JPS6147097A - Electroluminescent element - Google Patents

Electroluminescent element

Info

Publication number
JPS6147097A
JPS6147097A JP59167483A JP16748384A JPS6147097A JP S6147097 A JPS6147097 A JP S6147097A JP 59167483 A JP59167483 A JP 59167483A JP 16748384 A JP16748384 A JP 16748384A JP S6147097 A JPS6147097 A JP S6147097A
Authority
JP
Japan
Prior art keywords
light
layer
insulating layer
emitting layer
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP59167483A
Other languages
Japanese (ja)
Inventor
雅康 石子
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP59167483A priority Critical patent/JPS6147097A/en
Publication of JPS6147097A publication Critical patent/JPS6147097A/en
Pending legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、発光層に交番電界を印加することにより発光
を呈する薄膜エレクトロルミネセンス素子(以下EL索
子と略記)K関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a thin film electroluminescent device (hereinafter abbreviated as EL device) that emits light by applying an alternating electric field to its light emitting layer.

〔従来の技術〕[Conventional technology]

代表的な薄膜EL索子である二重絶縁ffEL素子の基
本的断面構造を第3図に示す。図において、ガラス等の
基板1の上にITO等の透明電極2、第一絶縁層3、発
光Jf14、第2絶縁JVI5、背面電極6が順次積層
されている。各層は真空蒸着法、スパッタ法、プラズマ
あるいは光G■法、有機金目Gつ法あるいは原子層エピ
タキシャル法等により作製される。
FIG. 3 shows the basic cross-sectional structure of a double-insulated ffEL element, which is a typical thin film EL element. In the figure, a transparent electrode 2 such as ITO, a first insulating layer 3, a light emitting Jf 14, a second insulating JVI 5, and a back electrode 6 are sequentially laminated on a substrate 1 made of glass or the like. Each layer is produced by vacuum evaporation, sputtering, plasma or photonic method, organic gold method, atomic layer epitaxial method, or the like.

発光層4はZnSあるいはZn5e等の■−■化合物半
導体薄膜からなり、適当な発光中心を添加することによ
シ発光中心固有の電界発光が生じる。
The light-emitting layer 4 is made of a thin film of a compound semiconductor such as ZnS or Zn5e, and by adding a suitable luminescent center, electroluminescence peculiar to the luminescent center is generated.

発光中心として、例えば丘をドープした場合は黄橙色、
TbFst−ドープした場合は緑色、Sml゛、をドー
プした場合は赤色の電界発光を得ることができる。
For example, if a hill is doped as a luminescent center, it will be yellow-orange,
Green electroluminescence can be obtained when doped with TbFst, and red electroluminescence can be obtained when doped with Sml.

電界発光は発光層にlO@V/CR程度の高電界が印加
されることにより、電界加速された電子が発光中心を衝
突励起して生じていることが知られている。
It is known that electroluminescence occurs when a high electric field of about 1O@V/CR is applied to a light-emitting layer, and electrons accelerated by the field collide and excite a luminescent center.

このZn8 e Zn5e等の発光層4は高電圧印加時
、局所的に過大電流が流れ絶縁、破壊に至ることを防止
するとともに、湿気等による素子劣化を防止する目的の
ため−0,、A7.O,等のI18緑体3,5でサンド
イッチされた構造となっている。
The light emitting layer 4 made of Zn8 e Zn5e, etc. is used to prevent local excessive current from flowing when a high voltage is applied, leading to insulation and breakdown, as well as to prevent element deterioration due to moisture, etc. -0, A7. It has a sandwiched structure between I18 green bodies 3 and 5 such as O, etc.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

このような構造をもつ従来のEL素子によれば、電界発
光が生じるために、発光#4に10 V/c!IL程度
の電界が必要であるのに加え、印加電圧が発光層と絶縁
層とく分割されるので必然的に高電圧で駆動しなければ
ならなかった。このためにピンホール等欠陥がなく絶縁
破壊電界の高い絶縁層を形成し、EL索子に絶縁破壊が
全く生じないようにしなければならなかつた。更に高電
圧で駆動するために、駆動回路の低価格化や小型化が困
難であるという欠点も有していた。
According to a conventional EL element having such a structure, electroluminescence occurs, so that emission #4 has a voltage of 10 V/c! In addition to requiring an electric field comparable to IL, the applied voltage is divided between the light-emitting layer and the insulating layer, so it is necessary to drive at a high voltage. For this reason, it was necessary to form an insulating layer that is free from defects such as pinholes and has a high dielectric breakdown electric field, so that no dielectric breakdown occurs in the EL string. Furthermore, since it is driven at a high voltage, it has the disadvantage that it is difficult to reduce the cost and size of the drive circuit.

一方、第3図の構成をした従来のIL*子において、背
面電極6は抵抗金小さくするため普通AJ等の金属が使
用されている。絶縁層3,5および発光rf!14は可
視光に対して透明であるため、外部入射光が前琺1等や
背面電極で反射され、KL素子が見づらくなるとともに
、コントラストを悪くしているという欠点を有していた
On the other hand, in the conventional IL* element having the configuration shown in FIG. 3, metal such as AJ is usually used for the back electrode 6 in order to reduce the resistance. Insulating layers 3, 5 and light emitting rf! 14 is transparent to visible light, it has the disadvantage that externally incident light is reflected by the front panel 1 and the back electrode, making it difficult to see the KL element and worsening the contrast.

そこで、本発明社以上の如き事情を考慮してなされたも
のであり、従来のEL素子に比べ低電圧で発光を呈し、
かつ表示品質の高いEL索子を提供すること金目的とし
ている。
Therefore, the present invention was made in consideration of the above circumstances, and it emits light at a lower voltage than conventional EL elements,
The objective is to provide an EL element with high display quality.

〔問題点を解決するだめの手段〕[Failure to solve the problem]

本発明は、一対の電極間にサンドインチ状に挾まれた発
光層を有し、かつ少なくとも一方の電極と発光層の間に
順次薄い絶縁体、半導体および絶縁体を順次積層してな
る複合膜を介在させたことを特徴とするEL素子である
The present invention provides a composite film comprising a light-emitting layer sandwiched between a pair of electrodes in a sandwich-like manner, and a thin insulator, a semiconductor, and an insulator successively laminated between at least one electrode and the light-emitting layer. This is an EL element characterized by intervening.

第1図は本発明の基本的断面構成を表わす図である。第
1図において、ガラス等透光性基板21上に透明電極2
2、第149縁層23を順次真空蒸着法、スパッタ法あ
るいはCVD法等によ膜形成し、続いてZ n S p
 Z n 8 eあるいはZn5xSe l−x等と発
光中心物質、例えば廊を同時に真空蒸着あるいはスノ(
ツタ法で発光71124を形成する。しかるのちに、プ
ラズマ(2)法、反応性スパッタ法あるいはイオンブレ
ーティング法などによシ、薄い中間絶縁層25、半導体
層、第3絶縁層dを発光層別上に形成し、最後にAJ等
の金IF4電極28を真空蒸着したのち防湿膜29で被
覆してEL素子を完成する。この背面電極28と前記透
明電極ηとの間に交番電圧を印加することにより電界発
光を呈する。
FIG. 1 is a diagram showing the basic cross-sectional configuration of the present invention. In FIG. 1, a transparent electrode 2 is placed on a transparent substrate 21 such as glass.
2. The 149th edge layer 23 is sequentially formed by vacuum evaporation, sputtering, CVD, etc., and then Z n S p
Zn 8 e or Zn 5
A light emitting 71124 is formed using the ivy method. Thereafter, a thin intermediate insulating layer 25, a semiconductor layer, and a third insulating layer d are formed on the light-emitting layer by plasma (2) method, reactive sputtering method, ion blating method, etc., and finally AJ After vacuum-depositing a gold IF4 electrode 28 such as the above, it is covered with a moisture-proof film 29 to complete the EL element. By applying an alternating voltage between this back electrode 28 and the transparent electrode η, electroluminescence is exhibited.

本発明の特徴は、薄い中間絶縁層25と半導体層26を
、従来のEL素子の発光層−絶縁体界面に挿入すること
により、発光輝度の低下がほとんどなく、低電圧で発光
を呈するEL素子が作製できるようになったことである
。この原因として、半導体層で生成、加速された電子が
発光層に注入されるため、低電圧より発光が生じるが、
中間絶縁層を入れることで発光層−半導体界面にエネル
ギーバリアーを形成し、高いエネルギーを有する電子だ
けを半導体層側よシ発光層側へ有効に注入できるように
なったと考えられる。従って、従来素子と同程度の発光
効率と輝度が低電圧で得ることができる・ 絶縁層はa−8ixNi−x:Hの他、a−8ix(’
l−x:Hやa−8iOx:Hあるいは積層した膜を使
用しても同様な効果を得ることができる。本発明のもう
一つの特徴は、前記半導体層がバンドギャップが1.7
〜1.9eVであるため、外部入射光を充分に吸収し、
EL素子面からの反射が減少し、コントラストが上がる
ことで゛ある・ 以下に本発明の実施例を示す。
A feature of the present invention is that by inserting a thin intermediate insulating layer 25 and a semiconductor layer 26 into the light emitting layer-insulator interface of a conventional EL element, an EL element that emits light at a low voltage with almost no reduction in luminance. can now be produced. The reason for this is that electrons generated and accelerated in the semiconductor layer are injected into the light emitting layer, which causes light emission at low voltage.
It is believed that the inclusion of the intermediate insulating layer forms an energy barrier at the light-emitting layer-semiconductor interface, making it possible to effectively inject only high-energy electrons from the semiconductor layer side to the light-emitting layer side. Therefore, luminous efficiency and brightness comparable to those of conventional elements can be obtained at low voltage.In addition to a-8ixNi-x:H, the insulating layer is made of a-8ix('
A similar effect can be obtained by using l-x:H, a-8iOx:H, or a stacked film. Another feature of the present invention is that the semiconductor layer has a band gap of 1.7.
~1.9eV, so it can sufficiently absorb external incident light,
The reflection from the EL element surface is reduced and the contrast is increased. Examples of the present invention are shown below.

〔実施例1〕 第1図において、ガラス基板21上にITO等の透明電
極72を真空蒸着法で2000人程度堆積し、続いてr
、fスパッタ法でBaTi0sJilを300OA堆積
し、第一絶縁Ff123を形成する。基板温度200℃
でZnSおよびMnを共蒸着法で5000人堆積し、真
空中で550℃2時間の熱処理をおこなう。しかるのち
にプラズマCVD法でa−8ixNl−x:Hを50〜
150 A形成し、薄い中間絶縁層部とする。このa−
8ixN1−x:H形成はN、、NH,およびSiH,
ガス金使用するが、次のa−8i:Hの半導体層26は
Ns −NHsの導入を停止し、5IH4ガスだけで2
000人の膜厚を形成する・第3絶縁層27は再びN、
、Nu、ガスを導入しa−8ixNl−x:Hを200
0人形成する。最後にAJを真空蒸着をして、背面電極
四を形成する。a−8ixN1−x:Hおよびa−8i
:H膜は非常に緻密な膜であることが知られており、剥
離や輝度低下等、発光層に湿気が侵入することによシ生
ずる劣化を防ぐ効果が高い・更にa−8tボ1−x:H
e a−8i :1(t a−8xxNl−x:Hを順
次積層した複合膜は、ガス組成をプロセスの中断なしに
連続的に変化させることが容易である。このため、ゴミ
、ホコリ等の侵入が非常に少なく、絶縁破壊をひきおこ
す欠陥を充分小さくおさえることが可能となった。
[Example 1] In FIG. 1, about 2000 transparent electrodes 72 such as ITO are deposited on a glass substrate 21 by vacuum evaporation, and then
, 300 OA of BaTi0sJil is deposited by f sputtering method to form a first insulating film Ff123. Substrate temperature 200℃
5,000 layers of ZnS and Mn were deposited by co-evaporation, and heat treated at 550° C. for 2 hours in vacuum. After that, a-8ixNl-x:H was converted to 50 to 50% by plasma CVD method.
150 A to form a thin intermediate insulating layer. This a-
8ixN1-x: H formation is N, NH, and SiH,
Gas gold is used, but for the next a-8i:H semiconductor layer 26, the introduction of Ns-NHs is stopped and only 5IH4 gas is used.
The third insulating layer 27 is again made of N,
, Nu, gas was introduced and a-8ixNl-x:H was 200
Form 0 people. Finally, AJ is vacuum deposited to form the back electrode 4. a-8ixN1-x:H and a-8i
:H film is known to be a very dense film, and is highly effective in preventing deterioration caused by moisture intrusion into the light emitting layer, such as peeling and reduction in brightness. x:H
e a-8i:1(t a-8xxNl-x:H) The composite film made by sequentially laminating the gas composition can easily change the gas composition continuously without interrupting the process.For this reason, dirt, dust, etc. There is very little penetration, making it possible to keep defects that can cause dielectric breakdown to a sufficiently small size.

〔実施例2〕 第2図は本発明の他の実施例を示す構成図である0図に
おいて、ガラス基板31上に、透明電極32、発光層3
3、中間絶縁層34、半導体層35、第3絶縁WI36
および背面金属電極37t−前実施例と同一の条件で順
に積層形成したものである。
[Embodiment 2] FIG. 2 is a block diagram showing another embodiment of the present invention. In FIG.
3. Intermediate insulating layer 34, semiconductor layer 35, third insulating WI36
and back metal electrode 37t - were formed in this order by laminating them under the same conditions as in the previous embodiment.

本実施例では前実施例に用いた第−絶縁層器を除去した
構成となっている。第一絶縁層を除去したことによって
、発光輝度はおよそ3割程度減少するものの、発光開始
電圧を大巾に低下させることが可能となった。
This embodiment has a configuration in which the first insulating layer used in the previous embodiment is removed. By removing the first insulating layer, although the luminance decreased by about 30%, it became possible to significantly lower the luminescence starting voltage.

〔発明の効果〕〔Effect of the invention〕

Lメ上述べたようK、本発明のEL水素子よれば、従来
素子にくらぺ低電圧で充分発光を呈し、更に絶縁破壊が
非常に少ないため、長寿命の素子を提供できる。このた
め、駆動回路の小壓化が可能となシ、コンパクトな平屋
ディスプレイが供給でき、従来のELg子に比ベコント
ラスト比が高い表示品質のすぐれたEL水素子提供でき
る効果を有するものである。
As mentioned above, the EL hydrogen element of the present invention emits sufficient light at a lower voltage than conventional elements, and further has very little dielectric breakdown, so it is possible to provide an element with a long life. Therefore, it is possible to downsize the drive circuit, provide a compact one-story display, and provide an EL element with excellent display quality and a high contrast ratio compared to conventional EL elements. .

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例を示すEL水素子断面図、第
2図は本発明の他の実施例を示すEL水素子断面図、第
3図は二重絶縁構造をした従来のEL水素子断面図であ
る。 21・・・ガラス基板、22:・・透明電極、詔・・・
第1絶縁層、ス・・・発光層、筋・・・中間絶縁層、2
6・・・半導体層、が・・・第3絶縁層、お・・・背面
金員電極、31・・・ガラス基板、32・・・透明電極
、お・・・発光層、34・・・中間絶縁層、35・・・
半導体層、36・・・第3絶#1層、37・・・背面金
属電極
FIG. 1 is a cross-sectional view of an EL hydrogen device showing one embodiment of the present invention, FIG. 2 is a cross-sectional view of an EL hydrogen device showing another embodiment of the present invention, and FIG. 3 is a conventional EL hydrogen device with a double insulation structure. It is a sectional view of a hydrogen element. 21: Glass substrate, 22: Transparent electrode, imperial order...
First insulating layer, stripe...light emitting layer, stripe...intermediate insulating layer, 2
6... Semiconductor layer,... Third insulating layer, O... Back metal electrode, 31... Glass substrate, 32... Transparent electrode, O... Light emitting layer, 34... Intermediate insulating layer, 35...
Semiconductor layer, 36...Third isolation #1 layer, 37... Back metal electrode

Claims (1)

【特許請求の範囲】[Claims]  (1)少なくとも一方が透明電極で構成された一対の
電極間にサンドイツチ状に挾まれた発光層と、該発光層
と前記電極のうち、少なくとも一方の電極との間に薄い
中間絶縁層、半導体層、絶縁層を順次積層した複合膜を
介在させたことを特徴とするエレクトロルミネセンス素
子。
(1) A light-emitting layer sandwiched between a pair of electrodes, at least one of which is a transparent electrode, in the shape of a sandwich, and a thin intermediate insulating layer and a semiconductor between the light-emitting layer and at least one of the electrodes. An electroluminescent device characterized by interposing a composite film in which layers and insulating layers are sequentially laminated.
JP59167483A 1984-08-10 1984-08-10 Electroluminescent element Pending JPS6147097A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59167483A JPS6147097A (en) 1984-08-10 1984-08-10 Electroluminescent element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59167483A JPS6147097A (en) 1984-08-10 1984-08-10 Electroluminescent element

Publications (1)

Publication Number Publication Date
JPS6147097A true JPS6147097A (en) 1986-03-07

Family

ID=15850515

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59167483A Pending JPS6147097A (en) 1984-08-10 1984-08-10 Electroluminescent element

Country Status (1)

Country Link
JP (1) JPS6147097A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63129995U (en) * 1987-02-18 1988-08-25
US6190166B1 (en) 1999-01-28 2001-02-20 Hitoshi Sasakura Orthodontic device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63129995U (en) * 1987-02-18 1988-08-25
US6190166B1 (en) 1999-01-28 2001-02-20 Hitoshi Sasakura Orthodontic device

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