JPS61155738A - 産業用ｃｔスキヤナ - Google Patents
産業用ｃｔスキヤナInfo
- Publication number
- JPS61155738A JPS61155738A JP59278264A JP27826484A JPS61155738A JP S61155738 A JPS61155738 A JP S61155738A JP 59278264 A JP59278264 A JP 59278264A JP 27826484 A JP27826484 A JP 27826484A JP S61155738 A JPS61155738 A JP S61155738A
- Authority
- JP
- Japan
- Prior art keywords
- radiation
- industrial
- data
- scanner
- subject
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000005855 radiation Effects 0.000 claims abstract description 44
- 238000012545 processing Methods 0.000 claims abstract description 22
- 230000007246 mechanism Effects 0.000 claims abstract description 20
- 230000009466 transformation Effects 0.000 claims description 2
- 238000000034 method Methods 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 7
- 238000012360 testing method Methods 0.000 description 6
- 238000013480 data collection Methods 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- PCTMTFRHKVHKIS-BMFZQQSSSA-N (1s,3r,4e,6e,8e,10e,12e,14e,16e,18s,19r,20r,21s,25r,27r,30r,31r,33s,35r,37s,38r)-3-[(2r,3s,4s,5s,6r)-4-amino-3,5-dihydroxy-6-methyloxan-2-yl]oxy-19,25,27,30,31,33,35,37-octahydroxy-18,20,21-trimethyl-23-oxo-22,39-dioxabicyclo[33.3.1]nonatriaconta-4,6,8,10 Chemical compound C1C=C2C[C@@H](OS(O)(=O)=O)CC[C@]2(C)[C@@H]2[C@@H]1[C@@H]1CC[C@H]([C@H](C)CCCC(C)C)[C@@]1(C)CC2.O[C@H]1[C@@H](N)[C@H](O)[C@@H](C)O[C@H]1O[C@H]1/C=C/C=C/C=C/C=C/C=C/C=C/C=C/[C@H](C)[C@@H](O)[C@@H](C)[C@H](C)OC(=O)C[C@H](O)C[C@H](O)CC[C@@H](O)[C@H](O)C[C@H](O)C[C@](O)(C[C@H](O)[C@H]2C(O)=O)O[C@H]2C1 PCTMTFRHKVHKIS-BMFZQQSSSA-N 0.000 description 2
- 230000008094 contradictory effect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000003028 elevating effect Effects 0.000 description 2
- 239000007787 solid Substances 0.000 description 2
- 235000019892 Stellar Nutrition 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000002902 bimodal effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000007781 pre-processing Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/419—Imaging computed tomograph
Landscapes
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Pulmonology (AREA)
- Radiology & Medical Imaging (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Apparatus For Radiation Diagnosis (AREA)
- Image Processing (AREA)
- Image Analysis (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59278264A JPS61155738A (ja) | 1984-12-27 | 1984-12-27 | 産業用ｃｔスキヤナ |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59278264A JPS61155738A (ja) | 1984-12-27 | 1984-12-27 | 産業用ｃｔスキヤナ |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61155738A true JPS61155738A (ja) | 1986-07-15 |
| JPH0250508B2 JPH0250508B2 (enrdf_load_stackoverflow) | 1990-11-02 |
Family
ID=17594916
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP59278264A Granted JPS61155738A (ja) | 1984-12-27 | 1984-12-27 | 産業用ｃｔスキヤナ |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61155738A (enrdf_load_stackoverflow) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007296352A (ja) * | 2006-04-28 | 2007-11-15 | Toshiba Corp | サイノグラムを完成するための方法、装置、記憶媒体及びプログラム |
| CN105102966A (zh) * | 2013-02-04 | 2015-11-25 | 赛克斯普拉斯公司 | 通过断层摄影用于轮胎无损检测的装置和方法 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0622610U (ja) * | 1992-08-26 | 1994-03-25 | 株式会社ニフコ | 部材取付用クリップ構造 |
| JP4494804B2 (ja) * | 2004-01-08 | 2010-06-30 | 東芝Ｉｔコントロールシステム株式会社 | コンピュータ断層撮影装置 |
-
1984
- 1984-12-27 JP JP59278264A patent/JPS61155738A/ja active Granted
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007296352A (ja) * | 2006-04-28 | 2007-11-15 | Toshiba Corp | サイノグラムを完成するための方法、装置、記憶媒体及びプログラム |
| CN105102966A (zh) * | 2013-02-04 | 2015-11-25 | 赛克斯普拉斯公司 | 通过断层摄影用于轮胎无损检测的装置和方法 |
| JP2016505152A (ja) * | 2013-02-04 | 2016-02-18 | シクセプリュＣｙｘｐｌｕｓ | 断層撮影法によるタイヤ非破壊検査装置及び方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0250508B2 (enrdf_load_stackoverflow) | 1990-11-02 |
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