JPS6141678B2 - - Google Patents
Info
- Publication number
- JPS6141678B2 JPS6141678B2 JP54057116A JP5711679A JPS6141678B2 JP S6141678 B2 JPS6141678 B2 JP S6141678B2 JP 54057116 A JP54057116 A JP 54057116A JP 5711679 A JP5711679 A JP 5711679A JP S6141678 B2 JPS6141678 B2 JP S6141678B2
- Authority
- JP
- Japan
- Prior art keywords
- slit
- pattern
- projection lens
- movable
- laser processing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000010586 diagram Methods 0.000 description 7
- 238000000034 method Methods 0.000 description 4
- 102100025490 Slit homolog 1 protein Human genes 0.000 description 2
- 101710123186 Slit homolog 1 protein Proteins 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/7025—Size or form of projection system aperture, e.g. aperture stops, diaphragms or pupil obscuration; Control thereof
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Laser Beam Processing (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5711679A JPS55149788A (en) | 1979-05-11 | 1979-05-11 | Laser working apparatus of pattern projection system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5711679A JPS55149788A (en) | 1979-05-11 | 1979-05-11 | Laser working apparatus of pattern projection system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS55149788A JPS55149788A (en) | 1980-11-21 |
| JPS6141678B2 true JPS6141678B2 (enrdf_load_stackoverflow) | 1986-09-17 |
Family
ID=13046559
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5711679A Granted JPS55149788A (en) | 1979-05-11 | 1979-05-11 | Laser working apparatus of pattern projection system |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS55149788A (enrdf_load_stackoverflow) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04258394A (ja) * | 1991-02-05 | 1992-09-14 | Fanuc Ltd | レーザ加工機の加工ヘッド |
| WO2007086132A1 (ja) * | 2006-01-27 | 2007-08-02 | Hoya Candeo Optronics Corporation | 可変スリット装置およびレーザー加工装置 |
| KR100766300B1 (ko) | 2006-07-12 | 2007-10-12 | (주)미래컴퍼니 | 레이저 가공슬릿 및 가공장치 |
-
1979
- 1979-05-11 JP JP5711679A patent/JPS55149788A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS55149788A (en) | 1980-11-21 |
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