JPS6139734B2 - - Google Patents

Info

Publication number
JPS6139734B2
JPS6139734B2 JP56013908A JP1390881A JPS6139734B2 JP S6139734 B2 JPS6139734 B2 JP S6139734B2 JP 56013908 A JP56013908 A JP 56013908A JP 1390881 A JP1390881 A JP 1390881A JP S6139734 B2 JPS6139734 B2 JP S6139734B2
Authority
JP
Japan
Prior art keywords
substrate
vacuum chuck
semiconductor wafer
wafer
recess
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56013908A
Other languages
English (en)
Japanese (ja)
Other versions
JPS57128939A (en
Inventor
Takuoki Numaga
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shibaura Machine Co Ltd
Original Assignee
Toshiba Machine Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Machine Co Ltd filed Critical Toshiba Machine Co Ltd
Priority to JP56013908A priority Critical patent/JPS57128939A/ja
Publication of JPS57128939A publication Critical patent/JPS57128939A/ja
Publication of JPS6139734B2 publication Critical patent/JPS6139734B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67242Apparatus for monitoring, sorting or marking
    • H01L21/67288Monitoring of warpage, curvature, damage, defects or the like
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/68Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/6838Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Jigs For Machine Tools (AREA)
JP56013908A 1981-02-02 1981-02-02 Vacuum chuck mechanism of wafer fixing apparatus Granted JPS57128939A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP56013908A JPS57128939A (en) 1981-02-02 1981-02-02 Vacuum chuck mechanism of wafer fixing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP56013908A JPS57128939A (en) 1981-02-02 1981-02-02 Vacuum chuck mechanism of wafer fixing apparatus

Publications (2)

Publication Number Publication Date
JPS57128939A JPS57128939A (en) 1982-08-10
JPS6139734B2 true JPS6139734B2 (US07166745-20070123-C00016.png) 1986-09-05

Family

ID=11846265

Family Applications (1)

Application Number Title Priority Date Filing Date
JP56013908A Granted JPS57128939A (en) 1981-02-02 1981-02-02 Vacuum chuck mechanism of wafer fixing apparatus

Country Status (1)

Country Link
JP (1) JPS57128939A (US07166745-20070123-C00016.png)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63201250A (ja) * 1987-02-13 1988-08-19 積水化学工業株式会社 軒先構造
JPH02240357A (ja) * 1989-03-14 1990-09-25 Sekisui Chem Co Ltd 軒先構造
JPH02240356A (ja) * 1989-03-14 1990-09-25 Sekisui Chem Co Ltd 軒先構造
JPH02240354A (ja) * 1989-03-14 1990-09-25 Sekisui Chem Co Ltd 軒先構造
JPH0437723U (US07166745-20070123-C00016.png) * 1990-07-25 1992-03-30

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59191344A (ja) * 1983-04-14 1984-10-30 Toshiba Corp 薄板取着用治具
CN102005395B (zh) * 2009-08-31 2013-03-06 日立设备工程股份有限公司 真空贴装方法及装置
JP5920058B2 (ja) * 2012-06-29 2016-05-18 日本精工株式会社 スピンドル装置、並びにそれを備えた工作機械及び半導体製造装置

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63201250A (ja) * 1987-02-13 1988-08-19 積水化学工業株式会社 軒先構造
JPH02240357A (ja) * 1989-03-14 1990-09-25 Sekisui Chem Co Ltd 軒先構造
JPH02240356A (ja) * 1989-03-14 1990-09-25 Sekisui Chem Co Ltd 軒先構造
JPH02240354A (ja) * 1989-03-14 1990-09-25 Sekisui Chem Co Ltd 軒先構造
JPH0437723U (US07166745-20070123-C00016.png) * 1990-07-25 1992-03-30

Also Published As

Publication number Publication date
JPS57128939A (en) 1982-08-10

Similar Documents

Publication Publication Date Title
JP5675239B2 (ja) ウエハ検査用インターフェース及びウエハ検査装置
KR20150052183A (ko) 다기능 웨이퍼 및 필름 프레임 조작 시스템
US20020001920A1 (en) Wafer bonding method, appartus and vacuum chuck
WO2010106958A1 (ja) 位置合わせ方法、蒸着方法
JPH11111819A (ja) ウェハーの固定方法及び露光装置
JPH10116760A (ja) 露光装置及び基板保持装置
JPWO2003071599A1 (ja) 基板吸着装置
KR20040014213A (ko) 레티클 핸들링 방법, 레티클 핸들링 장치 및 노광장치
JP7152602B2 (ja) 接合装置、接合システム及び接合方法
JPH0661319A (ja) 補助チャックを有するウェーハ・プローブ・ステーション
JPH01214042A (ja) 基板の吸着装置
US6156125A (en) Adhesion apparatus
JPS6139734B2 (US07166745-20070123-C00016.png)
JP7474325B2 (ja) ウエハ搬送装置、およびウエハ搬送方法
JP2007528558A (ja) ワイヤレス基板状センサ
JP2020127046A (ja) 接合装置、接合システム、接合方法及びコンピュータ記憶媒体
JPH0582631A (ja) 半導体ウエーハ用真空チヤツク
JP2008251968A (ja) ウエハ処理装置の運転方法
US20220277979A1 (en) Bonding apparatus, bonding system, and bonding method
JPH05283511A (ja) 真空吸着装置
US4271577A (en) Alignment device
JPH0722496A (ja) 基板の吸着保持装置
JP3647623B2 (ja) 膜厚測定装置
JPH0745692A (ja) 基板の吸着保持装置
JP2000223388A (ja) ステージ及び露光装置