JPS61126437A - 画像処理装置 - Google Patents

画像処理装置

Info

Publication number
JPS61126437A
JPS61126437A JP59248908A JP24890884A JPS61126437A JP S61126437 A JPS61126437 A JP S61126437A JP 59248908 A JP59248908 A JP 59248908A JP 24890884 A JP24890884 A JP 24890884A JP S61126437 A JPS61126437 A JP S61126437A
Authority
JP
Japan
Prior art keywords
edge
processing circuit
image
pixels
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59248908A
Other languages
English (en)
Japanese (ja)
Other versions
JPH048833B2 (enrdf_load_stackoverflow
Inventor
Satoshi Yamatake
聰 山竹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP59248908A priority Critical patent/JPS61126437A/ja
Publication of JPS61126437A publication Critical patent/JPS61126437A/ja
Publication of JPH048833B2 publication Critical patent/JPH048833B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/956—Inspecting patterns on the surface of objects

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP59248908A 1984-11-26 1984-11-26 画像処理装置 Granted JPS61126437A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59248908A JPS61126437A (ja) 1984-11-26 1984-11-26 画像処理装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59248908A JPS61126437A (ja) 1984-11-26 1984-11-26 画像処理装置

Publications (2)

Publication Number Publication Date
JPS61126437A true JPS61126437A (ja) 1986-06-13
JPH048833B2 JPH048833B2 (enrdf_load_stackoverflow) 1992-02-18

Family

ID=17185212

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59248908A Granted JPS61126437A (ja) 1984-11-26 1984-11-26 画像処理装置

Country Status (1)

Country Link
JP (1) JPS61126437A (enrdf_load_stackoverflow)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01273181A (ja) * 1988-04-25 1989-11-01 Matsushita Electric Works Ltd 外観検査方法
WO1997043623A1 (fr) * 1996-05-10 1997-11-20 Komatsu Ltd. Appareil et procede de detection de defaut

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01273181A (ja) * 1988-04-25 1989-11-01 Matsushita Electric Works Ltd 外観検査方法
WO1997043623A1 (fr) * 1996-05-10 1997-11-20 Komatsu Ltd. Appareil et procede de detection de defaut

Also Published As

Publication number Publication date
JPH048833B2 (enrdf_load_stackoverflow) 1992-02-18

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term