JPS6183248U - - Google Patents

Info

Publication number
JPS6183248U
JPS6183248U JP16837184U JP16837184U JPS6183248U JP S6183248 U JPS6183248 U JP S6183248U JP 16837184 U JP16837184 U JP 16837184U JP 16837184 U JP16837184 U JP 16837184U JP S6183248 U JPS6183248 U JP S6183248U
Authority
JP
Japan
Prior art keywords
sample
refrigerant
sample holder
supply pipe
supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16837184U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP16837184U priority Critical patent/JPS6183248U/ja
Publication of JPS6183248U publication Critical patent/JPS6183248U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例を示す縦断面図、第
2図はそのAA断面図である。 1:鏡体、2:対物レンズ、3:試料ホルダ、
4:ゴニオメータ、5:開口、6:熱絶縁物、7
:試料、8:試料台、9:熱伝導体、10:伝導
板、11:回収パイプ、12:供給パイプ、13
,15,18:金属ベローズ、14,16:パイ
プ、17:ケース、19:リング、20:Oリン
グパツキング、21:アーム、22:キー。
FIG. 1 is a longitudinal cross-sectional view showing an embodiment of the present invention, and FIG. 2 is a cross-sectional view taken along line AA. 1: Mirror body, 2: Objective lens, 3: Sample holder,
4: Goniometer, 5: Aperture, 6: Thermal insulation, 7
: Sample, 8: Sample stage, 9: Heat conductor, 10: Conductive plate, 11: Recovery pipe, 12: Supply pipe, 13
, 15, 18: metal bellows, 14, 16: pipe, 17: case, 19: ring, 20: O-ring packing, 21: arm, 22: key.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 鏡体に回転可能に装着された筒状の試料ホルダ
と、該試料ホルダ内に熱的に遮断された状態で取
付けられ、試料を保持した試料台と、該試料台の
一部を兼用して形成された、又は該試料台と熱的
に接続されて一体化されこ熱伝導体と、該熱伝導
体部に冷媒を供給するための供給パイプと、該供
給された冷媒の気化ガスを排出するための前記熱
伝導体に固定された排出パイプと、前記供給パイ
プに冷媒を送り込むための冷媒供給源と、前記試
料ホルダ内に連通され、且つ前記供給及び排出パ
イプを囲繞することにより各パイプを真空遮断す
るための鏡体に固定されたケースとを備え、前記
試料ホルダとケースとの連結は耐真空的にシール
された状態で回転可能となし、前記供給及び排出
パイプの途中に軸心が前記試料ホルダの軸心と略
交叉するように置かれた金属ベローズを夫々設け
てなる電子顕微鏡等における試料冷却装置。
A cylindrical sample holder rotatably attached to a mirror body, a sample stand attached in a thermally insulated state inside the sample holder and holding a sample, and a part of the sample stand also used. A heat conductor formed or thermally connected and integrated with the sample stage, a supply pipe for supplying a refrigerant to the heat conductor section, and a vaporized gas of the supplied refrigerant being discharged. a refrigerant supply source for feeding refrigerant into the supply pipe; and a refrigerant supply source for supplying refrigerant to the supply pipe; and a case fixed to a mirror body for vacuum isolation, the connection between the sample holder and the case is rotatable in a vacuum-proof sealed state, and an axial center is provided in the middle of the supply and discharge pipes. A sample cooling device for an electron microscope, etc., comprising metal bellows placed so as to substantially intersect with the axis of the sample holder.
JP16837184U 1984-11-06 1984-11-06 Pending JPS6183248U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16837184U JPS6183248U (en) 1984-11-06 1984-11-06

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16837184U JPS6183248U (en) 1984-11-06 1984-11-06

Publications (1)

Publication Number Publication Date
JPS6183248U true JPS6183248U (en) 1986-06-02

Family

ID=30726144

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16837184U Pending JPS6183248U (en) 1984-11-06 1984-11-06

Country Status (1)

Country Link
JP (1) JPS6183248U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010061990A (en) * 2008-09-03 2010-03-18 Japan Science & Technology Agency Sample holder for electron microscope
JP2020004509A (en) * 2018-06-25 2020-01-09 株式会社メルビル Sample holder

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS452411Y1 (en) * 1966-03-04 1970-01-31

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS452411Y1 (en) * 1966-03-04 1970-01-31

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010061990A (en) * 2008-09-03 2010-03-18 Japan Science & Technology Agency Sample holder for electron microscope
JP2020004509A (en) * 2018-06-25 2020-01-09 株式会社メルビル Sample holder

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