JPS61132761U - - Google Patents

Info

Publication number
JPS61132761U
JPS61132761U JP1688885U JP1688885U JPS61132761U JP S61132761 U JPS61132761 U JP S61132761U JP 1688885 U JP1688885 U JP 1688885U JP 1688885 U JP1688885 U JP 1688885U JP S61132761 U JPS61132761 U JP S61132761U
Authority
JP
Japan
Prior art keywords
probe
tip
wafer
contact
bent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1688885U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1688885U priority Critical patent/JPS61132761U/ja
Publication of JPS61132761U publication Critical patent/JPS61132761U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP1688885U 1985-02-08 1985-02-08 Pending JPS61132761U (nl)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1688885U JPS61132761U (nl) 1985-02-08 1985-02-08

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1688885U JPS61132761U (nl) 1985-02-08 1985-02-08

Publications (1)

Publication Number Publication Date
JPS61132761U true JPS61132761U (nl) 1986-08-19

Family

ID=30504079

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1688885U Pending JPS61132761U (nl) 1985-02-08 1985-02-08

Country Status (1)

Country Link
JP (1) JPS61132761U (nl)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994009374A1 (en) * 1992-10-12 1994-04-28 Kabushiki Kaisha Kobe Seiko Sho Probe unit and method of manufacturing the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1994009374A1 (en) * 1992-10-12 1994-04-28 Kabushiki Kaisha Kobe Seiko Sho Probe unit and method of manufacturing the same

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