JPS61105793A - Memory device - Google Patents

Memory device

Info

Publication number
JPS61105793A
JPS61105793A JP59226356A JP22635684A JPS61105793A JP S61105793 A JPS61105793 A JP S61105793A JP 59226356 A JP59226356 A JP 59226356A JP 22635684 A JP22635684 A JP 22635684A JP S61105793 A JPS61105793 A JP S61105793A
Authority
JP
Japan
Prior art keywords
control circuit
memory cells
gate
regardless
ram
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP59226356A
Other languages
Japanese (ja)
Inventor
Keisuke Tanaka
啓介 田中
Tsunezo Adachi
足立 恒三
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electronics Corp filed Critical Matsushita Electronics Corp
Priority to JP59226356A priority Critical patent/JPS61105793A/en
Publication of JPS61105793A publication Critical patent/JPS61105793A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To initialize the memory cells easily and in a short time regardless of the memory capacity by selecting all the addresses of the memory cells of an RAM simultaneously and initialize by writing the same value. CONSTITUTION:When the control signal S is made H, the outputs A1-An of the OR-gate 4 of the row address control circuit become H regardless of the address decode signal a1-an. The outputs of the OR-gate 5 of the column address control circuit also become H. The outputs of the NOR-gate 6 of the write control circuit become L regardless of write data DA. When the write enable signal WE becomes H, L is written in all the memory cells of the RAM, and initialize them in cleared status. The initialization of the RAM in H-level is performed likewise, and eliminates a complicated reset circuit and the likes. Thus the memory cells of the RAM built in the memory device of IC are easily and briefly initialized regardless of the memory capacity.

Description

【発明の詳細な説明】 産業上の利用分野 本発明は、1チツプに集積されたマイクロコンピュータ
−等の、RAMを内蔵する集積回路において、内蔵され
たRAMの全てのメモリセルに、同時に同じ値を書き込
むことで、全メモリセルの初期状態を設定する機能を有
する集積回路に関する0 従来例の構成とその問題点 集積回路に内蔵されたRAMの、電源投入時に2べ−7 おける各メモリセルの初期状態は不定である。従って必
要に応じて各メモリセルの初期状態を設定する必要があ
る。一般に初期状態の設定として、全てのメモリセルに
ロウレベルを書き込む場合が多い(以後クリアと呼ぶ)
DETAILED DESCRIPTION OF THE INVENTION Field of Industrial Application The present invention relates to an integrated circuit having a built-in RAM, such as a microcomputer integrated on one chip, in which all memory cells of the built-in RAM are simultaneously set to the same value. Regarding an integrated circuit that has the function of setting the initial state of all memory cells by writing The initial state is undefined. Therefore, it is necessary to set the initial state of each memory cell as necessary. Generally, a low level is often written to all memory cells as an initial state setting (hereinafter referred to as clear).
.

1チツプに集積されたマイクロコンピュータ−の場合は
、全メモリセルをクリアするだめには、前記マイクロコ
ンピュータ−の命令を用いて、ソフトウェアで1基本語
長(基本語長が8ビツトの場合は1バイト)ずつクリア
しなければなら々い。
In the case of a microcomputer integrated on one chip, in order to clear all memory cells, use the instructions of the microcomputer to clear one basic word length (1 basic word length if the basic word length is 8 bits) using software. I have to clear it one by one.

従って、メモリの容量が大きな場合は長時間を要してい
た。
Therefore, if the memory capacity is large, it takes a long time.

前記の欠点を補うだめに、従来より、リセット機能を有
したメモリセルも存在していた。第1図に従来のリセッ
ト機能を有するメモリセルの例を示す。まだ、第2図に
リセット機能を有さないメモリセルの例を示す。本来、
メモリセルは、第2図のように、インバータゲート1が
2個と、トランスファーゲート3が2個で構成すること
ができるが、リセット機能をもだせるために、第1図の
3べ− ように、インバータゲート1個のかわりに、NORゲー
ト2が1個必要になる。これd:、トランジスタ数に換
算すると、 Nch M OSの場合は1個、C−MO
Sの場合は2個の増加になる。まだ、リセット信号線も
余分に必要になる。
In order to compensate for the above-mentioned drawbacks, memory cells having a reset function have conventionally existed. FIG. 1 shows an example of a conventional memory cell having a reset function. Still, FIG. 2 shows an example of a memory cell without a reset function. Originally,
The memory cell can be configured with two inverter gates 1 and two transfer gates 3 as shown in FIG. , one NOR gate 2 is required instead of one inverter gate. This d:, when converted to the number of transistors, it is 1 in the case of Nch MOS, and 1 in the case of C-MO
In the case of S, the number increases by two. An extra reset signal line is still required.

このように、従来のりセット機能付きメモリセルでは回
路量が多くなり、チップ上に占める面積を増大させでい
た。
As described above, the conventional memory cell with the glue set function has a large amount of circuitry, which increases the area occupied on the chip.

発明の目的 本発明の目的は、前述の欠点を除去し、容易に全メモリ
セルの初期状態を設定する機能を有する集積回路を提供
するととにある。
OBJECTS OF THE INVENTION It is an object of the present invention to eliminate the above-mentioned drawbacks and to provide an integrated circuit having a function of easily setting the initial states of all memory cells.

発明の構成 本発明は、RAMに入力されたアドレス信号とは無関係
に、全てのメモリセルのアドレスを同時に選択する手段
を備え、これにより全てのメモリセルに同時に同じ値を
書き込むことで、全メモリセルの初期状態を設定するこ
とを可能にしだものである。
Structure of the Invention The present invention includes means for simultaneously selecting the addresses of all memory cells, regardless of the address signal input to the RAM, and by writing the same value to all memory cells at the same time, the entire memory This allows the initial state of the cell to be set.

実施例の説明 第3図に本発明のブロック図を示す。アドレス信号AD
を、行アドレスデコーダ■と、列アドレスデコーダ■に
入力する。通常の使用状態では、前記性および列の両ア
ドレスデコーダによって、行アドレスデコード信号a1
〜alおよび列アドレスデコード信号α1〜αmをデコ
ードするによって、メモリセルの1個が選択される。こ
の場合、行アドレス制御回路■ば、アドレスデコード信
号a1〜al をそのまま人1〜Anとして、メモリセ
ルアレイ■に伝達する。まだ、列アドレス制御回路■の
1組を選択し、書き込み制御回路■では薔き込みデータ
DAをそのまま伝達する。メモリセルをクリアする場合
は、制御信号Sを入力する。この場合、行アドレス制御
回路■により、行アドレスデコード信号a1〜anに無
関係にA1〜Anのすべての信号が選択される。また列
アドレス制御回路Vにより、データ信号線対(Dl、D
l)〜(De、De)の全組が選択される。書き込み制
御回路■では書き込みデータDAに無関係にロウレベル
が伝達さ5ぺ−7 れる。以上の動作により、メモリアレイ■中の全てのメ
モリセルに同時にロウレベルが書き適寸れるO 第4図に本発明の1実施例回路図を示す。
DESCRIPTION OF EMBODIMENTS FIG. 3 shows a block diagram of the present invention. Address signal AD
is input to the row address decoder (■) and column address decoder (■). In normal use, both the gender and column address decoders provide the row address decode signal a1.
~al and column address decode signals α1 to αm are decoded to select one of the memory cells. In this case, the row address control circuit (1) transmits the address decode signals a1-al as they are to the memory cell array (2) as signals 1-An. One set of column address control circuits (2) is still selected, and the write control circuit (2) transmits the fill-in data DA as is. When clearing a memory cell, a control signal S is input. In this case, row address control circuit (2) selects all signals A1-An regardless of row address decode signals a1-an. In addition, the column address control circuit V controls the data signal line pair (Dl, D
All pairs of l) to (De, De) are selected. In the write control circuit (2), a low level is transmitted regardless of the write data DA. By the above-described operation, a low level can be simultaneously written to all memory cells in the memory array (1). FIG. 4 shows a circuit diagram of an embodiment of the present invention.

この図で、4は行アドレス制御回路を構成するORゲー
ト、5は列アドレス制御回路を構成するORゲート、6
は書き込み制御回路を構成するNORゲートであるO8
はメモリセルをクリアするだめの制御信号である。通常
の使用状態では、制御信号Sをロウレベルにしておく。
In this figure, 4 is an OR gate that constitutes a row address control circuit, 5 is an OR gate that is a column address control circuit, and 6 is an OR gate that constitutes a column address control circuit.
O8 is a NOR gate that constitutes a write control circuit.
is a control signal for clearing the memory cell. In normal use, the control signal S is kept at a low level.

この場合、行アドレスデコーダにより、行アドレスデコ
ード線a1〜alの1本がハイレベルになり、行アドレ
ス制御回路■中のORゲート4はa1〜afiをそのt
tA+〜Anに伝達する。まだ、列アドレスデコーダに
より、列アドレスデコード線α1〜α。の1本カハイレ
ベルになり、列アドレス制御回路v中のORゲート5は
α1〜α。をそのま丑、選択信号β1〜βmとして、同
列アドレス制御回路v内に伝達する。一方、書き込み制
御回路では、NORゲート6を通して、書き込みデータ
DAがその!、ま6ベー7ノ 伝達される。従って、ライトイネーブル信号WEがハイ
レベルになると、行アドレスと列アドレスで指定された
メモリセルに書き込みデータDAが書き込まれる。
In this case, one of the row address decode lines a1 to al becomes high level by the row address decoder, and the OR gate 4 in the row address control circuit
tA+ to An. The column address decode lines α1 to α are still output by the column address decoder. One of the signals becomes a high level, and the OR gate 5 in the column address control circuit v goes to α1 to α. are directly transmitted to the same column address control circuit v as selection signals β1 to βm. On the other hand, in the write control circuit, the write data DA is passed through the NOR gate 6. , 6 and 7 are transmitted. Therefore, when the write enable signal WE becomes high level, the write data DA is written into the memory cell designated by the row address and column address.

次に、メモリセルをクリアする場合は制御信号Sをハイ
レベルにする。この場合、行アドレス制御回路■中のO
Rゲート4では、アドレスデコード信号a1〜anに無
関係にA1〜Anの全てをハイレベルにする。また、列
アドレス制御回路v中のORゲート5においても同様に
、列アドレスデコード信号α1〜αmに無関係にβ1〜
βmの全てをハイレベルにする。一方、書き込み制御回
路■のNORゲート6では書き込みデータDAに無関係
にロウレベルを伝達する。従って、ライトイネーブル信
号WEがハイレベルになると、全てのメモリセルにロウ
レベルが書き込まれる。
Next, when clearing the memory cell, the control signal S is set to high level. In this case, O in the row address control circuit ■
In the R gate 4, all of A1 to An are set to high level regardless of address decode signals a1 to an. Similarly, in the OR gate 5 in the column address control circuit v, β1 to
Set all of βm to high level. On the other hand, the NOR gate 6 of the write control circuit (2) transmits a low level regardless of the write data DA. Therefore, when the write enable signal WE goes high, a low level is written to all memory cells.

以上の説明では、メモリセルをクリアする場合について
述べたが、メモリセルをセットする(ハイレベルを書き
込む)場合は、書き込み制御回路において、セット時に
は書き込みデータに無関係にハイレベルを伝達するよう
にすればよい。
The above explanation deals with clearing a memory cell, but when setting a memory cell (writing a high level), the write control circuit must transmit a high level regardless of the write data when setting. Bye.

寸だ発明の一実施例として第4図にはNch−MOSの
場合を示しだが、C−MOSでも同様である。
As an embodiment of the present invention, FIG. 4 shows the case of Nch-MOS, but the same applies to C-MOS.

発明の効果 本発明によれば、簡単な制御回路を付加するだけで、メ
モリの容量に無関係に、短時間に全てのメモリセルの初
期状態を設定することができる。
Effects of the Invention According to the present invention, by simply adding a simple control circuit, the initial states of all memory cells can be set in a short time regardless of the capacity of the memory.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来のり七ソト機能伺きメモリセルの回路図、
第2図はりセット機能を有さ々い一般のメモリセルの回
路図、第3図は本発明実施例装置のブロック図、第4図
は本発明の一実施例を示す回路図である。 1 ・・・インバータゲー)、2.6・・・・・・NO
Rゲ−l−,3・・・・・トランスファーゲ−)、4.
ts・・・・ORゲート、■  ・・・・行アドレスデ
コーダ、■・・・・・行アドレス制御回路、■・・・・
メモリセルアレイ、■・・・・・列アドレスデコーダ、
■・・・・・・列アドレス制御回路、■・・・・・・書
き込み制御回路。 代理人の氏名 弁理士 中 尾 敏 男 ほか1名第1
Figure 1 is a circuit diagram of a conventional memory cell with seven functions.
FIG. 2 is a circuit diagram of a general memory cell having a beam setting function, FIG. 3 is a block diagram of a device according to an embodiment of the present invention, and FIG. 4 is a circuit diagram showing an embodiment of the present invention. 1...inverter game), 2.6...NO
R game-l-, 3...transfer game), 4.
ts...OR gate, ■...Row address decoder, ■...Row address control circuit, ■...
Memory cell array, ■・・・Column address decoder,
■・・・Column address control circuit, ■・・・Write control circuit. Name of agent: Patent attorney Toshio Nakao and 1 other person No. 1
figure

Claims (1)

【特許請求の範囲】[Claims]  RAMを内蔵するメモリ装置において、前記RAMに
入力されたアドレス信号とは無関係に、全てのメモリセ
ルのアドレスを同時に選択する手段を備え、前記全メモ
リセルに、同時に同じ値を書き込むことで、全メモリセ
ルの初期状態を設定する機能を有することを特徴とする
メモリ装置。
A memory device incorporating a RAM is provided with means for simultaneously selecting the addresses of all memory cells, regardless of the address signal input to the RAM, and by writing the same value to all the memory cells at the same time. A memory device characterized by having a function of setting an initial state of a memory cell.
JP59226356A 1984-10-26 1984-10-26 Memory device Pending JPS61105793A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59226356A JPS61105793A (en) 1984-10-26 1984-10-26 Memory device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59226356A JPS61105793A (en) 1984-10-26 1984-10-26 Memory device

Publications (1)

Publication Number Publication Date
JPS61105793A true JPS61105793A (en) 1986-05-23

Family

ID=16843868

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59226356A Pending JPS61105793A (en) 1984-10-26 1984-10-26 Memory device

Country Status (1)

Country Link
JP (1) JPS61105793A (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01205789A (en) * 1988-02-10 1989-08-18 Ricoh Co Ltd Static ram
US4890263A (en) * 1988-05-31 1989-12-26 Dallas Semiconductor Corporation RAM with capability for rapid clearing of data from memory by simultaneously selecting all row lines
US5402381A (en) * 1991-06-06 1995-03-28 Nec Corporation Semiconductor memory circuit having bit clear and/or register initialize function
GB2561011A (en) * 2017-03-31 2018-10-03 Advanced Risc Mach Ltd Initialisation of a storage device
US11137919B2 (en) 2017-10-30 2021-10-05 Arm Ltd. Initialisation of a storage device

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57176587A (en) * 1981-04-24 1982-10-29 Hitachi Ltd Semiconductor ram device
JPS58222489A (en) * 1982-06-18 1983-12-24 Nec Corp Semiconductor storage device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57176587A (en) * 1981-04-24 1982-10-29 Hitachi Ltd Semiconductor ram device
JPS58222489A (en) * 1982-06-18 1983-12-24 Nec Corp Semiconductor storage device

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01205789A (en) * 1988-02-10 1989-08-18 Ricoh Co Ltd Static ram
US4890263A (en) * 1988-05-31 1989-12-26 Dallas Semiconductor Corporation RAM with capability for rapid clearing of data from memory by simultaneously selecting all row lines
US5402381A (en) * 1991-06-06 1995-03-28 Nec Corporation Semiconductor memory circuit having bit clear and/or register initialize function
GB2561011A (en) * 2017-03-31 2018-10-03 Advanced Risc Mach Ltd Initialisation of a storage device
WO2018178644A1 (en) * 2017-03-31 2018-10-04 Arm Ltd Initialisation of a storage device
CN110520928A (en) * 2017-03-31 2019-11-29 阿姆有限公司 Store the initialization of equipment
GB2561011B (en) * 2017-03-31 2021-03-17 Advanced Risc Mach Ltd Initialisation of a storage device
US10964386B2 (en) 2017-03-31 2021-03-30 Arm Limited Initialisation of a storage device
US11137919B2 (en) 2017-10-30 2021-10-05 Arm Ltd. Initialisation of a storage device

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