JPS63224224A - Photo-plasma reacting device - Google Patents

Photo-plasma reacting device

Info

Publication number
JPS63224224A
JPS63224224A JP5784787A JP5784787A JPS63224224A JP S63224224 A JPS63224224 A JP S63224224A JP 5784787 A JP5784787 A JP 5784787A JP 5784787 A JP5784787 A JP 5784787A JP S63224224 A JPS63224224 A JP S63224224A
Authority
JP
Japan
Prior art keywords
reaction
chamber
wafer
chemical reaction
reactive gas
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5784787A
Other languages
Japanese (ja)
Inventor
Seiichi Iwamatsu
誠一 岩松
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Priority to JP5784787A priority Critical patent/JPS63224224A/en
Publication of JPS63224224A publication Critical patent/JPS63224224A/en
Pending legal-status Critical Current

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  • Drying Of Semiconductors (AREA)

Abstract

PURPOSE:To enable a high speed chemical reaction to be performed by thoroughly furnishing a plasma producing part and a photochemical reaction part. CONSTITUTION:A table 2 with motor etc., built therein is provided in a quartz chamber 1 to be a vacuum chamber; an Si wafer 3 as a test bar is mounted on the table 2 while reactive gas is led into the chamber 1 from a gas inlet 4; and any residual gas is exhausted from an exhaust port 5 to keep the pressure reduced state. High-frequency from a high-frequency power supply 7 is led to a electrode plates 6 to change the reactive gas into a radical while an Si wafer 3 is irradiated with the light from a light source 8 comprising a mercury lamp or laser beam source to photoexcite the radical of reactive gas for chemical reacting at high speed on the Si wafer 3. Furthermore, an electrode is inserted into the reaction chamber 1 to be impressed with voltage for providing a reaction specie with directivity. Through the procedures, high chemical reaction can be performed to manufacture a chemical reaction device in high productivity.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明け、化学反応装置に関し、とりわけ半導体装置の
CvDあるいはエツチング反応装置it構造に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a chemical reaction device, and particularly to a CvD or etching reaction device IT structure for a semiconductor device.

(従来の技術〕 従采、半導体装置の製造に用いられる化学反応装置とし
てはプラズマCvD装置、プラズマ(あるいけイオン)
工ヴチング装置、光OVD装置。
(Prior art) As a chemical reaction device used for manufacturing semiconductor devices, there are plasma CvD devices and plasma (air ion).
Engineering equipment, optical OVD equipment.

元エツチング装置等があっ之。There was a former etching device, etc.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

しかし、上記従来技術によると反応連間が遅くひいては
スルーブツト(生産性)が低いと云う問題点があった。
However, the above-mentioned prior art has the problem that the reaction rate is slow and the throughput (productivity) is low.

本発明は、かかる従来技術の問題点をなくし、高速化学
反応が可能な、生産性の高い半導体装置製造用のOVD
あるいはエツチング等の化学反応装置を提供する事を目
的とする。
The present invention eliminates the problems of the prior art and provides an OVD for manufacturing semiconductor devices that is capable of high-speed chemical reactions and has high productivity.
Alternatively, the purpose is to provide a chemical reaction device for etching, etc.

〔問題点を解決する九めの手段〕[Ninth way to solve the problem]

上記問題点を解決するために1本発明は化学反応装置に
於て、プラズマ反応装置を用いる手段をとる。
In order to solve the above-mentioned problems, the present invention takes a means of using a plasma reaction device in a chemical reaction device.

〔作用〕[Effect]

光・プラズマ反応装@に於ては、例えばガス体のプラズ
マ化〈よるラジカルの発生による化学反応種の基底状態
化と該ラジカルの光化学反応による励起状態化により1
反応速度がプラズマ反応あるいけ光化学反応部々の単独
反応より高速にできる作用がある。
In a light/plasma reaction device, for example, a gas is turned into a plasma, whereby radicals are generated to bring chemically reactive species into the ground state, and the radicals are brought into an excited state through a photochemical reaction.
It has the effect of making the reaction rate faster than a plasma reaction or a single reaction of photochemical reaction parts.

〔実施例〕〔Example〕

以下、実施例により本発明を詳述する。 Hereinafter, the present invention will be explained in detail with reference to Examples.

第1図は本発明の一実施例を示す光・プラズマ反応装置
の模式図である。すなわち、真空チャンバーである石英
チャンバー1にはモーター等が組入込まれ之支持台2が
設置され、該支持台2の士にけ試棒であるSiウェーハ
3が設置されると共にガス入口4から反応ガスが導入さ
れ、減圧状態を保つための真空の几め排気口5から残ガ
スb=排出され、高周波電源7からの高周波が極材6に
導入されて1反応ガスがラジカル化されると共に、水銀
ランプあるbはレーザー光源から成る光源8からの光線
がSiウェーハ3上に照射されて、前記反応ガスのラジ
カルを光励起して、Siウェーハ5上で高速の化学反応
を達成することができる。
FIG. 1 is a schematic diagram of a light/plasma reaction apparatus showing an embodiment of the present invention. That is, a motor and the like are installed in a quartz chamber 1 which is a vacuum chamber, and a support stand 2 is installed therein. A reaction gas is introduced, residual gas b= is exhausted from a vacuum exhaust port 5 to maintain a reduced pressure state, and high frequency from a high frequency power source 7 is introduced into the electrode material 6 to radicalize the 1 reaction gas. , a mercury lamp (b) is a laser light source, and a light beam from a light source 8 is irradiated onto the Si wafer 3 to optically excite the radicals of the reaction gas, thereby achieving a high-speed chemical reaction on the Si wafer 5. .

尚、反応チャンバー内に電源を挿入し、該11c甑に電
圧を印加して方向性を反応種にもたすことができること
けいうまでもない。
It goes without saying that directivity can be imparted to the reactive species by inserting a power source into the reaction chamber and applying voltage to the 11c pot.

〔発明の効果〕〔Effect of the invention〕

本発明の如舞光、プラズマ反応装置に於ては。 In the light plasma reaction device of the present invention.

高速の化学反応り一可能となり生産性の高い化学反応装
置をつくる事ができろ効果がある。
This has the effect of allowing high-speed chemical reactions to occur and creating a highly productive chemical reaction device.

【図面の簡単な説明】 第1図は本発明の一実施例を示す元・プラズマ反応装置
の模式図である。 1・・・・・・石英チャンバー 2・・・・・・支持台 3・・・・・・Siウェーハ 4・・・・・・ガス入口 5・・・・・・排気口 6・・・・・・極板 7・・・・・・高周波電源 8・・・・・・光源 以  上
BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic diagram of a plasma reactor showing an embodiment of the present invention. 1... Quartz chamber 2... Support stand 3... Si wafer 4... Gas inlet 5... Exhaust port 6... ... Pole plate 7 ... High frequency power supply 8 ... Light source and above

Claims (1)

【特許請求の範囲】[Claims] プラズマ発生部と光化学反応部とを完備する事を特徴と
する光・プラズマ反応装置。
A light/plasma reaction device characterized by being fully equipped with a plasma generation section and a photochemical reaction section.
JP5784787A 1987-03-12 1987-03-12 Photo-plasma reacting device Pending JPS63224224A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5784787A JPS63224224A (en) 1987-03-12 1987-03-12 Photo-plasma reacting device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5784787A JPS63224224A (en) 1987-03-12 1987-03-12 Photo-plasma reacting device

Publications (1)

Publication Number Publication Date
JPS63224224A true JPS63224224A (en) 1988-09-19

Family

ID=13067368

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5784787A Pending JPS63224224A (en) 1987-03-12 1987-03-12 Photo-plasma reacting device

Country Status (1)

Country Link
JP (1) JPS63224224A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02130826A (en) * 1988-11-11 1990-05-18 Hitachi Ltd Method and apparatus for processing with plasma
US5462635A (en) * 1991-01-29 1995-10-31 Hitachi, Ltd. Surface processing method and an apparatus for carrying out the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02130826A (en) * 1988-11-11 1990-05-18 Hitachi Ltd Method and apparatus for processing with plasma
US5462635A (en) * 1991-01-29 1995-10-31 Hitachi, Ltd. Surface processing method and an apparatus for carrying out the same

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