JPS63314828A - Photo-cvd equipment - Google Patents

Photo-cvd equipment

Info

Publication number
JPS63314828A
JPS63314828A JP15185387A JP15185387A JPS63314828A JP S63314828 A JPS63314828 A JP S63314828A JP 15185387 A JP15185387 A JP 15185387A JP 15185387 A JP15185387 A JP 15185387A JP S63314828 A JPS63314828 A JP S63314828A
Authority
JP
Japan
Prior art keywords
chamber
window
cleaning
reaction chamber
reaction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15185387A
Other languages
Japanese (ja)
Inventor
Takeshi Karasawa
武 柄沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP15185387A priority Critical patent/JPS63314828A/en
Publication of JPS63314828A publication Critical patent/JPS63314828A/en
Pending legal-status Critical Current

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  • Chemical Vapour Deposition (AREA)

Abstract

PURPOSE:To make it unnecessary to remove a window for cleaning, by installing a reaction chamber and a cleaning chamber on both sides of a lamp chamber, and rotating the contaminated window to the cleaning chamber side to clean it, when a substrate in the reaction chamber is irradiated with ultraviolet rays through the window arranged in the lamp chamber to form a film and the window is contaminated. CONSTITUTION:A reaction chamber 1 accommodating a semiconductor substrate 2 is provided with a material gas feeding inlet 3, a discharging vent 4 and an inlet 3B to feed gas which restrain the film from attaching to a window and does not contribute to reaction. On the opposite side of the reaction chamber 1 with respect to a lamp chamber 12, a cleaning equipment 8 provided with a gas feeding inlet 9A for plasma etching and a discharging vent 9B is installed, and therein a discharging electrode 10 as included. In the lamp chamber 12 situated between the two chambers, a plurality of ultra-violet ray sources 6 provided with a reflector 7 behind them are arranged. A plurality of windows 5A, 5B situated between the ultra-violet ray sources 6 and the substrates 2 are constituted so as to be able to rotate toward the reaction chamber 1 side and the cleaning chamber 8 side by a driving equipment 13. When the window in use is contaminated, which is monitored by using a film thickness meter 11, the window is transferred to the chamber 8 side to be cleaned.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は薄膜形成を利用する分野、特に半導体デバイス
等の作製において用いられる光励起気相反応による成膜
装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to the field of thin film formation, particularly to a film formation apparatus using a photo-excited gas phase reaction used in the production of semiconductor devices and the like.

従来の技術 光励起、特に紫外光による原料ガスの分解を利用したい
わゆる光CVD法は、プラズマCVD法等と比較した場
合に、 (7)低温プロセスであること。
Conventional technology The so-called photo-CVD method, which utilizes optical excitation, particularly the decomposition of raw material gas by ultraviolet light, has the following characteristics when compared to plasma CVD methods: (7) It is a low-temperature process.

(イ)イオン衝撃などによる下地、基板へのダメージが
ないこと。
(a) There shall be no damage to the base or substrate due to ion bombardment, etc.

(つ)レーザービームなどを利用すれば選択的成膜がで
きること。
(1) Selective film formation is possible using a laser beam, etc.

などの点において優位性があるものとして期待されてい
る。
It is expected that it will have superiority in these respects.

しかしながら光CVD法を実用に供するには解決すべき
課題が残っておシ、中でも光導入窓への膜付着は大きな
問題である。これを回避すべく種々の提案がなされてお
り、たとえば反応には関与しないガスを窓に沿って流す
もの、窓に特殊な薬剤を塗布するものなどがある。
However, there are still problems to be solved in order to put the photoCVD method into practical use, and among them, film adhesion to the light introduction window is a major problem. Various proposals have been made to avoid this, such as flowing a gas that does not participate in the reaction along the window, or applying a special chemical to the window.

発明が解決しようとする問題点 しかし、これらの方法によっても窓への膜付着の防止は
完全なものではない。光CVD法で用いる紫外光は真空
紫外とよばれる領域のもので波長が短−く、200 n
 m以下の場合もある。このような短波長の光は通常の
ガラスでは透過率が低く、成膜に必要な光励起分解反応
の効率がきわめて悪いため、合成石英などの短波長光を
比較的よく透過する材質の窓を使用している。この場合
でも窓に膜が付着するとそれに伴って紫外光の透過率が
低下してゆき、しだいに成膜が困難となってくる。
Problems to be Solved by the Invention However, even with these methods, it is not possible to completely prevent the film from adhering to the window. The ultraviolet light used in the photoCVD method is in a region called vacuum ultraviolet and has a short wavelength of 200 nm.
In some cases, it is less than m. Ordinary glass has low transmittance for light with such short wavelengths, and the efficiency of the photoexcited decomposition reaction necessary for film formation is extremely low. Therefore, windows made of materials that transmit relatively well short wavelength light, such as synthetic quartz, are used. are doing. Even in this case, as the film adheres to the window, the transmittance of ultraviolet light decreases, and film formation gradually becomes difficult.

したがっである期間使用の後には何らかの方法によって
窓のクリーニングを行なわなければならない。クリーニ
ング方法としては、窓を装置よシ取9はずし、付着した
膜を溶解する方法があるが、通常劇薬を使用せねばなら
ず、また、その後の洗浄、乾燥など取扱い上問題となる
点が多い。
Therefore, after a certain period of use, the windows must be cleaned by some method. As a cleaning method, there is a method of removing the window from the equipment and dissolving the attached film, but this usually requires the use of powerful chemicals, and there are many handling problems such as subsequent washing and drying. .

さらに、大面積にわたる成膜を行なう場合には単一の窓
ではその大きさに限界があシ、大きな窓の取扱いは実用
上困難である。
Furthermore, when forming a film over a large area, there is a limit to the size of a single window, and handling a large window is difficult in practice.

上記問題点を解決するために、本発明は光導入窓のクリ
ーニングを容易にし、光透過率の低下を防止し、成膜の
効率低下を防止する光CVD装置を提供することを目的
とするものである。
In order to solve the above problems, it is an object of the present invention to provide a photo-CVD apparatus that facilitates cleaning of a light introduction window, prevents a decrease in light transmittance, and prevents a decrease in film-forming efficiency. It is.

問題点を解決するための手段 上記目的を達成するために、本発明の光CVD装置は、
連続的に配設した複数の光導入窓と、個別に独立した反
応室と、クリーニング室と前記光導入窓を反応室とクリ
ーニング室との間で搬送する光導入窓支持体を有し、反
応室において使用した窓とクリーニング室においてプラ
ズマエツチング等により付着物を除去した窓とを交換で
きることを特徴とするものである。
Means for Solving the Problems In order to achieve the above object, the optical CVD apparatus of the present invention has the following features:
A reaction method comprising a plurality of continuously arranged light introduction windows, individually independent reaction chambers, a cleaning chamber and a light introduction window support for transporting the light introduction windows between the reaction chamber and the cleaning chamber, The feature is that the window used in the cleaning room can be replaced with a window from which deposits have been removed by plasma etching or the like in the cleaning room.

作  用 上記構成によれば、反応時に反応室に位置していた光導
入窓を支持体によってクリーニング室に搬送することに
よって装置よシ取シはずすことなくクリーニングを行々
うことができるため、反応室での成膜とクリーニング室
での付着膜除去とを適当なサイクルで行なうことが可能
となり、その結果、光透過率低下による膜形成の効率低
下等の゛影響を最小限度にとどめることができる。
Function According to the above configuration, the light introduction window located in the reaction chamber during the reaction can be transported to the cleaning chamber by the support, and cleaning can be performed without removing it from the apparatus. It becomes possible to perform film formation in the chamber and removal of the deposited film in the cleaning chamber in an appropriate cycle, and as a result, effects such as a decrease in film formation efficiency due to a decrease in light transmittance can be kept to a minimum. .

実施例 以下、本発明の実施例について図面にもとづいて説明す
る。
Embodiments Hereinafter, embodiments of the present invention will be described based on the drawings.

第1図は本発明の一実施例の光CVD装置の断面図であ
る。図において、反応室1内に基板2を装着し、反応ガ
スは導入口3Aより導入し、排気口4よシ排気する。ま
た、窓5A(sB)への膜付着を極力抑制するために、
反応に関与しないガスを導入口3Bより導入し、排気口
4よシ排気する。紫外光源6としては複数の線状低圧水
銀ランプを用い、照射強度を高め均一性を向上させるた
めに反射板7を設ける。クリーニング室8にはプラズマ
エツチング用のガスを導入口9Aよシ導入し排気口9B
より排気するようになっておシ、また、放電用の電極1
0が設置されている。
FIG. 1 is a sectional view of a photo-CVD apparatus according to an embodiment of the present invention. In the figure, a substrate 2 is mounted in a reaction chamber 1, and a reaction gas is introduced through an inlet 3A and exhausted through an exhaust port 4. In addition, in order to suppress film adhesion to the window 5A (sB) as much as possible,
A gas that does not participate in the reaction is introduced through the inlet 3B and exhausted through the exhaust port 4. A plurality of linear low-pressure mercury lamps are used as the ultraviolet light source 6, and a reflecting plate 7 is provided to increase the irradiation intensity and improve uniformity. A gas for plasma etching is introduced into the cleaning chamber 8 through an inlet 9A and an exhaust port 9B.
It has become more exhausting, and the discharge electrode 1
0 is set.

紫外光導入窓sA 、sBのクリーニングは次のような
ローテーションで行なう−。今、窓5Aが反応室1側に
、また、窓6Bがクリーニング室8側にあるとする。反
応室1における基板2上への成膜に伴っ′て窓5Aにも
膜がある程度付着し、その・量が多くなると紫外光透過
率が低下するため成膜に影響を及ぼす。そこで膜厚計1
1によって膜付着量をモニターし、所定量に達した段階
で反応室1、クリーニング室8およびランプ室12を大
気圧にし、駆動装置13によって膜の付着した窓弘をク
リーニング室8側に、また、クリーニングの終了してい
る窓5Bを反応室1側にそれぞれ移動させる。このよう
にして反応室1・ではクリーニングの終了した窓6Bを
使用して′成膜し、また、クリーニング室8では窓5A
に付着した膜をプラズマエツチングで除去する。以上の
ように、窓sA。
Cleaning of the ultraviolet light introducing windows sA and sB is performed in the following rotation. Assume now that the window 5A is on the reaction chamber 1 side, and the window 6B is on the cleaning chamber 8 side. As the film is formed on the substrate 2 in the reaction chamber 1, a certain amount of film also adheres to the window 5A, and when the amount increases, the ultraviolet light transmittance decreases, thereby affecting the film formation. Therefore, film thickness meter 1
1 monitors the amount of film adhered, and when a predetermined amount is reached, the reaction chamber 1, cleaning chamber 8, and lamp chamber 12 are brought to atmospheric pressure, and the drive device 13 moves the window with the film adhered to the cleaning chamber 8 side, and , the windows 5B that have been cleaned are moved to the reaction chamber 1 side. In this way, in the reaction chamber 1, the cleaned window 6B is used to form a film, and in the cleaning chamber 8, the window 5A is used to form a film.
The film attached to the surface is removed by plasma etching. As mentioned above, window sA.

5Bを移動させることにより、一方が成膜に使用   
  −中に他方はクリーニングを行なうことができる。
By moving 5B, one side is used for film formation.
- while the other can be cleaned.

第2図は窓およびその支持構造を示すものである。窓支
持体は第2図(a)に示すととりれ)を一単位として連
結した構成になっている。線B 1−B2における断面
図第2図(b)に示す。窓21は支持体22に取シ付け
られておシ、この支持体は連接部23によってつながっ
ている。この支持体22は0リング26を介してチャン
バー側フレーム24と接することにより、チャンバー内
の真空状態が保持される。
FIG. 2 shows the window and its supporting structure. The window support has a structure in which two parts (as shown in FIG. 2(a)) are connected as one unit. A cross-sectional view taken along line B1-B2 is shown in FIG. 2(b). The window 21 is attached to a support 22, which is connected by a link 23. This support body 22 comes into contact with the chamber-side frame 24 via the O-ring 26, thereby maintaining the vacuum state within the chamber.

上記実施例によれば、2枚の紫外光導入窓を反応室とク
リーニング室の間で移動可能に設けることによって、窓
を装置から取り外すことなく窓のクリーニングを実現し
、装置の運転効率を高め、また紫外光透過率の低下を効
率よく防止することが可能となる。
According to the above embodiment, by providing the two ultraviolet light introduction windows movably between the reaction chamber and the cleaning chamber, the window can be cleaned without removing the window from the apparatus, thereby increasing the operating efficiency of the apparatus. Moreover, it becomes possible to efficiently prevent a decrease in ultraviolet light transmittance.

第3図は本発明の量産に適した他の実施例の光CVD装
置の構成を示す断面図である。図において、31A、3
1Bは反応室、32はランプ室、33A、33Bはクリ
ーニング室、34は窓およびその支持体を示している。
FIG. 3 is a sectional view showing the structure of another embodiment of the optical CVD apparatus suitable for mass production according to the present invention. In the figure, 31A, 3
1B is a reaction chamber, 32 is a lamp chamber, 33A and 33B are cleaning chambers, and 34 is a window and its support.

前述の第一の実施例における構成と同様に、窓のローテ
ーションにより、反応室31A 、31 Bにおいて成
膜中に、クリーニング室33A 、33Bにおいて窓3
4のクリーニングを行なうことが可能である。
Similar to the configuration in the first embodiment described above, window rotation allows the window 3 to be opened in the cleaning chambers 33A and 33B during film formation in the reaction chambers 31A and 31B.
4 cleaning can be performed.

このような構成によるならば第1図に示した構成の光C
VD装置の2台分の機能をそれよシも少ないスペースで
もたせることができ、また、ランプ室を共用しているの
で、時間的にもロスがなく成膜運転できる。
If such a configuration is used, the light C having the configuration shown in FIG.
The functions of two VD devices can be provided in a much smaller space, and since the lamp chamber is shared, film deposition can be performed without any time loss.

発明の効果 本発明によれば反応室とクリーニング室と複数個の光導
入窓を設け、光導入窓は反応室とクリーニング室との間
で搬送可能に設けたことにより、窓に付着した膜の除去
のために窓をはずす必要なくりIJ−ニングを行なえ、
膜付着による紫外光透過率低下に伴う成膜速度の大幅な
低下に致る前に容易に窓のりIJ  +−ングが可能と
なシ、運転の効率向上につながる。さらに本発明の構成
を用いるならば、装置の大型化も容易であシ、量産用と
しての使用にも有効なものである。
Effects of the Invention According to the present invention, a reaction chamber, a cleaning chamber, and a plurality of light introduction windows are provided, and the light introduction window is provided so that it can be transported between the reaction chamber and the cleaning chamber, thereby removing the film attached to the window. Perform IJ-ning, which requires removing the window for removal.
Window gluing can be easily carried out before the film formation rate is significantly reduced due to a decrease in ultraviolet light transmittance due to film adhesion, leading to improved operational efficiency. Furthermore, if the configuration of the present invention is used, it is easy to increase the size of the device, and it is also effective for use in mass production.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例における光CVD装置の構成
を示す断面図、第2図(、)は同光CVD装置の窓およ
びその支持構造部分の概略平面図、第2図(b)は同(
a)のB1〜B2線断面図、第3図は本発明の他の実施
例のランプ室を共用した量産用光CVD装置の構成を示
す断面図である。 1・・・・・・反応室、5・・・・・・窓、6・・・・
・・紫外光源、8・・・・・・クリーニング室、13・
・・・・・1駆動装置、22・・・・・・窓支持体、2
4・・・・・・チャンバーフレーム、31A。 31B・・・・・反応室、32・・・・・・ランプ室、
33A。 33B・・・・・・クリーニング室。 代理人の氏名 弁理士 中 尾 敏 男 ほか1名1−
一一反E:、室 7−  斥肛隈 8−一−クワー;ング宣 12−一−ラ、ワ、室
FIG. 1 is a sectional view showing the configuration of an optical CVD apparatus according to an embodiment of the present invention, FIG. is the same (
FIG. 3 is a cross-sectional view taken along line B1-B2 in a), and a cross-sectional view showing the configuration of a mass-produced optical CVD apparatus that shares a lamp chamber according to another embodiment of the present invention. 1...Reaction chamber, 5...Window, 6...
...Ultraviolet light source, 8...Cleaning room, 13.
...1 drive device, 22 ... window support, 2
4...Chamber frame, 31A. 31B...Reaction chamber, 32...Lamp chamber,
33A. 33B...Cleaning room. Name of agent: Patent attorney Toshio Nakao and 1 other person1-
11-tan E:, room 7- 斥圜くま8-1-kwa; ngsen 12-1-ra, wa, room

Claims (2)

【特許請求の範囲】[Claims] (1)原料ガスを光分解することにより気相から基板上
に膜形成を行う光CVD装置であって、個別に独立した
反応室およびクリーニング室と、ランプ室からの光を反
応室に導入する複数の光導入窓と、前記複数の光導入窓
を前記反応室とクリーニング室との間で搬送する光導入
窓技持体とを備え、前記反応室で使用した光導入窓とク
リーニング室において付着物を除去された光導入窓とを
交換できる構成としたことを特徴とする光CVD装置。
(1) A photo-CVD device that forms a film on a substrate from a gas phase by photolyzing a source gas, and has separate reaction chambers and cleaning chambers, and light from a lamp chamber is introduced into the reaction chamber. It includes a plurality of light introduction windows and a light introduction window carrier for transporting the plurality of light introduction windows between the reaction chamber and the cleaning chamber, and the light introduction window used in the reaction chamber and the light introduction window used in the cleaning chamber are attached. An optical CVD apparatus characterized in that the kimono is replaced with a light introducing window from which the kimono has been removed.
(2)反応室側に配設された複数の光導入窓に1つの共
用ランプ室から光を照射することを特徴とする特許請求
の範囲第1項記載の光CVD装置。
(2) The optical CVD apparatus according to claim 1, wherein light is irradiated from one shared lamp chamber to a plurality of light introduction windows arranged on the reaction chamber side.
JP15185387A 1987-06-18 1987-06-18 Photo-cvd equipment Pending JPS63314828A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15185387A JPS63314828A (en) 1987-06-18 1987-06-18 Photo-cvd equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15185387A JPS63314828A (en) 1987-06-18 1987-06-18 Photo-cvd equipment

Publications (1)

Publication Number Publication Date
JPS63314828A true JPS63314828A (en) 1988-12-22

Family

ID=15527695

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15185387A Pending JPS63314828A (en) 1987-06-18 1987-06-18 Photo-cvd equipment

Country Status (1)

Country Link
JP (1) JPS63314828A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6520189B1 (en) 1986-09-09 2003-02-18 Semiconductor Energy Laboratory Co., Ltd. CVD apparatus
JP2005063850A (en) * 2003-08-14 2005-03-10 Ran Technical Service Kk Organic el display panel and its manufacturing method

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6052014A (en) * 1983-08-31 1985-03-23 Mitsubishi Electric Corp Production equipment for semiconductor
JPS6064426A (en) * 1983-09-19 1985-04-13 Hitachi Ltd Method and device for forming vapor-phase reaction thin- film
JPS6246515A (en) * 1985-08-26 1987-02-28 Semiconductor Energy Lab Co Ltd Thin film forming method

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6052014A (en) * 1983-08-31 1985-03-23 Mitsubishi Electric Corp Production equipment for semiconductor
JPS6064426A (en) * 1983-09-19 1985-04-13 Hitachi Ltd Method and device for forming vapor-phase reaction thin- film
JPS6246515A (en) * 1985-08-26 1987-02-28 Semiconductor Energy Lab Co Ltd Thin film forming method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6520189B1 (en) 1986-09-09 2003-02-18 Semiconductor Energy Laboratory Co., Ltd. CVD apparatus
JP2005063850A (en) * 2003-08-14 2005-03-10 Ran Technical Service Kk Organic el display panel and its manufacturing method

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