JPS61155758U - - Google Patents

Info

Publication number
JPS61155758U
JPS61155758U JP4035085U JP4035085U JPS61155758U JP S61155758 U JPS61155758 U JP S61155758U JP 4035085 U JP4035085 U JP 4035085U JP 4035085 U JP4035085 U JP 4035085U JP S61155758 U JPS61155758 U JP S61155758U
Authority
JP
Japan
Prior art keywords
sample
ray
sensor
detected
ray beam
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4035085U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4035085U priority Critical patent/JPS61155758U/ja
Publication of JPS61155758U publication Critical patent/JPS61155758U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案による物体組成判別装置の一実
施例を示す説明図、第2図は試料に対するX線ビ
ームの照射状態を示す図である。 1:X線管、2:試料、3:スリツト、4:通
孔、5:X線ビーム、6:第一のセンサ、7:第
二のセンサ、8:計算回路、9:コンピユータ。
FIG. 1 is an explanatory diagram showing an embodiment of the object composition determination apparatus according to the present invention, and FIG. 2 is a diagram showing the state of irradiation of an X-ray beam onto a sample. 1: X-ray tube, 2: sample, 3: slit, 4: through hole, 5: X-ray beam, 6: first sensor, 7: second sensor, 8: calculation circuit, 9: computer.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] X線管から発射されるX線を試料に照射し、試
料透過後のX線量と試料非透過のX線量とをそれ
ぞれのX線量検出用センサにより検出し、試料の
厚さを前記センサにより検出されたそれぞれの検
出値の対数比で除した値をもとに、試料の組成を
判別する装置において、複数の通孔を有してなる
スリツトを前記試料の前後いずれかに配置し、前
記通孔通過後に発生するX線ビーム個々の試料透
過後のX線量Aを検出する第一のセンサを複数個
配設し、さらに、試料非透過のX線量Bを検出す
る第二のセンサを配設すると共に、X線ビーム個
々の傾きθ及び試料の厚さdから前記X線ビーム
の透過距離d/cosθを算出し、前記X線ビー
ムの透過距離d/cosθと第一のセンサ及び第
二のセンサにより検出したX線量A,Bの対数比
lnBAとの比の計算を行う計算回路を設け、前
記計算回路で算出された数値をもとに試料の組成
を判別するコンピユータを計算回路に接続したこ
とを特徴とする多点測定型物体組成判別装置。
A sample is irradiated with X-rays emitted from an X-ray tube, the amount of X-rays that have passed through the sample and the amount of X-rays that have not passed through the sample are detected by respective X-ray amount detection sensors, and the thickness of the sample is detected by the sensors. In an apparatus for determining the composition of a sample based on the value divided by the logarithmic ratio of each detected value, a slit having a plurality of through holes is placed either before or after the sample, and the A plurality of first sensors are disposed to detect the X-ray dose A of each X-ray beam generated after passing through the sample after passing through the sample, and a second sensor is further disposed to detect the X-ray dose B that has not passed through the sample. At the same time, the transmission distance d/cos θ of the X-ray beam is calculated from the inclination θ of each X-ray beam and the thickness d of the sample, and the transmission distance d/cos θ of the X-ray beam and the first sensor and the second sensor are calculated. A calculation circuit was provided to calculate the ratio of the X-ray doses A and B detected by the sensor to the logarithmic ratio lnBA, and a computer was connected to the calculation circuit to determine the composition of the sample based on the values calculated by the calculation circuit. A multi-point measurement type object composition determination device characterized by the following.
JP4035085U 1985-03-19 1985-03-19 Pending JPS61155758U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4035085U JPS61155758U (en) 1985-03-19 1985-03-19

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4035085U JPS61155758U (en) 1985-03-19 1985-03-19

Publications (1)

Publication Number Publication Date
JPS61155758U true JPS61155758U (en) 1986-09-27

Family

ID=30549156

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4035085U Pending JPS61155758U (en) 1985-03-19 1985-03-19

Country Status (1)

Country Link
JP (1) JPS61155758U (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5772630A (en) * 1980-10-25 1982-05-07 Tokyo Shibaura Electric Co Radioactive ray diagnostic apparatus
JPS58191959A (en) * 1982-05-06 1983-11-09 Houseki Rigaku Kenkyusho:Kk Method for discriminating composition of object

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5772630A (en) * 1980-10-25 1982-05-07 Tokyo Shibaura Electric Co Radioactive ray diagnostic apparatus
JPS58191959A (en) * 1982-05-06 1983-11-09 Houseki Rigaku Kenkyusho:Kk Method for discriminating composition of object

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