JPS6143239Y2 - - Google Patents
Info
- Publication number
- JPS6143239Y2 JPS6143239Y2 JP15296379U JP15296379U JPS6143239Y2 JP S6143239 Y2 JPS6143239 Y2 JP S6143239Y2 JP 15296379 U JP15296379 U JP 15296379U JP 15296379 U JP15296379 U JP 15296379U JP S6143239 Y2 JPS6143239 Y2 JP S6143239Y2
- Authority
- JP
- Japan
- Prior art keywords
- turntable
- positioning
- adapter
- probe
- pin
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000000523 sample Substances 0.000 claims description 33
- 230000006835 compression Effects 0.000 claims description 14
- 238000007906 compression Methods 0.000 claims description 14
- 238000012360 testing method Methods 0.000 claims description 11
- 238000007689 inspection Methods 0.000 claims description 6
- 239000000758 substrate Substances 0.000 description 9
- 238000010586 diagram Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 2
- 230000002950 deficient Effects 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15296379U JPS6143239Y2 (enrdf_load_stackoverflow) | 1979-11-02 | 1979-11-02 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15296379U JPS6143239Y2 (enrdf_load_stackoverflow) | 1979-11-02 | 1979-11-02 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5670568U JPS5670568U (enrdf_load_stackoverflow) | 1981-06-10 |
| JPS6143239Y2 true JPS6143239Y2 (enrdf_load_stackoverflow) | 1986-12-06 |
Family
ID=29383792
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15296379U Expired JPS6143239Y2 (enrdf_load_stackoverflow) | 1979-11-02 | 1979-11-02 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6143239Y2 (enrdf_load_stackoverflow) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5819273U (ja) * | 1981-07-31 | 1983-02-05 | 富士通株式会社 | 位置合せ機構 |
-
1979
- 1979-11-02 JP JP15296379U patent/JPS6143239Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5670568U (enrdf_load_stackoverflow) | 1981-06-10 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100187559B1 (ko) | 전기적특성의 측정방법 및 그의 측정장치 | |
| KR100261957B1 (ko) | 수평 반송 테스트 핸들러 | |
| JPS6362245A (ja) | ウエハプロ−バ | |
| JPH05166893A (ja) | プローブカード検査装置 | |
| JPH0498167A (ja) | Ｉｃ検査装置 | |
| JPS6143239Y2 (enrdf_load_stackoverflow) | ||
| CN112648990B (zh) | 一种石英音叉敏感结构在片测试装置与方法 | |
| US6128074A (en) | Method and apparatus for inspection of pin grid array packages for bent leads | |
| JPH0441495B2 (enrdf_load_stackoverflow) | ||
| CN115372672A (zh) | 探针设备的工作台、探针设备、控制方法及探针测试方法 | |
| CN109661110B (zh) | 一种印刷电路板支撑顶针的定位方法及其定位装置 | |
| JP2971491B2 (ja) | 検査装置 | |
| KR20050067759A (ko) | 반도체 검사장치 | |
| JP2533881Y2 (ja) | 回路基板検査装置におけるピンボード構造 | |
| JPH0719817B2 (ja) | プロ−ブカ−ド自動交換方法 | |
| JP2007095753A (ja) | プローバ、プローブ接触方法及びそのためのプログラム | |
| JPH04340241A (ja) | 半導体ウエハの検査装置 | |
| JPH0758168A (ja) | プローブ装置 | |
| KR20050067760A (ko) | 반도체 검사장치 | |
| JPH0333022Y2 (enrdf_load_stackoverflow) | ||
| JPH022901A (ja) | 配線基板端子ピンの長さ検査機構 | |
| JPH0441342Y2 (enrdf_load_stackoverflow) | ||
| JPH0477871B2 (enrdf_load_stackoverflow) | ||
| JPH07107909B2 (ja) | ウエハプローバ | |
| JPS63244855A (ja) | プロ−ブ装置によるウエハの検査方法 |