JPS6130057A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS6130057A
JPS6130057A JP15190384A JP15190384A JPS6130057A JP S6130057 A JPS6130057 A JP S6130057A JP 15190384 A JP15190384 A JP 15190384A JP 15190384 A JP15190384 A JP 15190384A JP S6130057 A JPS6130057 A JP S6130057A
Authority
JP
Japan
Prior art keywords
seal ring
semiconductor device
metal
chip
package body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15190384A
Other languages
Japanese (ja)
Inventor
Takashi Kondo
隆 近藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP15190384A priority Critical patent/JPS6130057A/en
Publication of JPS6130057A publication Critical patent/JPS6130057A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/02Containers; Seals
    • H01L23/10Containers; Seals characterised by the material or arrangement of seals between parts, e.g. between cap and base of the container or between leads and walls of the container
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/4912Layout
    • H01L2224/49171Fan-out arrangements
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1515Shape
    • H01L2924/15153Shape the die mounting substrate comprising a recess for hosting the device
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/15165Monolayer substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/161Cap
    • H01L2924/1615Shape
    • H01L2924/16195Flat cap [not enclosing an internal cavity]

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Lead Frames For Integrated Circuits (AREA)

Abstract

PURPOSE:To obtain a high dampproof semiconductor device by a method wherein a projected part is formed surrounding a concave part of a package, in which a semiconductor chip is installed, a seal ring with rough back surface is adhered to the projected part, then this surface is covered with a lid. CONSTITUTION:A concave part is formed on a lower half of a package main body 12 made by thermosetting resin, a semiconductor chip 3 is adhered on the base 9a through a die-pad 11, a lead frame 9 is adhered on a convex lower half of the main body 12 and a lead 10 and an electrode of the chip 3 is connected through a bonding wire 4. Then a metal seal ring 13 with rough back surface is adhered on a lower half of the main body 12 in such a manner as to surround the chip 3, and a lid 14 is adhered to the ring 13 surface with a wax 15 to cover a chip accommodation concave part 6 created by the above-mentioned process. Thus, the package main body 12 will not be injured because of the sum effect when the wax 15 is molten.

Description

【発明の詳細な説明】 〔発明の技術分野〕 この発明は、半導体チップを収納するチップ収納凹部を
有したパッケージ本体とこのパッケージ本体のチップ収
納凹部を密封する蓋体とを備えた半導体装置に関するも
のである。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a semiconductor device including a package body having a chip storage recess for storing a semiconductor chip, and a lid body for sealing the chip storage recess of the package body. It is something.

〔従来技術〕[Prior art]

第1図は例えば〔日本マイクロエレクトロニクス協会編
1981年1月25日発行’IC化実装技術。
Figure 1 shows, for example, ``IC Mounting Technology'' edited by Japan Microelectronics Association, published January 25, 1981.

−P1B7図6.8 (e) )に示されているような
この種の中空プラスチックタイプの半導体装置であシ、
図1ζおいて(1)及び<2) 1.を薄い金属板から
なるリードフレームのリード及びダイパッド、(3)は
このダイパッド<2) 、t:にハンダ等によって付着
され、リード(1)とはボンディングワイヤ(4)を介
して電気的に接続される半導体チップ、(6)はリード
(1)及びダイパッド(2Jと一体成形され、半:8体
チップ(3)が収納される収納部(6)を有した樹脂か
らなるパッケージ本体、(7)はこのパラ・ケージ本体
(5)に樹脂接着剤(8)を用いて接着された蓋体であ
る。
-P1B7 This kind of hollow plastic type semiconductor device as shown in Figure 6.8 (e))
(1) and <2) in Figure 1ζ 1. is the lead and die pad of the lead frame made of a thin metal plate, (3) is attached to this die pad <2), t: by solder, etc., and is electrically connected to the lead (1) via a bonding wire (4). The semiconductor chip (6) is integrally molded with the leads (1) and the die pad (2J), and the package body (7) is made of resin and has a housing part (6) in which the half-eight chip (3) is housed. ) is a lid that is adhered to the para-cage body (5) using a resin adhesive (8).

このように構成された半導体装置に於ては、樹脂からな
るパッケージ本体(5)と蓋体(7)とを樹脂接着剤(
8)にて接着゛しているため、耐湿性等の面がら性に問
題を有するものであった。
In the semiconductor device configured in this way, the package body (5) and the lid body (7) made of resin are bonded together using a resin adhesive (
8), there were problems with surface properties such as moisture resistance.

〔発明の概要〕[Summary of the invention]

この発明は上記した点に鑑みてなされたものであシ、半
導体チップを収納するチップ収納凹部を有する樹脂から
なるパッケージ本体と、このパッケージ本体のチップ収
納凹部を密封する蓋体とを備えたものにおいて、パッケ
ージ本体のチップ収納凹部開口端全周に亘って少なくと
も表面が露出して埋込まれたシールリングを設けるとと
もに蓋体のシールリング対向面を少なくとも金属面とし
て、この金属面とシールリングとを金属接合するように
し、パッケージ本体におけるチップ収納凹部の密封性を
高めるとと−に耐湿性等に対し信頼性に富む半導体装置
を提案するものである。
The present invention has been made in view of the above points, and includes a package body made of resin having a chip storage recess for storing a semiconductor chip, and a lid body that seals the chip storage recess of the package body. A seal ring is provided with at least the surface exposed and embedded over the entire circumference of the open end of the chip storage recess of the package body, and the surface of the lid body facing the seal ring is at least a metal surface, and the metal surface and the seal ring are connected to each other. The present invention proposes a semiconductor device that is highly reliable in terms of moisture resistance and the like, by metal-bonding the chips and improving the sealing performance of the chip-accommodating recess in the package body.

〔発明の実施例〕[Embodiments of the invention]

以下にこの発明の一実施例を第2図及び第8図に基づい
て説明すると、図において、e)は薄い金属板のリード
(11)及びグイバット(ロ)よりなシ、グイバット(
ロ)がリード(2)に対し窪んだ形状のリードフレーム
、幹はリードフレーム■及びレールリング(2)と一体
成形され、半導体チップ(3)を収納するテップ収納部
(6)を有した熱硬化性樹脂に無機質充てん材を混合し
た樹脂からなるパッケージ本体で、チップ収納凹部(6
)の底面(Sa) Sつまレダイパットaη載置面、が
リードOすの載置面(9b)より低く形成されているも
のである。aaは上記チップ収納凹部(6)に於ける開
口端全周に頁って表面が露出して埋込まれ、パッケージ
本体口の接合部分とrJる裏面に粗い凹凸を有する金F
l製のレールリングで、パッケージ本体いを形成する際
に一体的醗ζ成形されるものである。Q(lはこのシー
ルリング6場にろう材四により接着されたコバール等の
金属からひる蓋体であるー 次にこの杼に構成された半導体装置の製造方法を説明す
る。まず、リードフレーム■及びシールリングG3を一
体醗ζしてパッケージ本体(ロ)を形成し、次に半導体
チップ(3)をダイパッド←℃に装着した後、半導体チ
ップ(3)の所望の電極・と、リード叫とのワイヤボン
ドを行う。その後高温状態にて溶けているろう材、例え
ば210″C程度で溶けている半田を用いて、パッケー
ジ本体(ロ)に埋込まれたシールリング(至)の露出表
面と蓋体α4におけるJ:E露出表面に対向する面とを
接合し、を記チップ収納凹部(6)を密封させ、完成さ
せるものである。この時ろう材(ト)が高温状態1とな
るものの、シールリング(至)が金属であるため溶解す
ることはなく、シかも、樹脂からなるパッケージ本体(
ロ)に対してもシールリング謁が温度に対し緩和作用を
果たすため、パッケージ本体口における温度の影響もほ
とんどないものである。
An embodiment of the present invention will be explained below based on FIG. 2 and FIG.
(b) is a lead frame with a recessed shape relative to the lead (2); the trunk is integrally molded with the lead frame (■) and the rail ring (2); The package body is made of resin that is a mixture of hardening resin and inorganic filler, and has a chip storage recess (6
) The bottom surface (Sa) of the lead die pad aη mounting surface is formed lower than the mounting surface (9b) of the lead O. aa is a gold F which is embedded around the entire circumference of the opening end of the chip storage recess (6) with its surface exposed and has rough irregularities on the back surface where it connects to the opening of the package body.
This rail ring is made of aluminum and is integrally molded when forming the package body. Q (l is a lid made of metal such as Kovar that is bonded to this seal ring 6 with a brazing filler metal 4.Next, we will explain the manufacturing method of the semiconductor device configured in this shuttle.First, the lead frame and the seal ring G3 are integrally assembled to form the package body (b), and then the semiconductor chip (3) is attached to the die pad ←°C, and then the desired electrodes and lead screams of the semiconductor chip (3) are attached. Then, using a brazing material melted at high temperature, for example, solder melted at about 210"C, bond the exposed surface of the seal ring (to) embedded in the package body (b). The surface opposite to the J:E exposed surface of the lid body α4 is joined, and the chip storage recess (6) is sealed to complete the process. Since the seal ring is made of metal, it will not melt, and the package body made of resin (
Regarding (b), the seal ring has a moderating effect on temperature, so there is almost no effect of temperature on the package body opening.

従って、上記の様に構成された半導体装置にあってはシ
ールリング(至)がパッケージ本体@に埋込まれ、この
シールリング(至)と蓋体(ロ)とをろう材(至)にて
接合しているため、第1図に示した樹脂接着材にて接合
したものに対しチップ収納凹部(6)の密封構造は高め
られ、かつ良好な耐湿性が得られるものである。
Therefore, in the semiconductor device configured as described above, the seal ring (1) is embedded in the package body @, and the seal ring (1) and the lid body (2) are connected using a brazing material (2). Since they are bonded together, the sealing structure of the chip storage recess (6) is improved compared to that shown in FIG. 1 which is bonded with a resin adhesive, and good moisture resistance can be obtained.

第4因はこの発明の他の実施例を示すものであシ、上記
第2図に示したものに対し、シールリνグ(至)におけ
るチップ収納凹部(6)開口端表面の一部をパッケージ
本体口で覆うようにしたものである。
The fourth factor shows another embodiment of the present invention, and in contrast to the one shown in FIG. It is designed to be covered by the mouth of the main body.

このよう1こすればシールリング(至)の固定強度は高
まシ更にはチップ収納凹部(6)の密封性も高まるもの
である。
In this way, by rubbing once, the fixing strength of the seal ring (to) is increased, and the sealing performance of the chip storage recess (6) is also improved.

なお、を記実施例に於ては金属の蓋体0<とシールリン
グ03との接合をろう材−を用いて行ったが、蓋体Q4
1とシールリング(2)とを電気抵抗溶接によって直接
付着しても良くその際には、シールリング(至)及び蓋
体aくを橘成する金属に電気抵抗溶接の可能なものを用
いれば良い。
In addition, in the embodiment described above, the metal lid Q4 was joined to the seal ring 03 using a brazing material.
1 and the seal ring (2) may be directly attached by electric resistance welding. In that case, if the metal forming the seal ring (to) and the lid body a is capable of electric resistance welding. good.

また、J:紀実施例に於ては、蓋体α◆を金属からなる
ものとしたがシールリング(2)の露出表面に対向する
面にメタライズが施さすtた透光性のガラスあるいはシ
ールリング(至)の露出表面に対向する面にメタライズ
が施された樹脂からなるものでも良く、要は蓋体α◆と
じて、シールリング斡の無比表面に対向する面が少なく
とも金属面となっているものであわば同様の効果を奏す
るものである。
In addition, in the J: period embodiment, the lid body α◆ was made of metal, but the surface opposite to the exposed surface of the seal ring (2) was made of transparent glass or a seal with metallization applied to it. It may also be made of a resin with metallization applied to the surface facing the exposed surface of the ring (to), and the point is that at least the surface facing the unrivaled surface of the seal ring □ is a metal surface as well as the lid body α◆. There are similar effects, so to speak.

〔発明の効果〕〔Effect of the invention〕

この発明は以と説明した通り、半導体チップが収納され
るチップ収納凹部を有した樹脂からなるパッケージ本体
と一体、このパッケージ本体のチップ収納凹部を密封す
る蓋体とを備えたものにおいて、パッケージ本体のチッ
プ収納凹部開口端全周に亘って少なくとも表面が露出し
て埋込まれたシールリングを設け、かつ蓋体におけるシ
ールリングの露出表面と対向する面を金属面とし、この
金属面とシールリングの露出表面とを金属接合したので
、パッケージ本体におけるチップ収納凹部の密封性が向
tするとともにパッケージ本体と蓋体との接合部におけ
る耐湿性も向tするという効果を有するものである。
As explained below, the present invention includes a package body made of resin having a chip storage recess in which a semiconductor chip is stored, and a lid body that seals the chip storage recess of the package body. A seal ring is provided with at least the surface exposed and embedded over the entire circumference of the opening end of the chip storage recess, and the surface of the lid body facing the exposed surface of the seal ring is a metal surface, and this metal surface and the seal ring are provided. Since the exposed surface of the package body is metal-bonded, the sealing performance of the chip storage recess in the package body is improved, and the moisture resistance of the joint between the package body and the lid body is also improved.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、従来の半導体装置を示す断面図、第る。 図に於て、(3)は半導体チップ、(6)はチップ収納
凹部、口はパッケージ本体、(至)はシールリング、α
◆は蓋体である。 なお各図中同一符号は同一または相当部分を示すものと
する。 −代理人 大岩増雄 第1図 第2図 第3図 第4図 手続補正書(自発) l、事件の表示   特願昭 59−151908号3
、補正をする者 代表者片由仁へ部 4、代理人 5、補正の対象 (1)明細書の発明の詳細な説明の欄。 6、補正の内容 (1)明細書中筒8頁第8行に「パッケージ本体と一体
、」とあるのを「パッケージ本体と、」と訂正する。 以上
FIG. 1 is a sectional view showing a conventional semiconductor device. In the figure, (3) is the semiconductor chip, (6) is the chip storage recess, the mouth is the package body, (to) is the seal ring, α
◆ is the lid body. Note that the same reference numerals in each figure indicate the same or corresponding parts. - Agent Masuo Oiwa Figure 1 Figure 2 Figure 3 Figure 4 Procedural amendment (voluntary) l, Indication of case Patent application No. 151908/1989 3
, To the representative of the person making the amendment, Kata Yuhito Part 4, Agent 5, Subject of amendment (1) Column for detailed explanation of the invention in the specification. 6. Contents of the amendment (1) In the eighth line of page 8 of the middle cylinder of the specification, the phrase "integrated with the package body" is corrected to "with the package body."that's all

Claims (8)

【特許請求の範囲】[Claims] (1)半導体チップが収納されるチップ収納凹部を有し
た樹脂からなるパッケージ本体と、上記チップ収納凹部
に於ける開口端全周にわたつて少なくとも表面が露出し
て埋込まれた金属からなるシールリング、このシールリ
ングの露出した表面に対向した面が少なくとも金属面か
らなり、この金属面と上記シールリングの露出表面とが
金属接合された蓋体とを備えた半導体装置。
(1) A package body made of resin having a chip storage recess in which a semiconductor chip is stored, and a seal made of metal embedded with at least the surface exposed over the entire circumference of the open end of the chip storage recess. 1. A semiconductor device comprising a ring, a lid body in which the surface facing the exposed surface of the seal ring is at least made of a metal surface, and the metal surface and the exposed surface of the seal ring are metal-bonded.
(2)シールリングは、パッケージ本体との接合面とな
る裏面が凹凸形成されているものである特許請求の範囲
第1項記載の半導体装置。
(2) The semiconductor device according to claim 1, wherein the seal ring has an uneven back surface that becomes a bonding surface with the package body.
(3)パッケージ本体は、熱硬化性樹脂であることを特
徴とする特許請求の範囲第1項または第2項記載の半導
体装置。
(3) The semiconductor device according to claim 1 or 2, wherein the package body is made of thermosetting resin.
(4)金属接合は、ろう付けであることを特徴とする特
許請求の範囲第1項ないし第3項のいずれかに記載の半
導体装置。
(4) The semiconductor device according to any one of claims 1 to 3, wherein the metal bonding is brazing.
(5)収納凹部底面は一体成形されるリードフレームの
リード載置面より低く形成されていることを特徴とする
特許請求の範囲第1項ないし第4項のいずれかに記載の
半導体装置。
(5) The semiconductor device according to any one of claims 1 to 4, wherein the bottom surface of the storage recess is formed lower than the lead mounting surface of the integrally molded lead frame.
(6)蓋体及びシールリングは、互いに電気抵抗溶接可
能な金属であることを特徴とする特許請求の範囲第1項
ないし第8項のいずれかに記載の半導体装置。
(6) The semiconductor device according to any one of claims 1 to 8, wherein the lid and the seal ring are made of metal that can be electrically resistance welded to each other.
(7)蓋体はシールリングの露出表面に対向した面がメ
タライズされた樹脂からなることを特徴とする特許請求
の範囲第1項ないし第5項のいずれかに記載の半導体装
置。
(7) The semiconductor device according to any one of claims 1 to 5, wherein the lid body is made of a resin whose surface facing the exposed surface of the seal ring is metalized.
(8)蓋体はシールリングの露出表面に対向して面がメ
タライズされたガラスからなることを特徴とする特許請
求の範囲第1項ないし第5項のいずれかに記載の半導体
装置。
(8) The semiconductor device according to any one of claims 1 to 5, wherein the lid body is made of glass whose surface facing the exposed surface of the seal ring is metalized.
JP15190384A 1984-07-20 1984-07-20 Semiconductor device Pending JPS6130057A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15190384A JPS6130057A (en) 1984-07-20 1984-07-20 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15190384A JPS6130057A (en) 1984-07-20 1984-07-20 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS6130057A true JPS6130057A (en) 1986-02-12

Family

ID=15528707

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15190384A Pending JPS6130057A (en) 1984-07-20 1984-07-20 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS6130057A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0928025A2 (en) * 1997-12-27 1999-07-07 TDK Corporation Wiring board and process for the production thereof
JP2006121278A (en) * 2004-10-20 2006-05-11 Matsushita Electric Ind Co Ltd Antenna system and communication system using the same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5832435A (en) * 1981-08-20 1983-02-25 Nec Corp Semiconductor device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5832435A (en) * 1981-08-20 1983-02-25 Nec Corp Semiconductor device

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0928025A2 (en) * 1997-12-27 1999-07-07 TDK Corporation Wiring board and process for the production thereof
EP0928025A3 (en) * 1997-12-27 2000-04-12 TDK Corporation Wiring board and process for the production thereof
US6204454B1 (en) 1997-12-27 2001-03-20 Tdk Corporation Wiring board and process for the production thereof
JP2006121278A (en) * 2004-10-20 2006-05-11 Matsushita Electric Ind Co Ltd Antenna system and communication system using the same
JP4631388B2 (en) * 2004-10-20 2011-02-16 パナソニック株式会社 Antenna device and communication system using the same

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