JPS6151542A - Optical system for particle analysis - Google Patents
Optical system for particle analysisInfo
- Publication number
- JPS6151542A JPS6151542A JP59174504A JP17450484A JPS6151542A JP S6151542 A JPS6151542 A JP S6151542A JP 59174504 A JP59174504 A JP 59174504A JP 17450484 A JP17450484 A JP 17450484A JP S6151542 A JPS6151542 A JP S6151542A
- Authority
- JP
- Japan
- Prior art keywords
- light
- optical system
- scattered
- particle analysis
- scattered light
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004458 analytical method Methods 0.000 title claims description 11
- 230000003287 optical effect Effects 0.000 title claims description 11
- 239000002245 particle Substances 0.000 title claims description 10
- 238000005375 photometry Methods 0.000 abstract description 3
- 239000000203 mixture Substances 0.000 abstract 1
- 210000004027 cell Anatomy 0.000 description 6
- 238000010586 diagram Methods 0.000 description 4
- 238000005259 measurement Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 241001446276 Helia <angisperm> Species 0.000 description 1
- 210000000601 blood cell Anatomy 0.000 description 1
- 239000006285 cell suspension Substances 0.000 description 1
- 230000000093 cytochemical effect Effects 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
Abstract
Description
【発明の詳細な説明】
[産業上の利用分野]
本発明は、フローサイトメータ等に用いられ、フローセ
ル流通部のエツジの影響を除去した粒子解析用光学系に
関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to an optical system for particle analysis that is used in flow cytometers and the like and eliminates the effects of edges in the flow cell flow section.
[従来の技術]
フローサイトメータとは、高速で流れる細胞浮遊溶液に
例えばレーザー光を照射し、その散乱光による光電信号
を検出し細胞の性質・構造を解明する装置であり、細胞
化学、免疫学、血液学、腫瘍学、遺伝学等の分野で使用
されている。[Prior art] A flow cytometer is a device that elucidates the properties and structure of cells by irradiating, for example, laser light onto a cell suspension solution flowing at high speed and detecting photoelectric signals from the scattered light. It is used in fields such as medicine, hematology, oncology, and genetics.
このフローサイトメータに用いられる従来の粒子解析用
光学系では、第1図に示すようにフローセル1の中央部
の例えば701LmX20gmの微小な矩形断面を有す
る流通部2内を、シース液に包まれて通過する血球細胞
などの検体Sに、図示しないレーザー光源からの照射光
りをレンズ3を介して集光し、照射光りの直進方向の前
方散乱光をレンズ4により7バーチヤ5を経て光電検出
器6上に集光し、主として検体Sの大きさの情報を得る
ことができる。開口を有するアパーチャ5は検体Sの散
乱光を71111定する際に、流通部2の周辺から到来
する不必要な光が、測定精度に影響を与えることを防止
するために、レンズ4を介して検体Sとほぼ共役な位置
に設置している。また図示は省略しているが、ト述の前
方If&乱光の測定以外に、必要に応じて側方散乱光を
411定して検体Sの背部情報を検出したり、蛍光標識
を施した検体をへリアフィルタを用いて側方から検出し
、細胞化学的な解析を行う場合もある。In the conventional optical system for particle analysis used in this flow cytometer, as shown in FIG. Irradiation light from a laser light source (not shown) is focused on the passing specimen S such as blood cells through a lens 3, and forward scattered light in the straight direction of the irradiation light is transmitted through a lens 4 to a photoelectric detector 6 via a 7-barrier 5. By concentrating light on the sample S, information mainly on the size of the specimen S can be obtained. An aperture 5 having an opening is configured to pass through a lens 4 in order to prevent unnecessary light arriving from the vicinity of the flow section 2 from affecting measurement accuracy when determining the scattered light of the specimen S. It is installed at a position that is almost conjugate to the specimen S. Although not shown in the diagram, in addition to measuring the forward If and scattered light as described above, side scattered light may be determined as necessary to detect information on the back of the specimen S, or for specimens with fluorescent labels. In some cases, it is detected from the side using a helia filter and cytochemical analysis is performed.
ところで、レーザー光から成る照射光りは流通部2の位
tで、第2図に示すように流通部2の周辺部の大きさよ
りも大き目、に集光させているが、これは検体Sが成る
程度照射光りの光軸と直交する方向に移動しても、測定
精度に大きな影響を及ぼさないようにするためである。By the way, the irradiation light consisting of a laser beam is focused at the size of the distribution section 2, which is larger than the size of the peripheral area of the distribution section 2, as shown in Fig. 2, but this is because the specimen S consists of This is to prevent measurement accuracy from being significantly affected even if the light is moved in a direction perpendicular to the optical axis of the irradiation light.
しかし、このように照射光りを流通部2の大きさよりも
太き目に集光すると i退部2の各エツジ2a、2b。However, if the irradiation light is focused on a part wider than the size of the circulation part 2 in this way, each of the edges 2a and 2b of the retreat part 2.
2c、2dで散乱光を生じ、これを除去することはアパ
ーチャ5によっても不可能であり、各エツジ2a〜2d
による散乱光が測定精度に及ぼす影響を無視することが
できない。2c and 2d, which cannot be removed even by the aperture 5, and each edge 2a to 2d
The influence of scattered light on measurement accuracy cannot be ignored.
[発明の目的]
本発明の目的は、このような従来の粒子解析用光学系の
欠点を除去し、流通部の各エツジによる散乱光を遮断す
る光遮蔽体を設けることにより+111定精度に及ぼす
影響を除去することが可能な粒子解析用光学系を提供す
ることにある。[Object of the Invention] The object of the present invention is to eliminate the drawbacks of the conventional optical system for particle analysis, and to improve the +111 constant accuracy by providing a light shielding body that blocks the scattered light from each edge of the flow section. An object of the present invention is to provide an optical system for particle analysis that can eliminate the influence.
[発明の概要] 上述の目的を達成するための本発明の要旨は。[Summary of the invention] The gist of the present invention is to achieve the above objects.
検体を流すための流通部を有するフローセルと、光源か
らの照射光の前記検体により直進方向に散乱された光を
測光するための集光レンズ及び光電検出器と、前記流通
部のエツジで散乱される光を取り除くために前記集光レ
ンズに関して前記エツジと共役な位置に設置した光遮蔽
体とを具備することを特徴とする粒子解析用光学系であ
る。a flow cell having a flow section for flowing a sample; a condenser lens and a photoelectric detector for measuring light emitted from a light source that is scattered in a straight direction by the sample; This optical system for particle analysis is characterized in that it includes a light shielding member installed at a position conjugate with the edge of the condensing lens in order to remove the light generated by the condenser lens.
[発明の実施例]
本発明を第3因に図示の実施例に基づいて詳細に説明す
る。なお、第1図と同一の符号は同一の部材、部位を示
している。[Embodiments of the Invention] The present invention will be described in detail based on the illustrated embodiments based on the third factor. Note that the same reference numerals as in FIG. 1 indicate the same members and parts.
検体Sを流す流通部2を持つフローセル1の一方側から
照射光りを入射させ、照射光の直進方向の前方散乱光を
測光する位置に集光レンズ4、アパーチャ5、光電検出
器6を設置することは第1図の従来例と同様である。Irradiation light is input from one side of a flow cell 1 having a flow section 2 through which a sample S flows, and a condenser lens 4, an aperture 5, and a photoelectric detector 6 are installed at positions where forward scattered light in the straight direction of the irradiation light is measured. This is the same as the conventional example shown in FIG.
集光レンズ4と光電検出器6の間には、4木の例えば幅
数10川mの帯状の光遮蔽体7a。Between the condensing lens 4 and the photoelectric detector 6, there is a light shielding body 7a in the form of a four-band strip, for example, several tens of meters wide.
7b、7c、7dが配置されている。これらの光遮蔽体
7aは流通部2のエツジ2aと、7bは2bと、7Cは
2cと、7dは2dとそれぞれ共役な位置において、各
エツジ2a〜2dの向きと平行に、つまり紙面に垂直な
方向に設置されている。7b, 7c, and 7d are arranged. These light shielding bodies 7a are arranged parallel to the direction of each of the edges 2a to 2d, that is, perpendicular to the plane of the paper, at positions that are conjugate with edges 2a, 7b with 2b, 7C with 2c, and 7d with 2d of the flow section 2, respectively. It is installed in the same direction.
レンズ3によって検体Sに集光された照射光は、検体S
により散乱され、この散乱光はレンズ4により光電変換
器6に集光される。ここで、流通部2の各エツジ2a〜
2dからの各散乱光は。The irradiation light focused on the specimen S by the lens 3 is
The scattered light is focused by the lens 4 onto the photoelectric converter 6. Here, each edge 2a~ of the distribution section 2
Each scattered light from 2d is.
それぞれ光遮蔽体7a〜7bにより除去され、更にアパ
ーチャ5によって流通部2の周辺からの光が除去され、
検体Sによるlik乱光のみが光電検出器6で受光され
測定される。The light is removed by the light shields 7a to 7b, respectively, and the aperture 5 removes light from the periphery of the flow section 2,
Only the lik scattered light caused by the sample S is received by the photoelectric detector 6 and measured.
[発明の効果]
このように本発明に係る粒子解析用光学系は、角型の流
通部を有するフローセルを用いた場合に、これら各エツ
ジからのnti乱光を集光レンズを介して各エツジと共
役な位置に光′g蔽体を設置することにより取り除き、
不必要な情報が混在しない高精度の測光を可能にするも
のである。[Effects of the Invention] As described above, the optical system for particle analysis according to the present invention, when using a flow cell having a rectangular flow section, collects nti scattered light from each of these edges through a condensing lens. It is removed by installing a light shield at a position conjugate to
This enables highly accurate photometry without unnecessary information being mixed in.
第1図は従来装置の構成図、第2図は照射光と流通部の
関係の説明図、第3図は本発明に係る粒子解析用光学系
の一実施例を示す要部構成図である。
符号lはフローセル、2は流通部、2a〜2dはエツジ
、3.4はレンズ、5はアパーチャ、6は光電検出器、
7a〜7dは光遮蔽体、Sは検体である。FIG. 1 is a configuration diagram of a conventional device, FIG. 2 is an explanatory diagram of the relationship between irradiation light and a flow section, and FIG. 3 is a configuration diagram of main parts showing an embodiment of an optical system for particle analysis according to the present invention. . Symbol l is a flow cell, 2 is a flow section, 2a to 2d are edges, 3.4 is a lens, 5 is an aperture, 6 is a photoelectric detector,
7a to 7d are light shields, and S is a specimen.
Claims (1)
源からの照射光の前記検体により直進方向に散乱された
光を測光するための集光レンズ及び光電検出器と、前記
流通部のエッジで散乱される光を取り除くために前記集
光レンズに関して前記エッジと共役な位置に設置した光
遮蔽体とを具備することを特徴とする粒子解析用光学系
。 2、前記光遮蔽体は帯状の形状とした特許請求の範囲第
1項に記載の粒子解析用光学系。[Scope of Claims] 1. A flow cell having a flow section for flowing a sample, a condensing lens and a photoelectric detector for photometrically measuring light emitted from a light source that is scattered in a straight direction by the sample; An optical system for particle analysis, comprising: a light shielding member installed at a position conjugate with the edge of the condenser lens in order to remove light scattered at the edge of the flow section. 2. The optical system for particle analysis according to claim 1, wherein the light shield has a band-like shape.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59174504A JPS6151542A (en) | 1984-08-22 | 1984-08-22 | Optical system for particle analysis |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59174504A JPS6151542A (en) | 1984-08-22 | 1984-08-22 | Optical system for particle analysis |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6151542A true JPS6151542A (en) | 1986-03-14 |
Family
ID=15979655
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59174504A Pending JPS6151542A (en) | 1984-08-22 | 1984-08-22 | Optical system for particle analysis |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6151542A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9261447B2 (en) | 2010-03-05 | 2016-02-16 | Pcme Limited | Apparatus and method for monitoring particles in a stack |
-
1984
- 1984-08-22 JP JP59174504A patent/JPS6151542A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9261447B2 (en) | 2010-03-05 | 2016-02-16 | Pcme Limited | Apparatus and method for monitoring particles in a stack |
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