JPS61263222A - 走査型描画装置 - Google Patents

走査型描画装置

Info

Publication number
JPS61263222A
JPS61263222A JP60103963A JP10396385A JPS61263222A JP S61263222 A JPS61263222 A JP S61263222A JP 60103963 A JP60103963 A JP 60103963A JP 10396385 A JP10396385 A JP 10396385A JP S61263222 A JPS61263222 A JP S61263222A
Authority
JP
Japan
Prior art keywords
pattern
key
exposure
scanning
laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60103963A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0580811B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Makoto Torigoe
真 鳥越
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP60103963A priority Critical patent/JPS61263222A/ja
Publication of JPS61263222A publication Critical patent/JPS61263222A/ja
Publication of JPH0580811B2 publication Critical patent/JPH0580811B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70358Scanning exposure, i.e. relative movement of patterned beam and workpiece during imaging
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
JP60103963A 1985-05-17 1985-05-17 走査型描画装置 Granted JPS61263222A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60103963A JPS61263222A (ja) 1985-05-17 1985-05-17 走査型描画装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60103963A JPS61263222A (ja) 1985-05-17 1985-05-17 走査型描画装置

Publications (2)

Publication Number Publication Date
JPS61263222A true JPS61263222A (ja) 1986-11-21
JPH0580811B2 JPH0580811B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1993-11-10

Family

ID=14368027

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60103963A Granted JPS61263222A (ja) 1985-05-17 1985-05-17 走査型描画装置

Country Status (1)

Country Link
JP (1) JPS61263222A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1048835A (ja) * 1996-08-06 1998-02-20 Ibiden Co Ltd プリント配線板の製造装置及び製造方法
US11143862B2 (en) 2016-03-30 2021-10-12 Nikon Corporation Pattern drawing device, pattern drawing method, and method for manufacturing device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1048835A (ja) * 1996-08-06 1998-02-20 Ibiden Co Ltd プリント配線板の製造装置及び製造方法
US11143862B2 (en) 2016-03-30 2021-10-12 Nikon Corporation Pattern drawing device, pattern drawing method, and method for manufacturing device

Also Published As

Publication number Publication date
JPH0580811B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1993-11-10

Similar Documents

Publication Publication Date Title
US4269505A (en) Device for the projection printing of the masks of a mask set onto a semiconductor substrate
US5148214A (en) Alignment and exposure apparatus
US5933219A (en) Projection exposure apparatus and device manufacturing method capable of controlling polarization direction
JPS62145730A (ja) 投影型露光装置
KR100277110B1 (ko) 노광장치
JP3320262B2 (ja) 走査露光装置及び方法並びにそれを用いたデバイス製造方法
JPS6193454A (ja) 写真平板式マスク整合装置
JP3097620B2 (ja) 走査型縮小投影露光装置
JPH1097969A (ja) 走査型縮小投影露光装置及びディストーション測定方法
JP2650396B2 (ja) 位置検出装置及び位置検出方法
JPS61263222A (ja) 走査型描画装置
JP4100038B2 (ja) 露光方法および露光装置
KR100596270B1 (ko) 얼라인 마크 및 얼라인 방법
JPS60177623A (ja) 露光装置
US4682037A (en) Projection exposure apparatus having an alignment light of a wavelength other than that of the exposure light
JPH0620913A (ja) 露光方法及び装置
JPH0933213A (ja) 位置誤差計測方法および半導体装置の製造方法
CN112327579A (zh) 曝光装置以及物品的制造方法
JP7513823B1 (ja) 露光装置、及び露光方法
JPS6340316A (ja) 半導体製造装置
JPH09275058A (ja) 投影露光方法
JP2899026B2 (ja) マーク検出装置
JPH0560254B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JPH11283911A (ja) 焼き付け方法、マスク基板、及び焼き付け装置
KR100632677B1 (ko) 투과율 조절 노광장치

Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term