JPS61155738A - 産業用ｃｔスキヤナ - Google Patents

産業用ｃｔスキヤナ

Info

Publication number
JPS61155738A
JPS61155738A JP59278264A JP27826484A JPS61155738A JP S61155738 A JPS61155738 A JP S61155738A JP 59278264 A JP59278264 A JP 59278264A JP 27826484 A JP27826484 A JP 27826484A JP S61155738 A JPS61155738 A JP S61155738A
Authority
JP
Japan
Prior art keywords
industrial
subject
scanner
support
sinogram
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59278264A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0250508B2 (enrdf_load_stackoverflow
Inventor
Kiichiro Uyama
喜一郎 宇山
Shigeo Nakamura
滋男 中村
Yoshitetsu Tanimoto
谷本　慶哲
Takao Shoji
庄司　孝雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP59278264A priority Critical patent/JPS61155738A/ja
Publication of JPS61155738A publication Critical patent/JPS61155738A/ja
Publication of JPH0250508B2 publication Critical patent/JPH0250508B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph

Landscapes

  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP59278264A 1984-12-27 1984-12-27 産業用ｃｔスキヤナ Granted JPS61155738A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59278264A JPS61155738A (ja) 1984-12-27 1984-12-27 産業用ｃｔスキヤナ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59278264A JPS61155738A (ja) 1984-12-27 1984-12-27 産業用ｃｔスキヤナ

Publications (2)

Publication Number Publication Date
JPS61155738A true JPS61155738A (ja) 1986-07-15
JPH0250508B2 JPH0250508B2 (enrdf_load_stackoverflow) 1990-11-02

Family

ID=17594916

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59278264A Granted JPS61155738A (ja) 1984-12-27 1984-12-27 産業用ｃｔスキヤナ

Country Status (1)

Country Link
JP (1) JPS61155738A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007296352A (ja) * 2006-04-28 2007-11-15 Toshiba Corp サイノグラムを完成するための方法、装置、記憶媒体及びプログラム
CN105102966A (zh) * 2013-02-04 2015-11-25 赛克斯普拉斯公司 通过断层摄影用于轮胎无损检测的装置和方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0622610U (ja) * 1992-08-26 1994-03-25 株式会社ニフコ 部材取付用クリップ構造
JP4494804B2 (ja) * 2004-01-08 2010-06-30 東芝Ｉｔコントロールシステム株式会社 コンピュータ断層撮影装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007296352A (ja) * 2006-04-28 2007-11-15 Toshiba Corp サイノグラムを完成するための方法、装置、記憶媒体及びプログラム
CN105102966A (zh) * 2013-02-04 2015-11-25 赛克斯普拉斯公司 通过断层摄影用于轮胎无损检测的装置和方法
JP2016505152A (ja) * 2013-02-04 2016-02-18 シクセプリュＣｙｘｐｌｕｓ 断層撮影法によるタイヤ非破壊検査装置及び方法

Also Published As

Publication number Publication date
JPH0250508B2 (enrdf_load_stackoverflow) 1990-11-02

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