JPS61118632A - 温度測定装置 - Google Patents
温度測定装置Info
- Publication number
- JPS61118632A JPS61118632A JP24138784A JP24138784A JPS61118632A JP S61118632 A JPS61118632 A JP S61118632A JP 24138784 A JP24138784 A JP 24138784A JP 24138784 A JP24138784 A JP 24138784A JP S61118632 A JPS61118632 A JP S61118632A
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- temperature measurement
- resistor
- oscillator
- memory
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/16—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
- G01K7/22—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor
- G01K7/24—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit
- G01K7/245—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a non-linear resistance, e.g. thermistor in a specially-adapted circuit, e.g. bridge circuit in an oscillator circuit
Landscapes
- Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- General Physics & Mathematics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24138784A JPS61118632A (ja) | 1984-11-15 | 1984-11-15 | 温度測定装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP24138784A JPS61118632A (ja) | 1984-11-15 | 1984-11-15 | 温度測定装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61118632A true JPS61118632A (ja) | 1986-06-05 |
| JPH0566534B2 JPH0566534B2 (enExample) | 1993-09-22 |
Family
ID=17073526
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP24138784A Granted JPS61118632A (ja) | 1984-11-15 | 1984-11-15 | 温度測定装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61118632A (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007134031A (ja) * | 2005-11-09 | 2007-05-31 | Hynix Semiconductor Inc | 温度検出装置 |
| JP2012090009A (ja) * | 2010-10-18 | 2012-05-10 | Lapis Semiconductor Co Ltd | 半導体集積回路及び測定温度検出方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59225323A (ja) * | 1983-06-06 | 1984-12-18 | Terumo Corp | 電子温度計 |
| JPS59225324A (ja) * | 1983-06-06 | 1984-12-18 | Terumo Corp | 電子温度計の製造方法 |
| JPS59225325A (ja) * | 1983-06-06 | 1984-12-18 | Terumo Corp | 電子温度計の製造方法 |
-
1984
- 1984-11-15 JP JP24138784A patent/JPS61118632A/ja active Granted
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59225323A (ja) * | 1983-06-06 | 1984-12-18 | Terumo Corp | 電子温度計 |
| JPS59225324A (ja) * | 1983-06-06 | 1984-12-18 | Terumo Corp | 電子温度計の製造方法 |
| JPS59225325A (ja) * | 1983-06-06 | 1984-12-18 | Terumo Corp | 電子温度計の製造方法 |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007134031A (ja) * | 2005-11-09 | 2007-05-31 | Hynix Semiconductor Inc | 温度検出装置 |
| JP2012090009A (ja) * | 2010-10-18 | 2012-05-10 | Lapis Semiconductor Co Ltd | 半導体集積回路及び測定温度検出方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0566534B2 (enExample) | 1993-09-22 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| LAPS | Cancellation because of no payment of annual fees |