JPS62162660U - - Google Patents
Info
- Publication number
- JPS62162660U JPS62162660U JP5069286U JP5069286U JPS62162660U JP S62162660 U JPS62162660 U JP S62162660U JP 5069286 U JP5069286 U JP 5069286U JP 5069286 U JP5069286 U JP 5069286U JP S62162660 U JPS62162660 U JP S62162660U
- Authority
- JP
- Japan
- Prior art keywords
- ray
- size
- evaluates
- slits
- irradiating
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000007547 defect Effects 0.000 claims description 5
- 238000007689 inspection Methods 0.000 claims description 4
- 238000011156 evaluation Methods 0.000 claims description 2
- 238000004876 x-ray fluorescence Methods 0.000 claims description 2
- 230000001678 irradiating effect Effects 0.000 claims 1
- 239000000463 material Substances 0.000 claims 1
- 239000002184 metal Substances 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
Description
第１図は本考案のＸ線検査用欠陥寸法評価ゲー
ジの実施例としてのゲージの平面図、第２図は本
考案のゲージを利用したＸ線検査の場合の機器の
配置構成図である。
１……Ｘ線管、２……検査対象物、３……欠陥
、４……Ｘ線蛍光増倍管、５……テレビモニター
、６……欠陥映像、７……ゲージ、８……スリツ
ト、９……孔。
FIG. 1 is a plan view of a gauge as an embodiment of the defect size evaluation gauge for X-ray inspection of the present invention, and FIG. 2 is a diagram showing the arrangement and configuration of equipment for X-ray inspection using the gauge of the present invention. 1... X-ray tube, 2... Inspection object, 3... Defect, 4... X-ray fluorescence multiplier tube, 5... TV monitor, 6... Defect image, 7... Gauge, 8... Slit , 9... hole.
Claims (1)
管を経てその結果をテレビに写し出し、欠陥の寸
法を評価する装置において、前記Ｘ線管とＸ線蛍
光増倍管との間に設けられ、厚さが数ミリの板状
の金属であつて、各種寸法のスリツト及び孔を設
けてなることを特徴とするＸ線検査用欠陥寸法評
価ゲージ。 In a device that evaluates the size of defects by irradiating X-rays onto a welded part of a material, passing through an X-ray fluorescence multiplier, and projecting the results on a television, A defect size evaluation gauge for X-ray inspection, characterized in that it is a plate-shaped metal several millimeters thick and is provided with slits and holes of various sizes.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5069286U JPS62162660U (en) | 1986-04-04 | 1986-04-04 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5069286U JPS62162660U (en) | 1986-04-04 | 1986-04-04 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS62162660U true JPS62162660U (en) | 1987-10-16 |
Family
ID=30874284
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5069286U Pending JPS62162660U (en) | 1986-04-04 | 1986-04-04 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62162660U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017106788A (en) * | 2015-12-09 | 2017-06-15 | 三菱電機株式会社 | Reference element |
-
1986
- 1986-04-04 JP JP5069286U patent/JPS62162660U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017106788A (en) * | 2015-12-09 | 2017-06-15 | 三菱電機株式会社 | Reference element |
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