JPS61132761U - - Google Patents
Info
- Publication number
- JPS61132761U JPS61132761U JP1688885U JP1688885U JPS61132761U JP S61132761 U JPS61132761 U JP S61132761U JP 1688885 U JP1688885 U JP 1688885U JP 1688885 U JP1688885 U JP 1688885U JP S61132761 U JPS61132761 U JP S61132761U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- tip
- wafer
- contact
- bent
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 11
- 238000007796 conventional method Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1688885U JPS61132761U (nl) | 1985-02-08 | 1985-02-08 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1688885U JPS61132761U (nl) | 1985-02-08 | 1985-02-08 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61132761U true JPS61132761U (nl) | 1986-08-19 |
Family
ID=30504079
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1688885U Pending JPS61132761U (nl) | 1985-02-08 | 1985-02-08 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61132761U (nl) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1994009374A1 (en) * | 1992-10-12 | 1994-04-28 | Kabushiki Kaisha Kobe Seiko Sho | Probe unit and method of manufacturing the same |
-
1985
- 1985-02-08 JP JP1688885U patent/JPS61132761U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO1994009374A1 (en) * | 1992-10-12 | 1994-04-28 | Kabushiki Kaisha Kobe Seiko Sho | Probe unit and method of manufacturing the same |
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