JPS6125173B2 - - Google Patents

Info

Publication number
JPS6125173B2
JPS6125173B2 JP55170834A JP17083480A JPS6125173B2 JP S6125173 B2 JPS6125173 B2 JP S6125173B2 JP 55170834 A JP55170834 A JP 55170834A JP 17083480 A JP17083480 A JP 17083480A JP S6125173 B2 JPS6125173 B2 JP S6125173B2
Authority
JP
Japan
Prior art keywords
flip
diagnostic
register
flop
package
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55170834A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5794857A (en
Inventor
Shigeaki Morisawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Electric Co Ltd filed Critical Nippon Electric Co Ltd
Priority to JP55170834A priority Critical patent/JPS5794857A/ja
Publication of JPS5794857A publication Critical patent/JPS5794857A/ja
Publication of JPS6125173B2 publication Critical patent/JPS6125173B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP55170834A 1980-12-05 1980-12-05 Logic device Granted JPS5794857A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55170834A JPS5794857A (en) 1980-12-05 1980-12-05 Logic device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55170834A JPS5794857A (en) 1980-12-05 1980-12-05 Logic device

Publications (2)

Publication Number Publication Date
JPS5794857A JPS5794857A (en) 1982-06-12
JPS6125173B2 true JPS6125173B2 (de) 1986-06-14

Family

ID=15912190

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55170834A Granted JPS5794857A (en) 1980-12-05 1980-12-05 Logic device

Country Status (1)

Country Link
JP (1) JPS5794857A (de)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0766030B2 (ja) * 1983-07-08 1995-07-19 株式会社日立製作所 論理パッケージの診断方法
US6304987B1 (en) 1995-06-07 2001-10-16 Texas Instruments Incorporated Integrated test circuit
JPH0368038A (ja) * 1989-08-08 1991-03-25 Nec Eng Ltd 情報処理装置
JP2738112B2 (ja) * 1990-02-22 1998-04-08 日本電気株式会社 情報処理装置の障害情報採取方式
JPH08226953A (ja) * 1993-04-05 1996-09-03 Hitachi Ltd 論理パッケージ診断方式
US6405335B1 (en) 1998-02-25 2002-06-11 Texas Instruments Incorporated Position independent testing of circuits
US6728915B2 (en) 2000-01-10 2004-04-27 Texas Instruments Incorporated IC with shared scan cells selectively connected in scan path
US6769080B2 (en) 2000-03-09 2004-07-27 Texas Instruments Incorporated Scan circuit low power adapter with counter

Also Published As

Publication number Publication date
JPS5794857A (en) 1982-06-12

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