JPS631952A - Particle analyser - Google Patents

Particle analyser

Info

Publication number
JPS631952A
JPS631952A JP61144433A JP14443386A JPS631952A JP S631952 A JPS631952 A JP S631952A JP 61144433 A JP61144433 A JP 61144433A JP 14443386 A JP14443386 A JP 14443386A JP S631952 A JPS631952 A JP S631952A
Authority
JP
Japan
Prior art keywords
scanning
particle
particles
inspected
stopper
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP61144433A
Other languages
Japanese (ja)
Inventor
Yuji Ito
勇二 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP61144433A priority Critical patent/JPS631952A/en
Publication of JPS631952A publication Critical patent/JPS631952A/en
Pending legal-status Critical Current

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  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

PURPOSE:To accurately analyze a particle to be inspected, by scanning the particle to be inspected in the direction crossing the flow of the particle at a right angle by a beam scanning apparatus and detecting scanning beam by a beam receiving element. CONSTITUTION:The laser beam L from a laser beam source 1 is incident to an acoustooptical element 3 and zero order beam advances straightly to be cut by a stopper 8. Then, a modulation signal is applied to the element 3 to scan the laser beam L, for example, at an angle theta and the scanning beam is allowed to irradiate the particles S to be inspected flowing through the flow part 1a of a flow cell 5 by an image forming lens 4. When the angle theta is selected by scanning the beam L so that the position of the particles S is necessarily detected even when said particle moves in the scanning direction, an irradiation condition becomes same. Since a stopper 5 is formed into a long shape in the scanning direction, the direct beam in the scanning direction can be cut. The beam scattered by the particles S is shifted from the stopper 5 to be incident to a beam detector 7 by a condensing lens 6. Said forward scattering beam generally imparts the size information of the particle to be inspected on a basis of a Nie scattering theory.

Description

【発明の詳細な説明】 「産業上の利用分野] 本発明は、フローサイトメータ等において、高速流体中
に浮遊する被検粒子に走査光を照則し、被検粒子による
散乱光を検出することにより、被検粒子の大きさを計測
する粒子解析装置に関するものである。
[Detailed Description of the Invention] "Industrial Application Field" The present invention is a flow cytometer, etc., in which scanning light is directed at test particles suspended in a high-speed fluid and light scattered by the test particles is detected. In particular, the present invention relates to a particle analysis device that measures the size of particles to be detected.

[従来の技術] フローサイトメータ等に用いられる従来の粒子解析装置
では、フローセルの中央部の例えば200ルmX 20
0 JLmの微少な断面を有する流通部内を、シース液
に包まれて通過する被検粒子に照射光を照射し、その結
果生ずる前方及び側方散乱光により、被検粒子の形状・
大きさ争屈折率等の粒子的性質を得ることが可能である
[Prior Art] In a conventional particle analysis device used in a flow cytometer or the like, a particle size of, for example, 200 m x 20
Irradiation light is irradiated onto the test particles passing through the flow section with a minute cross section of 0 JLm while being wrapped in sheath liquid, and the resulting forward and side scattered light is used to determine the shape and shape of the test particles.
It is possible to obtain particle-like properties such as size conflict refractive index.

従来、この種の装置は固定された光ビームを、流体中を
流れる被検粒子が横切ることによる前方散乱光を検出す
ることによって、被検粒子のサイズを測定している。し
かし、被検粒子が流体中を流れる位置が相対的に光ビー
ムの強度分Inとずれと被検粒子に当たる光量が変化す
るので、散乱光強度は一定にならない。シースフローJ
J:を採用スることにより、この欠点は相当に補うこと
ができるが、流れの中心と光ビームの強度分布の中心を
予め正確に合わせておく操作が不可欠である。
Conventionally, this type of device measures the size of a sample particle by detecting forward scattered light caused by a fixed light beam traversing the sample particle flowing in a fluid. However, the intensity of the scattered light is not constant because the position where the particles to be inspected flow through the fluid is relatively shifted from the intensity In of the light beam and the amount of light hitting the particles to be inspected changes. sheath flow J
By adopting J:, this drawback can be compensated to a considerable extent, but it is essential to accurately align the center of the flow with the center of the intensity distribution of the light beam in advance.

[発明の目的] 本発明の目的は、被検粒子を光ビームで走査することに
より、その前方散乱光を検出し、被検粒子の形状を決定
する粒子解析装置を提供することにある。
[Object of the Invention] An object of the present invention is to provide a particle analysis device that scans a test particle with a light beam, detects the forward scattered light, and determines the shape of the test particle.

[発明の概要] 上述の目的を達成するための本発明の要旨は、流体中を
流れる被検粒子に対して、光源から光を照射し被検粒子
の形状を測定する装置において、光走査手段により被検
粒子を流れと直交する方向に走査し受光素子により検出
することを特徴とする粒子解析装置である。
[Summary of the Invention] The gist of the present invention for achieving the above-mentioned object is to provide an apparatus for measuring the shape of particles to be inspected by irradiating light from a light source to particles to be inspected flowing in a fluid. This particle analysis device is characterized in that particles to be detected are scanned in a direction perpendicular to the flow and detected by a light receiving element.

[発明の実施例] 本発明を図示の実施例に基づいて詳細に説明する。[Embodiments of the invention] The present invention will be explained in detail based on illustrated embodiments.

第1図において、1はフローセルであり、図面と垂直方
向に設けられた流通部1aには被検粒子を含むサンプル
が流されている。この流通部1aには、レーザ光源2か
らのレーザービームLが音響光学素子3、結像レンズ4
を介して入射されるようになっている。また、入射ビー
ムの反対側にはストッパ5、集光レンズ6、光検出器7
が配置されている。そして、第2図に示すようにストッ
パ5の形状は集光レンズ6に対して中心部を横切る帯状
とされている。なお、音響光学素子3の背後のレーザー
ビームLの直進方向にはストッパ8が設けられている。
In FIG. 1, reference numeral 1 denotes a flow cell, and a sample containing test particles is flowed through a flow section 1a provided in a direction perpendicular to the drawing. In this circulation part 1a, a laser beam L from a laser light source 2 passes through an acousto-optic element 3 and an imaging lens 4.
It is designed to be incident through the Also, on the opposite side of the incident beam, a stopper 5, a condensing lens 6, and a photodetector 7 are provided.
is located. As shown in FIG. 2, the shape of the stopper 5 is a strip that crosses the center of the condenser lens 6. Note that a stopper 8 is provided behind the acousto-optic element 3 in the straight direction of the laser beam L.

レーザー光源1からのレーザービームLは音響光学素子
3に入射し、零次光は直進しストッパ8でカットされる
。音響光学素子3へ変調信号を付加することにより、レ
ーザービームLは図示のように走査角θで走査される。
A laser beam L from a laser light source 1 enters an acousto-optic element 3, and zero-order light travels straight and is cut by a stopper 8. By adding a modulation signal to the acousto-optic element 3, the laser beam L is scanned at a scanning angle θ as shown.

これを結像レンズ4でフローセル5の流通部1aを流れ
る被検粒子Sへ照射する。レーザービームLを走査する
ことにより、被検粒子Sの位置が走査方向に移動してい
ても、必ず検出されるように走査角θを選定しておけば
照射条件は同じとなる。ストッパ5は走査方向に長い形
状とされているので、走査方向の直接光をカットするこ
とができる。
This is irradiated by the imaging lens 4 onto the test particles S flowing through the flow section 1a of the flow cell 5. By scanning the laser beam L, even if the position of the particle S to be inspected moves in the scanning direction, the irradiation conditions remain the same if the scanning angle θ is selected so that it is always detected. Since the stopper 5 has a long shape in the scanning direction, it can cut direct light in the scanning direction.

被検粒子Sで散乱された光は、ストッパ5から外れて集
光レンズ6で光検出器7に入射する。前方散乱光は一般
的にHie散乱の理論により被検粒子Sの大きさを反映
するので、被検粒子Sの大きさの情報を得ることができ
る。
The light scattered by the test particles S leaves the stopper 5 and enters the photodetector 7 through the condensing lens 6. Since the forward scattered light generally reflects the size of the test particle S according to the theory of Hie scattering, information on the size of the test particle S can be obtained.

音響光学素子3による走査角θは、レーザーど−ムLが
流通部1aのエツジ部に当たらない程度にすることが望
ましい0図示はしていないが、前方散乱光検出方向とほ
ぼ90″異なる方向にも集光光学系を配して、被検粒子
Sの側方散乱、蛍光を測光する手段も従来の粒子解析装
置と同様に可能である。レーザービームLを音響光学素
子3に入射させるとき、その間にビームのサイズを変え
るためのビームサイズ変更用のレンズ系を挿入しっても
よい。
It is preferable that the scanning angle θ by the acousto-optic element 3 is set to such an extent that the laser beam L does not hit the edge of the flow section 1a. Although not shown, it is set in a direction approximately 90" different from the forward scattered light detection direction. Similarly to conventional particle analysis devices, it is also possible to arrange a condensing optical system in the particle analyzer and measure the side scattering and fluorescence of the particles S to be examined.When the laser beam L is made incident on the acousto-optic element 3 , a beam size changing lens system may be inserted between them to change the beam size.

なお、結像レンズ4の焦点位置を音響光学系3のビーム
出射点とすることにより、結像レンズ4と集光レンズ6
との間をテレセントリック光学系とし、被検粒子Sに平
行光を照射し測定条件の安定化を図ることが望ましい。
Note that by setting the focal position of the imaging lens 4 as the beam exit point of the acousto-optic system 3, the imaging lens 4 and the condensing lens 6
It is desirable to use a telecentric optical system between the two and irradiate parallel light onto the particles S to be measured to stabilize the measurement conditions.

[発明の効果] 以上説明したように本発明に係る粒子解析装置は、ビー
ムを走査しながら被検粒子に照射することによって、被
検粒子の流れ中での位置がばらついていても、例えばピ
ークをエリアを検出することにより被検粒子の正確な解
析が可能となり、照射光の強度中心とサンプル流の中心
の合軸精度が高くなり、従来の方法に比較して測定に及
ぼす影響が軽減される。
[Effects of the Invention] As explained above, the particle analysis device according to the present invention irradiates the test particles with a beam while scanning, so that even if the positions of the test particles in the flow vary, for example, the peak By detecting the area, accurate analysis of the particles under test is possible, and the alignment accuracy of the center of intensity of the irradiation light and the center of the sample flow is increased, reducing the influence on measurements compared to conventional methods. Ru.

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本発明に係る粒子解析装置の一実施例を示し、第
1図はその構成図、第2図は集光レンズとストッパの関
係の説明図である。 符号1はフローセル、laは流通部、2はレーザー光源
、3は音響光学素子、4は結像レンズ、5はストッパ、
6は集光レンズ、7は光検出器である。
The drawings show an embodiment of the particle analysis device according to the present invention, with FIG. 1 being a configuration diagram thereof, and FIG. 2 being an explanatory diagram of the relationship between a condenser lens and a stopper. Reference numeral 1 is a flow cell, la is a flow section, 2 is a laser light source, 3 is an acousto-optic element, 4 is an imaging lens, 5 is a stopper,
6 is a condensing lens, and 7 is a photodetector.

Claims (1)

【特許請求の範囲】 1、流体中を流れる被検粒子に対して、光源から光を照
射し被検粒子の形状を測定する装置において、光走査手
段により被検粒子を流れと直交する方向に走査し受光素
子により検出することを特徴とする粒子解析装置。 2、前記光源はレーザー光源とした特許請求の範囲第1
項に記載の粒子解析装置。 3、前記光走査手段は音響光学偏向素子とした特許請求
の範囲第1項に記載の粒子解析装置。 4、前記受光素子の前方に光走査方向に長辺を持つスト
ッパを設けた特許請求の範囲第1項に記載の粒子解析装
置。
[Claims] 1. In an apparatus for measuring the shape of particles to be detected by irradiating light from a light source to the particles to be detected flowing in a fluid, the particles to be detected are moved in a direction perpendicular to the flow using a light scanning means. A particle analysis device characterized by scanning and detection using a light receiving element. 2. Claim 1, wherein the light source is a laser light source
Particle analysis device described in section. 3. The particle analysis device according to claim 1, wherein the optical scanning means is an acousto-optic deflection element. 4. The particle analysis device according to claim 1, further comprising a stopper having a long side in the optical scanning direction in front of the light receiving element.
JP61144433A 1986-06-20 1986-06-20 Particle analyser Pending JPS631952A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61144433A JPS631952A (en) 1986-06-20 1986-06-20 Particle analyser

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61144433A JPS631952A (en) 1986-06-20 1986-06-20 Particle analyser

Publications (1)

Publication Number Publication Date
JPS631952A true JPS631952A (en) 1988-01-06

Family

ID=15362086

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61144433A Pending JPS631952A (en) 1986-06-20 1986-06-20 Particle analyser

Country Status (1)

Country Link
JP (1) JPS631952A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4215908A1 (en) * 1992-05-14 1993-11-18 Ubbo Prof Dr Ricklefs Optical particle size measurement appts. e.g. for clean room - periodically modulates light incident on measuring vol. e.g by varying light source power or using grating, acoustic=optic modulator or hologram, and detects scattered light.
JP2010515055A (en) * 2006-12-29 2010-05-06 アボット・ラボラトリーズ Method and apparatus for rapidly counting and identifying suspended particles by scanning
WO2010090279A1 (en) 2009-02-06 2010-08-12 株式会社オンチップ・バイオテクノロジーズ Disposable chip-type flow cell and flow cytometer using same
JP2011503551A (en) * 2007-11-05 2011-01-27 アボット・ラボラトリーズ Method and apparatus for rapidly counting and identifying biological particles in a stream

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4215908A1 (en) * 1992-05-14 1993-11-18 Ubbo Prof Dr Ricklefs Optical particle size measurement appts. e.g. for clean room - periodically modulates light incident on measuring vol. e.g by varying light source power or using grating, acoustic=optic modulator or hologram, and detects scattered light.
JP2010515055A (en) * 2006-12-29 2010-05-06 アボット・ラボラトリーズ Method and apparatus for rapidly counting and identifying suspended particles by scanning
JP2011503551A (en) * 2007-11-05 2011-01-27 アボット・ラボラトリーズ Method and apparatus for rapidly counting and identifying biological particles in a stream
WO2010090279A1 (en) 2009-02-06 2010-08-12 株式会社オンチップ・バイオテクノロジーズ Disposable chip-type flow cell and flow cytometer using same
US8951474B2 (en) 2009-02-06 2015-02-10 On-Chip Biotechnologies Co., Ltd. Disposable chip-type flow cell and flow cytometer using same
US9945769B2 (en) 2009-02-06 2018-04-17 On-Chip Biotechnologies Co., Ltd. Disposable chip-type flow cell and flow cytometer using same
EP3907488A1 (en) 2009-02-06 2021-11-10 On-chip Biotechnologies Co., Ltd. Disposable chip-type flow cell and flow cytometer using same

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