JPS6152262U - - Google Patents
Info
- Publication number
- JPS6152262U JPS6152262U JP1984138242U JP13824284U JPS6152262U JP S6152262 U JPS6152262 U JP S6152262U JP 1984138242 U JP1984138242 U JP 1984138242U JP 13824284 U JP13824284 U JP 13824284U JP S6152262 U JPS6152262 U JP S6152262U
- Authority
- JP
- Japan
- Prior art keywords
- ray
- intensity
- sensor
- crt
- line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000003384 imaging method Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Description
第1図は本考案X線像の画像処理装置の実施例
を示す説明図、第2図はX線強さの対数値lnB
Aと厚さとの関係を示すグラフ、第3図はX線の
フイルターによつて遮断する領域を示す波長と強
さの関係を示す説明図である。
1:X線センサー、2:XYテーブル、3:フ
イルター、4:X線管、5:X線センサー、6:
XYテーブル制御部、7:補正回路、9:CRT
。
Figure 1 is an explanatory diagram showing an embodiment of the image processing device for X-ray images of the present invention, and Figure 2 is the logarithm value lnB of the X-ray intensity.
A graph showing the relationship between A and thickness, and FIG. 3 is an explanatory diagram showing the relationship between wavelength and intensity showing the region blocked by an X-ray filter. 1: X-ray sensor, 2: XY table, 3: Filter, 4: X-ray tube, 5: X-ray sensor, 6:
XY table control section, 7: Correction circuit, 9: CRT
.
Claims (1)
線強さを線センサーで平面的に多数個所計測
し、この線センサーで計測された線強さを輝
度信号として及び線センサーの計測位置信号を
CRTに入力してCRTに二次元的線強さの分
布を画像として映像化する線画像装置において
、X線発生部からの線のうち被検査物を透過し
ないX線を計測するX線センサーを設け、このX
線センサーで計測した線強さBと前記被検査物
下位に配されたX線センサーのX線強さAとの比
の対数値lnBAを計算し、この対数値lnBA
の値にCRTの揮度が比例する様に対数値lnB
Aの信号をCRTに入力させる補正回路を設けた
ことを特徴とするX線像の画像処理装置。 A line sensor placed below the object to be inspected measures the intensity of the line passing through the object at multiple points on a plane, and the line intensity measured by the line sensor is used as a brightness signal and the measurement position of the line sensor is measured. In a ray imaging device that inputs a signal to a CRT and visualizes the two-dimensional distribution of ray intensity as an image, an A sensor is installed, and this
The logarithm lnBA of the ratio of the ray intensity B measured by the ray sensor to the X-ray intensity A of the X-ray sensor placed below the object to be inspected is calculated, and this logarithm lnBA
The logarithm value lnB is set so that the volatility of the CRT is proportional to the value of
An image processing device for an X-ray image, characterized in that it is provided with a correction circuit for inputting the signal A to a CRT.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1984138242U JPS6152262U (en) | 1984-09-11 | 1984-09-11 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1984138242U JPS6152262U (en) | 1984-09-11 | 1984-09-11 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6152262U true JPS6152262U (en) | 1986-04-08 |
Family
ID=30696636
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1984138242U Pending JPS6152262U (en) | 1984-09-11 | 1984-09-11 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6152262U (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5510858A (en) * | 1978-07-10 | 1980-01-25 | Hitachi Ltd | Coreless motor |
JPS57148934A (en) * | 1981-02-06 | 1982-09-14 | Philips Nv | X-ray inspecting apparatus |
-
1984
- 1984-09-11 JP JP1984138242U patent/JPS6152262U/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5510858A (en) * | 1978-07-10 | 1980-01-25 | Hitachi Ltd | Coreless motor |
JPS57148934A (en) * | 1981-02-06 | 1982-09-14 | Philips Nv | X-ray inspecting apparatus |
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