JPS61163915U - - Google Patents

Info

Publication number
JPS61163915U
JPS61163915U JP4999986U JP4999986U JPS61163915U JP S61163915 U JPS61163915 U JP S61163915U JP 4999986 U JP4999986 U JP 4999986U JP 4999986 U JP4999986 U JP 4999986U JP S61163915 U JPS61163915 U JP S61163915U
Authority
JP
Japan
Prior art keywords
light
infrared
light receiving
film
film thickness
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4999986U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4999986U priority Critical patent/JPS61163915U/ja
Publication of JPS61163915U publication Critical patent/JPS61163915U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
JP4999986U 1986-04-03 1986-04-03 Pending JPS61163915U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4999986U JPS61163915U (enExample) 1986-04-03 1986-04-03

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4999986U JPS61163915U (enExample) 1986-04-03 1986-04-03

Publications (1)

Publication Number Publication Date
JPS61163915U true JPS61163915U (enExample) 1986-10-11

Family

ID=30567716

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4999986U Pending JPS61163915U (enExample) 1986-04-03 1986-04-03

Country Status (1)

Country Link
JP (1) JPS61163915U (enExample)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4879686A (enExample) * 1972-01-28 1973-10-25
JPS54119948A (en) * 1978-03-10 1979-09-18 Asahi Dow Ltd Method and device for measuring thickness of infrared multilayer film

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4879686A (enExample) * 1972-01-28 1973-10-25
JPS54119948A (en) * 1978-03-10 1979-09-18 Asahi Dow Ltd Method and device for measuring thickness of infrared multilayer film

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