JPS6212286Y2 - - Google Patents
Info
- Publication number
- JPS6212286Y2 JPS6212286Y2 JP18716880U JP18716880U JPS6212286Y2 JP S6212286 Y2 JPS6212286 Y2 JP S6212286Y2 JP 18716880 U JP18716880 U JP 18716880U JP 18716880 U JP18716880 U JP 18716880U JP S6212286 Y2 JPS6212286 Y2 JP S6212286Y2
- Authority
- JP
- Japan
- Prior art keywords
- contact
- spring
- thin tube
- needle
- tapered
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000523 sample Substances 0.000 claims description 7
- 238000005259 measurement Methods 0.000 description 4
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 230000002093 peripheral effect Effects 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 229910000906 Bronze Inorganic materials 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- DMFGNRRURHSENX-UHFFFAOYSA-N beryllium copper Chemical compound [Be].[Cu] DMFGNRRURHSENX-UHFFFAOYSA-N 0.000 description 1
- 239000010974 bronze Substances 0.000 description 1
- KUNSUQLRTQLHQQ-UHFFFAOYSA-N copper tin Chemical compound [Cu].[Sn] KUNSUQLRTQLHQQ-UHFFFAOYSA-N 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18716880U JPS6212286Y2 (enrdf_load_stackoverflow) | 1980-12-25 | 1980-12-25 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP18716880U JPS6212286Y2 (enrdf_load_stackoverflow) | 1980-12-25 | 1980-12-25 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS57108161U JPS57108161U (enrdf_load_stackoverflow) | 1982-07-03 |
JPS6212286Y2 true JPS6212286Y2 (enrdf_load_stackoverflow) | 1987-03-28 |
Family
ID=29989749
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP18716880U Expired JPS6212286Y2 (enrdf_load_stackoverflow) | 1980-12-25 | 1980-12-25 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6212286Y2 (enrdf_load_stackoverflow) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6039972U (ja) * | 1983-08-25 | 1985-03-20 | 三興線材工業株式会社 | 回路検査針 |
-
1980
- 1980-12-25 JP JP18716880U patent/JPS6212286Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS57108161U (enrdf_load_stackoverflow) | 1982-07-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US20070018666A1 (en) | Spring contact pin for an IC chip tester | |
JPH0510971A (ja) | 導電性接触子 | |
JPS6212286Y2 (enrdf_load_stackoverflow) | ||
US6703855B1 (en) | Structure of a probe | |
JPH0532775Y2 (enrdf_load_stackoverflow) | ||
JPH0342377Y2 (enrdf_load_stackoverflow) | ||
JPH019014Y2 (enrdf_load_stackoverflow) | ||
JPS6236137Y2 (enrdf_load_stackoverflow) | ||
JPH026372Y2 (enrdf_load_stackoverflow) | ||
JPH0512771Y2 (enrdf_load_stackoverflow) | ||
JPH0145029B2 (enrdf_load_stackoverflow) | ||
JP2602097B2 (ja) | 導電性接触子 | |
JP2888316B2 (ja) | 導電性接触子 | |
JP2567591Y2 (ja) | コンタクトプローブ | |
JPH0526904A (ja) | スプリングコンタクト及びその接触方法 | |
JP2651405B2 (ja) | 導電性接触子 | |
JP2980625B2 (ja) | 導電性接触子 | |
JPH04216470A (ja) | プローブ | |
KR200182523Y1 (ko) | 검사용 탐침장치 | |
JPH0240539Y2 (enrdf_load_stackoverflow) | ||
JP3018248U (ja) | 検査用プローブ | |
JPS5817338Y2 (ja) | プリント基板の検査測定用チェッカ−ピン | |
JPS59632Y2 (ja) | 回路素子挾持装置 | |
JPH048374Y2 (enrdf_load_stackoverflow) | ||
JPS6222069Y2 (enrdf_load_stackoverflow) |