JPS6131948A - Instrument for measuring impedance of coated film - Google Patents

Instrument for measuring impedance of coated film

Info

Publication number
JPS6131948A
JPS6131948A JP15457284A JP15457284A JPS6131948A JP S6131948 A JPS6131948 A JP S6131948A JP 15457284 A JP15457284 A JP 15457284A JP 15457284 A JP15457284 A JP 15457284A JP S6131948 A JPS6131948 A JP S6131948A
Authority
JP
Japan
Prior art keywords
electrodes
impedance
electrode
coating film
current
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP15457284A
Other languages
Japanese (ja)
Other versions
JPH0546495B2 (en
Inventor
Sumio Yamamoto
澄夫 山本
Kiyoshi Fukui
清 福井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP15457284A priority Critical patent/JPS6131948A/en
Publication of JPS6131948A publication Critical patent/JPS6131948A/en
Publication of JPH0546495B2 publication Critical patent/JPH0546495B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/041Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body

Abstract

PURPOSE:To meassure exactly the impedance of a coated film without the influence of surface leak current on a measured value by disposing guard electrodes around measuring electrodes. CONSTITUTION:The measuring electrodes 4a, 4b are brought into contact directly or via a conductive material 3 with the surface of the paint-coated film 2 on a blank metal 1 and the guard electrodes 8a, 8b are provided around the same. A voltage is impressed to the electrodes 4a, 4b and the electrodes 8a, 8b by an AC power source 6 and the current is measured by ammeters 5a, 5b connected to the measuring electrodes 4a, 4b. The resistance of the ammeters 5a, 5b is small as compared to the surface leak resistance between the electrodes 4a, 4b and the guard electrodes 8a, 8b and therefore the impedance measurement is made possible without the influence of the surface leak current on the measured value.

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明は、防錆・美観等の目的で使用される金属表面に
塗付された塗装膜の劣化を検出、評価するために使用さ
れる塗膜インピーダンス測定装置に関する。
Detailed Description of the Invention [Technical Field of the Invention] The present invention relates to a coating used for detecting and evaluating deterioration of a coating film applied to a metal surface used for purposes such as rust prevention and aesthetics. The present invention relates to a membrane impedance measuring device.

〔発明の技術的背景とその問題点〕[Technical background of the invention and its problems]

まず、従来から行なわれている塗膜劣化の電気化学的評
価方法について説明する。
First, a conventional electrochemical evaluation method for paint film deterioration will be explained.

第5図に表わすように、素地金属1上に塗装した評価す
べき塗装膜2の上に直接あるいは導電性の液体ないしは
導電性のゲルつまシ導電性流体3を介して測定用電極4
を接触させる。素地金属1と測定用電極4間に電流計5
を介して交流電源6を用いて交流電圧を印加する。その
ときに印加された電圧は素地金属1と測定用電極4に接
続された電圧計7によシ読取る。
As shown in FIG. 5, a measuring electrode 4 is placed on a coating film 2 to be evaluated coated on a base metal 1 either directly or via a conductive liquid or a conductive gel 3.
contact. An ammeter 5 is connected between the base metal 1 and the measurement electrode 4.
An AC voltage is applied using an AC power supply 6 via the AC power source 6. The voltage applied at that time is read by a voltmeter 7 connected to the base metal 1 and the measuring electrode 4.

塗装膜2は塗装置後の正常な状態−では、電気抵抗が非
常に大ぎ(,10”Ω・儒あるいはそれ以上の直流抵抗
を有する。塗装膜2の電気的等価回路は塗装膜2が正常
な場合には、第6図に示すような抵抗Rfとコンデンサ
Cfとの並列回路で表わさnる。塗装膜2が劣化してく
ると、この抵抗Rf力緘少し【くるとともに、第6図に
示されるような単純な等何回路から複数の時定数を持つ
ような複雑なインピーダンスを表わすようになってくる
In the normal state after coating, the paint film 2 has a very large electrical resistance (10"Ω・F or more DC resistance. The electrical equivalent circuit of the paint film 2 is that the paint film 2 is In a normal case, it is represented by a parallel circuit of a resistor Rf and a capacitor Cf as shown in Fig. 6.As the coating film 2 deteriorates, the resistance Rf decreases a little [as shown in Fig. 6]. A simple equinumerical circuit, as shown in Figure 1, begins to express complex impedances with multiple time constants.

しかしながら、劣化の初期段階では抵抗Rfとコンデン
サCfとの並列回路として扱うことが可能である。
However, at the initial stage of deterioration, it is possible to treat the resistor Rf and capacitor Cf as a parallel circuit.

塗装膜のインピーダンスZ(js)  は、(1)式か
ら求められる。
The impedance Z (js) of the coating film is obtained from equation (1).

Z(jω) = e(jω)/i(jω) ・・・・・
・・・・(1)ここで、ωは角周波数。
Z(jω) = e(jω)/i(jω) ・・・・・・
...(1) Here, ω is the angular frequency.

e(jω)は電圧。e(jω) is voltage.

i(jω)は電流を表わす。i(jω) represents current.

また、もう1つの劣化の指標であるtanδは(2)式
で求められる。
Further, tan δ, which is another index of deterioration, is obtained by equation (2).

tanδ= IZmI/ IZeI    −・−・・
−・−(2)ここで、zmはインピーダンスの虚数部、
Z8はインピーダンスの実数部(イン ピーダンスが純抵抗と同じ位相の 抵抗成分)である。
tanδ= IZmI/ IZeI −・−・
−・−(2) Here, zm is the imaginary part of impedance,
Z8 is the real part of impedance (resistance component whose impedance is in the same phase as the pure resistance).

塗装膜2が劣化してくると、第6図の抵抗R。As the coating film 2 deteriorates, the resistance R shown in FIG.

が減少し、同じ交流電圧e(jω)を印加した場合には
電流1ts)が増加し、インピーダンスZ(jω)が減
少する。同様にして抵抗R,が減少してくると、インピ
ーダンスの実数部1Zelが減少しjanδが増加する
decreases, and when the same AC voltage e(jω) is applied, the current 1ts) increases and the impedance Z(jω) decreases. Similarly, when the resistance R, decreases, the real part 1Zel of the impedance decreases and janδ increases.

このようにして、塗装膜2のインピーダンスあるいはt
anδを測定することで、塗装膜2の劣化が検出できる
In this way, the impedance of the coating film 2 or t
Deterioration of the coating film 2 can be detected by measuring an δ.

塗装膜の劣化前後のインピーダンスの変化を第7図なら
びに第8図に示す。
Changes in impedance before and after the paint film deteriorates are shown in FIGS. 7 and 8.

第7図はインピーダンスの絶対値を周波数(対数)に対
してプロットしたものでちゃ、一般にボード線図と言わ
れている。劣化していない塗装膜のインピーダンス曲#
iaに対して、塗装膜が劣化してくると、インピーダン
スは曲線すのように周波数の低い側での減少が顕著とな
る。したがって、インピーダンスの絶対値のみから劣化
を検出する場合には、周波数の低い方で測定する方が有
効である。
Figure 7 is a plot of the absolute value of impedance versus frequency (logarithm), and is generally called a Bode diagram. Impedance song of undegraded paint film #
With respect to ia, as the paint film deteriorates, the impedance decreases markedly on the lower frequency side as shown in the curve. Therefore, when detecting deterioration only from the absolute value of impedance, it is more effective to measure at a lower frequency.

第8図はインピーダンスを実数部と虚数部とで表示した
もので一一般にはナイキスト線図と言われる複素表示で
ある。塗装膜2が劣化してくると。
FIG. 8 shows the impedance in terms of a real part and an imaginary part, which is a complex representation generally called a Nyquist diagram. When the paint film 2 deteriorates.

インピーダンス軌跡dは正常なものの曲線Cと比べて半
円が小さくなるとともに、円が変形してくる。この形か
ら、塗装膜2の劣化の程度が推定できるO インピーダンスの測定結果から塗装膜の劣化を検出する
方法は以上の通υであるが、実際の塗装膜2のインピー
ダンス測定の際には、素地金属1から直接電気的なリー
ド線を取出せない場合がある。その対処策としてこの出
願人はさきにダブルセル法(2電極沫)を提案した。た
とえば、特願昭58−198315 、特願昭59−5
5818等がそれである。
In the impedance locus d, the semicircle becomes smaller and the circle becomes deformed compared to the normal curve C. From this shape, the degree of deterioration of the paint film 2 can be estimated.O Although the method for detecting the deterioration of the paint film from the impedance measurement results is the same as above, when actually measuring the impedance of the paint film 2, There are cases where it is not possible to take out electrical lead wires directly from the base metal 1. As a countermeasure to this problem, the applicant previously proposed a double cell method (two electrodes). For example, Japanese Patent Application No. 58-198315, Japanese Patent Application No. 59-59
5818 etc. are such examples.

この方法は、第9図に示すように2つの測定用電極4a
、4b間に交流電圧を加え、その時の電圧、電流9周波
数から、上述した方法と同様にしてインピーダンスを測
定し、塗装膜2の劣化を検出する方法である。この場合
に測定さnるインピーダンスは電極4aと電極4b部の
インピーダンスの加算値となる。
In this method, two measurement electrodes 4a are used as shown in FIG.
, 4b is applied, and the impedance is measured from the voltage and current 9 frequencies at that time in the same manner as the method described above, and deterioration of the coating film 2 is detected. In this case, the impedance measured is the sum of the impedances of the electrode 4a and the electrode 4b.

しかしながら、この方法を用いてインピーダンスを測定
する場合、塗装膜2のインピーダンスが非常に大きな塗
装系1例えば海洋構造物のように厚膜系塗膜の測定を行
なう場合には、塗装膜表面のリーク電流が無視できなく
なる。塗装膜表面が汚nている場合、あるいは濡nてい
る場合、あるいは測定のために電極と塗装膜間に挿入し
た導電性の液体ないしはゲルが、電極間に導通を生じさ
せた場合などには、インピーダンス測定結果に誤差が生
じ、本来の塗装膜のインピーダンスが測定できない場合
がある。
However, when measuring impedance using this method, if the impedance of the paint film 2 is very high, such as a thick paint film such as an offshore structure, leakage on the paint film surface may occur. The current can no longer be ignored. If the surface of the paint film is dirty or wet, or if a conductive liquid or gel inserted between the electrode and the paint film for measurement causes electrical continuity between the electrodes, , errors may occur in the impedance measurement results, and the original impedance of the paint film may not be measured.

第9図において、塗装膜2のインピーダンスは電圧計7
で読取った電圧e(jω)と電流計5で読取った電流i
(jω)とから、(1)式によシ求められるが、電流i
(jω)は塗装膜2を通った塗装膜貫通電流j(以外に
表面リーク電流i、が含まれているため、結果としてイ
ンピーダンスは塗装膜2のインピーダンスよりも小さな
値となp、劣化の場合と同様な判断が下されることにな
る。表面リークを少なくする方法としては、測定用電極
4aと4.との距離を大きくすることが考えられるが、
測定装置が大きくなることあるいは測定物の大きさ、測
定範囲から限定されることが多く、ノイズの面からも電
極を遠ざけることは好ましくない。
In FIG. 9, the impedance of the coating film 2 is measured by the voltmeter 7.
Voltage e(jω) read by and current i read by ammeter 5
(jω), it can be found by equation (1), but the current i
(jω) is the paint film penetration current j that passed through the paint film 2 (in addition to the surface leakage current i), as a result, the impedance is a smaller value than the impedance of the paint film 2, p, in the case of deterioration. A similar judgment will be made.As a way to reduce surface leakage, increasing the distance between the measurement electrodes 4a and 4.
It is often limited by the size of the measuring device, the size of the object to be measured, and the measuring range, and it is not preferable to move the electrodes away from the viewpoint of noise.

〔発明の目的〕[Purpose of the invention]

ここにおいて本発明は、従来装置の難点を克服し、測定
電極の周囲にガード電極を設け、表面リーク電流が測定
値に影響を与えない正確な測定が可能な塗膜インピーダ
ンス測定装置を提供することを、その目的とする。
SUMMARY OF THE INVENTION An object of the present invention is to provide a coating film impedance measuring device that overcomes the drawbacks of conventional devices, provides a guard electrode around the measuring electrode, and is capable of accurate measurement in which surface leakage current does not affect the measured value. is its purpose.

〔発明の概要〕[Summary of the invention]

本発明は、2電極(ダブルセル)による塗膜インピーダ
ンス測定装置において、 電極間のリーク電流が測定値に影響を与えないように、
ガード電極を測定電極の周囲に配設した塗膜インピーダ
ンス測定装置であり、 さらには、カード電極をアンプを用いて測定電極と同電
位になるようにドライブする塗膜インピーダンス測定装
置である。
The present invention is a coating film impedance measuring device using two electrodes (double cell), so that leakage current between the electrodes does not affect the measured value.
This is a coating film impedance measuring device in which a guard electrode is arranged around the measuring electrode, and furthermore, it is a coating film impedance measuring device in which a card electrode is driven using an amplifier so that it has the same potential as the measuring electrode.

〔発明の実施例〕[Embodiments of the invention]

第1図は、本発明の一実施例における回路構成を表わす
ブロック図である。
FIG. 1 is a block diagram showing a circuit configuration in an embodiment of the present invention.

すべての図面において同一符号は同一もしくは相当部分
を示す。
The same reference numerals indicate the same or corresponding parts in all drawings.

素地金属1の上に塗らルた塗装膜2の上に、直接あるい
は導電性の液体、ないしは導電性のゲルもしくけそれら
を含んだ多孔質物質などの導電性物質3を介して測定電
極4 および4.を接触させる。その測定用電極4aお
よび4.は電流計5aおよび5.を介して交流電源6に
接続する。
A measuring electrode 4 and 4. contact. The measuring electrodes 4a and 4. are ammeter 5a and 5. It is connected to the AC power supply 6 via.

さらに測定用電極4aおよび4.の周囲にガード電極8
aおよび8bを設け、これらガード電極8aおよび8b
も塗装膜2に直接あるいは導電性物質3を介して接触さ
せる。こtらガード電極8aおよび8bは直接交流電源
6に接続する。
Further, measurement electrodes 4a and 4. guard electrode 8 around
a and 8b are provided, and these guard electrodes 8a and 8b
is also brought into contact with the coating film 2 directly or via a conductive substance 3. These guard electrodes 8a and 8b are directly connected to the AC power source 6.

しかして、測定用電極4aおよび4bあるいはガード電
極8aおよび8.の形状は、第2図(a)。
Therefore, the measurement electrodes 4a and 4b or the guard electrodes 8a and 8. The shape of is shown in Fig. 2(a).

(b)に平面図(上の図)、側断面図C下の図)をおの
おの示すように、円形、正方形等被測定物に応じてどの
ような形状でも良いが、ガード電極8は測定電極4aお
よび4bの周囲を完全に取巻いている方が好ましい。
As shown in the plan view (upper figure) and side sectional view C (lower figure) in (b), the guard electrode 8 may have any shape depending on the object to be measured, such as circular or square, but the guard electrode 8 is the measuring electrode. Preferably, it completely surrounds 4a and 4b.

このように構成すると、測定電極4aとガード電極8 
との間に電流計5aの抵抗による電圧降部分の電位差が
生じるが、測定電極4aとガード電極8 間の表面リー
ク抵抗に比べて電流計5aの抵抗は一般に充分小さいの
で、この電位差によるガード電極8 から測定電極4□
8への流れ込みは、測定電流iaに比べて充分小さな値
となる。
With this configuration, the measurement electrode 4a and the guard electrode 8
However, since the resistance of the ammeter 5a is generally sufficiently small compared to the surface leak resistance between the measurement electrode 4a and the guard electrode 8, this potential difference causes a voltage drop between the guard electrode and the measurement electrode 4a. 8 to measuring electrode 4□
8 has a sufficiently small value compared to the measurement current ia.

また、表面リーク電流i はガード電極8aからのみ流
れるので、測定用電極4aに流れる電流iaは塗装膜2
のインピーダンス測定に関与するものだけとなる。
Moreover, since the surface leakage current i flows only from the guard electrode 8a, the current ia flowing to the measurement electrode 4a is
Only those involved in impedance measurement.

測定用電極4b、ガード電極86.電流計5bに関して
も作用は同じである。
Measuring electrode 4b, guard electrode 86. The same effect applies to the ammeter 5b.

このようにして、塗装膜2の正確なインピーダンス測定
が可能となる。
In this way, accurate impedance measurement of the coating film 2 is possible.

インピーダンス測定用の交流電源6としては、正弦波以
外に、同時に多数の周波数成分を含んだインパルスある
いはランダムノイズ等が使用でき、電流および電圧を伝
達間数計に接続することで短時間に塗装抵抗Rf 、塗
装容量Ofないしは第7図および第8図に示されるよう
なインピーダンス軌跡が得らfる。
In addition to sine waves, impulses or random noise containing many frequency components can be used as the AC power source 6 for impedance measurement. Rf, coating volume Of or impedance loci as shown in FIGS. 7 and 8 are obtained.

本発明による塗装膜のインピーダンス測定結果を表1に
示す。
Table 1 shows the impedance measurement results of the coating film according to the present invention.

表1 エポキシ系厚膜塗料の塗膜インピーダンス測定結
果 ガード電極のない2電極法では表面が濡tている場合、
あるいは導電性のゲルが表面に付着している場合には、
表面リークのため、塗装膜のインピーダンスが1電極法
に比べて低い値となっている。特に電極間距離の小さい
方がその傾向が顕著である。
Table 1 Results of coating film impedance measurement of epoxy thick film paint In the two-electrode method without a guard electrode, when the surface is wet,
Or if a conductive gel is attached to the surface,
Due to surface leakage, the impedance of the coating film is lower than that of the one-electrode method. This tendency is particularly noticeable when the distance between the electrodes is small.

ガード電極を設けた本発明の測定結果は、1電極法に近
い値を示しており、本発明の有効性が確認された。
The measurement results of the present invention provided with a guard electrode showed values close to those of the one-electrode method, confirming the effectiveness of the present invention.

第3図は、本発明の他の実施例の回路構成を表わすブロ
ック図である。
FIG. 3 is a block diagram showing the circuit configuration of another embodiment of the present invention.

これは、実際の測定において必要となるアンダの接続を
示した例であp、更にガード電極8と測定用電極4aあ
るいは4.との電位差を少なくするために、バッファア
ンプ108,10bを付加している。測定電極4aに流
れる電流は、I■(電流→電圧)変換抵抗R間の電圧を
高入力インビーダンスアンプ118で取出している。同
様に、測定電極4.の電流は高入力インピーダンスアン
プ11bの出力に電圧として出力される。電圧は高入力
インピーダンスアンダー2の出力から取出される。
This is an example showing the under connection required in actual measurement, and also the guard electrode 8 and the measurement electrode 4a or 4. Buffer amplifiers 108 and 10b are added to reduce the potential difference between the two. The current flowing through the measurement electrode 4a is obtained by extracting the voltage across the I (current→voltage) conversion resistor R by a high input impedance amplifier 118. Similarly, measurement electrode 4. The current is output as a voltage to the output of the high input impedance amplifier 11b. The voltage is taken from the output of the high input impedance under 2.

また、ガード電極8をアンプ10a、105でドライブ
することにより1表面リーク電流が大きな場合でも、測
定電流値に影響が少ないので、測定電極4.と4.とを
近づけることが可能になり、塗膜インピーダンス測定装
置が小型化できる。更に測定電極間の距離が短くできる
ことは、耐ノイズ性能が向上するため、ノイズが多く、
アースの取りすらい現場での測定に対しては効果が大で
卆る。
Furthermore, by driving the guard electrode 8 with the amplifiers 10a and 105, even if one surface leakage current is large, there is little effect on the measured current value. and 4. This allows the coating film impedance measuring device to be made smaller. Furthermore, being able to shorten the distance between the measurement electrodes improves the noise resistance performance, making it possible to reduce the distance between measurement electrodes.
It is highly effective for on-site measurements of grounding.

本発明の別の実施例の側断面図、平断面図を第4図(a
) 、 (b)に示す。
FIG. 4(a) shows a side sectional view and a plan sectional view of another embodiment of the present invention.
), shown in (b).

これは電極を同意円上に配置した場合の例であり、この
ように配置することにより、測定電極4、がシールドと
して作用するため、ノイズ性能が向上する。
This is an example where the electrodes are arranged on the same circle, and by arranging the electrodes in this way, the measurement electrode 4 acts as a shield, so that the noise performance is improved.

測定電極4aと4bとの間にガード電極8が入っている
ため、測定電極4aと4b間のリーク電流が測定値に含
まれないので、このような構成においても塗膜インピー
ダンス測定装置を小型化することができる。小型化する
ことによシ更にノイズ性能が向上し、測定が容易になる
Since the guard electrode 8 is inserted between the measurement electrodes 4a and 4b, the leakage current between the measurement electrodes 4a and 4b is not included in the measured value, so even with this configuration, the coating film impedance measurement device can be made smaller. can do. Miniaturization further improves noise performance and facilitates measurement.

第4図中のバッファアンプ10は無くても良いが、その
場合はカード電極8は交流電源6の出力端子に直接ない
しは適当な抵抗を介して接続する必要がある。適当な抵
抗とは測定時に測定電極4aとガード電極8との電位が
等しくなるような値の抵抗である。
The buffer amplifier 10 shown in FIG. 4 may be omitted, but in that case, the card electrode 8 must be connected to the output terminal of the AC power supply 6 either directly or via a suitable resistor. An appropriate resistance is one having a value such that the potentials of the measurement electrode 4a and the guard electrode 8 are equal during measurement.

〔発明の効果〕〔Effect of the invention〕

かくして本発明によれば、2電極法(ダブルセル法)に
よる塗膜劣化の検出に使用されるインピーダンス゛測定
装置にガード電極を設けることで、海洋構造物等に使用
される厚膜型塗料のような高抵抗の塗膜インピーダンス
に関しても精度よく測定ができるとともに、測定用電極
を近づけることが可能となシ、小屋化、耐ノイズ性能が
向上し、現地での測定が精度よく測定できるようになっ
た。
Thus, according to the present invention, by providing a guard electrode to the impedance measurement device used for detecting paint film deterioration using the two-electrode method (double cell method), it is possible to It is possible to accurately measure the impedance of a high-resistance coating film, and the measurement electrodes can be moved closer together, making it possible to build a shed, and improving noise resistance, making it possible to measure accurately on-site. Ta.

この結果、塗膜の劣化が早期に検出可能となり、寿命の
推定、塗換え時期の決定、塗膜の評価等が短時間に高精
度で行なえるようになり、工業的に益するところが大き
い。
As a result, deterioration of the paint film can be detected early, and life estimation, repainting timing determination, paint film evaluation, etc. can be performed in a short time and with high precision, which is of great industrial benefit.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の回路構成を表わすブロック
図、第2図(a) 、 (b)はその電極の形状を示す
平断面図と側断面図、第3図は本発明の他の実施例の回
路構成を表わすブロック図、第4図(a)。 (b)は本発明の別の実施例の側断面図、平断面図、第
5図は従来の塗装膜劣化を電気化学的に評価する方法を
示す説明図、第6図は塗装膜の劣化を評価するために用
いられる塗装膜の電気的等価回路、第7図は塗装膜の劣
化によるインピーダンスの周波数依存性の変化を表わす
説明図、第8図は第7図を複素平面上で示した説明図、
第9図は2電極法による塗装膜劣化を電気化学的に評価
する方法を表わす説明図である。 1・・・・・・素地金属 2・・・・・・塗装膜 3・・・・・・導電性物質 4 + 4a、 4b・・・・・・測定用電極5 、5
a、 5.・・・・・・電流計6・・・・・・交流電源 7・・・・・・電圧計 818a、8.・・・・・・ガード電極9・・・・・・
絶縁物 10 、10a、 IOb・・・・・・バッファアンプ
11 、11a、 11b、 12・・・・・・高入力
インピーダンスアンプ a、c・・・・・・正常塗装膜のインピーダンス、その
軌跡 す、d・・・・・・劣化した塗装膜のインピーダンス。 その軌跡 R,・・・・・・塗膜抵抗 Cf・・・・・・塗膜容量 ia・・・・・・測定電流a i、・・・・・・測定電流b 15・・・・・・表面リーク電流 R,Ra、R,・・・・・・IV変換抵抗。 出願人代理人  猪  股     清第1図 第2園 第3図 第4図 第す図 第6図 尺f 第7図 周波′I?l椀(f) 実数部
FIG. 1 is a block diagram showing the circuit configuration of an embodiment of the present invention, FIGS. 2(a) and (b) are a plan sectional view and a side sectional view showing the shape of the electrode, and FIG. 3 is a block diagram showing the circuit configuration of an embodiment of the present invention. FIG. 4(a) is a block diagram showing the circuit configuration of another embodiment. (b) is a side sectional view and a plan sectional view of another embodiment of the present invention, FIG. 5 is an explanatory diagram showing a conventional electrochemical evaluation method for paint film deterioration, and FIG. 6 is a deterioration of paint film. Figure 7 is an explanatory diagram showing the change in frequency dependence of impedance due to deterioration of the paint film, and Figure 8 shows Figure 7 on a complex plane. Explanatory diagram,
FIG. 9 is an explanatory diagram showing a method for electrochemically evaluating paint film deterioration using the two-electrode method. 1... Base metal 2... Paint film 3... Conductive substance 4 + 4a, 4b... Measuring electrodes 5, 5
a.5. ... Ammeter 6 ... AC power supply 7 ... Voltmeter 818a, 8. ... Guard electrode 9 ...
Insulators 10, 10a, IOb... Buffer amplifiers 11, 11a, 11b, 12... High input impedance amplifiers a, c... Normal paint film impedance, its trajectory , d... Impedance of deteriorated paint film. Its locus R,... Coating film resistance Cf... Coating film capacitance ia... Measuring current a i,... Measuring current b 15...・Surface leakage current R, Ra, R,...IV conversion resistance. Applicant's Representative Kiyoshi Inomata Figure 1 Figure 2 Figure 3 Figure 4 Figure 6 Figure 6 Scale f Figure 7 Frequency 'I? l bowl (f) real part

Claims (1)

【特許請求の範囲】 1、素地金属表面塗装上の2個所のそれぞれに直接ある
いは導電性物質を介して設けられた測定用電極と、 両測定用電極間に接続された交流電源と、 両測定用電極の周囲におのおの直接あるいは導電物質を
介して素地金属表面塗装上に配設され交流電源の両端に
接続されたガード電極と、 両測定用電極間電圧を測定する電圧計と、 両測定用電極を流通する電流を測定する電流計と、 を備えたことを特徴とする塗膜インピーダンス測定装置
。 2、ガード電極を測定用電極の周囲を取り囲むようにし
た特許請求の範囲第1項記載の塗膜インピーダンス測定
装置。 3、ガード電極をアンプを用いて測定用電極と同電位に
なるようにドライブするようにした特許請求の範囲第1
項記載の塗膜インピーダンス測定装置。 4、電圧計の前段に高入力インピーダンスアンプを設け
て電圧を検出し、電流計に代えIV(電流→電圧)変換
抵抗を接続しその両端に高入力インピーダンスアンプを
備えこのアンプ出力から電流を導出するようにした特許
請求の範囲第1項記載の塗膜インピーダンス測定装置。
[Scope of Claims] 1. Measuring electrodes provided directly or via a conductive substance at two locations on the base metal surface coating, an AC power source connected between both measuring electrodes, and both measuring electrodes. A guard electrode is placed around the base metal surface coating either directly or via a conductive material and connected to both ends of the AC power source, and a voltmeter is used to measure the voltage between the electrodes for both measurements. A coating film impedance measuring device comprising: an ammeter that measures a current flowing through an electrode; 2. The coating film impedance measuring device according to claim 1, wherein the guard electrode surrounds the measuring electrode. 3. Claim 1 in which the guard electrode is driven to have the same potential as the measurement electrode using an amplifier.
The coating film impedance measuring device described in . 4. Install a high input impedance amplifier in front of the voltmeter to detect the voltage, connect an IV (current → voltage) conversion resistor instead of the ammeter, and have a high input impedance amplifier at both ends of the resistor to derive the current from the output of this amplifier. A coating film impedance measuring device according to claim 1, wherein the coating film impedance measuring device is configured to:
JP15457284A 1984-07-25 1984-07-25 Instrument for measuring impedance of coated film Granted JPS6131948A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15457284A JPS6131948A (en) 1984-07-25 1984-07-25 Instrument for measuring impedance of coated film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15457284A JPS6131948A (en) 1984-07-25 1984-07-25 Instrument for measuring impedance of coated film

Publications (2)

Publication Number Publication Date
JPS6131948A true JPS6131948A (en) 1986-02-14
JPH0546495B2 JPH0546495B2 (en) 1993-07-14

Family

ID=15587158

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15457284A Granted JPS6131948A (en) 1984-07-25 1984-07-25 Instrument for measuring impedance of coated film

Country Status (1)

Country Link
JP (1) JPS6131948A (en)

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JP2006349450A (en) * 2005-06-15 2006-12-28 Atago:Kk Concentration measuring device
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JP2012150033A (en) * 2011-01-20 2012-08-09 Nissan Motor Co Ltd Resistance measuring device and resistance measuring method
JP2014044102A (en) * 2012-08-27 2014-03-13 Hioki Ee Corp Four-terminal resistance measuring device, inspection device, four-terminal resistance measuring method and inspection method
JP2019032172A (en) * 2017-08-04 2019-02-28 マツダ株式会社 Device and method for testing corrosion resistance of coated metal material
EP3686575A1 (en) * 2019-01-18 2020-07-29 Mazda Motor Corporation Corrosion resistance tester for coated metal material
WO2023204018A1 (en) * 2022-04-22 2023-10-26 株式会社Screenホールディングス Impedance measurement apparatus and impedance measurement method

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11326408A (en) * 1998-04-21 1999-11-26 Illinois Tool Works Inc <Itw> Resistance measuring meter having voltage amplifier circuit
JP2006349450A (en) * 2005-06-15 2006-12-28 Atago:Kk Concentration measuring device
JP4532357B2 (en) * 2005-06-15 2010-08-25 株式会社アタゴ Concentration measuring device
JP2007212248A (en) * 2006-02-08 2007-08-23 Toppan Printing Co Ltd Detecting method of hybridization
JP2012150033A (en) * 2011-01-20 2012-08-09 Nissan Motor Co Ltd Resistance measuring device and resistance measuring method
JP2014044102A (en) * 2012-08-27 2014-03-13 Hioki Ee Corp Four-terminal resistance measuring device, inspection device, four-terminal resistance measuring method and inspection method
JP2019032172A (en) * 2017-08-04 2019-02-28 マツダ株式会社 Device and method for testing corrosion resistance of coated metal material
EP3686575A1 (en) * 2019-01-18 2020-07-29 Mazda Motor Corporation Corrosion resistance tester for coated metal material
US11566996B2 (en) 2019-01-18 2023-01-31 Mazda Motor Corporation Corrosion resistance tester for coated metal material
WO2023204018A1 (en) * 2022-04-22 2023-10-26 株式会社Screenホールディングス Impedance measurement apparatus and impedance measurement method

Also Published As

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