JPS61124874A - 集積回路の試験装置 - Google Patents

集積回路の試験装置

Info

Publication number
JPS61124874A
JPS61124874A JP59246612A JP24661284A JPS61124874A JP S61124874 A JPS61124874 A JP S61124874A JP 59246612 A JP59246612 A JP 59246612A JP 24661284 A JP24661284 A JP 24661284A JP S61124874 A JPS61124874 A JP S61124874A
Authority
JP
Japan
Prior art keywords
test
time
pattern
timer
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59246612A
Other languages
English (en)
Japanese (ja)
Other versions
JPH056672B2 (enrdf_load_stackoverflow
Inventor
Atsushi Nigorikawa
濁川　篤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP59246612A priority Critical patent/JPS61124874A/ja
Publication of JPS61124874A publication Critical patent/JPS61124874A/ja
Publication of JPH056672B2 publication Critical patent/JPH056672B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP59246612A 1984-11-21 1984-11-21 集積回路の試験装置 Granted JPS61124874A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59246612A JPS61124874A (ja) 1984-11-21 1984-11-21 集積回路の試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59246612A JPS61124874A (ja) 1984-11-21 1984-11-21 集積回路の試験装置

Publications (2)

Publication Number Publication Date
JPS61124874A true JPS61124874A (ja) 1986-06-12
JPH056672B2 JPH056672B2 (enrdf_load_stackoverflow) 1993-01-27

Family

ID=17150991

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59246612A Granted JPS61124874A (ja) 1984-11-21 1984-11-21 集積回路の試験装置

Country Status (1)

Country Link
JP (1) JPS61124874A (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPH056672B2 (enrdf_load_stackoverflow) 1993-01-27

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees