JPS6123327A - 集積回路を製造する方法 - Google Patents

集積回路を製造する方法

Info

Publication number
JPS6123327A
JPS6123327A JP60087676A JP8767685A JPS6123327A JP S6123327 A JPS6123327 A JP S6123327A JP 60087676 A JP60087676 A JP 60087676A JP 8767685 A JP8767685 A JP 8767685A JP S6123327 A JPS6123327 A JP S6123327A
Authority
JP
Japan
Prior art keywords
data
pass
address
series
addresses
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP60087676A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0577178B2 (enExample
Inventor
リオネル　エス．ホワイト，ジユニア
モウリイ　ジビツツ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Publication of JPS6123327A publication Critical patent/JPS6123327A/ja
Publication of JPH0577178B2 publication Critical patent/JPH0577178B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2257—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using expert systems
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/10—Test algorithms, e.g. memory scan [MScan] algorithms; Test patterns, e.g. checkerboard patterns 
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/44—Indication or identification of errors, e.g. for repair

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Semiconductor Memories (AREA)
  • Tests Of Electronic Circuits (AREA)
JP60087676A 1984-04-26 1985-04-25 集積回路を製造する方法 Granted JPS6123327A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/604,115 US4642784A (en) 1984-04-26 1984-04-26 Integrated circuit manufacture
US604115 1984-04-26

Publications (2)

Publication Number Publication Date
JPS6123327A true JPS6123327A (ja) 1986-01-31
JPH0577178B2 JPH0577178B2 (enExample) 1993-10-26

Family

ID=24418234

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60087676A Granted JPS6123327A (ja) 1984-04-26 1985-04-25 集積回路を製造する方法

Country Status (2)

Country Link
US (1) US4642784A (enExample)
JP (1) JPS6123327A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6374199B1 (en) 1997-12-25 2002-04-16 Nec Corporation Inspection and analyzing apparatus for semiconductor integrated circuit and inspection and analyzing method
US6493654B1 (en) 1999-01-07 2002-12-10 Nec Corporation Fault distribution analyzing system

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5335186A (en) * 1990-03-30 1994-08-02 Texas Instruments Incorporated Intelligent programmable sensing
JPH07159496A (ja) * 1993-10-12 1995-06-23 At & T Global Inf Solutions Internatl Inc 集積回路の検査のための装置及びその方法
US5440516A (en) * 1994-01-27 1995-08-08 Sgs-Thomson Microelectronics, Inc. Testing circuitry of internal peripheral blocks in a semiconductor memory device and method of testing the same
US6505282B1 (en) * 1994-11-30 2003-01-07 Intel Corporation Method and apparatus for determining memory types of a multi-type memory subsystem where memory of the different types are accessed using column control signals with different timing characteristics
US6167545A (en) * 1998-03-19 2000-12-26 Xilinx, Inc. Self-adaptive test program
JP2002343098A (ja) * 2001-05-18 2002-11-29 Mitsubishi Electric Corp 半導体記憶装置の試験方法
DE10330042A1 (de) * 2003-06-30 2005-02-03 Infineon Technologies Ag Halbleiter-Bauelement-Test-Verfahren, sowie Test-System zum Testen von Halbleiter-Bauelementen
US7391053B2 (en) * 2004-05-28 2008-06-24 Toshiba Matsushita Display Technology Co., Ltd. Inspection substrate for display device

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4168527A (en) * 1978-02-17 1979-09-18 Winkler Dean A Analog and digital circuit tester
CA1163721A (en) * 1980-08-18 1984-03-13 Milan Slamka Apparatus for the dynamic in-circuit testing of electronic digital circuit elements

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6374199B1 (en) 1997-12-25 2002-04-16 Nec Corporation Inspection and analyzing apparatus for semiconductor integrated circuit and inspection and analyzing method
US6493654B1 (en) 1999-01-07 2002-12-10 Nec Corporation Fault distribution analyzing system

Also Published As

Publication number Publication date
US4642784A (en) 1987-02-10
JPH0577178B2 (enExample) 1993-10-26

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees