JPS62119607U - - Google Patents
Info
- Publication number
- JPS62119607U JPS62119607U JP762186U JP762186U JPS62119607U JP S62119607 U JPS62119607 U JP S62119607U JP 762186 U JP762186 U JP 762186U JP 762186 U JP762186 U JP 762186U JP S62119607 U JPS62119607 U JP S62119607U
- Authority
- JP
- Japan
- Prior art keywords
- measured
- markers
- positions
- movement
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000003550 marker Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Landscapes
- Length Measuring Devices With Unspecified Measuring Means (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986007621U JPH0522814Y2 (OSRAM) | 1986-01-21 | 1986-01-21 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1986007621U JPH0522814Y2 (OSRAM) | 1986-01-21 | 1986-01-21 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS62119607U true JPS62119607U (OSRAM) | 1987-07-29 |
| JPH0522814Y2 JPH0522814Y2 (OSRAM) | 1993-06-11 |
Family
ID=30791244
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1986007621U Expired - Lifetime JPH0522814Y2 (OSRAM) | 1986-01-21 | 1986-01-21 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0522814Y2 (OSRAM) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005164611A (ja) * | 2000-03-27 | 2005-06-23 | Palm Microlaser Technologies Ag | 生物学的または非生物学的物体を操作する方法及び操作する装置の制御システム |
| JP2015112671A (ja) * | 2013-12-11 | 2015-06-22 | 松本 清 | 加工装置 |
| WO2020129850A1 (ja) * | 2018-12-21 | 2020-06-25 | オムロン株式会社 | リニアスケールの検出値の補正方法 |
| US11709050B2 (en) | 2019-10-28 | 2023-07-25 | Omron Corporation | Position measurement method using a calibration plate to correct a detection value from the position detector |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5779509A (en) * | 1980-11-04 | 1982-05-18 | Mutoh Ind Ltd | Coordinate reading and plotting device |
-
1986
- 1986-01-21 JP JP1986007621U patent/JPH0522814Y2/ja not_active Expired - Lifetime
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5779509A (en) * | 1980-11-04 | 1982-05-18 | Mutoh Ind Ltd | Coordinate reading and plotting device |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2005164611A (ja) * | 2000-03-27 | 2005-06-23 | Palm Microlaser Technologies Ag | 生物学的または非生物学的物体を操作する方法及び操作する装置の制御システム |
| JP2015112671A (ja) * | 2013-12-11 | 2015-06-22 | 松本 清 | 加工装置 |
| WO2020129850A1 (ja) * | 2018-12-21 | 2020-06-25 | オムロン株式会社 | リニアスケールの検出値の補正方法 |
| JPWO2020129850A1 (ja) * | 2018-12-21 | 2021-11-04 | オムロン株式会社 | リニアスケールの検出値の補正方法 |
| US11333535B2 (en) | 2018-12-21 | 2022-05-17 | Omron Corporation | Method for correcting values detected by linear scales |
| US11709050B2 (en) | 2019-10-28 | 2023-07-25 | Omron Corporation | Position measurement method using a calibration plate to correct a detection value from the position detector |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0522814Y2 (OSRAM) | 1993-06-11 |
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