JPS61121429A - Plasma cvd device - Google Patents

Plasma cvd device

Info

Publication number
JPS61121429A
JPS61121429A JP24376284A JP24376284A JPS61121429A JP S61121429 A JPS61121429 A JP S61121429A JP 24376284 A JP24376284 A JP 24376284A JP 24376284 A JP24376284 A JP 24376284A JP S61121429 A JPS61121429 A JP S61121429A
Authority
JP
Japan
Prior art keywords
plasma cvd
base material
electrode
vacuum container
vacuum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24376284A
Other languages
Japanese (ja)
Inventor
Akira Okuda
晃 奥田
Yoichi Onishi
陽一 大西
Mikio Takebayashi
幹男 竹林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP24376284A priority Critical patent/JPS61121429A/en
Publication of JPS61121429A publication Critical patent/JPS61121429A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02612Formation types
    • H01L21/02617Deposition types
    • H01L21/0262Reduction or decomposition of gaseous compounds, e.g. CVD
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02104Forming layers
    • H01L21/02365Forming inorganic semiconducting materials on a substrate
    • H01L21/02518Deposited layers
    • H01L21/02521Materials
    • H01L21/02524Group 14 semiconducting materials
    • H01L21/02532Silicon, silicon germanium, germanium

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Recrystallisation Techniques (AREA)

Abstract

PURPOSE:To prevent a particle from dropping to a substrate surface by heat- controlling an electrode surface with a temperature increasing device in forming a plasma CVD film. CONSTITUTION:A temperature increasing device 11 capable of heat-controlling a surface of an electrode 4 up to a predetermined temperature and an AC power source 12 to supply an electric power to this temperature increasing device 11 are provided. Therefore, in forming a plasma CVD film on a base material 2, after the surface of the electrode 4 is heated up to a predetermined temperature and bonding strength of the plasma CVD film bonding to the surface of the electrode 4 is enhanced, a particle is prevented from dr-opping to the surface of the base material 2.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、プラダ−r CV D (Chemical
 VaperDepos i t i on )法によ
って、基材表面にプラズマCVD膜を形成する際、基材
表面上に落下する粒子を減少し、ピンホール、パーティ
クルを減少させることの出来るプラズマCVD装置に関
するものである。
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention is directed to Prader CV D (Chemical
This invention relates to a plasma CVD device that can reduce particles falling onto the surface of a substrate and reduce pinholes and particles when forming a plasma CVD film on the surface of the substrate using the VaperDeposit ion method. .

従来の技術 プラズマCVD装置は、真空容器内に基材を加熱状態で
保持し、形成すべき薄膜の組成元素を含む化合物ガスを
一定流量で真空容器内に供給し、かつ、真空容器内の圧
力を大気圧以下の所定の真空度に維持した状態で、基材
を含む空間に低温プラズマを発生させることによって、
基材表面に、所望のプラズマCVD膜を形成する装置で
ある。
Conventional plasma CVD equipment maintains a substrate in a heated state in a vacuum container, supplies a compound gas containing the constituent elements of the thin film to be formed into the vacuum container at a constant flow rate, and maintains the pressure in the vacuum container. By generating low-temperature plasma in the space containing the base material while maintaining it at a predetermined degree of vacuum below atmospheric pressure,
This is an apparatus for forming a desired plasma CVD film on the surface of a base material.

以下、図面を参照しながら、上述した従来のプラズマC
VD装置について説明する。
Hereinafter, with reference to the drawings, the above-mentioned conventional plasma C
The VD device will be explained.

第2図は、従来のプラズマCVD装置を示すものである
。第2図において、101は、真空状態の維持が可能な
真空容器、102は、プラズマCVD膜が形成される基
材、103は基材102を保持し、かつ内部に加熱用の
ヒータを有して、基材102表面を加熱することが可能
な試料台、IQ3aは、試料台103の内部に搭載され
たヒ−タ、104は、形成すべきプラズマCVD膜の組
成元素を含む化合物ガスを供給するためのガス供給部を
持ち、化合物ガスを真空容器101内に導入するための
ガス導入口を持ち、かつ真空容器101内に化合物ガス
を導入し、所定の圧力に制御した状態で、基材102を
含む空間に低温プラズマを発生させるための電極、10
6は、出力の周波数が、13.56MHzの高周波電源
、106は電極104に高周波電力を効率良く供給する
ために設けた整合回路、107は、ヒータ103 aに
電力を供給する交流電源、108は、真空容器101内
の圧力を大気圧以下の真空度に真空排気するための真空
ポンプ、109f′i、真空容器101と真空ポンプ1
08の間を気密に接続する真空排気用のパイプ、110
は、真空容器101内の圧力を制御するために管内抵抗
を可変に制御するためのバタフライバルブである。
FIG. 2 shows a conventional plasma CVD apparatus. In FIG. 2, 101 is a vacuum container capable of maintaining a vacuum state, 102 is a base material on which a plasma CVD film is formed, and 103 holds the base material 102, and has a heater inside. A sample stage IQ3a capable of heating the surface of the base material 102 is a heater mounted inside the sample stage 103, and 104 supplies a compound gas containing the constituent elements of the plasma CVD film to be formed. It has a gas supply part for introducing the compound gas into the vacuum container 101, and has a gas inlet for introducing the compound gas into the vacuum container 101. an electrode for generating low temperature plasma in a space containing 102;
6 is a high frequency power source with an output frequency of 13.56 MHz; 106 is a matching circuit provided to efficiently supply high frequency power to the electrode 104; 107 is an AC power source that supplies power to the heater 103a; 108 is an AC power source that supplies power to the heater 103a; , a vacuum pump for evacuating the pressure inside the vacuum container 101 to a degree of vacuum below atmospheric pressure, 109f'i, the vacuum container 101 and the vacuum pump 1
A vacuum exhaust pipe that airtightly connects between 08 and 110
is a butterfly valve for variably controlling the resistance inside the tube in order to control the pressure inside the vacuum vessel 101.

以上のように構成されたプラズマCVD装置について、
以下その動作について説明する。
Regarding the plasma CVD apparatus configured as above,
The operation will be explained below.

まず、真空容器101内を真空ポンプ108により60
mTorr以下の真空度まで真空排気した後、基材10
2表面に形成すべき薄膜の組成元素を含む化合物ガスを
電極104のガス供給部からガス導入口を通して真空容
器101内に導入し、さらにバタフライバルブ110を
操作し、薄膜形成条件である圧力に真空容器101内を
制御する。また、基材102は試料台103によって所
定の温度に加熱制御される。次に、電極104に高周波
電源105より高周波電力を供給することによって、基
材102を含む空間に低温プラズマを発生させる。上記
結果として、基材102の表面に所マCVD膜を基材1
02表面に形成した際、電極104表面にも、プラズマ
CVD膜が付着し、その付着力が弱いため、粒子または
塊状で基材102表面上に落下する。その結果、プラズ
マCVD膜内にパーティクル欠陥が発生するという問題
点を有していた。
First, the inside of the vacuum container 101 is pumped by the vacuum pump 108 for 60 minutes.
After evacuation to a vacuum level of mTorr or less, the base material 10
2. A compound gas containing the constituent elements of the thin film to be formed on the surface is introduced from the gas supply section of the electrode 104 into the vacuum container 101 through the gas inlet, and the butterfly valve 110 is operated to adjust the vacuum to the pressure that is the thin film forming condition. The inside of the container 101 is controlled. Further, the base material 102 is heated and controlled to a predetermined temperature by the sample stage 103. Next, low-temperature plasma is generated in the space including the base material 102 by supplying high-frequency power to the electrode 104 from the high-frequency power source 105. As a result of the above, a CVD film is placed on the surface of the base material 102.
When the plasma CVD film is formed on the surface of the substrate 102, the plasma CVD film also adheres to the surface of the electrode 104, and since its adhesion is weak, it falls onto the surface of the substrate 102 in the form of particles or lumps. As a result, there was a problem in that particle defects were generated within the plasma CVD film.

このように従来のプラズマCVD膜の製造装置では、膜
を基材102表面に形成する際、電極104の表面の温
度が低く、また温度制御ができないため、表面に付着す
るプラズマCVD膜の電極104表面への付着力が弱く
なり、粒子として基材102表面上に落下し、プラズマ
CVD膜のピンホールや膜内欠陥を生じやすく、さらに
、後工程での歩留りを低下の原因ともなっていた。
As described above, in the conventional plasma CVD film manufacturing apparatus, when a film is formed on the surface of the base material 102, the temperature of the surface of the electrode 104 is low and the temperature cannot be controlled. The adhesion force to the surface is weakened, and particles fall onto the surface of the base material 102, which tends to cause pinholes and defects in the plasma CVD film, and further causes a decrease in yield in subsequent steps.

本発明は、上記問題点に鑑み、プラズマCVD膜形成時
に電極表面に付着するプラズマCVD膜の付着力を大き
くし、塞材表面上に粒子が落下するのを防ぎ、ピンホー
ル、パーティクルなどの膜内欠陥を減少させると共に1
後工程での歩留まりを向上することが可能なプラズマC
VD装置を提供するものである。
In view of the above-mentioned problems, the present invention increases the adhesion force of the plasma CVD film that adheres to the electrode surface during plasma CVD film formation, prevents particles from falling onto the plugging material surface, and prevents the formation of pinholes, particles, etc. 1 while reducing internal defects.
Plasma C that can improve yield in post-processing
It provides a VD device.

問題点を解決するための手段 上記問題点を解決するために、本発明のプラズマCVD
装置は、真空状態の維持が可能な真空容器と、プラズマ
CVD膜が、少なくとも一方の表。
Means for Solving the Problems In order to solve the above problems, the plasma CVD of the present invention
The apparatus includes a vacuum container capable of maintaining a vacuum state and a plasma CVD film on at least one side.

面に形成される基材を保持する試料台と、基材を加熱す
るための加熱装置と、真空容器内を減圧雰囲気にするた
めのポンプと、真空容器と真空ポンプを気密に接続する
パイプと、真空容器内に原料ガスを導入するためのガス
導入口と、真空容器内を所定の圧力に制御した状態で、
少なくとも基材を含む空間に、低温プラズマを発生させ
る電極と、この電極を加熱制御するための昇温装置とい
う構成を備えたものである。
A sample stage that holds the base material formed on the surface, a heating device that heats the base material, a pump that creates a reduced pressure atmosphere inside the vacuum container, and a pipe that airtightly connects the vacuum container and the vacuum pump. , a gas inlet for introducing raw material gas into the vacuum container, and a state in which the inside of the vacuum container is controlled to a predetermined pressure.
A space containing at least a base material is equipped with an electrode for generating low-temperature plasma and a temperature raising device for heating and controlling the electrode.

作  用 本発明は上記した構成によって、プラズマCVD膜形成
時に1電極表面を、昇温装置により加熱制御し、この結
果付着面の温度が高い程プラズマCVD膜の付着力は大
きくなるので、電極表面に付着するプラズマCVD膜の
付着力が大きくなり基板表面上への粒子の落下を防ぐこ
とが可能となる。
Effects According to the present invention, with the above-described configuration, the surface of one electrode is heated and controlled by a temperature raising device when forming a plasma CVD film, and as a result, the higher the temperature of the adhesion surface, the greater the adhesive force of the plasma CVD film. The adhesion force of the plasma CVD film that adheres to the substrate increases, making it possible to prevent particles from falling onto the substrate surface.

実施例 以下本発明の実施例のプラズマCVD装置について、図
面を参照しながら説明する。
EXAMPLES Hereinafter, plasma CVD apparatuses according to examples of the present invention will be described with reference to the drawings.

第1図は、本発明の実施例におけるプラズマCVD装置
を示すものである。
FIG. 1 shows a plasma CVD apparatus in an embodiment of the present invention.

第1図において、1は真空状態の維持が可能な真空容器
、2はプラズマCVD膜が形成される基材、3は基材2
を保持するための試料台、3aは試料台3を加熱するこ
とによって、基材2を所定の温度に加熱制御するだめの
加熱装置、4は形成すべきプラズマCVD膜の組成元素
を含む化合物ガスを供給するためのガス供給部を持ち、
化合物ガスを真空容器1内に導入するだめのガス導入口
を持ち、かつ真空容器1内に化合物ガスを導入し、所定
の圧力に制御した状態で、基材2を含む空間に低温プラ
ズマを発生させるための電極、5は出力の周波数が、1
3゜66MHzの高周波電源、6は電極4に高周波電力
を効率良く供給するために設けた整合回路、7は加熱装
置3a[電力を供給する交流電源、8は真空容器1内の
圧力を大気圧以下の真空度に真空排気するための真空ポ
ンプ、9は真空容器1と真空ポンプ8の間を気密に接続
する真空排気用のパイプ、1Qは真空容器1内の圧力を
制御するために管内抵抗を可変に制御する為のバタフラ
イバルブ、11は電極4の表面を所定の温度に加熱制御
するための昇温装置、12は昇温装置11に電力を供給
する電源である。
In FIG. 1, 1 is a vacuum container capable of maintaining a vacuum state, 2 is a base material on which a plasma CVD film is formed, and 3 is a base material 2.
3a is a heating device for heating and controlling the base material 2 to a predetermined temperature by heating the sample stage 3; 4 is a compound gas containing the constituent elements of the plasma CVD film to be formed; It has a gas supply section for supplying
It has a gas inlet for introducing the compound gas into the vacuum container 1, and generates low-temperature plasma in the space containing the base material 2 while introducing the compound gas into the vacuum container 1 and controlling it to a predetermined pressure. The electrode 5 indicates the output frequency is 1
3°66MHz high frequency power supply, 6 is a matching circuit provided to efficiently supply high frequency power to the electrode 4, 7 is an AC power supply that supplies the heating device 3a [power, 8 is the pressure inside the vacuum container 1 to atmospheric pressure A vacuum pump for evacuation to the following degree of vacuum; 9 is a pipe for evacuation that airtightly connects the vacuum container 1 and the vacuum pump 8; 1Q is an internal resistance for controlling the pressure inside the vacuum container 1; 11 is a temperature raising device for heating and controlling the surface of the electrode 4 to a predetermined temperature, and 12 is a power source for supplying power to the temperature raising device 11.

以上のように構成されたプラズマCVD装置について、
以下第1図を用いてその動作を説明する。
Regarding the plasma CVD apparatus configured as above,
The operation will be explained below using FIG.

まず真空容器1内を真空ポンプ8によって、somTo
rr以下の真空度まで真空排気した後、基材2の表面に
形成すべき薄膜の組成元素を含む化合物ガス、すなわち
、モノシラン(S 1H4)、アンモニア(NH3)、
窒素(N2)の混合ガスを各々13SCCM、16SC
CM、s2 SCCM  のガス流量で、電極4のガス
供給部からガス導入口を通して、真空容器1内に導入し
、かつ真空容器1内の圧力をバタフライバルブ10を操
作することによって、460 mTorrVc保持する
。また基材2は、試料台3によって、350℃の温度に
加熱制御される。
First, inside the vacuum container 1, the somTo
After evacuation to a degree of vacuum below rr, a compound gas containing the constituent elements of the thin film to be formed on the surface of the base material 2, i.e., monosilane (S 1H4), ammonia (NH3),
Mixed gas of nitrogen (N2) at 13SCCM and 16SC respectively
A gas flow rate of CM, s2 SCCM is introduced into the vacuum vessel 1 from the gas supply section of the electrode 4 through the gas inlet, and the pressure inside the vacuum vessel 1 is maintained at 460 mTorrVc by operating the butterfly valve 10. . Further, the base material 2 is heated and controlled to a temperature of 350° C. by the sample stage 3.

また、電極4の表面は、昇温装置11によって、250
℃の温度に加熱制御される、次に、電極4に高周波電源
5より高周波電力を供給することによって、基材2を含
む空間に低温プラズマを発生させる。上記の結果として
、基材2の表面に屈折率2.06のプラズマ窒化シリコ
ン膜を形成することができた。
Further, the surface of the electrode 4 is heated to 250
The heating is controlled to a temperature of .degree. C. Next, by supplying high frequency power to the electrode 4 from the high frequency power source 5, low temperature plasma is generated in the space containing the base material 2. As a result of the above, a plasma silicon nitride film with a refractive index of 2.06 could be formed on the surface of the base material 2.

以上のように本実施例によれば、電極4の表面を所定の
温度まで加熱制御することのできる昇温装置11と、こ
の昇温装置11に電力を供給するための交流電源12を
設けることにより、基材2にプラズマCVD膜を形成す
る際、電極4の表面を所定の温度まで加熱し、電極4表
面に付着するプラズマCVD膜の付着力を大きくして、
基材2表面上への粒子としての落下を防ぐことが出来る
As described above, according to this embodiment, a temperature raising device 11 capable of heating and controlling the surface of the electrode 4 to a predetermined temperature and an AC power source 12 for supplying power to the temperature raising device 11 are provided. When forming a plasma CVD film on the base material 2, the surface of the electrode 4 is heated to a predetermined temperature to increase the adhesive force of the plasma CVD film adhering to the surface of the electrode 4.
It is possible to prevent particles from falling onto the surface of the base material 2.

々お、実施例では高周波電源5は、出力の周波数が13
.56MHzとしたが、それに限定されず、高周波電源
5は、出力の周波数が、4’O〜500KHz  の低
周波のものを使用してもよい。
In the embodiment, the high frequency power supply 5 has an output frequency of 13
.. Although the frequency is 56 MHz, the present invention is not limited thereto, and the high frequency power source 5 may have a low output frequency of 4'O to 500 KHz.

また、実施例ではSiN膜を形成する装置としたが、S
iO2膜などを形成する装置についても使用できる。
In addition, although the example uses an apparatus for forming a SiN film,
It can also be used for devices that form iO2 films and the like.

発明の効果 以上のように本発明は、真空状態の維持が可能な真空容
器と、プラズマCVD膜が少なくとも一方の表面に形成
される基材を保持する試料台と、基材を加熱するための
加熱装置と真空容器内を減圧雰囲気にするためのポンプ
と真空容器と真空ポンプとを気密に接続するパイプと真
空容器内に原料ガスを導入するためガス導入口と、真空
容器内を所定の圧力に制御した状態で、少なくとも基材
を含む空間に、低温プラズマを発生させる電極と、電極
を加熱制御するための昇温装置とを設けることにより、
プラズマCVD膜を形成する際、電極表面が、加熱され
る為、電極表面に付着するプラズマCVD膜の付着力が
大きくなり、その結果それらが粒子となって、基材表面
上へ落下することを防止し、基材表面に形成されるプラ
ズマCVD膜のピンホール及びパーティクルなどの膜内
欠陥を減少することができ、その効果は顕著なものがあ
る。
Effects of the Invention As described above, the present invention provides a vacuum container that can maintain a vacuum state, a sample stage that holds a base material on which a plasma CVD film is formed on at least one surface, and a sample stage that holds a base material on at least one surface of which a plasma CVD film is formed. A heating device and a pump to create a reduced pressure atmosphere inside the vacuum container, a pipe that airtightly connects the vacuum container and the vacuum pump, a gas inlet for introducing raw material gas into the vacuum container, and a predetermined pressure inside the vacuum container. By providing an electrode for generating low-temperature plasma and a temperature raising device for controlling heating of the electrode in a space containing at least the base material in a controlled state,
When forming a plasma CVD film, the electrode surface is heated, so the adhesion force of the plasma CVD film adhering to the electrode surface increases, and as a result, particles form and fall onto the base material surface. It is possible to prevent defects in the plasma CVD film such as pinholes and particles formed on the surface of the substrate and to reduce defects in the film, and the effect is remarkable.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施例におけるプラズマCVD装置を
説明するための概略図、第2図は従来のプラズマCVD
装置を説明するための概略図である。 1・・・・・・真空容器、3・・・・・・試料台、3a
・・・・・・加熱装置、4・・・・・・電極、8・・・
・・・真空ポンプ、9・・・・・・・(イブ、11・・
・・・・昇温装置。 代理人の氏名 弁理士 中 尾 敏 男 ほか1名第1
図 (f−一一専壜弱1
FIG. 1 is a schematic diagram for explaining a plasma CVD apparatus in an embodiment of the present invention, and FIG. 2 is a conventional plasma CVD apparatus.
FIG. 2 is a schematic diagram for explaining the device. 1... Vacuum container, 3... Sample stand, 3a
... Heating device, 4 ... Electrode, 8 ...
...Vacuum pump, 9... (Eve, 11...
...Temperature raising device. Name of agent: Patent attorney Toshio Nakao and 1 other person No. 1
Figure (f-11 special bottle weak 1

Claims (1)

【特許請求の範囲】[Claims]  真空状態の維持が可能な真空容器と、プラズマCVD
膜が、少なくとも一方の表面に形成される基材を保持す
る試料台と、基材を加熱するための加熱装置と、真空容
器内を減圧雰囲気にするための真空ポンプと、真空容器
と真空ポンプを気密に接続するパイプと、真空容器内に
原料ガスを導入するためのガス導入口と、真空容器内を
所定の圧力に制御した状態で、少なくとも基材を含む空
間に、低温プラズマを発生させる電極と、この電極を加
熱制御するための昇温装置とを備えたことを特徴とする
プラズマCVD装置。
Vacuum container that can maintain vacuum state and plasma CVD
A sample stage that holds a base material on which a film is formed on at least one surface, a heating device that heats the base material, a vacuum pump that creates a reduced pressure atmosphere in the vacuum container, and a vacuum container and vacuum pump. A low-temperature plasma is generated in the space containing at least the base material, with a pipe that airtightly connects the material, a gas inlet for introducing the raw material gas into the vacuum container, and a predetermined pressure controlled inside the vacuum container. A plasma CVD apparatus comprising an electrode and a temperature raising device for heating and controlling the electrode.
JP24376284A 1984-11-19 1984-11-19 Plasma cvd device Pending JPS61121429A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24376284A JPS61121429A (en) 1984-11-19 1984-11-19 Plasma cvd device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24376284A JPS61121429A (en) 1984-11-19 1984-11-19 Plasma cvd device

Publications (1)

Publication Number Publication Date
JPS61121429A true JPS61121429A (en) 1986-06-09

Family

ID=17108603

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24376284A Pending JPS61121429A (en) 1984-11-19 1984-11-19 Plasma cvd device

Country Status (1)

Country Link
JP (1) JPS61121429A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0514362U (en) * 1991-08-07 1993-02-23 日東紡績株式会社 Roof daylighting structure
US9454000B2 (en) 2012-04-24 2016-09-27 Seiko Precision Inc. Aperture device and optical instrument

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57113214A (en) * 1980-12-29 1982-07-14 Seiko Epson Corp Manufacture of amorphous semiconductor film
JPS58151031A (en) * 1983-02-14 1983-09-08 Hitachi Ltd Plasma chemical vapor deposition apparatus
JPS6115978A (en) * 1984-07-03 1986-01-24 Minolta Camera Co Ltd Plasma cvd device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57113214A (en) * 1980-12-29 1982-07-14 Seiko Epson Corp Manufacture of amorphous semiconductor film
JPS58151031A (en) * 1983-02-14 1983-09-08 Hitachi Ltd Plasma chemical vapor deposition apparatus
JPS6115978A (en) * 1984-07-03 1986-01-24 Minolta Camera Co Ltd Plasma cvd device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0514362U (en) * 1991-08-07 1993-02-23 日東紡績株式会社 Roof daylighting structure
US9454000B2 (en) 2012-04-24 2016-09-27 Seiko Precision Inc. Aperture device and optical instrument

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