JPS6156426A - 電子ビ−ム装置 - Google Patents
電子ビ−ム装置Info
- Publication number
- JPS6156426A JPS6156426A JP59156640A JP15664084A JPS6156426A JP S6156426 A JPS6156426 A JP S6156426A JP 59156640 A JP59156640 A JP 59156640A JP 15664084 A JP15664084 A JP 15664084A JP S6156426 A JPS6156426 A JP S6156426A
- Authority
- JP
- Japan
- Prior art keywords
- electron beam
- circuit
- signal
- voltage distribution
- image data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/266—Measurement of magnetic or electric fields in the object; Lorentzmicroscopy
- H01J37/268—Measurement of magnetic or electric fields in the object; Lorentzmicroscopy with scanning beams
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59156640A JPS6156426A (ja) | 1984-07-27 | 1984-07-27 | 電子ビ−ム装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59156640A JPS6156426A (ja) | 1984-07-27 | 1984-07-27 | 電子ビ−ム装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6156426A true JPS6156426A (ja) | 1986-03-22 |
JPH0354857B2 JPH0354857B2 (enrdf_load_stackoverflow) | 1991-08-21 |
Family
ID=15632081
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59156640A Granted JPS6156426A (ja) | 1984-07-27 | 1984-07-27 | 電子ビ−ム装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6156426A (enrdf_load_stackoverflow) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63118381U (enrdf_load_stackoverflow) * | 1987-01-26 | 1988-07-30 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5871540A (ja) * | 1981-09-30 | 1983-04-28 | イーツエーテー、インテグレイテツド、サーキツト、テスチング、ゲゼルシヤフト、フユア、ハルプライタープリユーフテヒニク、ミツト、ベシユレンクテル、ハフツング | 電子線測定法による電位決定のための走査方法 |
JPS58197643A (ja) * | 1982-05-12 | 1983-11-17 | Toshiba Corp | ストロボ走査電子顕微鏡装置 |
-
1984
- 1984-07-27 JP JP59156640A patent/JPS6156426A/ja active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5871540A (ja) * | 1981-09-30 | 1983-04-28 | イーツエーテー、インテグレイテツド、サーキツト、テスチング、ゲゼルシヤフト、フユア、ハルプライタープリユーフテヒニク、ミツト、ベシユレンクテル、ハフツング | 電子線測定法による電位決定のための走査方法 |
JPS58197643A (ja) * | 1982-05-12 | 1983-11-17 | Toshiba Corp | ストロボ走査電子顕微鏡装置 |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS63118381U (enrdf_load_stackoverflow) * | 1987-01-26 | 1988-07-30 |
Also Published As
Publication number | Publication date |
---|---|
JPH0354857B2 (enrdf_load_stackoverflow) | 1991-08-21 |
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