JPH02250314A - Plasma cvd apparatus - Google Patents

Plasma cvd apparatus

Info

Publication number
JPH02250314A
JPH02250314A JP7312489A JP7312489A JPH02250314A JP H02250314 A JPH02250314 A JP H02250314A JP 7312489 A JP7312489 A JP 7312489A JP 7312489 A JP7312489 A JP 7312489A JP H02250314 A JPH02250314 A JP H02250314A
Authority
JP
Japan
Prior art keywords
gas
heating container
container
plasma
electrodes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7312489A
Other languages
Japanese (ja)
Inventor
Shuji Nakao
中尾 修治
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP7312489A priority Critical patent/JPH02250314A/en
Publication of JPH02250314A publication Critical patent/JPH02250314A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To prevent a foreign substance from being produced outside a heating container by a method wherein the heating container capable of housing an object to be treated at its inside is provided between electrodes for plasma generation use, a gas-outflow port and an introduction port of a reaction gas are installed at the heating container and a gas-supply passage linked to the gas-introduction port is installed at the electrode on one side. CONSTITUTION:A gas-outflow port 21 is installed at a heating container 19 which has been installed between electrodes 14, 15 for plasma generation use; introduction ports 22 of a reaction gas are installed; a gas-supply passage 17 linked to the gas-introduction ports 22 installed at the electrode on one side. A pressure inside a vacuum container 11 is reduced to 10<6>Torr; a pressure inside the heating container 19 is reduced to 10<1> to 10Torr; the reaction gas is introduced; a high-frequency voltage is applied to the electrodes 14, 15. A plasma 19 is generated inside the heating container 19; the reaction gas is pyrolyzed and reacts on a substrate 20. An undecomposed reaction gas is discharged to the outside of the heating container 19 from the gas-outflow port 21 ; it is diluted with an inert gas which has been introduced from an introduction port 12; its gas density is reduced; accordingly, it is possible to substantially neglect that a foreign substance is produced outside the heating container 19. Thereby, it is possible to restrain a plasma from being generated and to prevent the foreign substance from being produced outside the heating chamber.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、例えば半導体集積回路等の電子デバイス製造
プロセスで使用して好適なプラズマCVD装置に関する
ものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a plasma CVD apparatus suitable for use in the manufacturing process of electronic devices such as semiconductor integrated circuits.

〔従来の技術〕[Conventional technology]

一般に、プラズマCVD装置は低温での薄膜形成が可能
であることから広く採用されており、従来より5oli
d 5tate Technol−Vol、19.45
(1976)に開示され第2図に示すように構成されて
いる。これを同図に基づいて説明すると、同図において
、符号1で示すものは真空ポンプ(図示せず)に接続す
るガス排出口2を有する真空容器、3および4はこの真
空容器1内に設けられ各々が互いに対向する上下2つの
電極、5はこれら電極3,4に接続されかつ前記真空容
器1の外部に設けられたプラズマ発生用の高周波電源で
ある。また、6は前記真空容器lの外部に設けられ前記
画電極3゜4のうち下部電極4上の被処理物(以下、基
板と称する)7を加熱するヒータである。なお、8は前
記下部電極4に設けられ前記真空容器1内に連通ずるガ
ス供給通路である。
In general, plasma CVD equipment has been widely adopted because it is capable of forming thin films at low temperatures, and
d 5tate Technol-Vol, 19.45
(1976) and is configured as shown in FIG. To explain this based on the figure, in the figure, the reference numeral 1 denotes a vacuum vessel having a gas outlet 2 connected to a vacuum pump (not shown), and 3 and 4 are provided inside the vacuum vessel 1. There are two upper and lower electrodes facing each other, and 5 is a high frequency power source for plasma generation connected to these electrodes 3 and 4 and provided outside the vacuum vessel 1. Further, reference numeral 6 denotes a heater that is provided outside the vacuum chamber 1 and heats the object to be processed (hereinafter referred to as a substrate) 7 on the lower electrode 4 of the picture electrodes 3.4. Note that 8 is a gas supply passage provided in the lower electrode 4 and communicating with the inside of the vacuum container 1.

このように構成されたプラズマCVD装置を使用する薄
膜形成は、先ず下部電極4上に基板7をし載置し、次に
真空容器1内を所定の圧力に減圧した後、ガス供給通路
8から反応ガスを真空容器l内に導入してから画電極3
,4間に高周波電圧を印加することにより行われる。こ
のとき、真空容器l内にプラズマが発生するため、反応
ガスが熱分解されて活性種となり、これが基+JM ?
上で反応する。
To form a thin film using the plasma CVD apparatus configured in this way, first, the substrate 7 is placed on the lower electrode 4, and then the inside of the vacuum vessel 1 is reduced to a predetermined pressure, and then the gas supply passage 8 is After introducing the reaction gas into the vacuum container l, the picture electrode 3
, 4 by applying a high frequency voltage between them. At this time, since plasma is generated in the vacuum container l, the reaction gas is thermally decomposed and becomes active species, which form the group +JM?
React above.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

ところで、従来のプラズマCVD装置においては、真空
容器1内の圧力が任意の点で略同−の圧力に設定されて
おり、このため薄膜形成時にプラズマが真空容器1内全
体に発生して基板7上の6ならずこれ以外の部位にも生
成物が付着し、真空容器1内の清掃を頻繁に行う必要が
生じていた。
By the way, in a conventional plasma CVD apparatus, the pressure inside the vacuum chamber 1 is set to approximately the same pressure at any point, and therefore, when forming a thin film, plasma is generated throughout the vacuum chamber 1 and the substrate 7 is heated. The product adhered not only to the above 6 but also to other parts, making it necessary to frequently clean the inside of the vacuum container 1.

すなわち、プラズマが発生する低温の雰囲気中では、真
空容器l内に付着した生成物が剥離し易くなり、これが
薄膜形成時に基板7上に異物として付着すると、薄膜形
成に悪影響を及ぼしてしまうからである。この結果、運
転・停止の繰り返し回数が増加することになり、デバイ
スの生産性が低下するという問題があった。
That is, in a low-temperature atmosphere where plasma is generated, the products adhering to the inside of the vacuum container l tend to peel off, and if this adheres as foreign matter on the substrate 7 during thin film formation, it will adversely affect the thin film formation. be. As a result, the number of repetitions of starting and stopping increases, resulting in a problem that the productivity of the device decreases.

本発明はこのような事情に鑑みてなされたちので、運転
・停止の繰り返し回数を削減することがテキ、もってデ
バイスとしての生産性を高めることができるプラズマC
VD装置を提供するものである。
The present invention was made in view of these circumstances, and it is possible to reduce the number of repetitions of starting and stopping, thereby increasing the productivity of the device.
It provides a VD device.

〔課題を解決するための手段〕[Means to solve the problem]

本発明に係るプラズマCVD装置は、ガス排出口を有す
る真空容器と、この真空容器内に設けられ各々が互いに
対向する2つのプラズマ発生用電極と、これら両プラズ
マ発生用電極間に設けられその内部に被処理物を収容可
能な加熱容器とを備え、この加熱容器に真空容器内に連
通ずるガス導出口を設けると共に、反応ガスを導入する
ガス導入口を設け、このガス導入口に連通ずるガス供給
通路を両プラズマ発生用電極のうち一方の電極に設けた
ものである。
A plasma CVD apparatus according to the present invention includes a vacuum container having a gas exhaust port, two plasma generation electrodes provided in the vacuum container and facing each other, and a plasma CVD device provided between the two plasma generation electrodes and provided inside the vacuum container. The heating container is provided with a gas outlet that communicates with the inside of the vacuum container, and a gas inlet that introduces a reaction gas, and a gas inlet that communicates with the gas inlet is provided in the heating container. A supply passage is provided in one of the two plasma generation electrodes.

〔作 用〕[For production]

本発明においては、薄膜形成時に加熱容器内での生成物
の密着性を良好なものにすることができると共に、加熱
容器外のプラズマ発生を抑制して異物生成を防止するこ
とができる。
In the present invention, it is possible to improve the adhesion of the product inside the heating container during thin film formation, and it is also possible to suppress the generation of plasma outside the heating container and prevent the generation of foreign matter.

〔実施例〕〔Example〕

以下、本発明の構成等を図に示す実施例によって詳細に
説明する。
EMBODIMENT OF THE INVENTION Hereinafter, the structure etc. of this invention will be explained in detail by the Example shown in the figure.

第1図は本発明に係るプラズマCVD装置を示す断面図
である。同図において、符号11で示すものはCVD薄
膜形成用の真空容器で、上部には容器内圧力を調整する
パージガス導入口12が設けられており、下部には真空
ポンプ(図示せず)に接続するガス排出口13が設けら
れている。14および15は各々が互いに所定の間隔を
もって対向する2つのプラズマ発生用電極で、前記真空
容器11内に設けられ、かつ高周波発振器としての電源
16に接続されている。これら両電極13.14のうち
上部電極14には反応ガスを供給するガス供給通路17
が設けられており、下部電極15には後述する反応容器
を加熱するヒータ1Bが内蔵されている。19は加熱容
器としての反応容器で、基板(被処理物)20をその内
部に収容可能な有底筒19aおよびこの有底筒19aの
開口部を閉塞する蓋体19bからなり、前記両電極14
.15間に設けられている。この反応容器19の側方に
は前記真空容器ll内に連通ずるガス導出口21が設け
られており、上部には前記ガス供給通路17に連通ずる
ガス導入口(ノズル)22が設けられている。
FIG. 1 is a sectional view showing a plasma CVD apparatus according to the present invention. In the same figure, the reference numeral 11 is a vacuum container for CVD thin film formation, and the upper part is provided with a purge gas inlet 12 for adjusting the pressure inside the container, and the lower part is connected to a vacuum pump (not shown). A gas exhaust port 13 is provided to allow the gas to flow. Reference numerals 14 and 15 are two plasma generating electrodes facing each other at a predetermined distance, and are provided within the vacuum vessel 11 and connected to a power source 16 serving as a high frequency oscillator. Of these two electrodes 13 and 14, the upper electrode 14 has a gas supply passage 17 for supplying a reaction gas.
is provided, and the lower electrode 15 has a built-in heater 1B that heats a reaction container, which will be described later. Reference numeral 19 denotes a reaction vessel as a heating vessel, which includes a bottomed cylinder 19a that can accommodate a substrate (workpiece) 20 therein, and a lid 19b that closes the opening of this bottomed cylinder 19a.
.. It is located between 15 and 15. A gas outlet 21 communicating with the vacuum vessel 11 is provided on the side of the reaction vessel 19, and a gas inlet (nozzle) 22 communicating with the gas supply passage 17 is provided at the top. .

このように構成されたプラズマCVD装置を使用する薄
膜形成は、次に示すような手順を経て行われる。すなわ
ち、先ず反応容器19内に基板20を収容し、次に真空
容器11内を所定の圧力10 ’Toorに減圧すると
共に、反応容器19内を10 ’〜10Toorの範囲
の圧力に減圧した後、この反応容器19内に反応ガスを
導入してから両電極14.15間に高周波電圧を印加す
るのである。このとき、反応容器19内にプラズマが発
生するため、反応ガスが熱分解されて活性種となり、こ
れが基板20上で反応する。
Thin film formation using the plasma CVD apparatus configured as described above is performed through the following steps. That is, first, the substrate 20 is housed in the reaction container 19, and then the pressure inside the vacuum container 11 is reduced to a predetermined pressure of 10'Toor, and after the pressure inside the reaction container 19 is reduced to a pressure in the range of 10' to 10Toor, After introducing a reaction gas into this reaction vessel 19, a high frequency voltage is applied between both electrodes 14 and 15. At this time, since plasma is generated in the reaction vessel 19, the reaction gas is thermally decomposed to become active species, which react on the substrate 20.

ここで、真空容器11内における反応容器19外の圧力
が10 ’Toor以下の圧力に設定されているため、
この部位ではプラズマの発生を抑制することができ、し
かも未分解の反応ガスおよび活性種の一部がガス導出口
21から反応容器19外に流出して急激に膨張すると共
に、パージガス導入口12から導入された不活性ガスに
よって希釈されガス密度が小さ(なる。したがって、薄
膜形成時に真空容器ll内であって反応容器19外の異
物生成を実質的に無視することができる。また、反応容
器19内の温度を200℃位の温度に設定すると、反応
容器19内における生成物(薄膜)の密着性が良好にな
る。
Here, since the pressure outside the reaction vessel 19 inside the vacuum vessel 11 is set to a pressure of 10'Toor or less,
Plasma generation can be suppressed in this region, and part of the undecomposed reaction gas and active species flow out of the reaction vessel 19 from the gas outlet 21 and expand rapidly, and at the same time It is diluted by the introduced inert gas and the gas density becomes small. Therefore, when forming a thin film, the generation of foreign matter inside the vacuum vessel 11 and outside the reaction vessel 19 can be substantially ignored. When the temperature inside the reaction vessel 19 is set to about 200° C., the adhesion of the product (thin film) inside the reaction vessel 19 becomes good.

なお、本発明におけるガス導入口22とガス導出口21
の形状、不活性ガスの流量および真空ポンプ(図示せず
)による真空容器11内の排気速度は、適宜変更できる
ものとする。
Note that the gas inlet 22 and gas outlet 21 in the present invention
The shape of the inert gas, the flow rate of the inert gas, and the evacuation speed inside the vacuum container 11 by a vacuum pump (not shown) can be changed as appropriate.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明によれば、ガス排出口を有す
る真空容器と、この真空容器内に設けられ各々が互いに
対向する2つのプラズマ発生用電極と、これら両プラズ
マ発生用電極間に設けられその内部に被処理物を収容可
能な加熱容器とを備え、この加熱容器に真空容器内に連
通ずるガス導出口を設けると共に、反応ガスを導入する
ガス導入口を設け、このガス導入口に連通ずるガス供給
通路を両プラズマ発生用電極のうち一方の電極に設けた
ので、薄膜形成時に加熱容器外のプラズマ発生を抑制・
して異物生成を防止することができると共に、加熱容器
内の生成物の密着性を良好なものにすることができる。
As explained above, according to the present invention, there is a vacuum container having a gas exhaust port, two plasma generation electrodes provided in the vacuum container and facing each other, and a plasma generation electrode provided between the two plasma generation electrodes. The heating container is provided with a gas outlet that communicates with the inside of the vacuum container, and a gas inlet for introducing a reaction gas is provided in the heating container, which communicates with the gas inlet. Since a gas supply passage that communicates with one of the two plasma generation electrodes is provided, plasma generation outside the heating container can be suppressed during thin film formation.
This makes it possible to prevent the generation of foreign matter, and also to improve the adhesion of the product inside the heating container.

したがって、清掃による運転・停止の繰り返し回数を削
減することができるから、デバイスとしての生産性を高
めることができる。
Therefore, it is possible to reduce the number of times the device is repeatedly operated and stopped due to cleaning, thereby increasing the productivity of the device.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明に係るプラズマCVD装置を示す断面図
、第2図は従来のプラズマCVD装置を示す断面図であ
る。 11・・・・真空容器、13・・・・ガス排出口、14
、15・・・・電極、18・・・・ヒータ、19・・・
・反応容器、20・・・・基板、21・・・・ガス導出
口、22・・・・ガス導入口。 代 理 人 大岩増雄
FIG. 1 is a sectional view showing a plasma CVD apparatus according to the present invention, and FIG. 2 is a sectional view showing a conventional plasma CVD apparatus. 11... Vacuum container, 13... Gas outlet, 14
, 15... electrode, 18... heater, 19...
- Reaction container, 20... substrate, 21... gas outlet, 22... gas inlet. Agent Masuo Oiwa

Claims (1)

【特許請求の範囲】[Claims] ガス排出口を有する真空容器と、この真空容器内に設け
られ各々が互いに対向する2つのプラズマ発生用電極と
、これら両プラズマ発生用電極間に設けられその内部に
被処理物を収容可能な加熱容器とを備え、この加熱容器
に前記真空容器内に連通するガス導出口を設けると共に
、反応ガスを導入するガス導入口を設け、このガス導入
口に連通するガス供給通路を前記両プラズマ発生用電極
のうち一方の電極に設けたことを特徴とするプラズマC
VD装置。
A vacuum container having a gas exhaust port, two plasma generation electrodes provided in the vacuum container and facing each other, and a heating device provided between these plasma generation electrodes and capable of accommodating the object to be processed therein. a container, the heating container is provided with a gas outlet communicating with the inside of the vacuum container, a gas inlet for introducing a reaction gas is provided, and a gas supply passage communicating with the gas inlet is provided for both plasma generation. Plasma C characterized in that it is provided on one of the electrodes.
VD device.
JP7312489A 1989-03-23 1989-03-23 Plasma cvd apparatus Pending JPH02250314A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7312489A JPH02250314A (en) 1989-03-23 1989-03-23 Plasma cvd apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7312489A JPH02250314A (en) 1989-03-23 1989-03-23 Plasma cvd apparatus

Publications (1)

Publication Number Publication Date
JPH02250314A true JPH02250314A (en) 1990-10-08

Family

ID=13509169

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7312489A Pending JPH02250314A (en) 1989-03-23 1989-03-23 Plasma cvd apparatus

Country Status (1)

Country Link
JP (1) JPH02250314A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100700655B1 (en) * 2005-04-12 2007-03-27 삼성에스디아이 주식회사 Deposition equipment

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100700655B1 (en) * 2005-04-12 2007-03-27 삼성에스디아이 주식회사 Deposition equipment

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