JPS61171120A - Photo excitation process equipment - Google Patents
Photo excitation process equipmentInfo
- Publication number
- JPS61171120A JPS61171120A JP1222885A JP1222885A JPS61171120A JP S61171120 A JPS61171120 A JP S61171120A JP 1222885 A JP1222885 A JP 1222885A JP 1222885 A JP1222885 A JP 1222885A JP S61171120 A JPS61171120 A JP S61171120A
- Authority
- JP
- Japan
- Prior art keywords
- space
- reaction chamber
- process gas
- light source
- pressure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02612—Formation types
- H01L21/02617—Deposition types
- H01L21/0262—Reduction or decomposition of gaseous compounds, e.g. CVD
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02365—Forming inorganic semiconducting materials on a substrate
- H01L21/02518—Deposited layers
- H01L21/02521—Materials
- H01L21/02524—Group 14 semiconducting materials
- H01L21/02532—Silicon, silicon germanium, germanium
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
Abstract
Description
【発明の詳細な説明】 り産業上の利用分野コ 本発明は生産性の高い光励起プロセス装置に関する。[Detailed description of the invention] industrial application field The present invention relates to a photoexcitation process device with high productivity.
[従来の技術]
最近、光をエネルギ源として材料の表面処理を行なう、
いわゆる光励起プロセス装置が開発された。[Prior art] Recently, methods for surface treatment of materials using light as an energy source have been developed.
A so-called photoexcitation process device has been developed.
第2図は、この様な光励起プロセス装置の−っである光
CVD1!Fの一例を示したものである。FIG. 2 shows an optical CVD 1! which is one of such optical excitation process equipment. An example of F is shown.
図中1は反応室で、内部に基板2が配置されている。該
反応室の壁の一部には透明な材料で作られた窓3が設け
られており、該窓を介して基板2の反対側(反応室外)
に光314(例、レーザ光源)が設けられている。この
様な装置において、排気装M5により一旦反応室内を高
真空にした後、ガス供給源6からプロセスガスを反応室
1内に供給して該反応室内を例えば10−1〜10To
rrの圧力のにする。そして、光源4を動作させると、
基板2の表面近傍においてプロセスガスが光化学反応(
光励起)を起こし、該基板表面に該プロセスガスの膜が
形成される。In the figure, 1 is a reaction chamber in which a substrate 2 is placed. A window 3 made of a transparent material is provided in a part of the wall of the reaction chamber, and the opposite side of the substrate 2 (outside the reaction chamber) is provided through the window.
A light 314 (eg, a laser light source) is provided. In such an apparatus, after the reaction chamber is once made into a high vacuum by the exhaust system M5, a process gas is supplied into the reaction chamber 1 from the gas supply source 6, and the inside of the reaction chamber is heated to, for example, 10-1 to 10To
rr pressure. Then, when the light source 4 is activated,
Near the surface of the substrate 2, the process gas undergoes a photochemical reaction (
(photoexcitation), and a film of the process gas is formed on the surface of the substrate.
[発明が解決しようとする問題点]
さて、この様な装置において、エネルギ源となる光源は
、該光源が放出する光(エネルギ)の一部しか使用出来
ない位置に置いている。従って、光源からの光の利用効
率が悪く、基板の表面処理数が少なく、生産性が低かっ
た。[Problems to be Solved by the Invention] In such a device, the light source serving as the energy source is placed in a position where only a portion of the light (energy) emitted by the light source can be used. Therefore, the utilization efficiency of light from the light source was poor, the number of substrate surface treatments was small, and productivity was low.
本発明はこの様な問題を解決する事を目的としたもので
、新規な光励起プロセス装置を提供するものである。The present invention aims to solve such problems and provides a novel optical excitation process device.
[問題点を解決するための手段]
本発明の光励起プロレス装置は、反応室内にプロセスガ
スと光を導入する事によって、該反応室内で該ガスを光
励起させ、該反応室内に配置された基板の表面を化学的
処理する装置において、光源を反応室の中心部に配置し
た事を特徴とする。[Means for Solving the Problems] The optically excited professional wrestling device of the present invention introduces a process gas and light into a reaction chamber to optically excite the gas within the reaction chamber, thereby stimulating the reaction of a substrate placed within the reaction chamber. An apparatus for chemically treating a surface, characterized in that the light source is placed in the center of the reaction chamber.
[実施例]
第1図は本発明の一実施例を示した光CVD装置の概略
図である。[Embodiment] FIG. 1 is a schematic diagram of a photo-CVD apparatus showing an embodiment of the present invention.
図中10は中空円筒管状の反応室で、中空部分の中心軸
O上には光源として棒状の紫外線ランプ11が配置され
ている。該反応室10の該中空部分に接する内側面12
は円筒状の光の透過する材料(例0石英)で作られてい
る。該反応室の底面の略中央部にはドーナツ状(軸Oに
対して回転対称)の排気管13が設けられており、該排
気管には排気装置14が繋がっている。前記内側面12
の回りには一定の空間S1を介して、多数の穴が開けら
れ光を透過する材料(例えば石英)で作られた円筒状の
汚れ防止筒15が設けられている。In the figure, 10 is a hollow cylindrical reaction chamber, and a rod-shaped ultraviolet lamp 11 is disposed as a light source on the central axis O of the hollow portion. an inner surface 12 in contact with the hollow portion of the reaction chamber 10;
is made of a cylindrical light-transmissive material (eg quartz). A donut-shaped (rotationally symmetrical with respect to axis O) exhaust pipe 13 is provided approximately at the center of the bottom of the reaction chamber, and an exhaust device 14 is connected to the exhaust pipe. Said inner surface 12
A cylindrical dirt prevention tube 15 made of a light-transmitting material (for example, quartz) and having a large number of holes is provided around the tube through a certain space S1.
該汚れ防止筒15と前記円筒部分12との間の空間S1
における反応室10の上面にはドーナツ状のガス導通管
16が設けられており、該ガス供給管には不活性ガス供
給手段17が繋がっている。A space S1 between the dirt prevention tube 15 and the cylindrical portion 12
A doughnut-shaped gas conduction pipe 16 is provided on the upper surface of the reaction chamber 10, and an inert gas supply means 17 is connected to the gas supply pipe.
前記汚れ防止筒15の回りの空間S2の略中央部には複
数の基板18A、188.18G、・・・・・・・・・
・・・、18M、18N、180.18Pが置かれた基
板ホルダー19が配置されている。尚、該基板ホルダ1
9は必要に応じてヒータ或いは冷却機構を備えている。A plurality of substrates 18A, 188.18G, .
..., 18M, 18N, and 180.18P are placed on the substrate holder 19. In addition, the substrate holder 1
9 is provided with a heater or cooling mechanism as required.
前記空間S2の上面にはドーナツ状のガス導入管20が
設けられており、該ガス導入管にはプロセスガス供給手
段21が繋がっている。A doughnut-shaped gas introduction pipe 20 is provided on the upper surface of the space S2, and a process gas supply means 21 is connected to the gas introduction pipe.
この様な装置において、例えば、基板表面にSi膜を形
成する場合について動作を次に説明する。The operation of such an apparatus in the case of forming a Si film on the surface of a substrate, for example, will be described below.
先ず、反応室10内を排気装置14により高真?! I
−′it 6・151・Jim、1L119&:I、t
6 。First, the inside of the reaction chamber 10 is evacuated by the exhaust device 14. ! I
-'it 6・151・Jim, 1L119&:I, t
6.
れたヒータを作動させ、基板18A、18B、・・・・
・・・・・を所定の温度に加熱する。次に、不活性ガス
供給手段17から空f!181内に不活性ガスを流す。Activate the heated heaters, and the substrates 18A, 18B,...
... is heated to a predetermined temperature. Next, the inert gas supply means 17 is emptied f! Flow inert gas into 181.
該不活性ガスは汚れ防止筒15の穴から空間S2内に流
入する。そして、プロセスガス供給手段21から該空!
182内にプロセスガス(例、5iH4)を導入し、該
空間S2内を10’ 〜10Torrの圧力にする。こ
の時、前記前記空間S1内の圧力と前記空1ilS2内
の圧力を測定しておき、空間S1内の圧力が空間S2内
の圧力より高くなるように前記不活性ガス供給手段17
とプロセスガス供給手段21を制御する。この様にして
おけば、空間S1から空間S2に流入する不活性ガスの
流れは粘性流であるから空間S2から空間S1内にプロ
セスガスが流入する事は無い。従って、前記内側面12
の表面上や汚れ防止1i15の表面及び穴の部分にプロ
セスガスの分解によるIII(汚れ)が出来る事が無く
、前記紫外線ランプ11からの紫外線の透過が何ら妨げ
られるは事は無い。しかして、紫外線ランプ11を点灯
すると、該紫外線ランプ11から発生した紫外線が内側
面12.汚れ防止筒15を介して、該空間S2内に入る
。該空間において、基板18A、18B、・・・・・・
の表面の近くにおいて、プロセスガスが光化学反応(光
励起)を起こし、3iの膜が基板18A、18B。The inert gas flows into the space S2 through the hole in the stain prevention cylinder 15. Then, the process gas supply means 21 is empty!
A process gas (eg, 5iH4) is introduced into the space S2 to bring the pressure in the space S2 to 10' to 10 Torr. At this time, the pressure in the space S1 and the pressure in the space 1ilS2 are measured, and the inert gas supply means 17 is set so that the pressure in the space S1 is higher than the pressure in the space S2.
and controls the process gas supply means 21. If this is done, the flow of the inert gas flowing from the space S1 into the space S2 is a viscous flow, so no process gas will flow into the space S1 from the space S2. Therefore, the inner surface 12
There is no dirt formed on the surface of the dirt prevention device 1i15 or on the surface of the dirt prevention device 1i15 due to the decomposition of the process gas, and the transmission of the ultraviolet rays from the ultraviolet lamp 11 is not obstructed in any way. When the ultraviolet lamp 11 is turned on, the ultraviolet rays generated from the ultraviolet lamp 11 are transmitted to the inner surface 12. It enters the space S2 via the dirt prevention cylinder 15. In the space, substrates 18A, 18B,...
The process gas causes a photochemical reaction (photoexcitation) near the surfaces of the substrates 18A and 18B, and the 3i film is exposed to the substrates 18A and 18B.
・・・・・・・・・の表面に形成される。Formed on the surface of...
前記実施例では、光源として、封じ切りのランプを使用
したが、反応室として、例えば、円筒状のものを使用し
、該円筒状反応室内の中央部を透明な壁で囲まれた放電
室を作り、該放電室に排気装置を接続し、該放、電室内
に放電電極を配置し、更に、該放電室内に放電を起こす
為の適宜なガスを導入する為のガス供給手段を繋ぐ事に
よって、該放電室内に放電による光を発生させるように
成したものを光源としてもよい。この様な光源では、ガ
スの種類、ガス圧力、放電電圧等を種々選択する事によ
り、特定の波長の放電光を発生させる事が出来、基板上
への膜作成の為のプロセスガスを切換えた場合にも、直
ちにそのガスを励起するのに適した波長を選択する事が
出来る。In the above embodiment, a sealed lamp was used as the light source, but for example, a cylindrical reaction chamber was used, and a discharge chamber whose central part was surrounded by a transparent wall was used as the reaction chamber. By connecting an exhaust device to the discharge chamber, arranging a discharge electrode in the discharge chamber, and further connecting a gas supply means to introduce an appropriate gas to cause a discharge into the discharge chamber. The light source may be a light source configured to generate light due to discharge within the discharge chamber. With such a light source, it is possible to generate discharge light of a specific wavelength by selecting various gas types, gas pressures, discharge voltages, etc., and it is possible to change the process gas for film formation on the substrate. In this case, a wavelength suitable for exciting the gas can be selected immediately.
[発明の効果]
本発明によれば、プロセスガスを光励起する為の光を発
生する光源を反応室の中央部に配置したので、該光源か
ら発生した光の殆どを反応室内に照射する事が出来る。[Effects of the Invention] According to the present invention, since the light source that generates light for optically exciting the process gas is placed in the center of the reaction chamber, most of the light generated from the light source can be irradiated into the reaction chamber. I can do it.
従って、光源からの光の利用効率が高くなるので、反応
室内に光源から見て、全方位に基板を置く事が出来、基
板の表面処理数が多くなり、生産性が著しく高くなる。Therefore, since the efficiency of using light from the light source is increased, substrates can be placed in all directions in the reaction chamber as seen from the light source, and the number of substrate surface treatments increases, resulting in significantly higher productivity.
第1図は本発明の一実施例を示した光CvD装置の概略
図、第2図は従来の光励起プロセス装置の一例として示
した光CvD装置の概略図である。
10:反応室 11:紫外線ランプ 12:内側面
13:排気管 14:lJF気装置S1.82
:空間 15:汚れ防止筒 16:ガス導入管
17:不活性ガス供給手段 18A、18B、18C
,・・・・・・・・・基板 19:基板ホルダー
20=ガス導入管 21:プロセスガス供給手段FIG. 1 is a schematic diagram of a photo-CvD device showing an embodiment of the present invention, and FIG. 2 is a schematic diagram of a photo-CvD device shown as an example of a conventional photo-excitation process device. 10: Reaction chamber 11: Ultraviolet lamp 12: Inner surface 13: Exhaust pipe 14: lJF air device S1.82
: Space 15: Dirt prevention cylinder 16: Gas introduction pipe
17: Inert gas supply means 18A, 18B, 18C
,......Substrate 19: Substrate holder
20 = Gas introduction pipe 21: Process gas supply means
Claims (1)
該反応室内で該ガスを光励起させ、該反応室内に配置さ
れた基板の表面を化学的処理する装置において、光源を
反応室の中心部に配置した事を特徴とする光励起プロセ
ス装置。By introducing process gas and light into the reaction chamber,
A photoexcitation process device for chemically treating the surface of a substrate placed in the reaction chamber by optically exciting the gas in the reaction chamber, characterized in that a light source is disposed in the center of the reaction chamber.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1222885A JPS61171120A (en) | 1985-01-25 | 1985-01-25 | Photo excitation process equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1222885A JPS61171120A (en) | 1985-01-25 | 1985-01-25 | Photo excitation process equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61171120A true JPS61171120A (en) | 1986-08-01 |
Family
ID=11799510
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1222885A Pending JPS61171120A (en) | 1985-01-25 | 1985-01-25 | Photo excitation process equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61171120A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4958592A (en) * | 1988-08-22 | 1990-09-25 | General Electric Company | Resistance heater for diamond production by CVD |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4837408U (en) * | 1971-09-04 | 1973-05-08 | ||
JPS57128919A (en) * | 1980-12-20 | 1982-08-10 | Kenburitsuji Insutorumentsu Lt | Depositiong device |
-
1985
- 1985-01-25 JP JP1222885A patent/JPS61171120A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4837408U (en) * | 1971-09-04 | 1973-05-08 | ||
JPS57128919A (en) * | 1980-12-20 | 1982-08-10 | Kenburitsuji Insutorumentsu Lt | Depositiong device |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4958592A (en) * | 1988-08-22 | 1990-09-25 | General Electric Company | Resistance heater for diamond production by CVD |
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