JPS62132400A - Inspection of mounting situation of electronic parts - Google Patents

Inspection of mounting situation of electronic parts

Info

Publication number
JPS62132400A
JPS62132400A JP60273796A JP27379685A JPS62132400A JP S62132400 A JPS62132400 A JP S62132400A JP 60273796 A JP60273796 A JP 60273796A JP 27379685 A JP27379685 A JP 27379685A JP S62132400 A JPS62132400 A JP S62132400A
Authority
JP
Japan
Prior art keywords
electronic component
shadow
determined
mounting status
electronic components
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60273796A
Other languages
Japanese (ja)
Inventor
太田 正憲
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Corp
Original Assignee
TDK Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TDK Corp filed Critical TDK Corp
Priority to JP60273796A priority Critical patent/JPS62132400A/en
Priority to US06/865,067 priority patent/US4787143A/en
Priority to GB8612943A priority patent/GB2184877B/en
Priority to DE3618570A priority patent/DE3618570C2/en
Priority to FR8608060A priority patent/FR2591057A1/en
Priority to CA000510805A priority patent/CA1245773A/en
Priority to CN86104342A priority patent/CN1008504B/en
Priority to KR1019860008068A priority patent/KR950002212B1/en
Publication of JPS62132400A publication Critical patent/JPS62132400A/en
Priority to MYPI87002509A priority patent/MY101933A/en
Pending legal-status Critical Current

Links

Landscapes

  • Supply And Installment Of Electrical Components (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、主としてチップ状の電子部品を基板面に装着
した状態が適正か或いは不適正かを検査するところの電
子部品の実装状況検査方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a method for inspecting the mounting status of electronic components, which mainly involves inspecting whether a chip-shaped electronic component is properly or improperly mounted on a board surface. It is.

従来の技術 従来、この種の実装状況検査方法としてはラウセサ等に
よる部品と基板のコントラストを把握し或いはプリント
基板に電子部品を装着する個所に白いシルクを塗ること
により電子部品の実装位置ズレや部品の有無を判断する
手段が知られている。
Conventional technology Conventionally, this type of mounting status inspection method uses a loussesor to grasp the contrast between the components and the board, or by applying white silk to the parts where the electronic components are mounted on the printed circuit board to detect misalignment of the mounting position of the electronic components and parts. There are known means for determining the presence or absence of

発明が解決しようとする問題点 然し、これらの方法では必ずしも正確に電子部品の実装
状況を判断することができない。
Problems to be Solved by the Invention However, these methods cannot necessarily accurately determine the mounting status of electronic components.

問題点を解決するための手段 本発明に係る電子部品の実装状況検査方法においては、
電子部品を装着した基板の上方から光を照射して電子部
品の縁辺に影を出し、その影のコントラストを電子部品
の周辺に沿う数点で限定把握し、これらの限定把握した
コントラストが予め定めた範囲内にあるか否かに基づい
て電子部品の実装状況を判断するようにされている。
Means for Solving the Problems In the electronic component mounting status inspection method according to the present invention,
Light is irradiated from above the board on which electronic components are mounted to cast a shadow on the edge of the electronic component, and the contrast of the shadow is determined in a limited manner at several points along the periphery of the electronic component, and these limited contrasts are determined in advance. The mounting status of electronic components is determined based on whether or not the electronic component is within the specified range.

作   用 この電子部品の実装状況検査方法では、電子部品の形状
を光の照射による影で描出し、その影のコントラストを
電子部品の周辺に沿う数点で把握することにより、その
コントラスI・が予め定められた範囲内にあるか否かで
電子部品の実装状況を検査するものであるから、正確で
しかも簡単に電子部品の実装状況が適正か否かを判断す
ることができる。
Function: In this method for inspecting the mounting status of electronic components, the shape of the electronic component is depicted as a shadow caused by irradiation of light, and the contrast of the shadow is determined at several points along the periphery of the electronic component. Since the mounting status of electronic components is inspected to see if it is within a predetermined range, it is possible to accurately and easily determine whether the mounting status of electronic components is appropriate.

実施例 以下、添付図面を参照して説明すれば、次の通りである
Embodiments will now be described with reference to the accompanying drawings.

この電子部品の実装状況検査方法はチップ状の電子部品
が基板に装着されているか否かに加えて、所望通りの位
置に正確に装着されているか否かを検査するに適用する
ものである。その方法は概念的には第1図で示す如く基
板Pに装着した電子部品Eに対して上方からストロボS
、S・・・等の光源から光を照射し、その光の照射で電
子部品Eの縁辺に影を出すと共に、この影のコントラス
トをカメラCによる映像内で数点で限定把握し、そのコ
ントラストが予め定めた範囲内にあるか否かにより電子
部品Eの実装状況適否を判断するものである。蕊で、影
の限定把握は電子部品の周辺に沿って映像内の所定位と
数個所に把握領域を限定するウィンドを設けることによ
り行い、そのウィンド内に影として描出される部品本体
と周辺位置或いは電極端子と周辺位置とのコントラスト
の相違から電子部品側と基板面上の位置関係を割り出す
ことができる。
This method for inspecting the mounting status of electronic components is applied to inspecting not only whether a chip-shaped electronic component is mounted on a board but also whether it is mounted accurately at a desired position. Conceptually, the method is as shown in Figure 1, where a strobe light is applied to the electronic component E mounted on the board P from above.
, S..., etc., the irradiation of the light casts a shadow on the edge of the electronic component E, and the contrast of this shadow is grasped at several points in the image taken by camera C, and the contrast is determined. The suitability of the mounting situation of the electronic component E is determined based on whether or not the value is within a predetermined range. In this method, limited grasping of shadows is performed by creating a window that limits the grasping area to a predetermined position and several locations in the image along the periphery of the electronic component, and within that window, the component body and surrounding positions are depicted as shadows. Alternatively, the positional relationship between the electronic component side and the substrate surface can be determined from the difference in contrast between the electrode terminal and the peripheral position.

例えば角形のチップ部品e1の場合、第2図で示すよう
に光の照射で周辺に影10が出来る。その影を映すカメ
ラの画面には所望通りの実装位置に沿って上下、左右に
影を限定するウィンド11〜16を設け、カメラを通し
て映し出される影を画面上に重ねると共にチップ部品e
1の本体側から色のコントラストをスキャンすることに
よりチップ部品elと影との境目を検出する。この検出
を各ウィンド11〜16で行って外形の枠を取り、その
中心値が本来あるべき点より、予め設定した数値以上ズ
しているようであれば実装不適正であることが判別でき
る。
For example, in the case of a rectangular chip component e1, a shadow 10 is created around the periphery when irradiated with light, as shown in FIG. The screen of the camera that projects the shadow is provided with windows 11 to 16 that limit the shadow to the top, bottom, left and right along the desired mounting position, so that the shadow projected through the camera is superimposed on the screen, and the chip components e.
By scanning the color contrast from the main body side of 1, the boundary between the chip component el and the shadow is detected. This detection is performed for each of the windows 11 to 16 to determine the outline of the frame, and if the center value deviates from the original point by more than a preset value, it can be determined that the mounting is inappropriate.

また、第3図で示すように電極を突出したチップ型のト
ランジスタe2の場合、各電極t。
Furthermore, in the case of a chip-type transistor e2 with protruding electrodes as shown in FIG. 3, each electrode t.

〜t3の所定位置に対応してウィンド21〜23を設け
、このウィンド21〜23内に位置する周辺の影20と
電極からの反射光の割合を画素数でカウントすれば、電
子部品の実装状況を割出すことができる。
If windows 21 to 23 are provided corresponding to the predetermined positions of ~t3, and the proportion of reflected light from the surrounding shadows 20 and electrodes located within these windows 21 to 23 is counted by the number of pixels, the mounting status of electronic components can be determined. can be determined.

これと同様に円筒型C・Rような部品e3の場合には、
第4図で示す如く両脇の電極t4 。
Similarly, in the case of part e3 such as cylindrical C/R,
Electrodes t4 on both sides as shown in FIG.

t5が周辺に生ずる影30内でストロボの光を反射して
光るため、ウィンド31.32のエツジとチップ部品e
3の光るエツジとの相関関係で実装状況を判断すること
ができる。この検査ではチップ部品e3のエツジが各ウ
ィンド31.32で検出できしかも両エツジが重ならな
いときに適正状態と判断でき、それに対してチップ部品
e3の左右いずれかのエツジがウィンド31.32のエ
ツジと重なり或いはいずれのエツジもウィンド31.3
2内に検出できないときは実装不適正と判断できるよう
になる。
Since t5 reflects the strobe light within the shadow 30 generated around it, the edges of the windows 31 and 32 and the chip component e
The implementation status can be determined based on the correlation with 3 Shining Edge. In this inspection, when the edge of chip component e3 can be detected in each window 31.32 and the two edges do not overlap, it can be determined that the state is proper. Window 31.3 or any edge
If it cannot be detected within 2, it can be determined that the implementation is inappropriate.

なお、光の照射で影が生じない時は、電子部品の装着な
しとして判断することができる。
Note that when no shadow is produced by light irradiation, it can be determined that no electronic component is attached.

発明の効果 以上の如く、本発明に係る電子部品の実装状況検査方法
に依れば、光の照射で電子部品の周辺に生ずる影のコン
トラストで電子部品の実装状況を判断するため、電子部
品の形状に則って正確な実装状況の判別を極めて容易に
行うことができるようになる。
Effects of the Invention As described above, according to the method for inspecting the mounting status of electronic components according to the present invention, the mounting status of the electronic components can be determined based on the contrast of the shadows generated around the electronic components by light irradiation. It becomes possible to very easily determine the exact mounting status based on the shape.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明に係る検査方法を適用する機構の概略説
明図、第2〜4図は同検査方法による部品形状に応じた
実装状況判別処理の説明図である。 E(e、le2  、e3):電子部品、P:基板、S
、S・・・:ストロボ等の光源、10゜20.30:影
、11−16.21〜23.31.32:影のコントラ
ストを限定するウィンド。
FIG. 1 is a schematic explanatory diagram of a mechanism to which an inspection method according to the present invention is applied, and FIGS. 2 to 4 are explanatory diagrams of a mounting status determination process according to a component shape by the same inspection method. E (e, le2, e3): electronic component, P: board, S
, S...: Light source such as strobe, 10°20.30: Shadow, 11-16.21 to 23.31.32: Window that limits the contrast of the shadow.

Claims (1)

【特許請求の範囲】[Claims]  電子部品を装着した基板の上方から光を照射して電子
部品の縁辺に影を出し、その影のコントラストを電子部
品の周辺に沿う数点で限定把握し、これらの限定把握し
たコントラストが予め定めた範囲内にあるか否かに基づ
いて電子部品の実装状況を判断するようにしたことを特
徴とする電子部品の実装状況検査方法。
Light is irradiated from above the board on which electronic components are mounted to cast a shadow on the edge of the electronic component, and the contrast of the shadow is determined in a limited manner at several points along the periphery of the electronic component, and these limited contrasts are determined in advance. A method for inspecting a mounting status of an electronic component, characterized in that the mounting status of the electronic component is determined based on whether or not the electronic component is within a certain range.
JP60273796A 1985-12-04 1985-12-04 Inspection of mounting situation of electronic parts Pending JPS62132400A (en)

Priority Applications (9)

Application Number Priority Date Filing Date Title
JP60273796A JPS62132400A (en) 1985-12-04 1985-12-04 Inspection of mounting situation of electronic parts
US06/865,067 US4787143A (en) 1985-12-04 1986-05-19 Method for detecting and correcting failure in mounting of electronic parts on substrate and apparatus therefor
GB8612943A GB2184877B (en) 1985-12-04 1986-05-28 Method for detecting and correcting failure in mounting of electronic parts on substrate and apparatus therefor
DE3618570A DE3618570C2 (en) 1985-12-04 1986-06-03 Method and device for detecting and correcting errors in the assembly of printed circuit boards with electronic components
FR8608060A FR2591057A1 (en) 1985-12-04 1986-06-04 METHOD FOR DETECTING AND CORRECTING A FAULT IN MOUNTING ELECTRONIC PARTS ON A SUBSTRATE, AND DEVICE FOR APPLYING SAID METHOD
CA000510805A CA1245773A (en) 1985-12-04 1986-06-04 Method of detecting a failure in the mounting condition of electronic parts of substrates
CN86104342A CN1008504B (en) 1985-12-04 1986-06-24 Method for detecting and correcting failure in mounting of electronic parts on substrate and apparatus therefor
KR1019860008068A KR950002212B1 (en) 1985-12-04 1986-09-26 Method for detecting and correcting failure in mounting of electronic parts on substrate and apparatus therefor
MYPI87002509A MY101933A (en) 1985-12-04 1987-09-30 Method for detecting and correcting failure in mounting of electronic parts on substrate and apparatus therefor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60273796A JPS62132400A (en) 1985-12-04 1985-12-04 Inspection of mounting situation of electronic parts

Publications (1)

Publication Number Publication Date
JPS62132400A true JPS62132400A (en) 1987-06-15

Family

ID=17532699

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60273796A Pending JPS62132400A (en) 1985-12-04 1985-12-04 Inspection of mounting situation of electronic parts

Country Status (1)

Country Link
JP (1) JPS62132400A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012037255A (en) * 2010-08-04 2012-02-23 Panasonic Corp Mounting state inspection device for electronic component
JP2012037256A (en) * 2010-08-04 2012-02-23 Panasonic Corp Mounting state inspection method for electronic component

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012037255A (en) * 2010-08-04 2012-02-23 Panasonic Corp Mounting state inspection device for electronic component
JP2012037256A (en) * 2010-08-04 2012-02-23 Panasonic Corp Mounting state inspection method for electronic component

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