JPS6110751A - Measurement for diffusivity of heat by intermittent heating - Google Patents
Measurement for diffusivity of heat by intermittent heatingInfo
- Publication number
- JPS6110751A JPS6110751A JP13004384A JP13004384A JPS6110751A JP S6110751 A JPS6110751 A JP S6110751A JP 13004384 A JP13004384 A JP 13004384A JP 13004384 A JP13004384 A JP 13004384A JP S6110751 A JPS6110751 A JP S6110751A
- Authority
- JP
- Japan
- Prior art keywords
- sample plate
- measured
- plate
- distance
- heat
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/18—Investigating or analyzing materials by the use of thermal means by investigating thermal conductivity
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は、肉薄の試料板−の厚さ方向に対して直角方向
(面方向)の熱拡散率を求める断続加熱による熱拡散率
測定方法に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a thermal diffusivity measurement method using intermittent heating for determining the thermal diffusivity in a direction perpendicular to the thickness direction (plane direction) of a thin sample plate.
従来、熱拡散率の測定には種々の方法が考案さ九ている
が、肉薄の試料の厚さ方向に対して直角方向の熱拡散率
を求めることができなかつ次。Conventionally, various methods have been devised to measure thermal diffusivity, but it has not been possible to determine the thermal diffusivity in the direction perpendicular to the thickness direction of a thin sample.
しかし近年、エレクトロニクスの技術の進歩例とも々い
、薄い電気絶縁物、たとえばセラミック板の上に半導体
e’0.5w以下の膜厚に蒸着することが多くなり、こ
n等の肉薄板状材料の熱的性質を知ることが必要になっ
てきた。However, in recent years, with advances in electronics technology, semiconductors are often deposited on thin electrical insulators, such as ceramic plates, to a film thickness of e'0.5w or less, and thin plate-like materials such as It has become necessary to know the thermal properties of
本発明は、かかる要求を満す肉薄な試料板の厚さ方向に
対して直角方向c面方向)の熱拡散率の測定方法を提供
す−ること金その目的としたもので、厚さが一定の被測
定試料板の片面の一部を覆い部材で覆った状態で該片面
に一定振幅の熱エネルギを断続照射し、被測定試料板の
被遮蔽部における前記覆い部材の端部から2つの距離の
点の交流温度Ticを種々の交流周波数で測定し、該周
波数の平方根を変数とする2つの距離の点の交流温度の
振幅比の対数の特性線からその勾配mを求め次式
但し、lfは2点間の距離。The object of the present invention is to provide a method for measuring the thermal diffusivity of a thin sample plate in the c-plane direction (direction perpendicular to the thickness direction) of a thin sample plate, which satisfies such requirements. A part of one side of a certain sample plate to be measured is covered with a covering member, and thermal energy of a certain amplitude is intermittently irradiated to the one side, and two The AC temperature Tic at the distance point is measured at various AC frequencies, and the slope m is calculated from the characteristic line of the logarithm of the amplitude ratio of the AC temperature at the two distance points with the square root of the frequency as a variable. lf is the distance between two points.
より前記被測定試料板の面方向への熱拡散率Dfを得る
ことを特徴とする。The method is characterized in that the thermal diffusivity Df in the surface direction of the sample plate to be measured is obtained.
以下本発明の実施例を図面につき説明する。Embodiments of the present invention will be described below with reference to the drawings.
第1図及び第2図は、被測定試料板の厚さ方向に対して
直角方向(面方向)への熱拡散率D(ff求めるために
使用する測定装置の一例を示す。FIGS. 1 and 2 show an example of a measuring device used to determine the thermal diffusivity D (ff) in a direction perpendicular to the thickness direction (plane direction) of a sample plate to be measured.
同図において、(1)は厚さが例えば0.1〜0.5
m程度の薄い被測定試料板で、該試料板(1)の上部に
は試料板(1)の片面の一部を覆う覆い板(2)’を試
料板(1)の面に沿って移動自在に配置し更に覆い板(
2)の上部にチョッパ(3)を付設した例えばタングス
テンランプのような熱源(4)を配置した。該チョッパ
(3)はN2図示のように直径上の中心で回転自在に軸
支さ几、図示さnないモータにより所定の回転数で回転
さ几る半円形板から成る。In the same figure, (1) has a thickness of, for example, 0.1 to 0.5
The sample plate to be measured is about 100 m thick, and a cover plate (2)' is placed on top of the sample plate (1) and covers a part of one side of the sample plate (1), and is moved along the surface of the sample plate (1). You can arrange it freely and also cover the plate (
A heat source (4), such as a tungsten lamp, equipped with a chopper (3) was placed on top of the heat source (2). The chopper (3) consists of a semi-circular plate which is rotatably supported at its diametrical center as shown in the figure N2, and which is rotated at a predetermined number of revolutions by a motor (not shown).
(5)は前記覆い板(2)と連結さnたマイクロメータ
、(6)は覆い板(2)で熱源(4)の熱エネルギの照
射から遮蔽さnる被測定試料板(1)の面における、覆
い板(2)の端部から距離Lfの点に点溶接した熱電対
で、該熱電対(6) 111−例えばフォトトランジス
タからなるセンサ(7)の出力を参照信号とするロック
イン増幅器(8)に接続し、該ロックイン増幅器(8)
により熱電対(6)の交流出力を増幅するようにし次。(5) is a micrometer connected to the cover plate (2), and (6) is a sample plate (1) to be measured which is shielded from the thermal energy irradiation of the heat source (4) by the cover plate (2). A thermocouple spot-welded at a distance Lf from the end of the cover plate (2) on the surface of the cover plate (2). the lock-in amplifier (8);
Next, the AC output of the thermocouple (6) is amplified.
尚、被測定試料板(1)は、図示しないが熱浴中に配置
し、該試料板(1)から外へ熱が逃げるときの熱抵抗を
大とした。Note that the sample plate (1) to be measured was placed in a heat bath (not shown) to increase the thermal resistance when heat escapes from the sample plate (1) to the outside.
次に該測定装置を使用して本発明の被測定試料板(1)
の面方向への熱拡散率Dfの測定方法について説明する
。Next, using the measuring device, the sample plate to be measured (1) of the present invention is prepared.
A method for measuring the thermal diffusivity Df in the plane direction will be explained.
被測定試料板(υの片面の露出部に、チョツノク(3)
により交流化さ几た単位面積肖り振幅Qの熱エネルギを
照射する。On the exposed part of one side of the sample plate to be measured (υ),
It irradiates thermal energy of amplitude Q per unit area, which is converted into alternating current.
このとき熱電対(6)で検出さnる交流温度’I’ae
は前記距離Lf(D関数として次式で与えら几る。At this time, the AC temperature 'I'ae detected by the thermocouple (6)
is given by the following equation as the distance Lf (D function).
但し、ρは試料板(1)の密度
0は試料板(1)の比熱
またkfの逆数は熱拡散長であり
kf=y儒扁−
但しfはチョッパによる熱エネルギの交流周波数Dfは
試料(1)の面方向への熱拡散率(1)式から明らかな
ように距離Lfにおける被測定試料板(1)の交流温度
’racの振幅値ITao+にであり、この値は熱電対
(6)の出力信号をロックイン増幅器(8)で増幅する
ことにより測定さ几る。However, ρ is the density of the sample plate (1), 0 is the specific heat of the sample plate (1), and the reciprocal of kf is the thermal diffusion length, kf = y儒bia - However, f is the alternating current frequency Df of the thermal energy by the chopper, As is clear from equation (1), the thermal diffusivity in the plane direction of 1) is the amplitude value ITao+ of the AC temperature 'rac of the sample plate to be measured (1) at the distance Lf, and this value is The output signal is amplified by a lock-in amplifier (8).
被測定試料(1)の被遮蔽部における覆い板(2)の端
部から距離がLf、 、 Lf、である2点の交流温度
の振幅lTa011 + l’rao2+の比をとると
、(3)式から(4)式を変形すると、
数4の一次式であり、
は該−次式の勾配mfである。Taking the ratio of the amplitude lTa011 + l'rao2+ of the AC temperature at two points at distances Lf, , Lf from the end of the cover plate (2) in the shielded part of the sample to be measured (1), (3) When formula (4) is transformed from the equation, it becomes the linear equation of Equation 4, and is the gradient mf of the -order equation.
かくて、マイクロメータ(5)により覆い板(2)を移
動して、試料板(1)における該覆い板(2)の端部か
ら熱電対(6)までの距離がLf、 、 Lf2の2点
の、種々の周波数での交流温度の振幅値I T B 0
、l + I Ta cmlをロックイン増幅器(8)
の出力から求める。そして周波数の平方根(jk変数と
する2つの距離Lf1. Lf、の点の交流温度Ta(
4+ Ta(4の振幅比の率Dfを得る。Thus, by moving the cover plate (2) using the micrometer (5), the distance from the end of the cover plate (2) on the sample plate (1) to the thermocouple (6) is 2 of Lf, , Lf2. Amplitude value of AC temperature at various frequencies at point I T B 0
, l + I Ta cml lock-in amplifier (8)
Obtained from the output of Then, the AC temperature Ta(
4+ Ta (obtain the rate Df of the amplitude ratio of 4.
以上の本発明の実施例では、前記特性線を描いて、その
特性線の勾配を求めて熱拡散率を得たが、該特性線全紙
上に描くことなくその他の手段で勾配?求めてもよい。In the above embodiments of the present invention, the thermal diffusivity was obtained by drawing the characteristic line and determining the slope of the characteristic line. You can ask for it.
このように本発明によるときは、厚さが例えば0.5舞
以下の肉薄の試料板の、厚さ方向に対して直角方向の熱
拡散率を得ることができる効果を有する。As described above, according to the present invention, it is possible to obtain the thermal diffusivity in the direction perpendicular to the thickness direction of a thin sample plate having a thickness of, for example, 0.5 mm or less.
第1図は本発明の実施に使用する測定装置の線図、第2
図は熱源及びロックイン増幅器を除いfc第1図示のも
のの平面図を示す。Figure 1 is a diagram of the measuring device used to carry out the present invention;
The figure shows a plan view of the fc first figure, excluding the heat source and lock-in amplifier.
Claims (1)
で覆つた状態で該片面に一定振幅の熱エネルギを断続照
射し、被測定試料板の被遮蔽部における前記覆い部材の
端部から2つの距離の点の交流温度Tacを種々の交流
周波数で測定し、該周波数の平方根を変数とする2つの
距離の点の交流温度の振幅比の対数の特性線からその勾
配mを求め次式 m=√(π/D_f)l_f 但し、l_fは2点間の距離。 より前記被測定試料板の面方向への熱拡散率D_fを得
ることを特徴とする断続加熱による熱拡散率測定方法。[Claims] 1. A portion of one side of a sample plate to be measured having a constant thickness is covered with a covering member, and thermal energy of a constant amplitude is intermittently irradiated to the one side to shield the sample plate to be measured. The AC temperature Tac at two distance points from the end of the covering member in the section is measured at various AC frequencies, and the logarithmic characteristic of the amplitude ratio of the AC temperature at the two distance points with the square root of the frequency as a variable. Find the slope m from the line and use the following formula: m=√(π/D_f)l_f, where l_f is the distance between two points. A method for measuring thermal diffusivity by intermittent heating, characterized in that the thermal diffusivity D_f in the surface direction of the sample plate to be measured is obtained.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13004384A JPS6110751A (en) | 1984-06-26 | 1984-06-26 | Measurement for diffusivity of heat by intermittent heating |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13004384A JPS6110751A (en) | 1984-06-26 | 1984-06-26 | Measurement for diffusivity of heat by intermittent heating |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6110751A true JPS6110751A (en) | 1986-01-18 |
JPH0479534B2 JPH0479534B2 (en) | 1992-12-16 |
Family
ID=15024708
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13004384A Granted JPS6110751A (en) | 1984-06-26 | 1984-06-26 | Measurement for diffusivity of heat by intermittent heating |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6110751A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6381248U (en) * | 1986-11-18 | 1988-05-28 | ||
JPS63241457A (en) * | 1987-03-30 | 1988-10-06 | Kawasaki Steel Corp | Instrument for measuring thermal property of thin film-like material |
JPH0210145A (en) * | 1988-06-28 | 1990-01-12 | Nec Corp | Measuring instrument for thermal diffusivity |
JPH0393394U (en) * | 1989-12-28 | 1991-09-24 |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57163856A (en) * | 1981-11-16 | 1982-10-08 | Showa Denko Kk | Measuring method for thermal diffusivity of material |
-
1984
- 1984-06-26 JP JP13004384A patent/JPS6110751A/en active Granted
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57163856A (en) * | 1981-11-16 | 1982-10-08 | Showa Denko Kk | Measuring method for thermal diffusivity of material |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6381248U (en) * | 1986-11-18 | 1988-05-28 | ||
JPH0514200Y2 (en) * | 1986-11-18 | 1993-04-15 | ||
JPS63241457A (en) * | 1987-03-30 | 1988-10-06 | Kawasaki Steel Corp | Instrument for measuring thermal property of thin film-like material |
JPH0210145A (en) * | 1988-06-28 | 1990-01-12 | Nec Corp | Measuring instrument for thermal diffusivity |
JPH0393394U (en) * | 1989-12-28 | 1991-09-24 |
Also Published As
Publication number | Publication date |
---|---|
JPH0479534B2 (en) | 1992-12-16 |
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Legal Events
Date | Code | Title | Description |
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EXPY | Cancellation because of completion of term |