JPS61751U - Frozen sample observation device for scanning electron microscope - Google Patents

Frozen sample observation device for scanning electron microscope

Info

Publication number
JPS61751U
JPS61751U JP8467684U JP8467684U JPS61751U JP S61751 U JPS61751 U JP S61751U JP 8467684 U JP8467684 U JP 8467684U JP 8467684 U JP8467684 U JP 8467684U JP S61751 U JPS61751 U JP S61751U
Authority
JP
Japan
Prior art keywords
cooling
sample
observation device
frozen sample
electron microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8467684U
Other languages
Japanese (ja)
Inventor
秀則 岡崎
節雄 則岡
Original Assignee
日本電子株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電子株式会社 filed Critical 日本電子株式会社
Priority to JP8467684U priority Critical patent/JPS61751U/en
Publication of JPS61751U publication Critical patent/JPS61751U/en
Pending legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

添付図面は本考案の一実施例を示す構成略図である。 1:試料室、2:対物レンズ、3:ステージ、4:X移
動台、5:Y移動台、6:冷却台、7:熱絶縁物、8:
冷却棒、9,15:冷却槽、10:冷却台、11:凍結
試料、12:処理室、14:エアーロツク弁、16:保
持台、18,19:加熱ヒータ、20:冷却フィン。
The accompanying drawings are schematic diagrams showing an embodiment of the present invention. 1: Sample chamber, 2: Objective lens, 3: Stage, 4: X moving table, 5: Y moving table, 6: Cooling table, 7: Thermal insulator, 8:
Cooling rod, 9, 15: Cooling tank, 10: Cooling table, 11: Frozen sample, 12: Processing chamber, 14: Air lock valve, 16: Holding table, 18, 19: Heater, 20: Cooling fin.

Claims (2)

【実用新案登録請求の範囲】[Scope of utility model registration request] (1)試料室内に移動可能に置かれた移動体と、該移動
体に熱的に遮断された状態で取付けられた冷却台と、該
冷却台を冷却する手段と、前記冷却台上に着脱可能に装
着され、凍結試料を保持するための試料ホルダと、前記
試料室にエアーロツク弁を介して連通された処理室と、
前記試料ホルダを試料室と処理室との間で往復させるた
めの手段とを備えた装置において、前記試料室内に置か
れた凍結試料を加熱する手段を試料室内に設けてなる走
査電子顕微鏡における凍結試料観察装置。
(1) A movable body movably placed in a sample chamber, a cooling stand attached to the movable body in a thermally isolated state, a means for cooling the cooling stand, and a means for attaching and detaching the cooling stand to the cooling stand. a sample holder for holding a frozen sample; a processing chamber communicating with the sample chamber via an airlock valve;
A device for reciprocating the sample holder between a sample chamber and a processing chamber, wherein the apparatus includes means for heating a frozen sample placed in the sample chamber. Sample observation device.
(2)前記冷却台に載置された凍結試料の上方に電子線
通過穴を形成した冷却フィンを設け、該冷却フィンは前
記冷却台を冷却する手段に熱的に接続したことを特徴と
する実用新案登録請求の範囲第1項記載の走査電子顕微
鏡における凍績試料観察装置。
(2) Cooling fins with electron beam passage holes are provided above the frozen sample placed on the cooling table, and the cooling fins are thermally connected to means for cooling the cooling table. A frozen sample observation device for a scanning electron microscope according to claim 1 of the utility model registration claim.
JP8467684U 1984-06-07 1984-06-07 Frozen sample observation device for scanning electron microscope Pending JPS61751U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8467684U JPS61751U (en) 1984-06-07 1984-06-07 Frozen sample observation device for scanning electron microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8467684U JPS61751U (en) 1984-06-07 1984-06-07 Frozen sample observation device for scanning electron microscope

Publications (1)

Publication Number Publication Date
JPS61751U true JPS61751U (en) 1986-01-07

Family

ID=30634383

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8467684U Pending JPS61751U (en) 1984-06-07 1984-06-07 Frozen sample observation device for scanning electron microscope

Country Status (1)

Country Link
JP (1) JPS61751U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07280714A (en) * 1994-04-13 1995-10-27 Jeol Ltd Manufacture of biological sample for scanning electron microscope, device therefor and biological sample observing method
JP2005062130A (en) * 2003-08-20 2005-03-10 Canon Inc Microflake preparing device
JP2018206596A (en) * 2017-06-02 2018-12-27 国立研究開発法人物質・材料研究機構 Sample cooling device

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07280714A (en) * 1994-04-13 1995-10-27 Jeol Ltd Manufacture of biological sample for scanning electron microscope, device therefor and biological sample observing method
JP2005062130A (en) * 2003-08-20 2005-03-10 Canon Inc Microflake preparing device
JP2018206596A (en) * 2017-06-02 2018-12-27 国立研究開発法人物質・材料研究機構 Sample cooling device

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