JPS61230005A - Method for inspecting joint of sheet-like material - Google Patents

Method for inspecting joint of sheet-like material

Info

Publication number
JPS61230005A
JPS61230005A JP60069908A JP6990885A JPS61230005A JP S61230005 A JPS61230005 A JP S61230005A JP 60069908 A JP60069908 A JP 60069908A JP 6990885 A JP6990885 A JP 6990885A JP S61230005 A JPS61230005 A JP S61230005A
Authority
JP
Japan
Prior art keywords
sheet
joint
seam
light source
image
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60069908A
Other languages
Japanese (ja)
Inventor
Takeshi Matsumura
松村 猛
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Bridgestone Corp
Original Assignee
Bridgestone Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Bridgestone Corp filed Critical Bridgestone Corp
Priority to JP60069908A priority Critical patent/JPS61230005A/en
Publication of JPS61230005A publication Critical patent/JPS61230005A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To conduct a test at high accuracy by a simple device which makes its shift unnecessary by obtaining coordinates of at least one sheet end of an image picked up by lighting the joint of a sheet-like material at both sides of the joint. CONSTITUTION:The sheet 1 available from overlapping upper and lower sheets 1a and 1b is irradiated alternately by right and left light sources 3a and 3b of the joint. The image of the joint caused by the light source 3a is formed on a camera 2, stored in a frame memory 5a through a switch circuit SW4, and a window is set 6a. The luminous energy shading is corrected 7a and smoothed 8a, and a noise is removed to store the image in a frame memory 9a. Then after a picture signal is integrated 10a, coordinates of a density distribution in a direction intersecting orthogonally with the joint is detected 11a and inputted to a deciding circuit 12. The image caused by the light source 3b is processed in the same manner, and a smoothed 8b signal is subtracted 13 from the output of the frame memory 9a and then processed in the same way as the system of the light source 3a and inputted to the deciding circuit 12. Then the shift of the device can be unnecessary and the test can be conducted at high accuracy.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明はシート状物体、例えばインナーライチ、プライ
、ベルト等のタイヤ成型用部材、樹脂フィルムシート、
金属薄物シート、コンベアベルト等の継目、特に重ね合
わせて接合した継目の検査法に関するものである。
Detailed Description of the Invention (Industrial Field of Application) The present invention relates to sheet-like objects such as inner litchi, ply, tire molding members such as belts, resin film sheets,
This invention relates to a method for inspecting joints of thin metal sheets, conveyor belts, etc., especially joints formed by overlapping and joining.

(従来の技術) 従来のシート状物体の継目検査法として、被検物である
シート状物体にローラを接触させ、そのローラの変位を
ポテンショメータや差動トランスで検出して継目を検査
する方法、光源および受光素子を有する光マイクメータ
によってシート状物体表面の変位を検出して継目を検査
する方法、継目部の延在方向と直交する方向に配列した
一次元アレイセンザに継目部の一部の像を結像させ、そ
の画像信号を処理して継目を検査する方法、継目部にそ
の延在方向と直交する方向に延在するスリット光を、継
目部の延在方向に沿って順次投射して継目部を走査し、
これらスリット光の投射による継目部の像を二次元アレ
イセンサに結像させて、その画像信号に基づいて継目を
検査する方法が知られている。
(Prior Art) As a conventional method for inspecting seams of sheet-like objects, there is a method in which a roller is brought into contact with a sheet-like object to be inspected, and the displacement of the roller is detected using a potentiometer or a differential transformer to inspect the seams. A method of inspecting a seam by detecting the displacement of the surface of a sheet-like object using an optical microphone meter having a light source and a light receiving element. An image of a part of the seam is sent to a one-dimensional array sensor arranged in a direction perpendicular to the extending direction of the seam. A method for inspecting seams by forming an image on the seam and processing the image signal, which involves sequentially projecting slit light onto the seam in a direction perpendicular to the direction in which the seam extends. Scan the seam,
A method is known in which an image of the seam formed by projection of these slit lights is formed on a two-dimensional array sensor, and the seam is inspected based on the image signal.

(発明が解決しようとする問題点) しかし、上記のシート状物体にローラを接触させる方法
にあっては、シート状物体に変形を支えると共に分解能
が低く、精度が悪いという問題があり、光マイクロメー
タを用いる方法にあっては光マイクロメータとシート状
物体とを相対的に移動させる機構が必要になると共に、
スポット測光であるためにシート状物体表面の色、光沢
、粗さの影響で誤計測し易い問題がある。また、−次元
アレイセンサを用いる方法にあっては、1ラインの画像
信号しか得られないために、上記の光マイクロメータを
用いる場合と同様、シート状物体表面の色、光沢、粗さ
の影響で誤計測し易い問題があり、二次元アレイセンサ
を用いる方法にあってはスリット光を順次投射するため
、画像信号の処理ロジックが複雑になると共に、処理時
間も長くなる問題がある。
(Problems to be Solved by the Invention) However, in the above method of bringing the roller into contact with the sheet-like object, there are problems in that the sheet-like object supports deformation, the resolution is low, and the accuracy is poor. The method using a meter requires a mechanism to relatively move the optical micrometer and the sheet-like object, and
Since spot photometry is used, there is a problem that erroneous measurements are likely to occur due to the influence of the color, gloss, and roughness of the surface of the sheet-like object. In addition, in the method using a -dimensional array sensor, since only one line of image signal is obtained, the influence of the color, gloss, and roughness of the surface of the sheet-like object is similar to the case of using the optical micrometer described above. In the method using a two-dimensional array sensor, slit light is projected sequentially, which causes the problem that the image signal processing logic becomes complicated and the processing time becomes long.

本発明の目的は上述した種々の問題点を解決し、シート
状物体を変形させることなく、継目を短時間で常に高精
度で検査できると共に容易に実施できるシート状物体の
継目検査法を提供しようとするものである。
The purpose of the present invention is to solve the various problems mentioned above, and to provide a seam inspection method for sheet-like objects that can inspect seams quickly and with high accuracy without deforming the sheet-like object, and that can be easily carried out. That is.

(問題点を解決するための手段) 本発明のシート状物体の継目検査法は、シート状物体の
継目部を、継目方向を境に一方の側および他方の側から
それぞれ照明して撮像し、これら両画像信号に基づいて
継目部における両シート端の座標を、少なく共一方のシ
ート端の座標は前記両画像信号の差に基づいて求め、そ
の両シート端の座標に基づいて継目を検査することを特
徴とする“ものである。
(Means for Solving the Problems) The seam inspection method for a sheet-like object of the present invention involves illuminating and imaging the seam of a sheet-like object from one side and the other side with the seam direction as a boundary, Based on these image signals, the coordinates of both sheet ends at the joint are determined, at least the coordinates of one sheet end are determined based on the difference between the two image signals, and the joint is inspected based on the coordinates of both sheet ends. It is a “thing” that is characterized by

(作 用) 第1図AおよびBに示すように、シート状物体1の重ね
合わせて接合した継目部を、その延在方向すなわち継目
方向を境に上側シートlaの方向および下側シートlb
の方向からそれぞれ照明して二次元アレイセンサを有す
る撮像装置2上に結像させると、それらの像はそれぞれ
第2図AおよびBに示すようになる。すなわち、上側シ
ート1aの方向から照明した場合には、第2図Aに示す
ように、上側シー)1aが下側シートlbに乗り上がる
傾斜部分で最も明るく、上側シート1aのエツジの影の
部分で最も暗く、その他は中間濃度となる。また、下側
シート1bの方向から照明した場合には、第2図Bに示
すように、逆に上側シート1aが下側シー)1bに乗り
上がる傾斜部分で最も暗く、上側シート1aのエツジ部
分はそのエツジの端面形状によっては最も明るくなった
り、他の部分と同様に中間濃度となる。したがって、第
2図AおよびBに示す像の画像信号の差を取れば、例え
ば上側シート1aのエツジに対応する部分では暗濃度が
、下側シート1bのエツジに対応する部分では明濃度が
それぞれ強調されると共に、中間濃度におけるばらつき
は相殺されてコントラストが高くなるから、その濃度分
布から上側シート1aおよび下側シート1bのそれぞれ
のエツジの座標を正確に求めることができ、これにより
例えば両座標から求められる継目幅と基準値とを比較し
て継目の良否を判定することができる。また、一方の画
像信号、例えば上側シートlaの方向から照明したとき
の画像信号の暗濃度部分は、上側シー)1aのエツジに
正確に対応する。したがって、上側シート1aのエツジ
の座標は上側シー目aの方向から照明したときの画像信
号の濃度分布から求め、下側シート1bのエツジの座標
を両画像信号の差の濃度分布から求めることもできるし
、逆に下側シート1bの方向から照明したときの画像信
号の濃度分布から下側シート1bのエツジの座標を、両
画像信号の差の濃度分布から上側シート1aのエツジの
座標を求めることもできる。
(Function) As shown in FIGS. 1A and B, the seam portion of the sheet-like objects 1 that are overlapped and joined is moved in the direction of the upper sheet la and the lower sheet lb with the extending direction, that is, the seam direction as the boundary.
When the images are illuminated from the respective directions and formed on the imaging device 2 having a two-dimensional array sensor, the images become as shown in FIGS. 2A and 2B, respectively. That is, when illuminating from the direction of the upper sheet 1a, as shown in FIG. is the darkest, and the others are intermediate densities. In addition, when the light is illuminated from the direction of the lower sheet 1b, as shown in FIG. Depending on the shape of the edge, it may be the brightest, or it may have an intermediate density like other parts. Therefore, if we take the difference between the image signals of the images shown in FIG. 2A and B, for example, the dark density will be in the area corresponding to the edge of the upper sheet 1a, and the bright density will be in the area corresponding to the edge of the lower sheet 1b. At the same time, variations in the intermediate density are canceled out and the contrast is increased, so the coordinates of the respective edges of the upper sheet 1a and the lower sheet 1b can be accurately determined from the density distribution. The quality of the seam can be determined by comparing the seam width obtained from the above with a reference value. Further, one image signal, for example, the dark density portion of the image signal when illuminated from the direction of the upper sheet la corresponds exactly to the edge of the upper sheet la. Therefore, the coordinates of the edge of the upper sheet 1a can be determined from the density distribution of the image signal when illuminated from the direction of the upper seam a, and the coordinates of the edge of the lower sheet 1b can also be determined from the density distribution of the difference between the two image signals. Conversely, the coordinates of the edge of the lower sheet 1b are determined from the density distribution of the image signal when illuminating from the direction of the lower sheet 1b, and the coordinates of the edge of the upper sheet 1a are determined from the density distribution of the difference between both image signals. You can also do that.

(実施例) 第3図は本発明方法を実施する継目検査装置の一例の構
成図である。本例では、シート状物体1の継目部を二次
元アレイセンサを有する撮像装置2による撮像位置に位
置決めして検査する。撮像位置において、シート状物体
1の継目部の延在方向を境とする両側には光源3aおよ
び3bを配置する。
(Example) FIG. 3 is a configuration diagram of an example of a seam inspection apparatus that implements the method of the present invention. In this example, the joint portion of the sheet-like object 1 is positioned at an imaging position by an imaging device 2 having a two-dimensional array sensor and inspected. At the imaging position, light sources 3a and 3b are arranged on both sides of the sheet-like object 1 in the extending direction of the joint.

光源3a、3bは、例えば波長830nmの光を発する
レーザ光源を用い、これらを順次に発光させることによ
って光源3aにより上側シート1aの方向からシート平
面に対して156〜256の角度で平行光線を投射して
継目部を照明し、光源3bにより下側シート1bの方向
からレート平面に対して15°〜20°の角度で平行光
線を投射して継目部を照明する。光源3aによって照明
された継目部の像は撮像装置2に結像させ、その画像信
号をスイッチ回路4を経てフレームメモリ5aに格納し
た後、ウィンドウ設定回路6aを経て所定の範囲の画像
信号を抽出し、その抽出した画像信号に対して光量むら
補正回路7aにおいて光量むらを補正する。
The light sources 3a and 3b are, for example, laser light sources that emit light with a wavelength of 830 nm, and by sequentially emitting these laser light sources, the light source 3a projects parallel light rays from the direction of the upper sheet 1a at an angle of 156 to 256 with respect to the sheet plane. The light source 3b projects parallel light rays from the direction of the lower sheet 1b at an angle of 15° to 20° with respect to the rate plane to illuminate the joint. The image of the seam illuminated by the light source 3a is formed on the imaging device 2, and the image signal is stored in the frame memory 5a via the switch circuit 4, and then the image signal in a predetermined range is extracted via the window setting circuit 6a. Then, the light amount unevenness correction circuit 7a corrects the light amount unevenness with respect to the extracted image signal.

すなわち、光源によって平坦な面を斜め方向から照明す
ると、照射面における照度分布は光源に近い程大きく、
また光源の発光密度は中心部が高くなるガラス分布とな
るために光束の中心部における照度が大きくなる。この
ため、これらの現象による照射面における照明光の投射
方向およびそれと直交する幅方向での照度分布は、第4
図AおよびBにそれぞれ破線および実線で示すようにな
る。そこで、本例では光量むら補正回路7aにおいて、
光源3aにより照射面が等価的に一様な照度分布で照明
されたように画像信号を補正する。
In other words, when a flat surface is illuminated from an oblique direction by a light source, the illuminance distribution on the illuminated surface becomes larger the closer it is to the light source;
Furthermore, since the light emission density of the light source has a glass distribution in which the light density is high at the center, the illumination intensity at the center of the light beam is large. Therefore, due to these phenomena, the illuminance distribution in the projection direction of the illumination light on the irradiation surface and in the width direction perpendicular thereto is as follows:
This is shown by broken lines and solid lines in Figures A and B, respectively. Therefore, in this example, in the light amount unevenness correction circuit 7a,
The image signal is corrected so that the irradiation surface is illuminated with an equivalently uniform illuminance distribution by the light source 3a.

第3図において、光量むら補正回路7aで光量むらを補
正した画像信号は平滑化回路8aに供給し、ここで局所
積分処理を行ってシート状物体1の表面の色、光沢、粗
さのばらつきによる部分的ノイズを除去した後フレーム
メモリ9aに格納する。このフレームメモリ9aに格納
された画像信号は積分回路10aに供給し、ここで継目
方向における画像信号を積分して第5図Aに示すように
継目方向と直交する長さ方向での濃度分布を求め、これ
を座標検出回路11aに供給する。座標検出回路11a
においては、積分回路10aからの積分出力と第5図A
に破線で示す適当な闇値とを比較して、積分出力が閾値
を下回る座標x1、すなわち上iシートlaのエツジの
座標を検出し、これを判定回路12に供給する。
In FIG. 3, the image signal corrected for light intensity unevenness by the light intensity unevenness correction circuit 7a is supplied to a smoothing circuit 8a, where local integration processing is performed to determine variations in color, gloss, and roughness on the surface of the sheet-like object 1. After partial noise is removed, the data is stored in the frame memory 9a. The image signal stored in the frame memory 9a is supplied to an integrating circuit 10a, which integrates the image signal in the seam direction to obtain the density distribution in the length direction orthogonal to the seam direction, as shown in FIG. 5A. and supplies it to the coordinate detection circuit 11a. Coordinate detection circuit 11a
In FIG. 5A, the integral output from the integrating circuit 10a and
is compared with an appropriate darkness value indicated by a broken line to detect the coordinate x1 at which the integral output is below the threshold, that is, the coordinate of the edge of the upper i-sheet la, and supply this to the determination circuit 12.

一方、光源3bによる照明によって撮像装置2から得ら
れる継目部の画像信号は、スイッチ回路4を経てフレー
ムメモリ5bに格納し、ウィンドウ設定回路6b、光量
むら補正回路7bおよび平滑化回路8bにおいて同様に
処理した後減算回路13の一方の入力端、本例では反転
入力端に供給する。この減算回路13の非反転入力端に
はフレームメモリ9aに格納されている光源3aからの
照明による画像信号を供給し、ここで対応する画素同志
の信号の差を順次求めてフレームメモリ9bに格納する
。このフレームメモリ9bに格納された差信号は積分回
路10bに供給し、同様に処理した継目の延在方向と直
交する方向での濃度分布を求める。ここで、積分回路1
0bにおいて求められる濃度分布は、フレームメモリ9
bに格納される信号が光源3aからの照明による画像信
号から光s3bからの照明による画像信号を差し引いた
ものであるので、第5図Aに示す濃度分布においてrj
A濃度および暗濃度がそれぞれ強調され、中間濃度にお
けるばらつきが相殺された第5図Bに示すようなコント
ラストが高いものとなる。この積分回路10bの積分出
力は座標検出回路11bに供給し、ここで第5図Bに破
線で示す適当な闇値と比較して、積分出力が闇値を越え
る座標Xh、すなわち下側シートlbのエツジの座標を
検出し、これを判定回路12に供給する。
On the other hand, the image signal of the joint obtained from the imaging device 2 by illumination by the light source 3b is stored in the frame memory 5b via the switch circuit 4, and is similarly processed in the window setting circuit 6b, the light intensity unevenness correction circuit 7b and the smoothing circuit 8b. After processing, the signal is supplied to one input terminal of the subtraction circuit 13, in this example, the inverting input terminal. An image signal generated by illumination from the light source 3a stored in the frame memory 9a is supplied to the non-inverting input terminal of the subtraction circuit 13, and the difference between the signals of corresponding pixels is sequentially determined and stored in the frame memory 9b. do. The difference signal stored in the frame memory 9b is supplied to the integrating circuit 10b, and the density distribution in the direction perpendicular to the extending direction of the similarly processed seam is determined. Here, integrating circuit 1
The density distribution found at 0b is stored in the frame memory 9
Since the signal stored in b is the image signal caused by the illumination from the light source 3a minus the image signal caused by the illumination from the light s3b, in the density distribution shown in FIG. 5A, rj
The contrast is high as shown in FIG. 5B, in which the A density and the dark density are each emphasized, and variations in the intermediate density are canceled out. The integrated output of the integrating circuit 10b is supplied to the coordinate detection circuit 11b, where it is compared with an appropriate darkness value shown by the broken line in FIG. The coordinates of the edge are detected and supplied to the determination circuit 12.

判定回路12は、座標検出回路11aおよびllbから
の座標情報(XLXh)に基づいて継目幅、すなわち上
側シー)1aと下側シー)1bとの重なり量を検出し、
これと適当な基準値とを比較して継目の良否を判定し、
その結果を例えば表示装置14に供給して表示させたり
、警報装置に供給して不良の場合に警報を発生させる。
The determination circuit 12 detects the seam width, that is, the amount of overlap between the upper seam) 1a and the lower seam) 1b, based on the coordinate information (XLXh) from the coordinate detection circuits 11a and llb,
Compare this with an appropriate standard value to determine the quality of the seam,
The results are supplied to, for example, the display device 14 for display, or supplied to an alarm device to issue an alarm in the case of a defect.

本実施例によれば、光源3aからの照明による画像信号
および光源3bからの照明による画像信号をそれぞれ光
量むら補正処理および平滑化処理し、その後上側シート
1a方向の光源3aからの照明による画像信号の濃度分
布に基づいて上側シー)1aのエツジの座標を、両画像
信号の減算による濃度累積処理によって下側シート1b
のエツジの座標をそれぞれ検出するものであるから、局
所的なノイズの影響を受けることなく両座標を常に高精
度で無接触で検出することができ、したがって継目を正
確に検査することができる。
According to this embodiment, the image signal due to the illumination from the light source 3a and the image signal due to the illumination from the light source 3b are subjected to light intensity unevenness correction processing and smoothing processing, respectively, and then the image signal due to the illumination from the light source 3a in the direction of the upper sheet 1a is processed. Based on the density distribution of
Since the coordinates of each edge are detected, both coordinates can always be detected with high precision and without contact without being affected by local noise, and therefore the seam can be accurately inspected.

なお、本発明は上述した実施例にのみ限定されるもので
はなく幾多の変更または変形が可能である。例えば、両
画像信号の差の濃度分布に基づいて上側シートlaおよ
び下側シー)1bのそれぞれのエツジの座標を検出する
こともできるし、下側シート1bのエツジの座標は光源
3bからの照明による画像信号の濃度分布から、上側シ
ートlaのエッジの座標は両画像信号の差の濃度分布か
らそれぞれ検出することもできる。また、フレームメモ
リ5a。
It should be noted that the present invention is not limited to the above-described embodiments, and can be modified or modified in many ways. For example, the coordinates of the edges of the upper sheet 1a and the lower sheet 1b can be detected based on the density distribution of the difference between the two image signals, and the coordinates of the edges of the lower sheet 1b can be determined by the illumination from the light source 3b. The coordinates of the edge of the upper sheet la can also be detected from the density distribution of the difference between the two image signals. Also, a frame memory 5a.

5b、ウィンドウ設定回路6a、6b 、平滑化回路8
a、8bは、それぞれ1つのものを両画像処理において
供用することもできる。
5b, window setting circuits 6a, 6b, smoothing circuit 8
It is also possible to use one each of a and 8b for both image processing.

(発明の効果) 以上述べたように、本発明によれば無接触で検査するの
でシート状物体に何らの変形を与えることがないと共に
、少なく共一方のシート端の座標は両画像信号の差をと
ることによってシート状物体表面の色、光沢、粗さのば
らつきを相殺した高コントラストの信号に基づいて検出
するので、継目を常に高精度で検査することができる。
(Effects of the Invention) As described above, according to the present invention, since the inspection is performed without contact, there is no deformation of the sheet-like object, and at least the coordinates of one sheet edge are determined by the difference between the two image signals. Since the detection is based on a high contrast signal that cancels out variations in color, gloss, and roughness on the surface of a sheet-like object, seams can always be inspected with high precision.

また、照明光源、撮像装置、シート状物体を相対的に移
動させることなく、継目部を境とする一方および他方側
からの照明による順次の画像を取込んで処理するもので
あるから、機械的構成および信号処理回路の電気的構成
が簡単にでき、したがって容易に実施することができる
In addition, since images are sequentially captured and processed by illumination from one side and the other side of the seam without relatively moving the illumination light source, imaging device, or sheet-like object, mechanical The configuration and the electrical configuration of the signal processing circuit are simple and therefore easy to implement.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図A、Bおよび第2図A、Bは本発明の詳細な説明
するための図、 第3図は本発明方法を実施する継目検査装置の一例の構
成図、 第4図A、Bおよび第5図A、Bはその動作を説明する
ための図である。 1−・・シート状物体   1a・・−上側シート1b
−・・下側シート    2−撮像装置3a、3b−・
−光源     4− スイッチ回路5a、5b−・−
フレームメモリ 6a、6b・・−・ウィンドウ設定回路7a、7b・・
−光量むら補正回路 8a、8b・−・・・平滑化回路  9a、9b−フレ
ームメモリ10a、LOb −積分回路  11a、1
1b ・−座標検出回路12−・−判定回路     
13−・減算回路14−・−表示装置 第4図 A        B 第5図 A        B
FIGS. 1A and B and FIGS. 2A and B are diagrams for explaining the present invention in detail. FIG. 3 is a configuration diagram of an example of a seam inspection device that implements the method of the present invention. FIGS. 4A and B 5A and 5B are diagrams for explaining the operation. 1--sheet-like object 1a--upper sheet 1b
--Lower sheet 2-imaging devices 3a, 3b--
-Light source 4- Switch circuits 5a, 5b-.-
Frame memories 6a, 6b...Window setting circuits 7a, 7b...
- Light intensity unevenness correction circuits 8a, 8b --- Smoothing circuits 9a, 9b - Frame memories 10a, LOb - Integrating circuits 11a, 1
1b - Coordinate detection circuit 12 - - Judgment circuit
13--Subtraction circuit 14--Display device Fig. 4 A B Fig. 5 A B

Claims (1)

【特許請求の範囲】[Claims] 1、シート状物体の継目部を、継目方向を境に一方の側
および他方の側からそれぞれ照明して撮像し、これら両
画像信号に基づいて継目部における両シート端の座標を
、少なく共一方のシート端の座標は前記両画像信号の差
に基づいて求め、その両シート端の座標に基づいて継目
を検査することを特徴とするシート状物体の継目検査法
1. The joint of a sheet-like object is illuminated and imaged from one side and the other side with the seam direction as a boundary, and based on these image signals, the coordinates of both sheet edges at the joint are determined at least from one side. A seam inspection method for a sheet-like object, characterized in that the coordinates of the sheet edge are determined based on the difference between the two image signals, and the seam is inspected based on the coordinates of both sheet edges.
JP60069908A 1985-04-04 1985-04-04 Method for inspecting joint of sheet-like material Pending JPS61230005A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60069908A JPS61230005A (en) 1985-04-04 1985-04-04 Method for inspecting joint of sheet-like material

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60069908A JPS61230005A (en) 1985-04-04 1985-04-04 Method for inspecting joint of sheet-like material

Publications (1)

Publication Number Publication Date
JPS61230005A true JPS61230005A (en) 1986-10-14

Family

ID=13416265

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60069908A Pending JPS61230005A (en) 1985-04-04 1985-04-04 Method for inspecting joint of sheet-like material

Country Status (1)

Country Link
JP (1) JPS61230005A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01318907A (en) * 1988-06-17 1989-12-25 Daihatsu Motor Co Ltd Inspecting device for cam
JPH0450709A (en) * 1990-06-19 1992-02-19 Dainippon Screen Mfg Co Ltd Position detecting method for scribing line crossing area
JP2021018131A (en) * 2019-07-19 2021-02-15 住友ゴム工業株式会社 Edge detection device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57204264U (en) * 1981-06-23 1982-12-25

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57204264U (en) * 1981-06-23 1982-12-25

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01318907A (en) * 1988-06-17 1989-12-25 Daihatsu Motor Co Ltd Inspecting device for cam
JPH0450709A (en) * 1990-06-19 1992-02-19 Dainippon Screen Mfg Co Ltd Position detecting method for scribing line crossing area
JP2021018131A (en) * 2019-07-19 2021-02-15 住友ゴム工業株式会社 Edge detection device

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