JPS61258598A - Diagnostic system - Google Patents

Diagnostic system

Info

Publication number
JPS61258598A
JPS61258598A JP10069585A JP10069585A JPS61258598A JP S61258598 A JPS61258598 A JP S61258598A JP 10069585 A JP10069585 A JP 10069585A JP 10069585 A JP10069585 A JP 10069585A JP S61258598 A JPS61258598 A JP S61258598A
Authority
JP
Japan
Prior art keywords
division switch
sby
act
test pattern
time division
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10069585A
Other languages
Japanese (ja)
Inventor
Satoru Kuwata
桑田　悟
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP10069585A priority Critical patent/JPS61258598A/en
Publication of JPS61258598A publication Critical patent/JPS61258598A/en
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04M—TELEPHONIC COMMUNICATION
    • H04M3/00—Automatic or semi-automatic exchanges
    • H04M3/22—Arrangements for supervision, monitoring or testing
    • H04M3/26—Arrangements for supervision, monitoring or testing with means for applying test signals or for measuring
    • H04M3/28—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor
    • H04M3/32—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for lines between exchanges
    • H04M3/323—Automatic routine testing ; Fault testing; Installation testing; Test methods, test equipment or test arrangements therefor for lines between exchanges for the arrangements providing the connection (test connection, test call, call simulation)

Landscapes

  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Monitoring And Testing Of Exchanges (AREA)
  • Use Of Switch Circuits For Exchanges And Methods Of Control Of Multiplex Exchanges (AREA)

Abstract

PURPOSE:To attain complete switching diagnose by setting a test pattern to a transmission signal memory for operational system and transmitting the test pattern after providing a return route respectively with operational system as well as stand-by system and checking the test pattern which is received by stand-by receiving signal memory. CONSTITUTION:The test pattern is set a SSM 7n at an ACT side and both the return path and return instruction are set at the ACT side and at the same time both the return path and its instruction are set at a SBY side. Then the test pattern which is set to a SSM 7n at the ACT side is sent to a RSM 4s at the SBY side through following order; SSM 7n, ACT side dropper 12n, ACT side return route, ACT side inserter 11n, ACT side primary time division switch 1n, ACT side space division 3s, SBY side secondary time division switch 2s, SBY side dropper 12s, SBY side return route, SBY side inserter 11s, SBY side. Furthermore the following operation condition; space division switch 3s, SBY side secondary time division switch 2s dropper 12s is diagnosed after checking the test patterns inputted into the RSM 4s, SBY side.

Description

【発明の詳細な説明】 〔概要〕 運用系の送信信号メモリにテストパターンを設定し、運
用系と待機系に夫々折返しルートを設け、此のテストパ
ターンを運用系の一次時分割スイッチー待機系の空間分
割スイッチ−待機系の二次時分割スイッチを経由して待
機系の受信信号メモリへ伝送し、待機系の受信信号メモ
リへ正しいテストパターンが送られたか否かを調べてス
イッチの動作状態を診断する。[Detailed Description of the Invention] [Summary] A test pattern is set in the transmission signal memory of the active system, return routes are provided for the active system and the standby system, and this test pattern is transmitted between the primary time division switch of the active system and the standby system. Space division switch - Transmits the signal to the standby reception signal memory via the standby secondary time division switch, and checks whether the correct test pattern has been sent to the standby reception signal memory to check the operating status of the switch. Diagnose.

〔産業上の利用分野〕[Industrial application field]

本発明は其のスイッチが時分割スイッチ一空間分割スイ
ッチ一時分割スイッチ方式で構成され、此れ等スイッチ
が二重化され、而も時分割スイッチ一空間分割スイッチ
間に交絡を持つ時分割形電子交換機に関するものである
。The present invention relates to a time-division type electronic exchange in which the switch is configured with a time-division switch and a space-division switch, and a temporary division switch system, in which these switches are duplicated, and in which there is a confound between the time-division switch and the space-division switch. It is something.

」二記電子交換機に於いては従来スイッチの動作状態を
診断する際、一部診断が不可能な部分があり、此の改善
が強く求められていた。2) When diagnosing the operating status of conventional switches in electronic exchanges, there are some areas in which diagnosis is impossible, and there is a strong demand for improvements in this area.

〔従来の技術〕[Conventional technology]

第２図は従来の時分割形電子交換機のスイッチの一例を
示す図である。FIG. 2 is a diagram showing an example of a switch of a conventional time division type electronic exchange.

第３図は第２図に示す時分割形電子交換機のスイッチの
従来の診断方式の一例を説明する図である。FIG. 3 is a diagram illustrating an example of a conventional diagnosis method for the switch of the time-sharing electronic exchange shown in FIG. 2.

図中、ＡＣＴは運用中を、ＳＢＹは待機中（予備）を夫
々表す。In the figure, ACT indicates in operation, and SBY indicates standby (standby).

１ｎはＡＣＴ側一次時分割スイッチ、 １ｓはＳＢＹ側一次時分割スイッチ、 ２ｎばＡＣＴ側二次時分割スイッチ、 ２３はＳＢＹ側二次時分割スイッチ、 ３ｎばＡ、ＣＴ側空間分割スイッチ、 ３ｓはＳＢＹ側空間分割スイッチ、 ４ｎはＡ　ＣＴ（ｊｌ、ｌｌ　ＲＳ　Ｍ　（受信信号メ
モ１月、４ｓｉ才Ｓ　ＢＹ（！ｌ１ｌＲＳ　Ｍ　（受信
信号メモリ）、５ｎは八ＣＴ（！１．ＩＩ　Ｐ　Ｔ　Ｃ
（一次時分割スイッチ制御メモリ）、 ５ＳはＳ　Ｂ　Ｙ（ｊｌ、ｌｌＰ　Ｔ　Ｃ（一次時分割
スイッチ制御メモリ）、 ６ｎばＡ　ＣＴ　（！！ＩＩ　Ｓ　Ｗ　Ｃ（空間分割ス
イッチ制御メモリ）、 ６ＳはＳＢＹ側ＳＷＣ＜空間分割スイッチ制御メモリ）
、 ７ｎはＡＣＴ（！！ＩＩｓｓＭ（送信信号メモリ）、７
ｓはＳ　Ｂ　Ｙ（ｆｌｌｌｓ　Ｓ　Ｍ　（送信信号メモ
リ）、８ｎはＡ　ＣＴ　（ｊｌ、ｌｌ　Ｓ　Ｔ　Ｃ（二
次時分割スイッチ制御メモリ）、 ８Ｓは５ＢＹ（！！ｌｌ５Ｔｃ（二次時分割スイッチ制
御メモリ）、 ９ｎはＡ　ＣＴ（！１．ｌＩＭ　Ｐ　Ｘ　（、多重化装
置）、９ＳはＳ　Ｂ　Ｙ（ｊｊｌｌＭ　Ｐ　Ｘ　（多重
化装置）、ＩｏｎはＡＣＴ側ＤＭＸ　（多重化分離装置
）、１０ｓばＳ　Ｂ　Ｙ（！１．ｌ］ＤＭＸ　（多重化
分離装置）、１１ｎはＡＣＴ側インサータ、 １］ＳばＳＢＹ側インザータ、 １２ｎばＡＣＴ側ドｏ　ソバ−１ １２３はＳＢＹ側ドロッパーである。1n is the ACT side primary time division switch, 1s is the SBY side primary time division switch, 2n is the ACT side secondary time division switch, 23 is the SBY side secondary time division switch, 3n is A, the CT side space division switch, 3s is the SBY side space division switch, 4n is A CT (jl, ll RS M (received signal memo January, 4si year old SBY (!l1lRS M (received signal memory), 5n is 8 CT (!1. II P T C
(Primary time-division switch control memory), 5S is S B Y (jl, llP T C (primary time-division switch control memory), 6n is A CT (!!II S W C (space-division switch control memory), 6S is SBY side SWC<space division switch control memory)
, 7n is ACT (!!IIssM (transmission signal memory), 7
s is SBY (fulls SM (transmission signal memory), 8n is A CT (jl,ll STC (secondary time division switch control memory), 8S is 5BY (!!ll5Tc (secondary time division switch control memory) 9n is ACT (!1.IM P SBY (!1.l)DMX (multiplexing/demultiplexing device), 11n is an ACT side inserter, 1]S is an SBY side inserter, 12n is an ACT side dropper.123 is an SBY side dropper.

尚以下全図を通じ同一記号は同一対象物を表す。The same symbols represent the same objects throughout all the figures below.

上記ネットワークに関する従来の診断方式は、二重化さ
れたスイッチの片方をシステムから分離し、分離された
スイッチ（以下ＳＢＹ側スイッチと呼ぶ）のみを取り出
して此れに対する診断を行っていた。In the conventional diagnosis method for the above network, one of the duplicated switches is separated from the system, and only the separated switch (hereinafter referred to as the SBY side switch) is taken out and diagnosed.

即ち、従来の診断方式に依ると第３図に示す様にＳＢＹ
側では５５Ｍ７ｓにはテストパターンを設定し、診断を
行う時には此のテストパターンを５５Ｍ７ｓから取り出
してドロッパー］２ｓに入力する。That is, according to the conventional diagnosis method, SBY is detected as shown in Fig. 3.
On the side, a test pattern is set in the 55M7s, and when making a diagnosis, this test pattern is taken out from the 55M7s and input into the dropper]2s.

従来の電子交換機にはドロッパー１２ｓからインサータ
ＩＩｓへの折返しルートが設定出来るようになっている
ので実線で示す様に此の折返しルーＩ・を使用してテス
トパターンをインサータ１．Ｉｓ経山Ｒ３Ｍ４ｓ及び一
次時分割スイッチ１ｓに入力出来る。Conventional electronic exchanges are capable of setting a return route from the dropper 12s to the inserter IIs, so the test pattern is transferred to the inserter 1. It can be input to Is Keizan R3M4s and primary time division switch 1s.

従って一次時分割スイッチ１ｓの試験を行うことは出来
る。Therefore, it is possible to test the primary time division switch 1s.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

然しなから、空間分割スイッチ３ｓと二次時分割スイッ
チ２ｓの試験は運用中の音声信号を予備側スイッチに流
して試験する方法があるが、従来の電子交換機では一次
時分割スイッチ１一空間分割スイッチ３の接続はＡＣＴ
選択方式である為、第２図に示す様に一次時分割スイッ
チ１ｎ一空間分割スイッチ３ｓ−二次時分割スイッチ２
ｓのルート、及び一次時分割スイッチ１ｎ一空間分割ス
イッチ３ｎ−二次時分割スイッチ２ｎのルートで信号を
通ずことは出来るが、一次時分割スイッチＩＳ一空間分
割スイッチ３ｓのルートで信号を１ｆｆｌ。However, there is a method to test the space division switch 3s and the secondary time division switch 2s by sending the voice signal during operation to the standby switch, but in conventional electronic exchanges, the primary time division switch 1 and the space division switch 2s are tested. Switch 3 connection is ACT
Since it is a selection method, as shown in Fig. 2, the primary time division switch 1n, the space division switch 3s - the secondary time division switch 2
Although it is possible to pass the signal through the route of the primary time division switch IS and the route of the space division switch 3n to the secondary time division switch 2n, the signal can be passed through the route of the primary time division switch IS and the space division switch 3s. .

ずことＩＩ出来ない。Zuko and II can't do it.

従って空間分割スイッチ３ｓ−・二次１１．．５分割ス
イッチ２ＳのルートはＡＣＴ側のテークしか通らないた
めデータを変化させて試験すること幡出来ない。Therefore, the space division switch 3s-secondary 11. ．． Since the route of the 5-split switch 2S passes only the take on the ACT side, it is not possible to test by changing the data.

此の為診断を行うに当たり任意のテスト用テークを時分
割スイッチから空間分割スイ・２チに移すことか出来な
いので、−次時分割スイノチｌｓ一空間分割スイッチ３
８間のインタフェイス、及び二次時分割スイッチ２ｓの
診断が一部不可能となると云う欠点かあった。For this reason, when making a diagnosis, it is only possible to move any test take from the time division switch to the space division switch 2, so - next time division switch ls 1 space division switch 3
There was a drawback in that it became partially impossible to diagnose the interface between the 8 and 8 and the secondary time division switch 2s.

〔問題点を解決するための手段〕[Means for solving problems]

第１図に示す様に運用系の送信信号メモリ　（７ｎ）に
テストパターンを設定し、運用系と待機系に人々折返し
ルートを設け、運用系の送信信号メモリ　（７ｎ）→運
用系ドロンパー（１２ｎ）−運用系折返しルート−運用
系インサータ（１１ｎ　）−運用系の二次時分割スイッ
チ（１ｎ）−待機系の空間分割スイッチ（３ｓ）−待機
系の二次時分割スィッチ（２Ｓ）−待機系ドロッパー（
１２Ｓ）−待機系折返しルート−待機系インサータ（Ｉ
Ｉｓ）−”待機系の受信信号メモリ　（４Ｓ）のルート
で前記テストパターンを伝送し、運用系の送信信号メモ
リ　（７ｎ）に設定された前記テストパターンと待機系
の受信信号メモリ　（４ｓ）が受信した前記テストパタ
ーンを照合する。As shown in Figure 1, a test pattern is set in the active system transmission signal memory (7n), a return route is established between the active system and the standby system, and the active system transmission signal memory (7n) → active system Dronper (12n) is set. ) - Active system return route - Active system inserter (11n) - Active system secondary time division switch (1n) - Standby system space division switch (3s) - Standby system secondary time division switch (2S) - Standby system Dropper (
12S) - Standby system return route - Standby system inserter (I
Is) - "The test pattern is transmitted through the route of the standby system reception signal memory (4S), and the test pattern set in the active system transmission signal memory (7n) and the standby system reception signal memory (4S) are transmitted. The received test pattern is verified.

〔作用〕[Effect]

本発明に依ると任意のテストパターンを運用系の送信信
号メモリ　（７ｎ）に設定し、此のテストパターンを運
用系の二次時分割スイッチ（１ｎ）−待機系の空間分割
スイッチ（３ｓ）−待機系の二次時分割スイッチ（２Ｓ
）を経由して伝送し、最後に待機系の受信信号メモリ　
（４ｓ）で受信し、運用系の送信信号メモリ　（７ｎ）
に設定された前記テストパターンと、待機系の受信信号
メモリ（４Ｓ）が受信した前記テストパターンを照合す
るので完全なスイッチ診断が可能となると云う効果が生
まれる。According to the present invention, an arbitrary test pattern is set in the transmission signal memory (7n) of the active system, and this test pattern is sent to the secondary time division switch (1n) of the active system - the space division switch (3s) of the standby system. Standby secondary time division switch (2S
) and finally to the standby receiving signal memory.
(4s) and operational transmission signal memory (7n)
Since the test pattern set in the test pattern is compared with the test pattern received by the standby received signal memory (4S), it is possible to perform a complete switch diagnosis.

〔実施例〕〔Example〕

第１図は本発明に依る診断方式の一実施例を示す図であ
る。FIG. 1 is a diagram showing an embodiment of the diagnostic method according to the present invention.

以下図に従って本発明の詳細な説明する。The present invention will be described in detail below with reference to the drawings.

本発明に依るとテストパターンをＡＣＴ（！ＩＩＩｓｓ
Ｍ　７　ｎに設定し、此のテストパターンを使用して空
間分割スィッチ３ｓ→二次時分割スイッチ２ｓのルート
の試験を行う。According to the present invention, the test pattern is ACT (!IIIss
M 7 n, and using this test pattern, a test is performed on the route from the space division switch 3s to the secondary time division switch 2s.

其の手順は下記による。The procedure is as follows.

■ＡＣＴ側の折返しパスを設定する為、５５Ｍ７、Ｒ３
Ｍ４、及びＩＴＳ　（折返しパス設定用タイムスロット
）をハントする。■To set the return path on the ACT side, 55M7, R3
Hunt M4 and ITS (time slot for setting a return path).

■ＡＣＴ（ｉｌｌｓｓＭ７ｎにテストパターンを設定す
る。■ACT (Set test pattern on illssM7n.

■ＡＣＴ側で折返しパスを設定する。■Set the return path on the ACT side.

■ＡＣＴ側で折返し指示を設定する。■Set callback instructions on the ACT side.

■ＳＢＹ側で折返しパスを設定する。■Set a return path on the SBY side.

■ＳＢＹ側で折返し指示を設定する。■Set a callback instruction on the SBY side.

■Ｓ　Ｂ　Ｙ（ｉｌ、ｌＩＲＳ　Ｍ　４　ｓを読取る。■ Read S B Y (il, l IRS M 4 s.

■５ＢＹ（１１，！ＩＲ３Ｍ４ｓの読取データとＡＣＴ
側５５Ｍ７ｎに設定されたテストパターンを照合する。■5BY(11,!IR3M4s read data and ACT
The test pattern set on the side 55M7n is compared.

■〜■の操作により、実線で示す様にＡＣＴ側５５Ｍ７
ｎに設定されたテストパターンは下記のルートでＳ　Ｂ
　Ｙ（！］、’ｌＲＳ　Ｍ　４　ｓへ送られる。By operating ■～■, the ACT side 55M7 is turned on as shown by the solid line.
The test pattern set to n is S B using the following route.
Y(!], sent to 'lRS M 4 s.

ＡＣＴ（！ｌｌＩＳＳＭ７　ｎ→ＡＣＴ側ドロッパー１
２ｒｌ−ＡＣＴ側折返しルート−ＡＣＴ側インザータ１
１ｎ　４　Ａ　ＣＴ側一次時分割スイッチＩｎ−３ＢＹ
側空間分割スイッチ３ｓ−３ＢＹ側二次時分割スイッチ
２ｓ−３ＢＹ側ドロッパー１２３−３ＢＹ側折返しルー
ト→ＳＢＹ側インサータ１１３→ＳＢＹ側Ｒ３Ｍ４−ｓ
。ACT(!llISSM7 n→ACT side dropper 1
2rl-ACT side return route-ACT side inserter 1
1n 4 A CT side primary time division switch In-3BY
Side space division switch 3s-3BY side secondary time division switch 2s-3BY side dropper 123-3BY side return route → SBY side inserter 113 → SBY side R3M4-s
.

■〜■により、Ｓ　Ｂ　Ｙ（ｊｌ、ｌＩＲＳ　Ｍ　４　
ｓに入力されたテストパターンを３周べることにより、
５ＢＹ（同空間分割スイッチ３ｓ−３ＢＹ側二次時分割
スイッチ２ｓ−３ＢＹ側ドロツパー１２３の動作状態を
診断することが出来る。According to ■～■, S B Y (jl, lIRS M 4
By running the test pattern input to s three times,
5BY (same space division switch 3s-3BY side secondary time division switch 2s-3BY side dropper 123 operating state can be diagnosed.

〔発明の効果〕〔Effect of the invention〕

以上詳細に説明した様に本発明によれば、テストパター
ンを使用して時分割スイッチ一空間分割スイッチのイン
タフェイス、空間分割スイッチ、及び二次時分割スイッ
チを完全に診断することが出来ると云う大きい効果があ
る。As described in detail above, according to the present invention, it is possible to completely diagnose a time division switch-space division switch interface, a space division switch, and a secondary time division switch using test patterns. It has a big effect.

【図面の簡単な説明】[Brief explanation of drawings]

第１図は本発明に依る診断方式の一実施例を示す図であ
る。 第２図は従来の時分割形電子交換機のスイッチの一例を
示す図である。 第３図は第２図に示す時分割形電子交換機のスイッチの
従来の診断方式の一例を説明する図である。 図中、ＡＣＴは運用中を、ＳＢＹは待機中（予備）を夫
々表す。 １ｎはＡＣＴ側一次時分割スイッチ、 ＩＳはＳＢＹ側−次時分割スイッチ、 ２ｎはＡＣＴ側二次時分割スイッチ、 ２ｓはＳＢＹ側二次時分割スイッチ、 ３ｎはＡＣＴ側空間分割スイッチ、 ３ｓはＳＢＹ側空同空間分割スイッ チｎはＡＣＴ（ｊｔｌｌＲ３Ｍ（受信信号メモ１月、４
Ｓは５ＢＹ（！！ＩＩＲ３Ｍ（受信信号メモリ）、５ｎ
はＡＣＴ（ｊｌｌＰＴｃ（一次時分割スイッチ制御メモ
リ）、 ５Ｓは５ＢＹ（ｉｌ、１ｌＰＴｃ（−次時分割スイッチ
制御メモリ）、 ６ｎはＡＣＴ側ＳＷＣ（空間分割スイッチ制御メモリ）
、 ６ｓはＳＢＹ側ＳＷＣ（空間分割スイッチ制御メモリ）
、 ７ｎはＡ　ＣＴ（！１．１１ｓ　ＳＭ　（送信信号メモ
１月、７ｓは５ＢＹ（！！ＩＩＳＳＭ（送信信号メモリ
）、８ｎはＡＣＴ側ＳＴＣ（二次時分割スイッチ制御メ
モリ）、 ８ＳはＳ　Ｂ　Ｙ（！１．１１ｓ　Ｔ　Ｃ（二次時分割
スイッチ制御メモリ）、 ９ｎばＡＣＴ側ＭＰＸ　（多重化装置）、９ＳはＳＢＹ
側ＭＰＸ　（多重化装置）、冊 ＩｏｎはＡ　ＣＴ　（！１．１１　Ｄ　Ｍ　Ｘ　（多重
化分離装置）、１０ｓはＳＢＹ側ＤＭＸ　（多重化分離
装置）、１１ｎはＡＣＴ側インザータ、 １１ＳはＳＢＹ側インザータ、 １２ｎはＡＣＴ側ドｐ　ソバ−１ １２ＳはＳＢＹ側ドロッパーである。FIG. 1 is a diagram showing an embodiment of the diagnostic method according to the present invention. FIG. 2 is a diagram showing an example of a switch of a conventional time division type electronic exchange. FIG. 3 is a diagram illustrating an example of a conventional diagnosis method for the switch of the time-sharing electronic exchange shown in FIG. 2. In the figure, ACT indicates in operation, and SBY indicates standby (standby). 1n is the primary time division switch on the ACT side, IS is the secondary time division switch on the SBY side, 2n is the secondary time division switch on the ACT side, 2s is the secondary time division switch on the SBY side, 3n is the space division switch on the ACT side, 3s is the SBY side The side air space division switch n is ACT (jtllR3M (received signal memo January, 4
S is 5BY (!! IIR3M (received signal memory), 5n
is ACT (jllPTc (primary time division switch control memory), 5S is 5BY (il, 11PTc (-second time division switch control memory), 6n is ACT side SWC (space division switch control memory)
, 6s is SBY side SWC (space division switch control memory)
, 7n is ACT (!1.11s SM (transmission signal memo January), 7s is 5BY (!! IISSM (transmission signal memory), 8n is ACT side STC (secondary time division switch control memory), 8S is S B Y (!1.11s T C (secondary time division switch control memory), 9n is ACT side MPX (multiplexer), 9S is SBY
side MPX (multiplexing device), book Ion is ACT (!1.11 DMX (multiplexing demultiplexing device), 10s is SBY side DMX (multiplexing demultiplexing device), 11n is ACT side inserter, 11S is SBY side Inserter, 12n is the ACT side dropper, 12S is the SBY side dropper.

Claims (1)

【特許請求の範囲】 夫々のスイッチが何れも二重化され、且つ前記スイッチ
が一次時分割スイッチ（１ｎ、１ｓ）一空間分割スイッ
チ（３ｎ、３ｓ）−二次時分割スイッチ（２ｎ、２ｓ）
方式で構成され、而も前記一次時分割スイッチ（１ｎ、
１ｓ）〜前記空間分割スイッチ（３ｎ、３ｓ）間に交絡
を持つ時分割形電子交換機に於いて、 運用系の送信信号メモリ（７ｎ）にテストパターンを設
定し、 運用系と待機系に夫々折返しルートを設け、該運用系の
送信信号メモリ（７ｎ）→運用系のドロッパー（１２ｎ
）→運用系の折返しルート→運用系のインサータ（１１
ｎ）→運用系の一次時分割スイッチ（１ｎ）→待機系の
空間分割スイッチ（３ｓ）→待機系の二次時分割スイッ
チ（２ｓ）→待機系のドロッパー（１２ｓ）→待機系の
折返しルート→待機系のインサータ（１１ｓ）→待機系
の受信信号メモリ（４ｓ）のルートで前記テストパター
ンを伝送し、 該運用系の送信信号メモリ（７ｎ）に設定された前記テ
ストパターンと該待機系の受信信号メモリ（４ｓ）が受
信した前記テストパターンを照合することを特徴とする
診断方式。[Claims] Each switch is duplexed, and each switch is a primary time division switch (1n, 1s), a space division switch (3n, 3s), and a secondary time division switch (2n, 2s).
The primary time division switch (1n,
In a time-division type electronic exchange with interlacing between 1s) and the space-division switch (3n, 3s), a test pattern is set in the transmission signal memory (7n) of the active system, and the test pattern is looped back to the active system and the standby system, respectively. A route is established, and the transmission signal memory of the active system (7n) → the dropper of the active system (12n)
) → Return route of the active system → Inserter of the active system (11
n) → Primary time division switch (1n) in the active system → Space division switch (3s) in the standby system → Secondary time division switch (2s) in the standby system → Dropper (12s) in the standby system → Return route in the standby system → The test pattern is transmitted via the route from the standby system inserter (11s) to the standby system reception signal memory (4s), and the test pattern set in the active system transmission signal memory (7n) and the standby system reception are transmitted. A diagnostic method characterized in that the test pattern received by the signal memory (4s) is verified.
JP10069585A 1985-05-13 1985-05-13 Diagnostic system Pending JPS61258598A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10069585A JPS61258598A (en) 1985-05-13 1985-05-13 Diagnostic system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10069585A JPS61258598A (en) 1985-05-13 1985-05-13 Diagnostic system

Publications (1)

Publication Number Publication Date
JPS61258598A true JPS61258598A (en) 1986-11-15

Family

ID=14280861

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10069585A Pending JPS61258598A (en) 1985-05-13 1985-05-13 Diagnostic system

Country Status (1)

Country Link
JP (1) JPS61258598A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6556566B1 (en) 1997-10-09 2003-04-29 Nec Corporation Time division switch with inserter and dropper using external memory and time division switching method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6556566B1 (en) 1997-10-09 2003-04-29 Nec Corporation Time division switch with inserter and dropper using external memory and time division switching method

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