JPS61155758U - - Google Patents
Info
- Publication number
- JPS61155758U JPS61155758U JP4035085U JP4035085U JPS61155758U JP S61155758 U JPS61155758 U JP S61155758U JP 4035085 U JP4035085 U JP 4035085U JP 4035085 U JP4035085 U JP 4035085U JP S61155758 U JPS61155758 U JP S61155758U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- ray
- sensor
- detected
- ray beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005540 biological transmission Effects 0.000 claims 2
- 238000001514 detection method Methods 0.000 claims 1
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Description
第1図は本考案による物体組成判別装置の一実
施例を示す説明図、第2図は試料に対するX線ビ
ームの照射状態を示す図である。
1:X線管、2:試料、3:スリツト、4:通
孔、5:X線ビーム、6:第一のセンサ、7:第
二のセンサ、8:計算回路、9:コンピユータ。
FIG. 1 is an explanatory diagram showing an embodiment of the object composition determination apparatus according to the present invention, and FIG. 2 is a diagram showing the state of irradiation of an X-ray beam onto a sample. 1: X-ray tube, 2: sample, 3: slit, 4: through hole, 5: X-ray beam, 6: first sensor, 7: second sensor, 8: calculation circuit, 9: computer.
Claims (1)
料透過後のX線量と試料非透過のX線量とをそれ
ぞれのX線量検出用センサにより検出し、試料の
厚さを前記センサにより検出されたそれぞれの検
出値の対数比で除した値をもとに、試料の組成を
判別する装置において、複数の通孔を有してなる
スリツトを前記試料の前後いずれかに配置し、前
記通孔通過後に発生するX線ビーム個々の試料透
過後のX線量Aを検出する第一のセンサを複数個
配設し、さらに、試料非透過のX線量Bを検出す
る第二のセンサを配設すると共に、X線ビーム個
々の傾きθ及び試料の厚さdから前記X線ビーム
の透過距離d/cosθを算出し、前記X線ビー
ムの透過距離d/cosθと第一のセンサ及び第
二のセンサにより検出したX線量A,Bの対数比
lnBAとの比の計算を行う計算回路を設け、前
記計算回路で算出された数値をもとに試料の組成
を判別するコンピユータを計算回路に接続したこ
とを特徴とする多点測定型物体組成判別装置。 A sample is irradiated with X-rays emitted from an X-ray tube, the amount of X-rays that have passed through the sample and the amount of X-rays that have not passed through the sample are detected by respective X-ray amount detection sensors, and the thickness of the sample is detected by the sensors. In an apparatus for determining the composition of a sample based on the value divided by the logarithmic ratio of each detected value, a slit having a plurality of through holes is placed either before or after the sample, and the A plurality of first sensors are disposed to detect the X-ray dose A of each X-ray beam generated after passing through the sample after passing through the sample, and a second sensor is further disposed to detect the X-ray dose B that has not passed through the sample. At the same time, the transmission distance d/cos θ of the X-ray beam is calculated from the inclination θ of each X-ray beam and the thickness d of the sample, and the transmission distance d/cos θ of the X-ray beam and the first sensor and the second sensor are calculated. A calculation circuit was provided to calculate the ratio of the X-ray doses A and B detected by the sensor to the logarithmic ratio lnBA, and a computer was connected to the calculation circuit to determine the composition of the sample based on the values calculated by the calculation circuit. A multi-point measurement type object composition determination device characterized by the following.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4035085U JPS61155758U (en) | 1985-03-19 | 1985-03-19 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4035085U JPS61155758U (en) | 1985-03-19 | 1985-03-19 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61155758U true JPS61155758U (en) | 1986-09-27 |
Family
ID=30549156
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4035085U Pending JPS61155758U (en) | 1985-03-19 | 1985-03-19 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61155758U (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5772630A (en) * | 1980-10-25 | 1982-05-07 | Tokyo Shibaura Electric Co | Radioactive ray diagnostic apparatus |
JPS58191959A (en) * | 1982-05-06 | 1983-11-09 | Houseki Rigaku Kenkyusho:Kk | Method for discriminating composition of object |
-
1985
- 1985-03-19 JP JP4035085U patent/JPS61155758U/ja active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5772630A (en) * | 1980-10-25 | 1982-05-07 | Tokyo Shibaura Electric Co | Radioactive ray diagnostic apparatus |
JPS58191959A (en) * | 1982-05-06 | 1983-11-09 | Houseki Rigaku Kenkyusho:Kk | Method for discriminating composition of object |
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