JPH03113152U - - Google Patents

Info

Publication number
JPH03113152U
JPH03113152U JP1942790U JP1942790U JPH03113152U JP H03113152 U JPH03113152 U JP H03113152U JP 1942790 U JP1942790 U JP 1942790U JP 1942790 U JP1942790 U JP 1942790U JP H03113152 U JPH03113152 U JP H03113152U
Authority
JP
Japan
Prior art keywords
ray tube
detector
measurement point
distance
goniometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1942790U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1942790U priority Critical patent/JPH03113152U/ja
Publication of JPH03113152U publication Critical patent/JPH03113152U/ja
Pending legal-status Critical Current

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  • Analysing Materials By The Use Of Radiation (AREA)

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図は、本考案の第１実施例に係る深溝底部
測定の説明図、第２図は本考案の第２実施例に係
る平板・測定の説明図、第３図は半価幅法の説明
図、第４図は従来のＸ線応力測定時の配置説明図
である。 １……Ｘ線管、２……測定点、３……検出器、
４……ゴニオメータ、５……スライド機構、６…
…入射Ｘ線、７……回析Ｘ線、Ｌ１……Ｘ線管と
測定点との距離、Ｌ２……測定点と検出器との距
離。 Fig. 1 is an explanatory diagram of deep groove bottom measurement according to the first embodiment of the present invention, Fig. 2 is an explanatory diagram of flat plate measurement according to the second embodiment of the present invention, and Fig. 3 is an explanatory diagram of the half width method. The explanatory diagram, FIG. 4, is an explanatory diagram of the arrangement during conventional X-ray stress measurement. 1...X-ray tube, 2...Measurement point, 3...Detector,
4... Goniometer, 5... Slide mechanism, 6...
...Incidence X-ray, 7...Diffraction X-ray, L1 ...Distance between the X-ray tube and the measurement point, L2 ...Distance between the measurement point and the detector.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] Ｘ線管および検出器をそれぞれゴニオメータに
測定点の方向にスライドできる機構を介して取付
けて試料とＸ線管および検出器との間の距離を調
節可能にしたことを特徴とするＸ線管応力測定装
置。 X-ray tube stress characterized in that the X-ray tube and the detector are each attached to a goniometer via a mechanism that can slide in the direction of the measurement point, so that the distance between the sample and the X-ray tube and detector can be adjusted. measuring device.
JP1942790U 1990-03-01 1990-03-01 Pending JPH03113152U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1942790U JPH03113152U (en) 1990-03-01 1990-03-01

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1942790U JPH03113152U (en) 1990-03-01 1990-03-01

Publications (1)

Publication Number Publication Date
JPH03113152U true JPH03113152U (en) 1991-11-19

Family

ID=31522550

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1942790U Pending JPH03113152U (en) 1990-03-01 1990-03-01

Country Status (1)

Country Link
JP (1) JPH03113152U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101297624B1 (en) * 2013-05-24 2013-08-22 장상윤 Cooking apparatus for cooking to bar shaped food
KR101372572B1 (en) * 2013-07-10 2014-03-13 (주)케이엠인터내셔널 Cooker

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101297624B1 (en) * 2013-05-24 2013-08-22 장상윤 Cooking apparatus for cooking to bar shaped food
KR101372572B1 (en) * 2013-07-10 2014-03-13 (주)케이엠인터내셔널 Cooker

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