JPS61192445U - - Google Patents

Info

Publication number
JPS61192445U
JPS61192445U JP1985076988U JP7698885U JPS61192445U JP S61192445 U JPS61192445 U JP S61192445U JP 1985076988 U JP1985076988 U JP 1985076988U JP 7698885 U JP7698885 U JP 7698885U JP S61192445 U JPS61192445 U JP S61192445U
Authority
JP
Japan
Prior art keywords
photomask
mask
defect inspection
range
movement mechanism
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1985076988U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985076988U priority Critical patent/JPS61192445U/ja
Publication of JPS61192445U publication Critical patent/JPS61192445U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1985076988U 1985-05-22 1985-05-22 Pending JPS61192445U (pl)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985076988U JPS61192445U (pl) 1985-05-22 1985-05-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985076988U JPS61192445U (pl) 1985-05-22 1985-05-22

Publications (1)

Publication Number Publication Date
JPS61192445U true JPS61192445U (pl) 1986-11-29

Family

ID=30619636

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985076988U Pending JPS61192445U (pl) 1985-05-22 1985-05-22

Country Status (1)

Country Link
JP (1) JPS61192445U (pl)

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