JPS61117450A - 割れ状欠陥検出用超音波検査装置 - Google Patents

割れ状欠陥検出用超音波検査装置

Info

Publication number
JPS61117450A
JPS61117450A JP59238427A JP23842784A JPS61117450A JP S61117450 A JPS61117450 A JP S61117450A JP 59238427 A JP59238427 A JP 59238427A JP 23842784 A JP23842784 A JP 23842784A JP S61117450 A JPS61117450 A JP S61117450A
Authority
JP
Japan
Prior art keywords
ultrasonic
defect
defects
echo
transducer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP59238427A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0376865B2 (enExample
Inventor
Jun Kubota
純 窪田
Soji Sasaki
佐々木　荘二
Masayuki Watabiki
綿引　誠之
Mitsuo Koshirae
美津男 拵
Akitaka Fujita
藤田　明孝
Mamoru Okada
衛 岡田
Shinichi Shimizu
進一 清水
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Tokyo Gas Co Ltd
Hitachi Industry and Control Solutions Co Ltd
Original Assignee
Hitachi Engineering Co Ltd Ibaraki
Hitachi Ltd
Tokyo Gas Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Engineering Co Ltd Ibaraki, Hitachi Ltd, Tokyo Gas Co Ltd filed Critical Hitachi Engineering Co Ltd Ibaraki
Priority to JP59238427A priority Critical patent/JPS61117450A/ja
Publication of JPS61117450A publication Critical patent/JPS61117450A/ja
Publication of JPH0376865B2 publication Critical patent/JPH0376865B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4445—Classification of defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609—Display arrangements, e.g. colour displays
    • G01N29/0618—Display arrangements, e.g. colour displays synchronised with scanning, e.g. in real-time
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/07—Analysing solids by measuring propagation velocity or propagation time of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/11—Analysing solids by measuring attenuation of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36—Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/38—Detecting the response signal, e.g. electronic circuits specially adapted therefor by time filtering, e.g. using time gates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36—Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/42—Detecting the response signal, e.g. electronic circuits specially adapted therefor by frequency filtering or by tuning to resonant frequency
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02854—Length, thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/26—Scanned objects
    • G01N2291/267—Welds
    • G01N2291/2675—Seam, butt welding

Landscapes

  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP59238427A 1984-11-14 1984-11-14 割れ状欠陥検出用超音波検査装置 Granted JPS61117450A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59238427A JPS61117450A (ja) 1984-11-14 1984-11-14 割れ状欠陥検出用超音波検査装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59238427A JPS61117450A (ja) 1984-11-14 1984-11-14 割れ状欠陥検出用超音波検査装置

Publications (2)

Publication Number Publication Date
JPS61117450A true JPS61117450A (ja) 1986-06-04
JPH0376865B2 JPH0376865B2 (enExample) 1991-12-06

Family

ID=17030047

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59238427A Granted JPS61117450A (ja) 1984-11-14 1984-11-14 割れ状欠陥検出用超音波検査装置

Country Status (1)

Country Link
JP (1) JPS61117450A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6480859A (en) * 1987-09-24 1989-03-27 Hitachi Ltd Multichannel flaw detection system

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5310484A (en) * 1976-07-16 1978-01-30 Nippon Steel Corp Surface wave and ultrasonic flaw detection
JPS5599065A (en) * 1979-01-24 1980-07-28 Sumitomo Metal Ind Ltd Ultrasonic flaw detection

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5310484A (en) * 1976-07-16 1978-01-30 Nippon Steel Corp Surface wave and ultrasonic flaw detection
JPS5599065A (en) * 1979-01-24 1980-07-28 Sumitomo Metal Ind Ltd Ultrasonic flaw detection

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6480859A (en) * 1987-09-24 1989-03-27 Hitachi Ltd Multichannel flaw detection system

Also Published As

Publication number Publication date
JPH0376865B2 (enExample) 1991-12-06

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