JPS62123464A - 光メモリ素子基板製造用フオトマスク - Google Patents
光メモリ素子基板製造用フオトマスクInfo
- Publication number
- JPS62123464A JPS62123464A JP60263316A JP26331685A JPS62123464A JP S62123464 A JPS62123464 A JP S62123464A JP 60263316 A JP60263316 A JP 60263316A JP 26331685 A JP26331685 A JP 26331685A JP S62123464 A JPS62123464 A JP S62123464A
- Authority
- JP
- Japan
- Prior art keywords
- film
- mask
- photomask
- ultra
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000758 substrate Substances 0.000 claims abstract description 11
- 230000003287 optical effect Effects 0.000 claims description 11
- 238000004519 manufacturing process Methods 0.000 claims description 6
- 238000000034 method Methods 0.000 abstract description 14
- 239000011521 glass Substances 0.000 abstract description 5
- 238000004544 sputter deposition Methods 0.000 abstract description 4
- 239000004925 Acrylic resin Substances 0.000 abstract description 2
- 229920000178 Acrylic resin Polymers 0.000 abstract description 2
- 238000000151 deposition Methods 0.000 abstract 2
- 238000009499 grossing Methods 0.000 abstract 1
- 239000010410 layer Substances 0.000 abstract 1
- 239000002356 single layer Substances 0.000 abstract 1
- 239000000126 substance Substances 0.000 abstract 1
- 239000010408 film Substances 0.000 description 31
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 229910019923 CrOx Inorganic materials 0.000 description 1
- 238000004380 ashing Methods 0.000 description 1
- 210000003323 beak Anatomy 0.000 description 1
- 238000004140 cleaning Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 239000004615 ingredient Substances 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000001771 vacuum deposition Methods 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/38—Masks having auxiliary features, e.g. special coatings or marks for alignment or testing; Preparation thereof
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/50—Mask blanks not covered by G03F1/20 - G03F1/34; Preparation thereof
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/54—Absorbers, e.g. of opaque materials
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Preparing Plates And Mask In Photomechanical Process (AREA)
- Manufacturing Optical Record Carriers (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60263316A JPS62123464A (ja) | 1985-11-22 | 1985-11-22 | 光メモリ素子基板製造用フオトマスク |
US06/930,157 US4764441A (en) | 1985-11-22 | 1986-11-12 | Photo-mask for production of substrate for optical memory element |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP60263316A JPS62123464A (ja) | 1985-11-22 | 1985-11-22 | 光メモリ素子基板製造用フオトマスク |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS62123464A true JPS62123464A (ja) | 1987-06-04 |
JPH0517542B2 JPH0517542B2 (enrdf_load_stackoverflow) | 1993-03-09 |
Family
ID=17387785
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP60263316A Granted JPS62123464A (ja) | 1985-11-22 | 1985-11-22 | 光メモリ素子基板製造用フオトマスク |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS62123464A (enrdf_load_stackoverflow) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01149243A (ja) * | 1987-12-04 | 1989-06-12 | Sharp Corp | ディスク状光記録媒体の製造方法および製造用フォトマスク |
JPH01243062A (ja) * | 1988-03-24 | 1989-09-27 | Nikon Corp | フォトマスク |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5517152A (en) * | 1978-07-25 | 1980-02-06 | Fujitsu Ltd | Photo mask |
-
1985
- 1985-11-22 JP JP60263316A patent/JPS62123464A/ja active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5517152A (en) * | 1978-07-25 | 1980-02-06 | Fujitsu Ltd | Photo mask |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01149243A (ja) * | 1987-12-04 | 1989-06-12 | Sharp Corp | ディスク状光記録媒体の製造方法および製造用フォトマスク |
JPH01243062A (ja) * | 1988-03-24 | 1989-09-27 | Nikon Corp | フォトマスク |
Also Published As
Publication number | Publication date |
---|---|
JPH0517542B2 (enrdf_load_stackoverflow) | 1993-03-09 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |