JPS61131678U - - Google Patents
Info
- Publication number
- JPS61131678U JPS61131678U JP1440585U JP1440585U JPS61131678U JP S61131678 U JPS61131678 U JP S61131678U JP 1440585 U JP1440585 U JP 1440585U JP 1440585 U JP1440585 U JP 1440585U JP S61131678 U JPS61131678 U JP S61131678U
- Authority
- JP
- Japan
- Prior art keywords
- housing
- test probes
- circuit board
- printed circuit
- housed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 6
- 238000005476 soldering Methods 0.000 claims description 3
- 238000009413 insulation Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Tests Of Electronic Circuits (AREA)
Description
第１図は本考案の一実施例の要部縦断面図、第
２図は全体の斜視外観図、第３図はマスク板の平
面図である。
１……筐体、２……プリント板、２ｂ……ハン
ダ付点、１８……テストプローブ、１８ａ……接
触部、２０，２５……ばね、２１……配線、２２
……絶縁座、２３……ピストン、２４……シリン
ダ、２４ａ……吸い出し口、２６……底板、２７
……マスク板、２８……透孔。
FIG. 1 is a vertical cross-sectional view of a main part of an embodiment of the present invention, FIG. 2 is a perspective external view of the whole, and FIG. 3 is a plan view of a mask plate. 1... Housing, 2... Printed board, 2b... Soldering point, 18... Test probe, 18a... Contact part, 20, 25... Spring, 21... Wiring, 22
... Insulation seat, 23 ... Piston, 24 ... Cylinder, 24a ... Suction port, 26 ... Bottom plate, 27
...Mask board, 28...Through hole.
Claims (1)
リント板を載置して密閉し、そのプリント板のハ
ンダ付点と接離自在な複数のテストプローブを筐
体内に収納してなり、該テストプローブがハンダ
付点と接触してプリント板の電気的良否を検査す
るインサーキツトテスター用フイクスチヤーにお
いて、 前記テストプローブを筐体内に縦横一定間隔で
収納するとともに、該テストプローブのそれぞれ
と対向して筐体内圧の変化により出没可能なピス
トンを有するシリンダを筐体の下面に配設した底
板に突設し、更に、このシリンダの底部を外方へ
開口させ、かつ、この開口の所要部位に対応して
穿設された透孔を有するマスク板を前記底板へ着
脱可能に装着してなり、該マスク板の選択により
所要のテストプローブのみをプリント板のハンダ
付点に接離可能ならしめたことを特徴とするイン
サーキツトテスター用ユニバーサルフイクスチヤ
ー。[Scope of Claim for Utility Model Registration] A printed circuit board to be tested is placed on the top surface of a housing provided with an air vent hole, sealed, and a plurality of test probes that can come into contact with and separate from the soldering points of the printed circuit board are attached. In a fixture for an in-circuit tester that is housed in a housing and that tests the electrical quality of a printed circuit board by contacting the test probes with soldering points, the test probes are housed in the housing at regular intervals vertically and horizontally, and A cylinder facing each of the test probes and having a piston that can be moved in and out according to a change in the internal pressure of the housing is provided protruding from a bottom plate disposed on the lower surface of the housing, and further, the bottom of the cylinder is opened outward, In addition, a mask plate having through-holes drilled corresponding to the required portions of the opening is removably attached to the bottom plate, and by selecting the mask plate, only the required test probes can be soldered to the printed board. A universal fixture for an in-circuit tester, which is characterized by being able to touch and separate from a point.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1440585U JPS61131678U (en) | 1985-02-04 | 1985-02-04 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1440585U JPS61131678U (en) | 1985-02-04 | 1985-02-04 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61131678U true JPS61131678U (en) | 1986-08-16 |
Family
ID=30499299
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1440585U Pending JPS61131678U (en) | 1985-02-04 | 1985-02-04 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61131678U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01184480A (en) * | 1988-01-18 | 1989-07-24 | Tokyo Electron Ltd | Inspecting device |
-
1985
- 1985-02-04 JP JP1440585U patent/JPS61131678U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01184480A (en) * | 1988-01-18 | 1989-07-24 | Tokyo Electron Ltd | Inspecting device |
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